{"id":"https://openalex.org/W2904456028","doi":"https://doi.org/10.1109/tim.2018.2882958","title":"Graphene Devices for Tabletop and High-Current Quantized Hall Resistance Standards","display_name":"Graphene Devices for Tabletop and High-Current Quantized Hall Resistance Standards","publication_year":2018,"publication_date":"2018-12-11","ids":{"openalex":"https://openalex.org/W2904456028","doi":"https://doi.org/10.1109/tim.2018.2882958","mag":"2904456028","pmid":"https://pubmed.ncbi.nlm.nih.gov/31274879"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2018.2882958","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2018.2882958","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","pubmed"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://www.ncbi.nlm.nih.gov/pmc/articles/6604640","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5039812989","display_name":"Albert F. Rigosi","orcid":"https://orcid.org/0000-0002-8189-3829"},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]},{"id":"https://openalex.org/I4210109969","display_name":"Physical Measurement Laboratory","ror":"https://ror.org/016s8vs02","country_code":"US","type":"government","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065","https://openalex.org/I4210109969"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Albert F. Rigosi","raw_affiliation_strings":["Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899 USA","Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, USA"],"raw_orcid":"https://orcid.org/0000-0002-8189-3829","affiliations":[{"raw_affiliation_string":"Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899 USA","institution_ids":["https://openalex.org/I4210109969","https://openalex.org/I1321296531"]},{"raw_affiliation_string":"Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, USA","institution_ids":["https://openalex.org/I4210109969","https://openalex.org/I1321296531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075794046","display_name":"Alireza R. Panna","orcid":"https://orcid.org/0000-0001-6557-2112"},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]},{"id":"https://openalex.org/I4210109969","display_name":"Physical Measurement Laboratory","ror":"https://ror.org/016s8vs02","country_code":"US","type":"government","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065","https://openalex.org/I4210109969"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Alireza R. Panna","raw_affiliation_strings":["Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899 USA","Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, USA"],"raw_orcid":"https://orcid.org/0000-0001-6557-2112","affiliations":[{"raw_affiliation_string":"Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899 USA","institution_ids":["https://openalex.org/I4210109969","https://openalex.org/I1321296531"]},{"raw_affiliation_string":"Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, USA","institution_ids":["https://openalex.org/I4210109969","https://openalex.org/I1321296531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082719299","display_name":"Shamith U. Payagala","orcid":"https://orcid.org/0000-0001-6359-8765"},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]},{"id":"https://openalex.org/I4210109969","display_name":"Physical Measurement Laboratory","ror":"https://ror.org/016s8vs02","country_code":"US","type":"government","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065","https://openalex.org/I4210109969"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Shamith U. Payagala","raw_affiliation_strings":["Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899 USA","Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, USA"],"raw_orcid":"https://orcid.org/0000-0001-6359-8765","affiliations":[{"raw_affiliation_string":"Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899 USA","institution_ids":["https://openalex.org/I4210109969","https://openalex.org/I1321296531"]},{"raw_affiliation_string":"Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, USA","institution_ids":["https://openalex.org/I4210109969","https://openalex.org/I1321296531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075471824","display_name":"Mattias Kruskopf","orcid":"https://orcid.org/0000-0003-2846-3157"},"institutions":[{"id":"https://openalex.org/I4210151733","display_name":"Joint Quantum Institute","ror":"https://ror.org/04xz38214","country_code":"US","type":"facility","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065","https://openalex.org/I4210151733","https://openalex.org/I66946132"]},{"id":"https://openalex.org/I66946132","display_name":"University of Maryland, College Park","ror":"https://ror.org/047s2c258","country_code":"US","type":"education","lineage":["https://openalex.org/I66946132"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mattias Kruskopf","raw_affiliation_strings":["Joint Quantum Institute, University of Maryland, College Park, MD 20742 USA","Joint Quantum Institute, University of Maryland, College Park, MD, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Joint Quantum Institute, University of Maryland, College Park, MD 20742 USA","institution_ids":["https://openalex.org/I4210151733","https://openalex.org/I66946132"]},{"raw_affiliation_string":"Joint Quantum Institute, University of Maryland, College Park, MD, USA","institution_ids":["https://openalex.org/I4210151733","https://openalex.org/I66946132"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5076757055","display_name":"Marlin E. Kraft","orcid":null},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]},{"id":"https://openalex.org/I4210109969","display_name":"Physical Measurement Laboratory","ror":"https://ror.org/016s8vs02","country_code":"US","type":"government","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065","https://openalex.org/I4210109969"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Marlin E. Kraft","raw_affiliation_strings":["Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899 USA","Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899 USA","institution_ids":["https://openalex.org/I4210109969","https://openalex.org/I1321296531"]},{"raw_affiliation_string":"Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, USA","institution_ids":["https://openalex.org/I4210109969","https://openalex.org/I1321296531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111473417","display_name":"George R. Jones","orcid":null},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]},{"id":"https://openalex.org/I4210109969","display_name":"Physical Measurement