{"id":"https://openalex.org/W2929815085","doi":"https://doi.org/10.1109/tim.2019.2905307","title":"A Combined Method for Analog Circuit Fault Diagnosis Based on Dependence Matrices and Intelligent Classifiers","display_name":"A Combined Method for Analog Circuit Fault Diagnosis Based on Dependence Matrices and Intelligent Classifiers","publication_year":2019,"publication_date":"2019-04-04","ids":{"openalex":"https://openalex.org/W2929815085","doi":"https://doi.org/10.1109/tim.2019.2905307","mag":"2929815085"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2019.2905307","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2019.2905307","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101722984","display_name":"Junyou Shi","orcid":"https://orcid.org/0000-0001-6135-8055"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Junyou Shi","raw_affiliation_strings":["School of Reliability and Systems Engineering, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0001-6135-8055","affiliations":[{"raw_affiliation_string":"School of Reliability and Systems Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015076117","display_name":"Yi Deng","orcid":"https://orcid.org/0000-0003-2657-4689"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yi Deng","raw_affiliation_strings":["School of Reliability and Systems Engineering, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0003-2657-4689","affiliations":[{"raw_affiliation_string":"School of Reliability and Systems Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100693880","display_name":"Zili Wang","orcid":"https://orcid.org/0000-0002-5003-3092"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zili Wang","raw_affiliation_strings":["School of Reliability and Systems Engineering, Beihang University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Reliability and Systems Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5066213936","display_name":"Qingjie He","orcid":"https://orcid.org/0000-0003-4008-6622"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qingjie He","raw_affiliation_strings":["School of Reliability and Systems Engineering, Beihang University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Reliability and Systems Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5101722984"],"corresponding_institution_ids":["https://openalex.org/I82880672"],"apc_list":null,"apc_paid":null,"fwci":1.4528,"has_fulltext":false,"cited_by_count":31,"citation_normalized_percentile":{"value":0.82193421,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":"69","issue":"3","first_page":"782","last_page":"793"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/ambiguity","display_name":"Ambiguity","score":0.8366513252258301},{"id":"https://openalex.org/keywords/classifier","display_name":"Classifier (UML)","score":0.6397525072097778},{"id":"https://openalex.org/keywords/separable-space","display_name":"Separable space","score":0.5610579252243042},{"id":"https://openalex.org/keywords/linear-discriminant-analysis","display_name":"Linear discriminant analysis","score":0.5569578409194946},{"id":"https://openalex.org/keywords/discriminant","display_name":"Discriminant","score":0.5415897369384766},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.5235630869865417},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.4832783043384552},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4454869031906128},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4352658987045288},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.4137572646141052},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.3362467885017395}],"concepts":[{"id":"https://openalex.org/C2780522230","wikidata":"https://www.wikidata.org/wiki/Q1140419","display_name":"Ambiguity","level":2,"score":0.8366513252258301},{"id":"https://openalex.org/C95623464","wikidata":"https://www.wikidata.org/wiki/Q1096149","display_name":"Classifier (UML)","level":2,"score":0.6397525072097778},{"id":"https://openalex.org/C70710897","wikidata":"https://www.wikidata.org/wiki/Q680081","display_name":"Separable space","level":2,"score":0.5610579252243042},{"id":"https://openalex.org/C69738355","wikidata":"https://www.wikidata.org/wiki/Q1228929","display_name":"Linear discriminant analysis","level":2,"score":0.5569578409194946},{"id":"https://openalex.org/C78397625","wikidata":"https://www.wikidata.org/wiki/Q192487","display_name":"Discriminant","level":2,"score":0.5415897369384766},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.5235630869865417},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4832783043384552},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4454869031906128},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4352658987045288},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.4137572646141052},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.3362467885017395},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2019.2905307","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2019.2905307","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Reduced