{"id":"https://openalex.org/W2906518203","doi":"https://doi.org/10.1109/tim.2018.2884553","title":"Toward a Calculable Standard Shunt for Current Measurements at 10 A and Up To 1 MHz","display_name":"Toward a Calculable Standard Shunt for Current Measurements at 10 A and Up To 1 MHz","publication_year":2018,"publication_date":"2018-12-24","ids":{"openalex":"https://openalex.org/W2906518203","doi":"https://doi.org/10.1109/tim.2018.2884553","mag":"2906518203"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2018.2884553","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2018.2884553","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5003587364","display_name":"Mohamed Ouameur","orcid":"https://orcid.org/0000-0002-4775-362X"},"institutions":[{"id":"https://openalex.org/I4210107682","display_name":"Laboratoire National de M\u00e9trologie et d'Essais","ror":"https://ror.org/01ph39d13","country_code":"FR","type":"other","lineage":["https://openalex.org/I4210107682"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Mohamed Ouameur","raw_affiliation_strings":["Laboratoire National de M\u00e9trologie et d\u2019Essais, Trappes, France","LNE - Laboratoire National de M\u00e9trologie et d'Essais [Trappes] (29 avenue Roger Hennequin 78197 Trappes cedex - France)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Laboratoire National de M\u00e9trologie et d\u2019Essais, Trappes, France","institution_ids":["https://openalex.org/I4210107682"]},{"raw_affiliation_string":"LNE - Laboratoire National de M\u00e9trologie et d'Essais [Trappes] (29 avenue Roger Hennequin 78197 Trappes cedex - France)","institution_ids":["https://openalex.org/I4210107682"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004600779","display_name":"Fran\u00e7ois Ziad\u00e9","orcid":"https://orcid.org/0000-0002-0996-9817"},"institutions":[{"id":"https://openalex.org/I4210107682","display_name":"Laboratoire National de M\u00e9trologie et d'Essais","ror":"https://ror.org/01ph39d13","country_code":"FR","type":"other","lineage":["https://openalex.org/I4210107682"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Francois Ziade","raw_affiliation_strings":["Laboratoire National de M\u00e9trologie et d\u2019Essais, Trappes, France","LNE - Laboratoire National de M\u00e9trologie et d'Essais [Trappes] (29 avenue Roger Hennequin 78197 Trappes cedex - France)"],"raw_orcid":"https://orcid.org/0000-0002-0996-9817","affiliations":[{"raw_affiliation_string":"Laboratoire National de M\u00e9trologie et d\u2019Essais, Trappes, France","institution_ids":["https://openalex.org/I4210107682"]},{"raw_affiliation_string":"LNE - Laboratoire National de M\u00e9trologie et d'Essais [Trappes] (29 avenue Roger Hennequin 78197 Trappes cedex - France)","institution_ids":["https://openalex.org/I4210107682"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5047431453","display_name":"Yann Le Bihan","orcid":"https://orcid.org/0000-0001-5563-9192"},"institutions":[{"id":"https://openalex.org/I102197404","display_name":"Universit\u00e9 Paris-Sud","ror":"https://ror.org/028rypz17","country_code":"FR","type":"education","lineage":["https://openalex.org/I102197404"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I3019908861","display_name":"Laboratoire de G\u00e9nie \u00c9lectrique et \u00c9lectronique de Paris","ror":"https://ror.org/02xnnng09","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I277688954","https://openalex.org/I277688954","https://openalex.org/I3019908861","https://openalex.org/I39804081","https://openalex.org/I4210107720"]},{"id":"https://openalex.org/I39804081","display_name":"Sorbonne Universit\u00e9","ror":"https://ror.org/02en5vm52","country_code":"FR","type":"education","lineage":["https://openalex.org/I39804081"]},{"id":"https://openalex.org/I4210107720","display_name":"CentraleSup\u00e9lec","ror":"https://ror.org/019tcpt25","country_code":"FR","type":"facility","lineage":["https://openalex.org/I277688954","https://openalex.org/I4210107720"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Yann Le Bihan","raw_affiliation_strings":["CNRS, Group of Electrical Engineering of Paris, CentraleSup\u00e9lec, Universit\u00e9 Paris-Sud, Sorbonne Universit\u00e9, Gif-sur-Yvette, France","GeePs - Laboratoire G\u00e9nie \u00e9lectrique et \u00e9lectronique de Paris (11, rue Joliot Curie\r\nPlateau de Moulon\r\n91192 Gif sur Yvette - France)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CNRS, Group of Electrical Engineering of Paris, CentraleSup\u00e9lec, Universit\u00e9 Paris-Sud, Sorbonne Universit\u00e9, Gif-sur-Yvette, France","institution_ids":["https://openalex.org/I4210107720","https://openalex.org/I39804081","https://openalex.org/I102197404","https://openalex.org/I1294671590"]},{"raw_affiliation_string":"GeePs - Laboratoire G\u00e9nie \u00e9lectrique et \u00e9lectronique de Paris (11, rue Joliot Curie\r\nPlateau de Moulon\r\n91192 Gif sur Yvette - France)","institution_ids":["https://openalex.org/I3019908861"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.2619,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.59879044,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":95},"biblio":{"volume":"68","issue":"6","first_page":"2215","last_page":"2222"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/shunt","display_name":"Shunt (medical)","score":0.6938689351081848},{"id":"https://openalex.org/keywords/metrology","display_name":"Metrology","score":0.5671489834785461},{"id":"https://openalex.org/keywords/broadband","display_name":"Broadband","score":0.5543503165245056},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.4968006908893585},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4914485216140747},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.44166430830955505},{"id":"https://openalex.org/keywords/standard-deviation","display_name":"Standard deviation","score":0.43625378608703613},{"id":"https://openalex.org/keywords/bandwidth","display_name":"Bandwidth (computing)","score":0.41799819469451904},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3410242199897766},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.33322155475616455},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.31712305545806885},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.2634718716144562},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.12853708863258362},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.11368995904922485}],"concepts":[{"id":"https://openalex.org/C2780968331","wikidata":"https://www.wikidata.org/wiki/Q1890115","display_name":"Shunt (medical)","level":2,"score":0.6938689351081848},{"id":"https://openalex.org/C195766429","wikidata":"https://www.wikidata.org/wiki/Q394","display_name":"Metrology","level":2,"score":0.5671489834785461},{"id":"https://openalex.org/C509933004","wikidata":"https://www.wikidata.org/wiki/Q194163","display_name":"Broadband","level":2,"score":0.5543503165245056},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.4968006908893585},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4914485216140747},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.44166430830955505},{"id":"https://openalex.org/C22679943","wikidata":"https://www.wikidata.org/wiki/Q159375","display_name":"Standard deviation","level":2,"score":0.43625378608703613},{"id":"https://openalex.org/C2776257435","wikidata":"https://www.wikidata.org/wiki/Q1576430","display_name":"Bandwidth (computing)","level":2,"score":0.41799819469451904},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3410242199897766},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.33322155475616455},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.31712305545806885},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.2634718716144562},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.12853708863258362},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.11368995904922485},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C164705383","wikidata":"https://www.wikidata.org/wiki/Q10379","display_name":"Cardiology","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tim.2018.2884553","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2018.2884553","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},{"id":"pmh:oai:HAL:hal-02936684v1","is_oa":false,"landing_page_url":"https://hal.science/hal-02936684","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement, 2019, 68 (6), pp.2215-2222. ⟨10.1109/TIM.2018.2884553⟩","raw_type":"Journal articles"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.8100000023841858}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W2024885563","https://openalex.org/W2028437540","https://openalex.org/W2135449237","https://openalex.org/W2151940577","https://openalex.org/W2545036239","https://openalex.org/W2746714525","https://openalex.org/W2898996685","https://openalex.org/W2913951818","https://openalex.org/W3214750710","https://openalex.org/W4229594554","https://openalex.org/W4233225650","https://openalex.org/W6678427688"],"related_works":["https://openalex.org/W1998546186","https://openalex.org/W2061967405","https://openalex.org/W2923974939","https://openalex.org/W2110528520","https://openalex.org/W2174860717","https://openalex.org/W2392646414","https://openalex.org/W2590542424","https://openalex.org/W2755767658","https://openalex.org/W2527699603","https://openalex.org/W1990949930"],"abstract_inverted_index":{"Electrical":[0],"current":[1,37,59,103,109,125,151,195],"shunts":[2,110,149],"are":[3,39,48,131],"widely":[4],"used":[5],"as":[6,228,230],"a":[7,21,42,58,102,112,198],"resistance":[8],"standard":[9],"in":[10,115,217,240],"metrology":[11],"laboratories":[12],"and":[13,26,30,47,71,88,98,117,214,222],"precision":[14],"instruments":[15],"with":[16,32],"the":[17,62,76,144,175,183,202,231,235],"aim":[18],"of":[19,24,57,65,80,92,105,123,147,186,194,234],"measuring":[20],"high":[22,33,86,90],"level":[23,104],"alternative":[25],"direct":[27],"currents":[28],"(ac":[29],"dc)":[31],"accuracy.":[34],"These":[35],"ac":[36],"sensors":[38],"characterized":[40],"by":[41,208],"broadband":[43],"operating":[44],"frequency":[45],"bandwidth":[46],"commonly":[49],"calibrated":[50],"up":[51,159],"to":[52,75,133,156,160,171,181],"100":[53,96,137,220],"kHz.":[54,138],"The":[55,78,119,163,226],"use":[56],"shunt":[60,126,188,200,236],"requires":[61],"preliminary":[63],"knowledge":[64],"its":[66],"magnitude":[67,116,121,218],"deviation":[68,204],"from":[69,153,168,205],"dc":[70,206],"phase":[72],"angle":[73],"according":[74],"frequency.":[77],"determination":[79],"these":[81],"parameters":[82],"is":[83,166,210,237],"challenging":[84],"at":[85,136,219],"frequencies":[87],"for":[89,150,191],"levels":[91],"current:":[93],"typically":[94],"beyond":[95],"kHz":[97,221],"1":[99,161,223],"zA.":[100],"For":[101,197],"10":[106,157,172],"A,":[107],"existing":[108],"exhibit":[111],"strong":[113],"variation":[114],"phase.":[118],"best":[120],"performances":[122],"10-A":[124,199],"standards":[127,189],"published":[128],"so":[129],"far":[130],"limited":[132],"2":[134],"\u03bc\u03a9/\u03a9":[135,216],"In":[139],"this":[140,192,241],"paper,":[141],"we":[142],"detail":[143],"theoretical":[145],"basis":[146],"innovate":[148],"measurements":[152],"50":[154,169],"mA":[155,170],"A":[158],"MHz.":[162],"electrical":[164],"modeling":[165,233],"valid":[167],"A:":[173],"only":[174],"Rdc":[176],"value":[177],"must":[178],"be":[179],"changed":[180],"get":[182],"electromagnetic":[184,232],"response":[185],"any":[187],"designed":[190],"range":[193],"levels.":[196],"standard,":[201],"relative":[203],"obtained":[207],"calculation":[209],"less":[211],"than":[212],"0.2":[213],"20":[215],"MHz,":[224],"respectively.":[225],"design":[227],"well":[229],"profoundly":[238],"described":[239],"paper.":[242]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}