{"id":"https://openalex.org/W2912528171","doi":"https://doi.org/10.1109/tim.2019.2890890","title":"Closed-Loop Optimization of DIC Speckle Patterns Based on Simulated Experiments","display_name":"Closed-Loop Optimization of DIC Speckle Patterns Based on Simulated Experiments","publication_year":2019,"publication_date":"2019-01-22","ids":{"openalex":"https://openalex.org/W2912528171","doi":"https://doi.org/10.1109/tim.2019.2890890","mag":"2912528171"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2019.2890890","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2019.2890890","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5079232964","display_name":"Alberto Lavatelli","orcid":"https://orcid.org/0000-0001-8518-3296"},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"Alberto Lavatelli","raw_affiliation_strings":["Department of Mechanical Engineering, Politecnico di Milan, Milan, Italy"],"affiliations":[{"raw_affiliation_string":"Department of Mechanical Engineering, Politecnico di Milan, Milan, Italy","institution_ids":["https://openalex.org/I93860229"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009753788","display_name":"R. Balcaen","orcid":"https://orcid.org/0000-0002-6877-2459"},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Ruben Balcaen","raw_affiliation_strings":["Materials Engineering Department, KU Leuven, Ghent, Belgium"],"affiliations":[{"raw_affiliation_string":"Materials Engineering Department, KU Leuven, Ghent, Belgium","institution_ids":["https://openalex.org/I99464096"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018223216","display_name":"Emanuele Zappa","orcid":"https://orcid.org/0000-0003-3320-9030"},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Emanuele Zappa","raw_affiliation_strings":["Department of Mechanical Engineering, Politecnico di Milan, Milan, Italy"],"affiliations":[{"raw_affiliation_string":"Department of Mechanical Engineering, Politecnico di Milan, Milan, Italy","institution_ids":["https://openalex.org/I93860229"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5010606696","display_name":"Dimitri Debruyne","orcid":"https://orcid.org/0000-0002-9940-7200"},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Dimitri Debruyne","raw_affiliation_strings":["Materials Engineering Department, KU Leuven, Ghent, Belgium"],"affiliations":[{"raw_affiliation_string":"Materials Engineering Department, KU Leuven, Ghent, Belgium","institution_ids":["https://openalex.org/I99464096"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5079232964"],"corresponding_institution_ids":["https://openalex.org/I93860229"],"apc_list":null,"apc_paid":null,"fwci":0.8098,"has_fulltext":false,"cited_by_count":17,"citation_normalized_percentile":{"value":0.76191997,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"68","issue":"11","first_page":"4376","last_page":"4386"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10531","display_name":"Advanced Vision and Imaging","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/speckle-pattern","display_name":"Speckle pattern","score":0.8448085188865662},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6260560750961304},{"id":"https://openalex.org/keywords/digital-image-correlation","display_name":"Digital image correlation","score":0.5778115391731262},{"id":"https://openalex.org/keywords/displacement","display_name":"Displacement (psychology)","score":0.45957016944885254},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.36360475420951843},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.1622644066810608}],"concepts":[{"id":"https://openalex.org/C102290492","wikidata":"https://www.wikidata.org/wiki/Q7575045","display_name":"Speckle pattern","level":2,"score":0.8448085188865662},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6260560750961304},{"id":"https://openalex.org/C115635565","wikidata":"https://www.wikidata.org/wiki/Q860900","display_name":"Digital image correlation","level":2,"score":0.5778115391731262},{"id":"https://openalex.org/C107551265","wikidata":"https://www.wikidata.org/wiki/Q1458245","display_name":"Displacement (psychology)","level":2,"score":0.45957016944885254},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.36360475420951843},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.1622644066810608},{"id":"https://openalex.org/C542102704","wikidata":"https://www.wikidata.org/wiki/Q183257","display_name":"Psychotherapist","level":1,"score":0.0},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tim.2019.2890890","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2019.2890890","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},{"id":"pmh:oai:re.public.polimi.it:11311/1157899","is_oa":false,"landing_page_url":"http://hdl.handle.net/11311/1157899","pdf_url":null,"source":{"id":"https://openalex.org/S4306400312","display_name":"Virtual Community of