{"id":"https://openalex.org/W2922367511","doi":"https://doi.org/10.1109/tim.2019.2900143","title":"An Approach on MCSA-Based Fault Detection Using Independent Component Analysis and Neural Networks","display_name":"An Approach on MCSA-Based Fault Detection Using Independent Component Analysis and Neural Networks","publication_year":2019,"publication_date":"2019-03-15","ids":{"openalex":"https://openalex.org/W2922367511","doi":"https://doi.org/10.1109/tim.2019.2900143","mag":"2922367511"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2019.2900143","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2019.2900143","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5086177072","display_name":"Juan Enrique Garcia-Bracamonte","orcid":null},"institutions":[{"id":"https://openalex.org/I39824353","display_name":"National Institute of Astrophysics, Optics and Electronics","ror":"https://ror.org/00bpmmc63","country_code":"MX","type":"facility","lineage":["https://openalex.org/I39824353"]}],"countries":["MX"],"is_corresponding":false,"raw_author_name":"Juan Enrique Garcia-Bracamonte","raw_affiliation_strings":["Electronics Department, National Institute of Astrophysics, Optics and Electronics, Puebla, Mexico"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electronics Department, National Institute of Astrophysics, Optics and Electronics, Puebla, Mexico","institution_ids":["https://openalex.org/I39824353"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084917273","display_name":"Juan Manuel Ram\u00edrez-Cort\u00e9s","orcid":"https://orcid.org/0000-0002-8515-2489"},"institutions":[{"id":"https://openalex.org/I39824353","display_name":"National Institute of Astrophysics, Optics and Electronics","ror":"https://ror.org/00bpmmc63","country_code":"MX","type":"facility","lineage":["https://openalex.org/I39824353"]}],"countries":["MX"],"is_corresponding":false,"raw_author_name":"Juan Manuel Ramirez-Cortes","raw_affiliation_strings":["Electronics Department, National Institute of Astrophysics, Optics and Electronics, Puebla, Mexico"],"raw_orcid":"https://orcid.org/0000-0002-8515-2489","affiliations":[{"raw_affiliation_string":"Electronics Department, National Institute of Astrophysics, Optics and Electronics, Puebla, Mexico","institution_ids":["https://openalex.org/I39824353"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010423760","display_name":"Jose Rangel\u2010Magdaleno","orcid":"https://orcid.org/0000-0003-2785-5060"},"institutions":[{"id":"https://openalex.org/I39824353","display_name":"National Institute of Astrophysics, Optics and Electronics","ror":"https://ror.org/00bpmmc63","country_code":"MX","type":"facility","lineage":["https://openalex.org/I39824353"]}],"countries":["MX"],"is_corresponding":false,"raw_author_name":"Jose de Jesus Rangel-Magdaleno","raw_affiliation_strings":["Electronics Department, National Institute of Astrophysics, Optics and Electronics, Puebla, Mexico"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electronics Department, National Institute of Astrophysics, Optics and Electronics, Puebla, Mexico","institution_ids":["https://openalex.org/I39824353"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5046645490","display_name":"Pilar G\u00f3mez\u2010Gil","orcid":"https://orcid.org/0000-0003-1550-6218"},"institutions":[{"id":"https://openalex.org/I39824353","display_name":"National Institute of Astrophysics, Optics and Electronics","ror":"https://ror.org/00bpmmc63","country_code":"MX","type":"facility","lineage":["https://openalex.org/I39824353"]}],"countries":["MX"],"is_corresponding":false,"raw_author_name":"Pilar Gomez-Gil","raw_affiliation_strings":["Computer Science Department, National Institute of Astrophysics, Optics and Electronics, Puebla, Mexico"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Computer Science Department, National Institute of Astrophysics, Optics and Electronics, Puebla, Mexico","institution_ids":["https://openalex.org/I39824353"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032036781","display_name":"Hayde Peregrina\u2010Barreto","orcid":"https://orcid.org/0000-0002-8623-091X"},"institutions":[{"id":"https://openalex.org/I39824353","display_name":"National Institute of Astrophysics, Optics and Electronics","ror":"https://ror.org/00bpmmc63","country_code":"MX","type":"facility","lineage":["https://openalex.org/I39824353"]}],"countries":["MX"],"is_corresponding":false,"raw_author_name":"Hayde Peregrina-Barreto","raw_affiliation_strings":["Computer Science Department, National Institute of Astrophysics, Optics and Electronics, Puebla, Mexico"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Computer