{"id":"https://openalex.org/W2915382733","doi":"https://doi.org/10.1109/tim.2019.2895482","title":"Insulation Defect Diagnostic Method for OIP Bushing Based on Multiclass LS-SVM and Cuckoo Search","display_name":"Insulation Defect Diagnostic Method for OIP Bushing Based on Multiclass LS-SVM and Cuckoo Search","publication_year":2019,"publication_date":"2019-02-21","ids":{"openalex":"https://openalex.org/W2915382733","doi":"https://doi.org/10.1109/tim.2019.2895482","mag":"2915382733"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2019.2895482","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2019.2895482","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100343194","display_name":"Dongyang Wang","orcid":null},"institutions":[{"id":"https://openalex.org/I4800084","display_name":"Southwest Jiaotong University","ror":"https://ror.org/00hn7w693","country_code":"CN","type":"education","lineage":["https://openalex.org/I4800084"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Dongyang Wang","raw_affiliation_strings":["College of Electrical Engineering, Southwest Jiaotong University, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0003-4332-2862","affiliations":[{"raw_affiliation_string":"College of Electrical Engineering, Southwest Jiaotong University, Chengdu, China","institution_ids":["https://openalex.org/I4800084"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066087659","display_name":"Lijun Zhou","orcid":"https://orcid.org/0000-0002-6070-0020"},"institutions":[{"id":"https://openalex.org/I4800084","display_name":"Southwest Jiaotong University","ror":"https://ror.org/00hn7w693","country_code":"CN","type":"education","lineage":["https://openalex.org/I4800084"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lijun Zhou","raw_affiliation_strings":["College of Electrical Engineering, Southwest Jiaotong University, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0002-6070-0020","affiliations":[{"raw_affiliation_string":"College of Electrical Engineering, Southwest Jiaotong University, Chengdu, China","institution_ids":["https://openalex.org/I4800084"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087747345","display_name":"Chongjing Dai","orcid":"https://orcid.org/0000-0003-2223-9146"},"institutions":[{"id":"https://openalex.org/I4210087493","display_name":"National Institute of Measurement and Testing Technology","ror":"https://ror.org/002qybp75","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210087493"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chongjing Dai","raw_affiliation_strings":["National Institute of Measurement and Testing Technology, Chengdu, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Institute of Measurement and Testing Technology, Chengdu, China","institution_ids":["https://openalex.org/I4210087493"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101850015","display_name":"Lei Guo","orcid":"https://orcid.org/0000-0003-4881-7960"},"institutions":[{"id":"https://openalex.org/I4800084","display_name":"Southwest Jiaotong University","ror":"https://ror.org/00hn7w693","country_code":"CN","type":"education","lineage":["https://openalex.org/I4800084"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lei Guo","raw_affiliation_strings":["College of Electrical Engineering, Southwest Jiaotong University, Chengdu, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Electrical Engineering, Southwest Jiaotong University, Chengdu, China","institution_ids":["https://openalex.org/I4800084"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101471121","display_name":"Wei Liao","orcid":"https://orcid.org/0000-0001-8530-887X"},"institutions":[{"id":"https://openalex.org/I4800084","display_name":"Southwest Jiaotong University","ror":"https://ror.org/00hn7w693","country_code":"CN","type":"education","lineage":["https://openalex.org/I4800084"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wei Liao","raw_affiliation_strings":["College of Electrical Engineering, Southwest Jiaotong University, Chengdu, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Electrical Engineering, Southwest Jiaotong University, Chengdu, China","institution_ids":["https://openalex.org/I4800084"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5100343194"],"corresponding_institution_ids":["https://openalex.org/I4800084"],"apc_list":null,"apc_paid":null,"fwci":2.3003,"has_fulltext":false,"cited_by_count":35,"citation_normalized_percentile":{"value":0.88458999,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":"69","issue":"1","first_page":"163","last_page":"172"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11343","display_name":"Power Transformer Diagnostics and Insulation","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11343","display_name":"Power Transformer Diagnostics and Insulation","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9952999949455261,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/bushing","display_name":"Bushing","score":0.947573184967041},{"id":"https://openalex.org/keywords/support-vector-machine","display_name":"Support vector machine","score":0.6930659413337708},{"id":"https://openalex.org/keywords/particle-swarm-optimization","display_name":"Particle swarm optimization","score":0.625199019908905},{"id":"https://openalex.org/keywords/cuckoo-search","display_name":"Cuckoo search","score":0.5103756785392761},{"id":"https://openalex.org/keywords/genetic-algorithm","display_name":"Genetic algorithm","score":0.47249117493629456},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4463047683238983},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.36979126930236816},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3658192455768585},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.36313769221305847},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.32339954376220703},{"id":"https://openalex.org/keywords/structural-engineering","display_name":"Structural