{"id":"https://openalex.org/W2914468587","doi":"https://doi.org/10.1109/tim.2018.2888920","title":"Null Technique for Precision RF Phase Shift Measurements","display_name":"Null Technique for Precision RF Phase Shift Measurements","publication_year":2019,"publication_date":"2019-01-23","ids":{"openalex":"https://openalex.org/W2914468587","doi":"https://doi.org/10.1109/tim.2018.2888920","mag":"2914468587"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2018.2888920","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2018.2888920","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5001237524","display_name":"Anton Widarta","orcid":"https://orcid.org/0000-0002-7550-3337"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]},{"id":"https://openalex.org/I177738480","display_name":"Japan Advanced Institute of Science and Technology","ror":"https://ror.org/03frj4r98","country_code":"JP","type":"education","lineage":["https://openalex.org/I177738480"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Anton Widarta","raw_affiliation_strings":["National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology (NMIJ/AIST), Tsukuba, Japan"],"affiliations":[{"raw_affiliation_string":"National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology (NMIJ/AIST), Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424","https://openalex.org/I177738480"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5001237524"],"corresponding_institution_ids":["https://openalex.org/I177738480","https://openalex.org/I73613424"],"apc_list":null,"apc_paid":null,"fwci":0.2385,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.52598058,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"68","issue":"6","first_page":"1840","last_page":"1843"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9972000122070312,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9972000122070312,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9923999905586243,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9861999750137329,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/phase-shift-module","display_name":"Phase shift module","score":0.7539081573486328},{"id":"https://openalex.org/keywords/attenuation","display_name":"Attenuation","score":0.6168258190155029},{"id":"https://openalex.org/keywords/null","display_name":"Null (SQL)","score":0.5822268724441528},{"id":"https://openalex.org/keywords/phase","display_name":"Phase (matter)","score":0.5436290502548218},{"id":"https://openalex.org/keywords/system-of-measurement","display_name":"System of measurement","score":0.5152995586395264},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.47540125250816345},{"id":"https://openalex.org/keywords/device-under-test","display_name":"Device under test","score":0.4672541320323944},{"id":"https://openalex.org/keywords/radio-frequency","display_name":"Radio frequency","score":0.4606471359729767},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.45249316096305847},{"id":"https://openalex.org/keywords/broadband","display_name":"Broadband","score":0.4434293210506439},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4086569845676422},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3767586052417755},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.34482449293136597},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.29651162028312683},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.24864235520362854},{"id":"https://openalex.org/keywords/scattering-parameters","display_name":"Scattering parameters","score":0.2435862123966217},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.240128755569458},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.23641997575759888}],"concepts":[{"id":"https://openalex.org/C103864889","wikidata":"https://www.wikidata.org/wiki/Q4480524","display_name":"Phase shift module","level":3,"score":0.7539081573486328},{"id":"https://openalex.org/C184652730","wikidata":"https://www.wikidata.org/wiki/Q2357982","display_name":"Attenuation","level":2,"score":0.6168258190155029},{"id":"https://openalex.org/C203763787","wikidata":"https://www.wikidata.org/wiki/Q371029","display_name":"Null (SQL)","level":2,"score":0.5822268724441528},{"id":"https://openalex.org/C44280652","wikidata":"https://www.wikidata.org/wiki/Q104837","display_name":"Phase (matter)","level":2,"score":0.5436290502548218},{"id":"https://openalex.org/C37649242","wikidata":"https://www.wikidata.org/wiki/Q932268","display_name":"System of measurement","level":2,"score":0.5152995586395264},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.47540125250816345},{"id":"https://openalex.org/C76249512","wikidata":"https://www.wikidata.org/wiki/Q1206780","display_name":"Device under test","level":3,"score":0.4672541320323944},{"id":"https://openalex.org/C74064498","wikidata":"https://www.wikidata.org/wiki/Q3396184","display_name":"Radio frequency","level":2,"score":0.4606471359729767},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.45249316096305847},{"id":"https://openalex.org/C509933004","wikidata":"https://www.wikidata.org/wiki/Q194163","display_name":"Broadband","level":2,"score":0.4434293210506439},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4086569845676422},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3767586052417755},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.34482449293136597},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.29651162028312683},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.24864235520362854},{"id":"https://openalex.org/C195266298","wikidata":"https://www.wikidata.org/wiki/Q2165620","display_name":"Scattering parameters","level":2,"score":0.2435862123966217},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.240128755569458},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.23641997575759888},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C1276947","wikidata":"https://www.wikidata.org/wiki/Q333","display_name":"Astronomy","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2018.2888920","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2018.2888920","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.7200000286102295,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W2035348922","https://openalex.org/W2157916737","https://openalex.org/W2262918075","https://openalex.org/W2898930972","https://openalex.org/W4253675283"],"related_works":["https://openalex.org/W2368851831","https://openalex.org/W2978186478","https://openalex.org/W3022393363","https://openalex.org/W4230078636","https://openalex.org/W2924853718","https://openalex.org/W2121842510","https://openalex.org/W1974696141","https://openalex.org/W2154506683","https://openalex.org/W2130448639","https://openalex.org/W2769209333"],"abstract_inverted_index":{"A":[0,27],"dual-channel":[1],"intermediate":[2],"frequency":[3,19],"(IF)":[4],"substitution":[5],"null":[6,50],"system":[7,97,104],"is":[8,39],"developed":[9],"for":[10,75],"precision":[11],"phase":[12,31,37,43,114],"shift":[13,115],"measurements":[14,54],"and":[15,71,82,93],"standards":[16],"in":[17],"the":[18,49,56],"range":[20],"from":[21],"1":[22,25,87],"MHz":[23],"to":[24,55,90],"GHz.":[26,88],"particular":[28],"programmable":[29],"IF":[30],"shifter":[32],"equipped":[33],"with":[34,62,77],"a":[35,42,102,108,112],"calibrated":[36],"monitor":[38],"used":[40,100],"as":[41,101,105,107],"reference":[44,109],"standard.":[45],"High-sensitivity":[46],"nature":[47],"of":[48,68,79,111],"technique":[51],"provides":[52],"accurate":[53],"device":[57],"under":[58],"test":[59],"(DUT)":[60],"even":[61],"large":[63],"attenuation.":[64],"Excellent":[65],"measurement":[66,116],"resolutions":[67],"0.002\u00b0,":[69],"0.006\u00b0,":[70],"0.023\u00b0":[72],"were":[73],"obtained":[74],"DUT":[76],"losses":[78],"20,":[80],"40,":[81],"60":[83],"dB,":[84],"respectively,":[85],"at":[86],"Due":[89],"its":[91],"independent":[92],"high-precision":[94],"nature,":[95],"this":[96],"can":[98],"be":[99],"validation":[103],"well":[106],"standard":[110],"broadband":[113],"system.":[117]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":2},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}