{"id":"https://openalex.org/W2910135575","doi":"https://doi.org/10.1109/tim.2018.2890328","title":"On-Site Reliable Wheel Size Measurement Based on Multisensor Data Fusion","display_name":"On-Site Reliable Wheel Size Measurement Based on Multisensor Data Fusion","publication_year":2019,"publication_date":"2019-01-17","ids":{"openalex":"https://openalex.org/W2910135575","doi":"https://doi.org/10.1109/tim.2018.2890328","mag":"2910135575"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2018.2890328","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2018.2890328","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5083026056","display_name":"Xiao Pan","orcid":"https://orcid.org/0000-0001-8786-9347"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Xiao Pan","raw_affiliation_strings":["Ministry of Education Key Laboratory of Precision Opto-Mechatronics Technology, Beihang University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Ministry of Education Key Laboratory of Precision Opto-Mechatronics Technology, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100412083","display_name":"Zhen Liu","orcid":"https://orcid.org/0000-0003-0917-5475"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhen Liu","raw_affiliation_strings":["Ministry of Education Key Laboratory of Precision Opto-Mechatronics Technology, Beihang University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Ministry of Education Key Laboratory of Precision Opto-Mechatronics Technology, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100602615","display_name":"Guangjun Zhang","orcid":"https://orcid.org/0000-0003-1365-716X"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Guangjun Zhang","raw_affiliation_strings":["Ministry of Education Key Laboratory of Precision Opto-Mechatronics Technology, Beihang University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Ministry of Education Key Laboratory of Precision Opto-Mechatronics Technology, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5083026056"],"corresponding_institution_ids":["https://openalex.org/I82880672"],"apc_list":null,"apc_paid":null,"fwci":1.5184,"has_fulltext":false,"cited_by_count":31,"citation_normalized_percentile":{"value":0.8598195,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":"68","issue":"11","first_page":"4575","last_page":"4589"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12549","display_name":"Image and Object Detection Techniques","score":0.9955000281333923,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12549","display_name":"Image and Object Detection Techniques","score":0.9955000281333923,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11606","display_name":"Infrastructure Maintenance and Monitoring","score":0.9948999881744385,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14257","display_name":"Advanced Measurement and Detection Methods","score":0.9941999912261963,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.7323393225669861},{"id":"https://openalex.org/keywords/sensor-fusion","display_name":"Sensor fusion","score":0.6805535554885864},{"id":"https://openalex.org/keywords/system-of-measurement","display_name":"System of measurement","score":0.538356602191925},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5373700261116028},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.5183054804801941},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.46668869256973267},{"id":"https://openalex.org/keywords/fusion","display_name":"Fusion","score":0.4614270031452179},{"id":"https://openalex.org/keywords/data-acquisition","display_name":"Data acquisition","score":0.4453815817832947},{"id":"https://openalex.org/keywords/observational-error","display_name":"Observational error","score":0.43203648924827576},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.42992669343948364},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.33064889907836914},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.3254167139530182},{"id":"https://openalex.org/keywords/simulation","display_name":"Simulation","score":0.32296520471572876}],"concepts":[{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.7323393225669861},{"id":"https://openalex.org/C33954974","wikidata":"https://www.wikidata.org/wiki/Q486494","display_name":"Sensor fusion","level":2,"score":0.6805535554885864},{"id":"https://openalex.org/C37649242","wikidata":"https://www.wikidata.org/wiki/Q932268","display_name":"System of measurement","level":2,"score":0.538356602191925},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5373700261116028},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5183054804801941},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.46668869256973267},{"id":"https://openalex.org/C158525013","wikidata":"https://www.wikidata.org/wiki/Q2593739","display_name":"Fusion","level":2,"score":0.4614270031452179},{"id":"https://openalex.org/C163985040","wikidata":"https://www.wikidata.org/wiki/Q1172399","display_name":"Data acquisition","level":2,"score":0.4453815817832947},{"id":"https://openalex.org/C19619285","wikidata":"https://www.wikidata.org/wiki/Q196372","display_name":"Observational