Science Department, National Institute of Astrophysics, Optics and Electronics, Puebla, Mexico","institution_ids":["https://openalex.org/I39824353"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5031137488","display_name":"Vicente Alarcon\u2010Aquino","orcid":"https://orcid.org/0000-0002-9843-9219"},"institutions":[{"id":"https://openalex.org/I69181431","display_name":"Universidad de las Am\u00e9ricas Puebla","ror":"https://ror.org/01s1km724","country_code":"MX","type":"education","lineage":["https://openalex.org/I69181431"]}],"countries":["MX"],"is_corresponding":false,"raw_author_name":"Vicente Alarcon-Aquino","raw_affiliation_strings":["Department of Computer Systems and Electronic Engineering, University of the Americas, Puebla, Mexico"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Systems and Electronic Engineering, University of the Americas, Puebla, Mexico","institution_ids":["https://openalex.org/I69181431"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":10.3465,"has_fulltext":false,"cited_by_count":125,"citation_normalized_percentile":{"value":0.98702168,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":98,"max":100},"biblio":{"volume":"68","issue":"5","first_page":"1353","last_page":"1361"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11447","display_name":"Blind Source Separation Techniques","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/1711","display_name":"Signal Processing"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9943000078201294,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/independent-component-analysis","display_name":"Independent component analysis","score":0.8201154470443726},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.6600052118301392},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.6262627840042114},{"id":"https://openalex.org/keywords/autocorrelation","display_name":"Autocorrelation","score":0.6030957102775574},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.6012618541717529},{"id":"https://openalex.org/keywords/signal-processing","display_name":"Signal processing","score":0.5360972881317139},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.5278183221817017},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5194058418273926},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5014848709106445},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.49560296535491943},{"id":"https://openalex.org/keywords/feature-vector","display_name":"Feature vector","score":0.47694888710975647},{"id":"https://openalex.org/keywords/bar","display_name":"Bar (unit)","score":0.4737432897090912},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.44155848026275635},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3080814778804779},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.2776864171028137},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.20298203825950623},{"id":"https://openalex.org/keywords/digital-signal-processing","display_name":"Digital signal processing","score":0.14697220921516418},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.12572753429412842},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.09072813391685486}],"concepts":[{"id":"https://openalex.org/C51432778","wikidata":"https://www.wikidata.org/wiki/Q1259145","display_name":"Independent component analysis","level":2,"score":0.8201154470443726},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.6600052118301392},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.6262627840042114},{"id":"https://openalex.org/C5297727","wikidata":"https://www.wikidata.org/wiki/Q786970","display_name":"Autocorrelation","level":2,"score":0.6030957102775574},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.6012618541717529},{"id":"https://openalex.org/C104267543","wikidata":"https://www.wikidata.org/wiki/Q208163","display_name":"Signal processing","level":3,"score":0.5360972881317139},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.5278183221817017},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5194058418273926},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5014848709106445},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.49560296535491943},{"id":"https://openalex.org/C83665646","wikidata":"https://www.wikidata.org/wiki/Q42139305","display_name":"Feature vector","level":2,"score":0.47694888710975647},{"id":"https://openalex.org/C188721877","wikidata":"https://www.wikidata.org/wiki/Q103510","display_name":"Bar (unit)","level":2,"score":0.4737432897090912},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.44155848026275635},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3080814778804779},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.2776864171028137},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.20298203825950623},{"id":"https://openalex.org/C84462506","wikidata":"https://www.wikidata.org/wiki/Q173142","display_name":"Digital signal processing","level":2,"score":0.14697220921516418},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.12572753429412842},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.09072813391685486},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C153294291","wikidata":"https://www.wikidata.org/wiki/Q25261","display_name":"Meteorology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2019.2900143","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2019.2900143","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":33,"referenced_works":["https://openalex.org/W1532325895","https://openalex.org/W1569512666","https://openalex.org/W1587473149","https://openalex.org/W2019502123","https://openalex.org/W2026550072","https://openalex.org/W2031321561","https://openalex.org/W2036947671","https://openalex.org/W2038331350","https://openalex.org/W2039057510","https://openalex.org/W2044097773","https://openalex.org/W2047539961","https://openalex.org/W2057318207","https://openalex.org/W2096529776","https://openalex.org/W2123649031","https://openalex.org/W2143169494","https://openalex.org/W2156718086","https://openalex.org/W2160818386","https://openalex.org/W2171529802","https://openalex.org/W2263083964","https://openalex.org/W2271370785","https://openalex.org/W2320618658","https://openalex.org/W2343523717","https://openalex.org/W2540203555","https://openalex.org/W2620600652","https://openalex.org/W2645210455","https://openalex.org/W2735682211","https://openalex.org/W2743853352","https://openalex.org/W2797521339","https://openalex.org/W2850645533","https://openalex.org/W4213009331","https://openalex.org/W6661369007","https://openalex.org/W6700104450","https://openalex.org/W6729661918"],"related_works":["https://openalex.org/W2121429698","https://openalex.org/W2182042810","https://openalex.org/W55679925","https://openalex.org/W2046761971","https://openalex.org/W1720164552","https://openalex.org/W3144722888","https://openalex.org/W2089650474","https://openalex.org/W2364896863","https://openalex.org/W2389189059","https://openalex.org/W1680053903"],"abstract_inverted_index":{"This":[0],"paper":[1,154],"presents":[2],"a":[3,61,105,142,157,168],"novel":[4],"approach":[5],"on":[6],"motor":[7,33,136],"current":[8,25],"signature":[9],"analysis":[10,37],"(MCSA)":[11],"for":[12,108,163,172],"broken":[13,131],"bar":[14,128],"fault":[15,174],"detection":[16],"of":[17,30,57,63,66,83,97,113,152,160],"induction":[18],"motors":[19],"(IMs),":[20],"using":[21,123],"as":[22],"input":[23,49],"the":[24,31,42,48,84,114],"signal":[26,69,161],"measured":[27],"from":[28,47,146],"one":[29],"three":[32,90],"phases.":[34],"Independent":[35],"component":[36],"(ICA)":[38],"is":[39,117],"used":[40],"over":[41],"Fourier-domain":[43],"spectral":[44,58],"signals":[45],"obtained":[46],"and":[50,79,89,129,133,139],"its":[51],"autocorrelation":[52],"function.":[53],"The":[54,111,150],"standard":[55],"deviation":[56],"components":[59],"within":[60],"region":[62],"interest":[64],"(ROI)":[65],"an":[67,94],"ICA":[68],"output":[70],"was":[71],"found":[72],"to":[73,93,148],"exhibit":[74],"substantial":[75],"differences":[76],"between":[77],"damaged":[78],"healthy":[80],"motors.":[81],"Separation":[82],"ROI":[85],"in":[86,156,167],"one,":[87],"two,":[88],"sectors":[91],"leads":[92],"improved":[95],"extraction":[96,166],"feature":[98,165,170],"vectors,":[99],"which":[100],"are":[101],"further":[102],"fed":[103],"into":[104],"neural":[106],"network":[107],"classification":[109,143],"purposes.":[110],"assessment":[112],"proposed":[115],"method":[116],"carried":[118],"out":[119],"through":[120],"several":[121],"experiments":[122],"two":[124,134],"damage":[125],"levels":[126],"(broken":[127],"half":[130],"bar)":[132],"load":[135],"conditions":[137],"(50%":[138],"75%),":[140],"with":[141],"accuracy":[144],"ranging":[145],"90%":[147],"99%.":[149],"contribution":[151],"this":[153],"lies":[155],"new":[158],"technique":[159],"processing":[162],"ICA-based":[164],"3-D":[169],"space":[171],"IM":[173],"diagnosis.":[175]},"counts_by_year":[{"year":2026,"cited_by_count":4},{"year":2025,"cited_by_count":10},{"year":2024,"cited_by_count":16},{"year":2023,"cited_by_count":32},{"year":2022,"cited_by_count":29},{"year":2021,"cited_by_count":16},{"year":2020,"cited_by_count":13},{"year":2019,"cited_by_count":5}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}