engineering","score":0.244465172290802},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.1948193609714508}],"concepts":[{"id":"https://openalex.org/C30293662","wikidata":"https://www.wikidata.org/wiki/Q2262992","display_name":"Bushing","level":2,"score":0.947573184967041},{"id":"https://openalex.org/C12267149","wikidata":"https://www.wikidata.org/wiki/Q282453","display_name":"Support vector machine","level":2,"score":0.6930659413337708},{"id":"https://openalex.org/C85617194","wikidata":"https://www.wikidata.org/wiki/Q2072794","display_name":"Particle swarm optimization","level":2,"score":0.625199019908905},{"id":"https://openalex.org/C117241572","wikidata":"https://www.wikidata.org/wiki/Q5192379","display_name":"Cuckoo search","level":3,"score":0.5103756785392761},{"id":"https://openalex.org/C8880873","wikidata":"https://www.wikidata.org/wiki/Q187787","display_name":"Genetic algorithm","level":2,"score":0.47249117493629456},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4463047683238983},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.36979126930236816},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3658192455768585},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.36313769221305847},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.32339954376220703},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.244465172290802},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.1948193609714508}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2019.2895482","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2019.2895482","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.49000000953674316,"display_name":"Reduced inequalities","id":"https://metadata.un.org/sdg/10"},{"score":0.4699999988079071,"display_name":"Peace, Justice and strong institutions","id":"https://metadata.un.org/sdg/16"}],"awards":[{"id":"https://openalex.org/G5629531042","display_name":null,"funder_award_id":"51877183","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":36,"referenced_works":["https://openalex.org/W1976744965","https://openalex.org/W1991224261","https://openalex.org/W2004039783","https://openalex.org/W2011272021","https://openalex.org/W2026637527","https://openalex.org/W2063748670","https://openalex.org/W2076306561","https://openalex.org/W2082101046","https://openalex.org/W2102731100","https://openalex.org/W2120792742","https://openalex.org/W2151388232","https://openalex.org/W2161015233","https://openalex.org/W2170559427","https://openalex.org/W2191848209","https://openalex.org/W2207354331","https://openalex.org/W2263556947","https://openalex.org/W2296077894","https://openalex.org/W2304309600","https://openalex.org/W2473447586","https://openalex.org/W2542700981","https://openalex.org/W2559673340","https://openalex.org/W2563424502","https://openalex.org/W2564549268","https://openalex.org/W2608783468","https://openalex.org/W2769117317","https://openalex.org/W2789833457","https://openalex.org/W2791150267","https://openalex.org/W2791339424","https://openalex.org/W2791494834","https://openalex.org/W2792273360","https://openalex.org/W2794173545","https://openalex.org/W2794975951","https://openalex.org/W2809418482","https://openalex.org/W2896983078","https://openalex.org/W4301501800","https://openalex.org/W6683903772"],"related_works":["https://openalex.org/W2942767629","https://openalex.org/W3194380549","https://openalex.org/W2388318728","https://openalex.org/W2330662521","https://openalex.org/W1560946885","https://openalex.org/W2353424217","https://openalex.org/W2132065678","https://openalex.org/W2008233638","https://openalex.org/W2371704579","https://openalex.org/W2113981829"],"abstract_inverted_index":{"Frequency-domain":[0],"dielectric":[1],"spectrum":[2],"(FDS)":[3],"is":[4,54,77,110,123,160,179],"an":[5,55],"effective":[6],"testing":[7],"method":[8,67,135],"to":[9,68,112],"reflect":[10],"the":[11,25,41,70,95,102,106,114,119,133,139,154,157,163,172,176,182],"changes":[12],"of":[13,17,27,45,57,59,74,175],"internal":[14,42,71,140],"insulation":[15,43,72,141],"status":[16],"oil-impregnated":[18],"paper":[19],"(OIP)":[20],"bushing.":[21],"In":[22,151],"field":[23],"application,":[24],"results":[26,130],"FDS":[28],"test":[29,120],"can":[30,136],"be":[31,49],"both":[32],"affected":[33],"by":[34,89,101],"aging":[35,146],"defects":[36,44,73,142,147],"and":[37,118,148,166,171],"damp":[38,149],"defects,":[39],"then":[40],"OIP":[46,75],"bushing":[47,76],"cannot":[48],"diagnosed":[50],"in":[51,143,153],"detail,":[52,144],"which":[53],"issue":[56],"discrimination":[58],"multiclass":[60,81,96,115],"classification.":[61],"To":[62],"solve":[63],"this":[64],"problem,":[65],"a":[66],"diagnose":[69,138],"proposed":[78,134,155],"based":[79],"on":[80],"least":[82],"square":[83],"support":[84],"vector":[85],"machines":[86],"(LS-SVMs)":[87],"optimized":[88,100],"cuckoo":[90],"search":[91],"(CS)":[92],"algorithm.":[93,104],"First,":[94],"LS-SVM":[97,116],"parameters":[98],"are":[99],"CS":[103,158,177],"Then,":[105],"training":[107],"data":[108,121],"set":[109,122],"used":[111,124],"train":[113],"model,":[117],"for":[125],"model":[126],"testing.":[127],"The":[128],"experimental":[129],"show":[131],"that":[132],"effectively":[137],"i.e.,":[145],"defects.":[150],"addition,":[152],"method,":[156],"algorithm":[159,165,178],"better":[161],"than":[162,181],"genetic":[164],"particle":[167],"swarm":[168],"optimization":[169],"algorithm,":[170],"convergence":[173],"rate":[174],"faster":[180],"other":[183],"two":[184],"algorithms.":[185]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":8},{"year":2023,"cited_by_count":7},{"year":2022,"cited_by_count":7},{"year":2021,"cited_by_count":5},{"year":2020,"cited_by_count":6},{"year":2019,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}