error","level":2,"score":0.43203648924827576},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.42992669343948364},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.33064889907836914},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3254167139530182},{"id":"https://openalex.org/C44154836","wikidata":"https://www.wikidata.org/wiki/Q45045","display_name":"Simulation","level":1,"score":0.32296520471572876},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C1276947","wikidata":"https://www.wikidata.org/wiki/Q333","display_name":"Astronomy","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2018.2890328","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2018.2890328","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1326692461","display_name":null,"funder_award_id":"3132029","funder_id":"https://openalex.org/F4320322919","funder_display_name":"Natural Science Foundation of Beijing Municipality"},{"id":"https://openalex.org/G3471411459","display_name":null,"funder_award_id":"51575033","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G6844979236","display_name":null,"funder_award_id":"2012YQ140032","funder_id":"https://openalex.org/F4320335765","funder_display_name":"National Key Scientific Instrument and Equipment Development Projects of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320322919","display_name":"Natural Science Foundation of Beijing Municipality","ror":null},{"id":"https://openalex.org/F4320335765","display_name":"National Key Scientific Instrument and Equipment Development Projects of China","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":40,"referenced_works":["https://openalex.org/W1009021611","https://openalex.org/W1529771476","https://openalex.org/W1541824440","https://openalex.org/W1543836308","https://openalex.org/W1964834025","https://openalex.org/W1969227767","https://openalex.org/W1970810429","https://openalex.org/W1984667320","https://openalex.org/W1986501736","https://openalex.org/W1991386217","https://openalex.org/W1993701858","https://openalex.org/W2001857426","https://openalex.org/W2013420496","https://openalex.org/W2022106065","https://openalex.org/W2040483045","https://openalex.org/W2063598795","https://openalex.org/W2066307304","https://openalex.org/W2069747077","https://openalex.org/W2078087367","https://openalex.org/W2082222201","https://openalex.org/W2108903966","https://openalex.org/W2124290272","https://openalex.org/W2130105873","https://openalex.org/W2156155065","https://openalex.org/W2162600280","https://openalex.org/W2167667767","https://openalex.org/W2175573234","https://openalex.org/W2191848209","https://openalex.org/W2203871207","https://openalex.org/W2233647881","https://openalex.org/W2340397957","https://openalex.org/W2364792190","https://openalex.org/W2416675426","https://openalex.org/W2492815713","https://openalex.org/W2530397894","https://openalex.org/W2744245146","https://openalex.org/W2789323698","https://openalex.org/W2796007364","https://openalex.org/W6655821650","https://openalex.org/W6684164952"],"related_works":["https://openalex.org/W2132659060","https://openalex.org/W2031992971","https://openalex.org/W3214791684","https://openalex.org/W2353265673","https://openalex.org/W2031175860","https://openalex.org/W2152662039","https://openalex.org/W2726747157","https://openalex.org/W2010131506","https://openalex.org/W2392133813","https://openalex.org/W2145797872"],"abstract_inverted_index":{"The":[0],"real-time":[1],"monitoring":[2],"of":[3,16,80,90,153],"wheel":[4,70,81,93,120,139,145],"size":[5,146],"is":[6,27,156,177],"important":[7],"technology":[8],"in":[9,50,119],"ensuring":[10],"the":[11,91,106,116,123,137,141,151,166],"normal":[12],"and":[13,46,98,143,168,179,187],"safe":[14],"operation":[15],"railways.":[17],"Meanwhile,":[18],"online":[19],"dynamic":[20,169],"measurement":[21,38,61,128,170,175],"equipment":[22,33],"based":[23,63],"on":[24,64],"structured-light":[25],"sensors":[26,84],"becoming":[28],"increasingly":[29],"available.":[30],"However,":[31],"such":[32],"only":[34],"has":[35,43,188],"an":[36,51,183],"\u201cartificial\u201d":[37],"mode,":[39],"collects":[40],"minimal":[41],"data,":[42],"low":[44],"reliability,":[45],"cannot":[47],"be":[48,72],"used":[49],"on-site":[52,184],"complex":[53,185],"environment.":[54],"In":[55,172],"this":[56,154,174],"regard,":[57],"we":[58],"propose":[59],"a":[60,69,76,102,189],"system":[62,176],"multisensor":[65],"data":[66,117,134],"fusion.":[67],"When":[68],"to":[71,114],"measured":[73,92],"passes":[74],"through":[75],"rail,":[77],"two":[78,88],"groups":[79],"cross-profile":[82],"acquisition":[83],"are":[85,94,148],"arranged.":[86],"Then,":[87],"profiles":[89],"reconstructed,":[95],"aligned":[96],"together,":[97],"segmentation":[99],"parameterized":[100],"for":[101,182],"complete":[103,138],"profile.":[104,121],"On":[105,122],"one":[107],"hand,":[108,125],"they":[109],"can":[110],"compensate":[111],"each":[112],"other":[113,124],"overcome":[115],"missing":[118],"it":[126],"improves":[127],"accuracy":[129],"by":[130,158],"resisting":[131],"error":[132],"noise":[133],"induces.":[135],"With":[136],"cross-profile,":[140],"reliable":[142],"accurate":[144],"parameters":[147],"obtained.":[149],"Furthermore,":[150],"feasibility":[152],"method":[155],"verified":[157],"analyzing":[159],"possible":[160],"influencing":[161],"factors.":[162],"Real":[163],"experiments":[164],"demonstrate":[165],"robustness":[167],"accuracy.":[171],"conclusion,":[173],"simple":[178],"highly":[180],"robust":[181],"environment":[186],"promising":[190],"application":[191],"value.":[192]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":7},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":4},{"year":2022,"cited_by_count":5},{"year":2021,"cited_by_count":5},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}