Pathological Anatomy (University of Castilla La Mancha)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I79189158","host_organization_name":"University of Castilla-La Mancha","host_organization_lineage":["https://openalex.org/I79189158"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":67,"referenced_works":["https://openalex.org/W151830","https://openalex.org/W81849723","https://openalex.org/W231861835","https://openalex.org/W981081358","https://openalex.org/W1179843221","https://openalex.org/W1491333862","https://openalex.org/W1534629079","https://openalex.org/W1580750110","https://openalex.org/W1966832848","https://openalex.org/W1970280495","https://openalex.org/W1991737196","https://openalex.org/W1998779514","https://openalex.org/W2010254595","https://openalex.org/W2017147486","https://openalex.org/W2022735901","https://openalex.org/W2029223910","https://openalex.org/W2030367672","https://openalex.org/W2030736515","https://openalex.org/W2031784695","https://openalex.org/W2035701594","https://openalex.org/W2039451503","https://openalex.org/W2056898157","https://openalex.org/W2057727857","https://openalex.org/W2062742666","https://openalex.org/W2069477188","https://openalex.org/W2078950386","https://openalex.org/W2101119306","https://openalex.org/W2112732289","https://openalex.org/W2123166934","https://openalex.org/W2136489486","https://openalex.org/W2142928224","https://openalex.org/W2160985153","https://openalex.org/W2167667767","https://openalex.org/W2169216879","https://openalex.org/W2185248021","https://openalex.org/W2202122378","https://openalex.org/W2279192960","https://openalex.org/W2283149547","https://openalex.org/W2285089189","https://openalex.org/W2299951517","https://openalex.org/W2321802089","https://openalex.org/W2425965412","https://openalex.org/W2503067397","https://openalex.org/W2551994560","https://openalex.org/W2560295478","https://openalex.org/W2573798160","https://openalex.org/W2574872366","https://openalex.org/W2590662562","https://openalex.org/W2599445072","https://openalex.org/W2603212959","https://openalex.org/W2610542229","https://openalex.org/W2614282005","https://openalex.org/W2618067260","https://openalex.org/W2619707939","https://openalex.org/W2748750586","https://openalex.org/W2766432420","https://openalex.org/W2768899224","https://openalex.org/W2771053351","https://openalex.org/W2771902404","https://openalex.org/W2785788649","https://openalex.org/W2807532078","https://openalex.org/W3128065278","https://openalex.org/W3189181998","https://openalex.org/W6600010345","https://openalex.org/W6603298295","https://openalex.org/W6736495749","https://openalex.org/W6790400412"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2018008899","https://openalex.org/W2793402697","https://openalex.org/W2967406116","https://openalex.org/W3172020832","https://openalex.org/W2682616418","https://openalex.org/W2655141849","https://openalex.org/W2054931143","https://openalex.org/W2353893566","https://openalex.org/W2063525586"],"abstract_inverted_index":{"Stereo":[0],"digital":[1],"image":[2,68],"correlation":[3],"(DIC)":[4],"spreads":[5],"widely":[6],"in":[7,138],"the":[8,14,32,41,53,76,105,109,120],"last":[9],"years":[10],"as":[11],"one":[12],"of":[13,25,34,46,57,79,122],"most":[15],"flexible":[16],"and":[17,43,55],"accurate":[18],"full-field":[19],"displacement-strain":[20],"measurement":[21,130],"techniques.":[22],"The":[23,49,95,132],"development":[24],"novel":[26],"applications":[27],"based":[28,88],"on":[29,89,119],"DIC":[30,58,110],"makes":[31],"design":[33,54],"3-D":[35,90],"setups":[36],"a":[37,84,116,124],"challenging":[38],"task,":[39],"given":[40],"complex":[42],"nonlinear":[44],"nature":[45],"stereophotogrammetric":[47],"methods.":[48],"present":[50],"literature":[51],"allows":[52],"optimization":[56,86],"experimental":[59],"setup":[60,107],"only":[61],"with":[62,75],"approximated":[63],"uncertainty":[64],"models":[65],"or":[66],"upon":[67],"quality":[69],"metrics":[70],"that":[71],"are":[72],"linked":[73],"loosely":[74],"actual":[77],"value":[78],"uncertainty.":[80],"In":[81],"this":[82],"paper,":[83],"closed-loop":[85],"method":[87],"experiment":[91],"simulation":[92],"is":[93,135],"presented.":[94],"approach":[96,134],"may":[97],"be":[98],"used":[99],"to":[100,108],"optimize":[101],"several":[102],"parameters":[103],"(from":[104],"camera":[106],"processing":[111],"parameters).":[112],"This":[113],"paper":[114],"features":[115],"case":[117],"study":[118],"problem":[121],"optimizing":[123],"regular":[125],"speckle":[126],"pattern":[127],"for":[128],"different":[129],"tasks.":[131],"whole":[133],"validated":[136],"experimentally":[137],"Section":[139],"V.":[140]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":5},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":5},{"year":2020,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2019-02-21T00:00:00"}