{"id":"https://openalex.org/W2911688199","doi":"https://doi.org/10.1109/tim.2018.2890745","title":"Nonlinearity of the NIST Calculable Capacitor","display_name":"Nonlinearity of the NIST Calculable Capacitor","publication_year":2019,"publication_date":"2019-01-29","ids":{"openalex":"https://openalex.org/W2911688199","doi":"https://doi.org/10.1109/tim.2018.2890745","mag":"2911688199"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2018.2890745","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2018.2890745","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5009850120","display_name":"Yicheng Wang","orcid":"https://orcid.org/0000-0003-2068-8706"},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Yicheng Wang","raw_affiliation_strings":["National Institute of Standards and Technology, Gaithersburg, MD, USA"],"affiliations":[{"raw_affiliation_string":"National Institute of Standards and Technology, Gaithersburg, MD, USA","institution_ids":["https://openalex.org/I1321296531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058388737","display_name":"Zhuang Fu","orcid":"https://orcid.org/0000-0001-8825-4029"},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Zhuang Fu","raw_affiliation_strings":["National Institute of Standards and Technology, Gaithersburg, MD, USA"],"affiliations":[{"raw_affiliation_string":"National Institute of Standards and Technology, Gaithersburg, MD, USA","institution_ids":["https://openalex.org/I1321296531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5105667883","display_name":"Mathieu Durand","orcid":"https://orcid.org/0000-0001-5366-0473"},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mathieu Durand","raw_affiliation_strings":["National Institute of Standards and Technology, Gaithersburg, MD, USA"],"affiliations":[{"raw_affiliation_string":"National Institute of Standards and Technology, Gaithersburg, MD, USA","institution_ids":["https://openalex.org/I1321296531"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5113680777","display_name":"A. Jeffery","orcid":null},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Anne-Marie Jeffery","raw_affiliation_strings":["National Institute of Standards and Technology, Gaithersburg, MD, USA"],"affiliations":[{"raw_affiliation_string":"National Institute of Standards and Technology, Gaithersburg, MD, USA","institution_ids":["https://openalex.org/I1321296531"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5009850120"],"corresponding_institution_ids":["https://openalex.org/I1321296531"],"apc_list":null,"apc_paid":null,"fwci":0.1192,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.42709808,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"68","issue":"6","first_page":"1895","last_page":"1900"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11236","display_name":"Control Systems and Identification","score":0.9930999875068665,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/nist","display_name":"NIST","score":0.8401428461074829},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.8371150493621826},{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.7996054291725159},{"id":"https://openalex.org/keywords/nonlinear-system","display_name":"Nonlinear system","score":0.6132340431213379},{"id":"https://openalex.org/keywords/electrode","display_name":"Electrode","score":0.5148560404777527},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.49680641293525696},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4366619288921356},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.42995545268058777},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4045499563217163},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.37203407287597656},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.31929051876068115},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.2022239863872528}],"concepts":[{"id":"https://openalex.org/C111219384","wikidata":"https://www.wikidata.org/wiki/Q6954384","display_name":"NIST","level":2,"score":0.8401428461074829},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.8371150493621826},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.7996054291725159},{"id":"https://openalex.org/C158622935","wikidata":"https://www.wikidata.org/wiki/Q660848","display_name":"Nonlinear system","level":2,"score":0.6132340431213379},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.5148560404777527},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.49680641293525696},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4366619288921356},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.42995545268058777},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4045499563217163},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.37203407287597656},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.31929051876068115},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.2022239863872528},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C204321447","wikidata":"https://www.wikidata.org/wiki/Q30642","display_name":"Natural language processing","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2018.2890745","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2018.2890745","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W1998024323","https://openalex.org/W2105271699","https://openalex.org/W2106850573","https://openalex.org/W2115520604","https://openalex.org/W2152654860","https://openalex.org/W2154459920","https://openalex.org/W2160114804","https://openalex.org/W2175523226","https://openalex.org/W2393414506","https://openalex.org/W2566568815","https://openalex.org/W2898735848","https://openalex.org/W4240549567","https://openalex.org/W6677681628"],"related_works":["https://openalex.org/W2898735848","https://openalex.org/W2152654860","https://openalex.org/W2518635414","https://openalex.org/W2513162078","https://openalex.org/W2091663648","https://openalex.org/W2059279687","https://openalex.org/W2898755522","https://openalex.org/W2137795893","https://openalex.org/W2005864180","https://openalex.org/W2327316569","https://openalex.org/W2048793893","https://openalex.org/W2029030751","https://openalex.org/W2370461157","https://openalex.org/W1626140704","https://openalex.org/W2507144066","https://openalex.org/W2081132817","https://openalex.org/W2143966149","https://openalex.org/W2175523226","https://openalex.org/W2188037755","https://openalex.org/W2513711850"],"abstract_inverted_index":{"We":[0,34,54],"re-examine":[1],"the":[2,5,23,31,51,65,70],"nonlinearity":[3,48],"of":[4,8],"National":[6],"Institute":[7],"Standards":[9],"and":[10,68],"Technology,":[11],"Gaithersburg,":[12],"MD,":[13],"USA":[14],"calculable":[15],"capacitor":[16],"(CC)":[17],"which":[18],"is":[19],"used":[20],"for":[21,45],"realizing":[22],"capacitance":[24,47],"unit.":[25],"The":[26],"dominant":[27],"error":[28],"originates":[29],"from":[30,76],"electrode":[32,52],"nonuniformity.":[33,53],"use":[35],"a":[36,42,73],"boundary":[37],"perturbation":[38],"technique":[39],"to":[40,50,78],"develop":[41],"convolution":[43],"method":[44],"estimating":[46],"due":[49],"conclude":[55],"that":[56],"an":[57],"improved":[58],"accuracy":[59],"can":[60],"be":[61],"achieved":[62],"by":[63],"avoiding":[64],"end":[66],"effect":[67],"operating":[69],"CC":[71],"in":[72],"shortened":[74],"range":[75],"0.2":[77],"0.6":[79],"pF.":[80]},"counts_by_year":[{"year":2019,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}