{"id":"https://openalex.org/W2904145552","doi":"https://doi.org/10.1109/tim.2018.2884062","title":"Analysis of Correlation in the Intercomparison of DC Voltage Reference Standards","display_name":"Analysis of Correlation in the Intercomparison of DC Voltage Reference Standards","publication_year":2018,"publication_date":"2018-12-17","ids":{"openalex":"https://openalex.org/W2904145552","doi":"https://doi.org/10.1109/tim.2018.2884062","mag":"2904145552"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2018.2884062","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2018.2884062","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5051352497","display_name":"Mauricio S\u00e1chica Avellaneda","orcid":"https://orcid.org/0000-0003-3148-1153"},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Mauricio Sachica","raw_affiliation_strings":["Instituto Nacional de Metrolog\u00eda, Bogot\u00e1, Colombia"],"affiliations":[{"raw_affiliation_string":"Instituto Nacional de Metrolog\u00eda, Bogot\u00e1, Colombia","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5073748243","display_name":"Alexander Martinez","orcid":"https://orcid.org/0000-0002-9518-2454"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Alexander Martinez","raw_affiliation_strings":["Instituto Nacional de Metrolog\u00eda, Bogot\u00e1, Colombia"],"affiliations":[{"raw_affiliation_string":"Instituto Nacional de Metrolog\u00eda, Bogot\u00e1, Colombia","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5051352497"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.3863,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.6452244,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"68","issue":"6","first_page":"2168","last_page":"2171"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9940999746322632,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10573","display_name":"Power Quality and Harmonics","score":0.9940000176429749,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.588791012763977},{"id":"https://openalex.org/keywords/correlation","display_name":"Correlation","score":0.531627357006073},{"id":"https://openalex.org/keywords/measurement-uncertainty","display_name":"Measurement uncertainty","score":0.5063611268997192},{"id":"https://openalex.org/keywords/voltage-reference","display_name":"Voltage reference","score":0.4229139983654022},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3795376121997833},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.33253052830696106},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3241288661956787},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.3086951673030853},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2378099262714386},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.23291242122650146}],"concepts":[{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.588791012763977},{"id":"https://openalex.org/C117220453","wikidata":"https://www.wikidata.org/wiki/Q5172842","display_name":"Correlation","level":2,"score":0.531627357006073},{"id":"https://openalex.org/C137209882","wikidata":"https://www.wikidata.org/wiki/Q1403517","display_name":"Measurement uncertainty","level":2,"score":0.5063611268997192},{"id":"https://openalex.org/C44351266","wikidata":"https://www.wikidata.org/wiki/Q1465532","display_name":"Voltage reference","level":3,"score":0.4229139983654022},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3795376121997833},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.33253052830696106},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3241288661956787},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.3086951673030853},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2378099262714386},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23291242122650146},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2018.2884062","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2018.2884062","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W2031455694","https://openalex.org/W2791111984","https://openalex.org/W2899144880","https://openalex.org/W2948333153","https://openalex.org/W6763199354"],"related_works":["https://openalex.org/W3130844878","https://openalex.org/W4205181462","https://openalex.org/W2899909497","https://openalex.org/W2364238915","https://openalex.org/W1840158209","https://openalex.org/W4367339106","https://openalex.org/W4385525234","https://openalex.org/W2913371358","https://openalex.org/W2055167838","https://openalex.org/W2155835898"],"abstract_inverted_index":{"This":[0],"paper":[1],"describes":[2],"the":[3,13,34,43,47,51],"application":[4],"of":[5,16,19,36,50],"GUM":[6],"supplement":[7,10],"1":[8],"and":[9,30,45],"2":[11],"in":[12],"intercomparison":[14],"procedure":[15],"a":[17,37],"group":[18],"four":[20],"dc":[21],"voltage":[22],"reference":[23],"standards.":[24],"The":[25],"results":[26],"obtained":[27],"are":[28],"presented":[29],"according":[31],"to":[32,41],"these,":[33],"choice":[35],"restriction":[38],"is":[39],"suggested":[40],"improve":[42],"uncertainty":[44],"avoiding":[46],"strong":[48],"correlation":[49],"estimated":[52],"values.":[53]},"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2019,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}