{"id":"https://openalex.org/W2914449784","doi":"https://doi.org/10.1109/tim.2019.2890886","title":"Method for the Absolute Calibration of Direct-Current Current Transducers","display_name":"Method for the Absolute Calibration of Direct-Current Current Transducers","publication_year":2019,"publication_date":"2019-01-22","ids":{"openalex":"https://openalex.org/W2914449784","doi":"https://doi.org/10.1109/tim.2019.2890886","mag":"2914449784"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2019.2890886","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2019.2890886","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101597417","display_name":"Jianting Zhao","orcid":"https://orcid.org/0000-0002-9198-461X"},"institutions":[{"id":"https://openalex.org/I4210162136","display_name":"National Institute of Metrology","ror":"https://ror.org/05dw0p167","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210162136"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Jianting Zhao","raw_affiliation_strings":["National Institute of Metrology, Beijing, China"],"affiliations":[{"raw_affiliation_string":"National Institute of Metrology, Beijing, China","institution_ids":["https://openalex.org/I4210162136"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085012128","display_name":"Yunfeng Lu","orcid":"https://orcid.org/0000-0003-0421-763X"},"institutions":[{"id":"https://openalex.org/I4210162136","display_name":"National Institute of Metrology","ror":"https://ror.org/05dw0p167","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210162136"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yunfeng Lu","raw_affiliation_strings":["National Institute of Metrology, Beijing, China"],"affiliations":[{"raw_affiliation_string":"National Institute of Metrology, Beijing, China","institution_ids":["https://openalex.org/I4210162136"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5104304787","display_name":"Changwei Zhai","orcid":null},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Changwei Zhai","raw_affiliation_strings":["Harbin Institute of Technology, Harbin, China"],"affiliations":[{"raw_affiliation_string":"Harbin Institute of Technology, Harbin, China","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100734675","display_name":"Qing He","orcid":"https://orcid.org/0000-0002-4172-1547"},"institutions":[{"id":"https://openalex.org/I4210162136","display_name":"National Institute of Metrology","ror":"https://ror.org/05dw0p167","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210162136"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qing He","raw_affiliation_strings":["National Institute of Metrology, Beijing, China"],"affiliations":[{"raw_affiliation_string":"National Institute of Metrology, Beijing, China","institution_ids":["https://openalex.org/I4210162136"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112416145","display_name":"Xiaoding Huang","orcid":null},"institutions":[{"id":"https://openalex.org/I194716290","display_name":"China Academy of Space Technology","ror":"https://ror.org/025397a59","country_code":"CN","type":"government","lineage":["https://openalex.org/I194716290","https://openalex.org/I2802615301"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaoding Huang","raw_affiliation_strings":["China Academy of Space Technology, Beijing, China"],"affiliations":[{"raw_affiliation_string":"China Academy of Space Technology, Beijing, China","institution_ids":["https://openalex.org/I194716290"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5009850120","display_name":"Yicheng Wang","orcid":"https://orcid.org/0000-0003-2068-8706"},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yicheng Wang","raw_affiliation_strings":["National Institute of Standards and Technology, Gaithersburg, MD, USA"],"affiliations":[{"raw_affiliation_string":"National Institute of Standards and Technology, Gaithersburg, MD, USA","institution_ids":["https://openalex.org/I1321296531"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5101597417"],"corresponding_institution_ids":["https://openalex.org/I4210162136"],"apc_list":null,"apc_paid":null,"fwci":0.4827,"has_fulltext":false,"cited_by_count":11,"citation_normalized_percentile":{"value":0.64120268,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"68","issue":"6","first_page":"1961","last_page":"1966"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electromagnetic-coil","display_name":"Electromagnetic coil","score":0.704723060131073},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.6956754922866821},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.6309562921524048},{"id":"https://openalex.org/keywords/transducer","display_name":"Transducer","score":0.6203219890594482},{"id":"https://openalex.org/keywords/current-ratio","display_name":"Current ratio","score":0.47824278473854065},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.35160475969314575},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3453786373138428},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.33767837285995483},{"id":"https://openalex.org/keywords/analytical-chemistry","display_name":"Analytical Chemistry (journal)","score":0.3299356698989868},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.24096471071243286},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.1990392506122589},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.08907902240753174}],"concepts":[{"id":"https://openalex.org/C30403606","wikidata":"https://www.wikidata.org/wiki/Q2981904","display_name":"Electromagnetic coil","level":2,"score":0.704723060131073},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.6956754922866821},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.6309562921524048},{"id":"https://openalex.org/C56318395","wikidata":"https://www.wikidata.org/wiki/Q215928","display_name":"Transducer","level":2,"score":0.6203219890594482},{"id":"https://openalex.org/C52272595","wikidata":"https://www.wikidata.org/wiki/Q2210989","display_name":"Current ratio","level":3,"score":0.47824278473854065},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.35160475969314575},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3453786373138428},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.33767837285995483},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.3299356698989868},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24096471071243286},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.1990392506122589},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.08907902240753174},{"id":"https://openalex.org/C10138342","wikidata":"https://www.wikidata.org/wiki/Q43015","display_name":"Finance","level":1,"score":0.0},{"id":"https://openalex.org/C183582576","wikidata":"https://www.wikidata.org/wiki/Q184783","display_name":"Market liquidity","level":2,"score":0.0},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2019.2890886","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2019.2890886","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.4399999976158142,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[{"id":"https://openalex.org/G1538687614","display_name":null,"funder_award_id":"2017YFF0206106","funder_id":"https://openalex.org/F4320335777","funder_display_name":"National Key Research and Development Program of China"},{"id":"https://openalex.org/G6381779649","display_name":null,"funder_award_id":"51777199","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320335777","display_name":"National Key Research and Development Program of China","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W1620478295","https://openalex.org/W1968744552","https://openalex.org/W2005350749","https://openalex.org/W2021038552","https://openalex.org/W2066215015","https://openalex.org/W2077682329","https://openalex.org/W2096777464","https://openalex.org/W2124332311","https://openalex.org/W2131308970","https://openalex.org/W2154761636","https://openalex.org/W2331524889","https://openalex.org/W2898839419","https://openalex.org/W3164786900","https://openalex.org/W4210809922","https://openalex.org/W4253601979"],"related_works":["https://openalex.org/W4384820447","https://openalex.org/W2012283803","https://openalex.org/W2072454424","https://openalex.org/W2117438306","https://openalex.org/W2185942010","https://openalex.org/W2260725127","https://openalex.org/W2004297762","https://openalex.org/W2824867401","https://openalex.org/W2265040659","https://openalex.org/W4364321570"],"abstract_inverted_index":{"This":[0],"paper":[1],"describes":[2],"an":[3,137],"absolute":[4],"method":[5,30],"for":[6,84,147],"calibrating":[7],"commercial":[8],"1000:1":[9,34,74,149],"dc":[10],"current":[11,35,75,86,90,133],"transducers":[12],"(DCCTs).":[13],"By":[14],"adding":[15],"two":[16],"auxiliary":[17,64],"windings":[18,65],"to":[19,31,57,98],"produce":[20,58],"10:1":[21,42],"and":[22,88,115],"100:1":[23,60],"ratios,":[24],"we":[25,39,50,70],"use":[26],"a":[27,53,59],"three-step":[28],"build-up":[29],"establish":[32],"the":[33,41,67,73,82,85,89,99,112,119,123,132,148],"ratio":[36,134],"standard.":[37],"First,":[38],"determine":[40],"ratios":[43],"of":[44,118,122,140],"11":[45],"DCCTs":[46,124],"through":[47],"permutation;":[48],"second,":[49],"set":[51],"up":[52],"two-stage":[54,68],"composite":[55],"DCCT":[56],"ratio;":[61],"after":[62],"switching":[63],"in":[66],"setup,":[69],"then":[71],"derive":[72],"ratio.":[76,150],"The":[77],"experimental":[78,113],"results":[79],"show":[80,130],"that":[81,131],"requirements":[83],"source":[87],"meter":[91],"are":[92,102,125],"not":[93],"stringent;":[94],"their":[95],"Type-B":[96],"contributions":[97],"overall":[100],"uncertainties":[101,106],"very":[103],"small.":[104],"Type-A":[105],"which":[107],"include":[108],"factors":[109],"such":[110],"as":[111],"environment":[114],"possible":[116],"drifts":[117],"output":[120],"offsets":[121],"experimentally":[126],"determined.":[127],"Repeated":[128],"tests":[129],"standard":[135],"has":[136],"expanded":[138],"uncertainty":[139],"0.26":[141],"\u00d7":[142],"10":[143],"<sup":[144],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[145],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">-6</sup>":[146]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":4},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":2}],"updated_date":"2026-03-31T07:56:22.981413","created_date":"2025-10-10T00:00:00"}