{"id":"https://openalex.org/W2905919008","doi":"https://doi.org/10.1109/tim.2018.2885502","title":"Externally Referenced Current Source With Stability Down to 1 nA/A at 50 mA","display_name":"Externally Referenced Current Source With Stability Down to 1 nA/A at 50 mA","publication_year":2018,"publication_date":"2018-12-25","ids":{"openalex":"https://openalex.org/W2905919008","doi":"https://doi.org/10.1109/tim.2018.2885502","mag":"2905919008"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2018.2885502","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2018.2885502","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5088201943","display_name":"I. Fan","orcid":"https://orcid.org/0000-0003-4414-7920"},"institutions":[{"id":"https://openalex.org/I1285933455","display_name":"Physikalisch-Technische Bundesanstalt","ror":"https://ror.org/05r3f7h03","country_code":"DE","type":"government","lineage":["https://openalex.org/I1285933455","https://openalex.org/I4210136623"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Isaac Fan","raw_affiliation_strings":["Physikalisch-Technische Bundesanstalt, Berlin, Germany"],"raw_orcid":"https://orcid.org/0000-0003-4414-7920","affiliations":[{"raw_affiliation_string":"Physikalisch-Technische Bundesanstalt, Berlin, Germany","institution_ids":["https://openalex.org/I1285933455"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5046206081","display_name":"R. Behr","orcid":"https://orcid.org/0000-0002-5480-443X"},"institutions":[{"id":"https://openalex.org/I1285933455","display_name":"Physikalisch-Technische Bundesanstalt","ror":"https://ror.org/05r3f7h03","country_code":"DE","type":"government","lineage":["https://openalex.org/I1285933455","https://openalex.org/I4210136623"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Ralf Behr","raw_affiliation_strings":["Physikalisch-Technische Bundesanstalt, Braunschweig, Germany"],"raw_orcid":"https://orcid.org/0000-0002-5480-443X","affiliations":[{"raw_affiliation_string":"Physikalisch-Technische Bundesanstalt, Braunschweig, Germany","institution_ids":["https://openalex.org/I1285933455"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088521040","display_name":"D. Drung","orcid":"https://orcid.org/0000-0003-3984-4940"},"institutions":[{"id":"https://openalex.org/I1285933455","display_name":"Physikalisch-Technische Bundesanstalt","ror":"https://ror.org/05r3f7h03","country_code":"DE","type":"government","lineage":["https://openalex.org/I1285933455","https://openalex.org/I4210136623"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Dietmar Drung","raw_affiliation_strings":["Physikalisch-Technische Bundesanstalt, Berlin, Germany"],"raw_orcid":"https://orcid.org/0000-0003-3984-4940","affiliations":[{"raw_affiliation_string":"Physikalisch-Technische Bundesanstalt, Berlin, Germany","institution_ids":["https://openalex.org/I1285933455"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101744848","display_name":"Christian Krause","orcid":"https://orcid.org/0000-0001-6626-4680"},"institutions":[{"id":"https://openalex.org/I1285933455","display_name":"Physikalisch-Technische Bundesanstalt","ror":"https://ror.org/05r3f7h03","country_code":"DE","type":"government","lineage":["https://openalex.org/I1285933455","https://openalex.org/I4210136623"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Christian Krause","raw_affiliation_strings":["Physikalisch-Technische Bundesanstalt, Berlin, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Physikalisch-Technische Bundesanstalt, Berlin, Germany","institution_ids":["https://openalex.org/I1285933455"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101972192","display_name":"Martin G\u00f6tz","orcid":"https://orcid.org/0000-0002-9281-6626"},"institutions":[{"id":"https://openalex.org/I1285933455","display_name":"Physikalisch-Technische Bundesanstalt","ror":"https://ror.org/05r3f7h03","country_code":"DE","type":"government","lineage":["https://openalex.org/I1285933455","https://openalex.org/I4210136623"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Martin Gotz","raw_affiliation_strings":["Physikalisch-Technische Bundesanstalt, Braunschweig, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Physikalisch-Technische Bundesanstalt, Braunschweig, Germany","institution_ids":["https://openalex.org/I1285933455"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5045901200","display_name":"Eckart Pesel","orcid":null},"institutions":[{"id":"https://openalex.org/I1285933455","display_name":"Physikalisch-Technische Bundesanstalt","ror":"https://ror.org/05r3f7h03","country_code":"DE","type":"government","lineage":["https://openalex.org/I1285933455","https://openalex.org/I4210136623"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Eckart Pesel","raw_affiliation_strings":["Physikalisch-Technische Bundesanstalt, Braunschweig, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Physikalisch-Technische Bundesanstalt, Braunschweig, Germany","institution_ids":["https://openalex.org/I1285933455"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5087734536","display_name":"H. Scherer","orcid":"https://orcid.org/0000-0002-6287-5107"},"institutions":[{"id":"https://openalex.org/I1285933455","display_name":"Physikalisch-Technische Bundesanstalt","ror":"https://ror.org/05r3f7h03","country_code":"DE","type":"government","lineage":["https://openalex.org/I1285933455","https://openalex.org/I4210136623"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Hansjorg Scherer","raw_affiliation_strings":["Physikalisch-Technische Bundesanstalt, Braunschweig, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Physikalisch-Technische Bundesanstalt, Braunschweig, Germany","institution_ids":["https://openalex.org/I1285933455"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5088201943"],"corresponding_institution_ids":["https://openalex.org/I1285933455"],"apc_list":null,"apc_paid":null,"fwci":0.3927,"has_fulltext":false,"cited_by_count":13,"citation_normalized_percentile":{"value":0.65292547,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"68","issue":"6","first_page":"2129","last_page":"2135"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9959999918937683,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9955999851226807,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/current-source","display_name":"Current