{"id":"https://openalex.org/W2904570335","doi":"https://doi.org/10.1109/tim.2018.2884044","title":"Electron Paramagnetic Resonance Study on <sup>28</sup>Si Single Crystal for the Future Realization of the Kilogram","display_name":"Electron Paramagnetic Resonance Study on <sup>28</sup>Si Single Crystal for the Future Realization of the Kilogram","publication_year":2018,"publication_date":"2018-12-18","ids":{"openalex":"https://openalex.org/W2904570335","doi":"https://doi.org/10.1109/tim.2018.2884044","mag":"2904570335"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2018.2884044","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tim.2018.2884044","pdf_url":"https://ieeexplore.ieee.org/ielx7/19/8712472/08579159.pdf","source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"bronze","oa_url":"https://ieeexplore.ieee.org/ielx7/19/8712472/08579159.pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5011590604","display_name":"Shigeki Mizushima","orcid":"https://orcid.org/0000-0003-1276-1328"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Shigeki Mizushima","raw_affiliation_strings":["National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan"],"affiliations":[{"raw_affiliation_string":"National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007242339","display_name":"Naoki Kuramoto","orcid":"https://orcid.org/0000-0002-4375-5214"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Naoki Kuramoto","raw_affiliation_strings":["National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan"],"affiliations":[{"raw_affiliation_string":"National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101954354","display_name":"Kenichi Fujii","orcid":"https://orcid.org/0000-0002-5578-0038"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kenichi Fujii","raw_affiliation_strings":["National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan"],"affiliations":[{"raw_affiliation_string":"National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5001500059","display_name":"T. Umeda","orcid":"https://orcid.org/0000-0002-2584-4782"},"institutions":[{"id":"https://openalex.org/I146399215","display_name":"University of Tsukuba","ror":"https://ror.org/02956yf07","country_code":"JP","type":"education","lineage":["https://openalex.org/I146399215"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takahide Umeda","raw_affiliation_strings":["Applied Physics, University of Tsukuba, Tsukuba, Japan"],"affiliations":[{"raw_affiliation_string":"Applied Physics, University of Tsukuba, Tsukuba, Japan","institution_ids":["https://openalex.org/I146399215"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5011590604"],"corresponding_institution_ids":["https://openalex.org/I73613424"],"apc_list":null,"apc_paid":null,"fwci":0.6217,"has_fulltext":true,"cited_by_count":3,"citation_normalized_percentile":{"value":0.72398403,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"68","issue":"6","first_page":"1879","last_page":"1886"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11733","display_name":"X-ray Spectroscopy and Fluorescence Analysis","score":0.9944999814033508,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11733","display_name":"X-ray Spectroscopy and Fluorescence Analysis","score":0.9944999814033508,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11949","display_name":"Nuclear Physics and Applications","score":0.991100013256073,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","score":0.9898999929428101,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electron-paramagnetic-resonance","display_name":"Electron paramagnetic resonance","score":0.7612179517745972},{"id":"https://openalex.org/keywords/crystal","display_name":"Crystal (programming language)","score":0.6462216973304749},{"id":"https://openalex.org/keywords/analytical-chemistry","display_name":"Analytical Chemistry (journal)","score":0.5319972634315491},{"id":"https://openalex.org/keywords/impurity","display_name":"Impurity","score":0.47066983580589294},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.41679131984710693},{"id":"https://openalex.org/keywords/crystallography","display_name":"Crystallography","score":0.3673042058944702},{"id":"https://openalex.org/keywords/nuclear-magnetic-resonance","display_name":"Nuclear magnetic resonance","score":0.3358018398284912},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.2984514534473419},{"id":"https://openalex.org/keywords/quantum-mechanics","display_name":"Quantum mechanics","score":0.1232282817363739},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.09553295373916626},{"id":"https://openalex.org/keywords/organic-chemistry","display_name":"Organic chemistry","score":0.08681342005729675}],"concepts":[{"id":"https://openalex.org/C187961010","wikidata":"https://www.wikidata.org/wiki/Q260463","display_name":"Electron paramagnetic resonance","level":2,"score":0.7612179517745972},{"id":"https://openalex.org/C2781285689","wikidata":"https://www.wikidata.org/wiki/Q21921428","display_name":"Crystal (programming language)","level":2,"score":0.6462216973304749},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.5319972634315491},{"id":"https://openalex.org/C71987851","wikidata":"https://www.wikidata.org/wiki/Q7216430","display_name":"Impurity","level":2,"score":0.47066983580589294},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.41679131984710693},{"id":"https://openalex.org/C8010536","wikidata":"https://www.wikidata.org/wiki/Q160398","display_name":"Crystallography","level":1,"score":0.3673042058944702},{"id":"https://openalex.org/C46141821","wikidata":"https://www.wikidata.org/wiki/Q209402","display_name":"Nuclear magnetic