inequalities","score":0.6700000166893005,"id":"https://metadata.un.org/sdg/10"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":40,"referenced_works":["https://openalex.org/W900323514","https://openalex.org/W1487149262","https://openalex.org/W1971750638","https://openalex.org/W1973236629","https://openalex.org/W1981010694","https://openalex.org/W1981553561","https://openalex.org/W1984204893","https://openalex.org/W1993005434","https://openalex.org/W2004069056","https://openalex.org/W2008903358","https://openalex.org/W2018787098","https://openalex.org/W2035530690","https://openalex.org/W2036572072","https://openalex.org/W2042311265","https://openalex.org/W2066949563","https://openalex.org/W2073779627","https://openalex.org/W2075445189","https://openalex.org/W2077700998","https://openalex.org/W2077773163","https://openalex.org/W2090666879","https://openalex.org/W2096280374","https://openalex.org/W2099383324","https://openalex.org/W2099684000","https://openalex.org/W2103879197","https://openalex.org/W2108921639","https://openalex.org/W2113423548","https://openalex.org/W2129103059","https://openalex.org/W2154871109","https://openalex.org/W2171360905","https://openalex.org/W2209953139","https://openalex.org/W2518269126","https://openalex.org/W2525089770","https://openalex.org/W2537309743","https://openalex.org/W2553245882","https://openalex.org/W2568645856","https://openalex.org/W2571260886","https://openalex.org/W2776271218","https://openalex.org/W2782762569","https://openalex.org/W2789267725","https://openalex.org/W2789290713"],"related_works":["https://openalex.org/W2350751952","https://openalex.org/W1999647744","https://openalex.org/W2362114017","https://openalex.org/W3147024994","https://openalex.org/W2063246903","https://openalex.org/W2374055396","https://openalex.org/W1978302214","https://openalex.org/W2021817983","https://openalex.org/W3008559849","https://openalex.org/W2371177901"],"abstract_inverted_index":{"This":[0,135],"paper":[1],"presents":[2],"a":[3,34,39,57,113,141,154,189],"novel":[4],"combined":[5,136],"method":[6,25,137],"for":[7,130],"analog":[8],"circuit":[9],"fault":[10,194],"diagnosis":[11,174],"based":[12,88],"on":[13,89],"dependence":[14,35,60],"matrices":[15],"and":[16,64,105,125,163,199],"intelligent":[17,48],"classifiers":[18,158],"(DM-IC).":[19],"The":[20],"main":[21],"purpose":[22],"of":[23,53,77,84,157,183,193],"this":[24,151],"is":[26,62,68,93,118,128,168],"to":[27,37,70,95,120,160,170],"obtain":[28,71],"preliminary":[29,72,79],"ambiguity":[30,73,80,99,133,197,201],"groups":[31,202],"by":[32,44],"constructing":[33],"matrix,":[36],"achieve":[38],"more":[40],"accurate":[41],"diagnostic":[42],"result":[43],"using":[45],"several":[46,146],"simple":[47],"classifiers.":[49],"Considering":[50],"the":[51,82,122,126,173,181,184,204],"presence":[52],"imperfect":[54],"test":[55],"points,":[56],"new":[58,114],"0-1-X":[59],"matrix":[61],"defined":[63],"an":[65,98],"expansion-reduction":[66],"algorithm":[67,83,117],"proposed":[69,94,119],"groups.":[74],"For":[75],"each":[76,131],"these":[78],"groups,":[81,198],"separability":[85],"discrimination":[86],"analysis":[87,92],"Fisher":[90],"discriminant":[91],"determine":[96],"whether":[97],"group":[100],"can":[101,138],"be":[102,110,161],"further":[103],"classified":[104],"how":[106],"many":[107],"classes":[108],"should":[109],"classified.":[111],"Furthermore,":[112],"test-point":[115],"optimization":[116],"simplify":[121],"input":[123],"nodes,":[124],"classifier":[127,167],"constructed":[129],"separable":[132],"group.":[134],"break":[139],"down":[140],"difficult":[142],"classification":[143,148,192],"problem":[144],"into":[145],"simpler":[147],"problems.":[149],"In":[150],"way,":[152],"only":[153],"small":[155],"number":[156],"need":[159],"constructed,":[162],"at":[164],"most":[165],"one":[166],"required":[169],"participate":[171],"in":[172,203],"process.":[175],"Our":[176],"experimental":[177],"results":[178],"clearly":[179],"demonstrate":[180],"superiority":[182],"DM-IC":[185],"method,":[186],"which":[187],"has":[188],"100%":[190],"correct":[191],"classes,":[195],"fewer":[196],"smaller":[200],"sample":[205],"circuit.":[206]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":5},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":10},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":4},{"year":2020,"cited_by_count":4},{"year":2019,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}