source","score":0.7648459672927856},{"id":"https://openalex.org/keywords/resistor","display_name":"Resistor","score":0.7611860632896423},{"id":"https://openalex.org/keywords/stability","display_name":"Stability (learning theory)","score":0.6273744106292725},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5842945575714111},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.5760512948036194},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.5736424922943115},{"id":"https://openalex.org/keywords/johnson\u2013nyquist-noise","display_name":"Johnson\u2013Nyquist noise","score":0.5021262168884277},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4762837290763855},{"id":"https://openalex.org/keywords/voltage-source","display_name":"Voltage source","score":0.43108734488487244},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3991330862045288},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.38252025842666626},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3678819537162781},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3226799964904785},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.27412551641464233}],"concepts":[{"id":"https://openalex.org/C2781331714","wikidata":"https://www.wikidata.org/wiki/Q1163768","display_name":"Current source","level":3,"score":0.7648459672927856},{"id":"https://openalex.org/C137488568","wikidata":"https://www.wikidata.org/wiki/Q5321","display_name":"Resistor","level":3,"score":0.7611860632896423},{"id":"https://openalex.org/C112972136","wikidata":"https://www.wikidata.org/wiki/Q7595718","display_name":"Stability (learning theory)","level":2,"score":0.6273744106292725},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5842945575714111},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.5760512948036194},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5736424922943115},{"id":"https://openalex.org/C104419016","wikidata":"https://www.wikidata.org/wiki/Q1337490","display_name":"Johnson\u2013Nyquist noise","level":3,"score":0.5021262168884277},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4762837290763855},{"id":"https://openalex.org/C144655898","wikidata":"https://www.wikidata.org/wiki/Q1161128","display_name":"Voltage source","level":3,"score":0.43108734488487244},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3991330862045288},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.38252025842666626},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3678819537162781},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3226799964904785},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.27412551641464233},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2018.2885502","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2018.2885502","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.8199999928474426,"id":"https://metadata.un.org/sdg/7"}],"awards":[{"id":"https://openalex.org/G5511866461","display_name":null,"funder_award_id":"10.13039/501100001659","funder_id":"https://openalex.org/F4320320879","funder_display_name":"Deutsche Forschungsgemeinschaft"},{"id":"https://openalex.org/G7528931397","display_name":null,"funder_award_id":"FA 1456/1-1","funder_id":"https://openalex.org/F4320320879","funder_display_name":"Deutsche Forschungsgemeinschaft"}],"funders":[{"id":"https://openalex.org/F4320320879","display_name":"Deutsche Forschungsgemeinschaft","ror":"https://ror.org/018mejw64"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W605895377","https://openalex.org/W2003867184","https://openalex.org/W2009254132","https://openalex.org/W2067736322","https://openalex.org/W2096919012","https://openalex.org/W2100173632","https://openalex.org/W2109276239","https://openalex.org/W2116044800","https://openalex.org/W2126794874","https://openalex.org/W2139476244","https://openalex.org/W2139875501","https://openalex.org/W2140816342","https://openalex.org/W2162420039","https://openalex.org/W2442406114","https://openalex.org/W2566706182","https://openalex.org/W2593501362","https://openalex.org/W2899423357","https://openalex.org/W3121584350"],"related_works":["https://openalex.org/W1963561013","https://openalex.org/W1972019987","https://openalex.org/W1934416369","https://openalex.org/W2102865711","https://openalex.org/W4239441596","https://openalex.org/W2357737656","https://openalex.org/W2382226827","https://openalex.org/W2010022036","https://openalex.org/W2002509857","https://openalex.org/W2156919093"],"abstract_inverted_index":{"The":[0],"noise":[1,75],"and":[2,25],"stability":[3,36,69],"of":[4,13,77,84],"a":[5,35,52,56,86,95],"current":[6,31,57,67,107],"source":[7,32,58,68,108],"are":[8],"limited":[9],"by":[10],"the":[11,20,66,74,78,104,110],"quality":[12],"components":[14],"used":[15],"for":[16],"construction,":[17],"such":[18],"as":[19],"voltage":[21],"reference":[22],"chips,":[23],"resistors,":[24],"power":[26,80],"supplies.":[27],"A":[28],"state-of-the-art":[29],"commercial":[30],"typically":[33],"exhibits":[34],"no":[37],"better":[38],"than":[39],"parts":[40,88],"in":[41,89,94],"10":[42,90],"<sup":[43,91],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[44,92],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">7</sup>":[45],".":[46],"In":[47],"this":[48],"paper,":[49],"we":[50],"present":[51],"way":[53],"to":[54,70,113],"implement":[55],"with":[59],"\u201cexternal\u201d":[60],"electrical":[61],"references.":[62],"This":[63],"approach":[64],"allows":[65],"be":[71],"decoupled":[72],"from":[73],"characteristics":[76],"main":[79],"supply":[81],"circuit.":[82],"Stability":[83],"about":[85],"few":[87],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">9</sup>":[93],"day":[96],"has":[97],"been":[98],"reached":[99],"at":[100,109],"50":[101],"mA,":[102],"representing":[103],"most":[105],"stable":[106],"milliampere":[111],"range":[112],"date.":[114]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":1}],"updated_date":"2026-05-05T08:41:31.759640","created_date":"2025-10-10T00:00:00"}