resonance","level":1,"score":0.3358018398284912},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.2984514534473419},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.1232282817363739},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.09553295373916626},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.08681342005729675},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2018.2884044","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tim.2018.2884044","pdf_url":"https://ieeexplore.ieee.org/ielx7/19/8712472/08579159.pdf","source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1109/tim.2018.2884044","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tim.2018.2884044","pdf_url":"https://ieeexplore.ieee.org/ielx7/19/8712472/08579159.pdf","source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1069223013","display_name":null,"funder_award_id":"JSPS KAKENHI","funder_id":"https://openalex.org/F4320334764","funder_display_name":"Japan Society for the Promotion of Science"},{"id":"https://openalex.org/G3283080113","display_name":null,"funder_award_id":"JSPS KAKENHI","funder_id":"https://openalex.org/F4320311508","funder_display_name":"National Institute of Advanced Industrial Science and Technology"},{"id":"https://openalex.org/G3459562248","display_name":null,"funder_award_id":"Grant","funder_id":"https://openalex.org/F4320334764","funder_display_name":"Japan Society for the Promotion of Science"},{"id":"https://openalex.org/G4636223006","display_name":null,"funder_award_id":"JSPS KAK","funder_id":"https://openalex.org/F4320334764","funder_display_name":"Japan Society for the Promotion of Science"},{"id":"https://openalex.org/G6295425650","display_name":null,"funder_award_id":"17K05112","funder_id":"https://openalex.org/F4320334764","funder_display_name":"Japan Society for the Promotion of Science"}],"funders":[{"id":"https://openalex.org/F4320311508","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54"},{"id":"https://openalex.org/F4320334764","display_name":"Japan Society for the Promotion of Science","ror":"https://ror.org/00hhkn466"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2904570335.pdf","grobid_xml":"https://content.openalex.org/works/W2904570335.grobid-xml"},"referenced_works_count":33,"referenced_works":["https://openalex.org/W168076904","https://openalex.org/W1977870888","https://openalex.org/W1980859041","https://openalex.org/W1998412565","https://openalex.org/W1998505469","https://openalex.org/W2014857431","https://openalex.org/W2042076307","https://openalex.org/W2043388419","https://openalex.org/W2044138521","https://openalex.org/W2052461464","https://openalex.org/W2052588503","https://openalex.org/W2053398693","https://openalex.org/W2053782806","https://openalex.org/W2056281274","https://openalex.org/W2072676577","https://openalex.org/W2074151869","https://openalex.org/W2077906639","https://openalex.org/W2081885036","https://openalex.org/W2085359410","https://openalex.org/W2092171916","https://openalex.org/W2093140212","https://openalex.org/W2146406469","https://openalex.org/W2157664098","https://openalex.org/W2172200950","https://openalex.org/W2314721838","https://openalex.org/W2535300812","https://openalex.org/W2622724175","https://openalex.org/W2899439085","https://openalex.org/W3105698769","https://openalex.org/W4211153246","https://openalex.org/W6606888036","https://openalex.org/W6683323899","https://openalex.org/W6698665728"],"related_works":["https://openalex.org/W2082337540","https://openalex.org/W1981011544","https://openalex.org/W2084916282","https://openalex.org/W1994875143","https://openalex.org/W1585447513","https://openalex.org/W1654479263","https://openalex.org/W1516735584","https://openalex.org/W1542837180","https://openalex.org/W2021691575","https://openalex.org/W2466090274"],"abstract_inverted_index":{"For":[0],"the":[1,5,8,20,47,54,62,94,99,111,140],"future":[2],"realization":[3],"of":[4,49,101,104],"kilogram":[6],"using":[7,87],"X-ray":[9],"crystal":[10,43,63,112],"density":[11],"(XRCD)":[12],"method,":[13],"isotopically":[14],"enriched":[15],"silicon":[16],"crystals":[17],"grown":[18],"by":[19],"floating":[21],"zone":[22],"method":[23],"are":[24,113],"employed.":[25],"In":[26,92],"this":[27],"paper,":[28],"we":[29],"present":[30],"quantitative":[31],"electron":[32],"paramagnetic":[33],"resonance":[34],"(EPR)":[35],"measurements":[36,96],"on":[37],"<sup":[38,73,77,119,123],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[39,74,78,120,124],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">28</sup>":[40],"Si":[41],"single":[42],"AVO28":[44,158],"to":[45,68,146,152],"increase":[46],"reliability":[48],"mass":[50,142],"deficit":[51,143],"correction":[52,144],"in":[53,61,110,130],"XRCD":[55],"method.":[56],"We":[57],"detected":[58],"phosphorus":[59],"impurity":[60],"and":[64,134],"determined":[65],"its":[66],"concentration":[67],"be":[69,153],"3.2(5)":[70],"x":[71,117],"10":[72,118],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">12</sup>":[75,121],"cm":[76,122],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">-3</sup>":[79,125],",":[80],"which":[81],"is":[82,150],"consistent":[83],"with":[84,107],"that":[85,98],"estimated":[86,151],"Fourier":[88],"transform":[89],"infrared":[90],"spectroscopy.":[91],"addition,":[93],"EPR":[95],"revealed":[97],"concentrations":[100],"nine":[102],"types":[103],"vacancy":[105,148],"defects":[106,149],"unpaired":[108],"electrons":[109],"less":[114],"than":[115],"1":[116],"at":[126],"25":[127],"K":[128],"both":[129],"a":[131,138],"dark":[132],"environment":[133],"under":[135],"illumination.":[136],"As":[137],"result,":[139],"necessary":[141],"due":[145],"these":[147],"0.0(2)":[154],"\u03bcg":[155],"for":[156],"1-kg":[157],"spheres.":[159]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1}],"updated_date":"2026-03-15T09:29:46.208133","created_date":"2025-10-10T00:00:00"}