Laboratory","ror":"https://ror.org/016s8vs02","country_code":"US","type":"government","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065","https://openalex.org/I4210109969"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"George R. Jones","raw_affiliation_strings":["Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899 USA","Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899 USA","institution_ids":["https://openalex.org/I4210109969","https://openalex.org/I1321296531"]},{"raw_affiliation_string":"Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, USA","institution_ids":["https://openalex.org/I4210109969","https://openalex.org/I1321296531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069318296","display_name":"Bi\u2010Yi Wu","orcid":"https://orcid.org/0000-0001-7790-3839"},"institutions":[{"id":"https://openalex.org/I16733864","display_name":"National Taiwan University","ror":"https://ror.org/05bqach95","country_code":"TW","type":"education","lineage":["https://openalex.org/I16733864"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Bi-Yi Wu","raw_affiliation_strings":["Graduate Institute of Applied Physics, National Taiwan University, Taipei 10617, Taiwan","Graduate Institute of Applied Physics, National Taiwan University, Taipei, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Graduate Institute of Applied Physics, National Taiwan University, Taipei 10617, Taiwan","institution_ids":["https://openalex.org/I16733864"]},{"raw_affiliation_string":"Graduate Institute of Applied Physics, National Taiwan University, Taipei, Taiwan","institution_ids":["https://openalex.org/I16733864"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083247924","display_name":"Hsin\u2010Yen Lee","orcid":null},"institutions":[{"id":"https://openalex.org/I4210097074","display_name":"Theiss Research","ror":"https://ror.org/00scjnx30","country_code":"US","type":"nonprofit","lineage":["https://openalex.org/I4210097074"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Hsin-Yen Lee","raw_affiliation_strings":["Theiss Research, La Jolla, CA 92037 USA","Theiss Research, La Jolla, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Theiss Research, La Jolla, CA 92037 USA","institution_ids":["https://openalex.org/I4210097074"]},{"raw_affiliation_string":"Theiss Research, La Jolla, CA, USA","institution_ids":["https://openalex.org/I4210097074"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100369311","display_name":"Yanfei Yang","orcid":"https://orcid.org/0000-0003-0406-7416"},"institutions":[{"id":"https://openalex.org/I4210151733","display_name":"Joint Quantum Institute","ror":"https://ror.org/04xz38214","country_code":"US","type":"facility","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065","https://openalex.org/I4210151733","https://openalex.org/I66946132"]},{"id":"https://openalex.org/I66946132","display_name":"University of Maryland, College Park","ror":"https://ror.org/047s2c258","country_code":"US","type":"education","lineage":["https://openalex.org/I66946132"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yanfei Yang","raw_affiliation_strings":["Joint Quantum Institute, University of Maryland, College Park, MD 20742 USA","Joint Quantum Institute, University of Maryland, College Park, MD, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Joint Quantum Institute, University of Maryland, College Park, MD 20742 USA","institution_ids":["https://openalex.org/I4210151733","https://openalex.org/I66946132"]},{"raw_affiliation_string":"Joint Quantum Institute, University of Maryland, College Park, MD, USA","institution_ids":["https://openalex.org/I4210151733","https://openalex.org/I66946132"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101531676","display_name":"Jiuning Hu","orcid":"https://orcid.org/0000-0001-5911-9186"},"institutions":[{"id":"https://openalex.org/I4210151733","display_name":"Joint Quantum Institute","ror":"https://ror.org/04xz38214","country_code":"US","type":"facility","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065","https://openalex.org/I4210151733","https://openalex.org/I66946132"]},{"id":"https://openalex.org/I66946132","display_name":"University of Maryland, College Park","ror":"https://ror.org/047s2c258","country_code":"US","type":"education","lineage":["https://openalex.org/I66946132"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jiuning Hu","raw_affiliation_strings":["Joint Quantum Institute, University of Maryland, College Park, MD 20742 USA","Joint Quantum Institute, University of Maryland, College Park, MD, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Joint Quantum Institute, University of Maryland, College Park, MD 20742 USA","institution_ids":["https://openalex.org/I4210151733","https://openalex.org/I66946132"]},{"raw_affiliation_string":"Joint Quantum Institute, University of Maryland, College Park, MD, USA","institution_ids":["https://openalex.org/I4210151733","https://openalex.org/I66946132"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043286311","display_name":"Dean G. Jarrett","orcid":"https://orcid.org/0000-0003-1392-423X"},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]},{"id":"https://openalex.org/I4210109969","display_name":"Physical Measurement Laboratory","ror":"https://ror.org/016s8vs02","country_code":"US","type":"government","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065","https://openalex.org/I4210109969"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Dean G. Jarrett","raw_affiliation_strings":["Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899 USA","Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, USA"],"raw_orcid":"https://orcid.org/0000-0003-1392-423X","affiliations":[{"raw_affiliation_string":"Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899 USA","institution_ids":["https://openalex.org/I4210109969","https://openalex.org/I1321296531"]},{"raw_affiliation_string":"Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, USA","institution_ids":["https://openalex.org/I4210109969","https://openalex.org/I1321296531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006474578","display_name":"David B. Newell","orcid":"https://orcid.org/0000-0002-2612-1172"},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]},{"id":"https://openalex.org/I4210109969","display_name":"Physical Measurement Laboratory","ror":"https://ror.org/016s8vs02","country_code":"US","type":"government","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065","https://openalex.org/I4210109969"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"David B. Newell","raw_affiliation_strings":["Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899 USA","Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899 USA","institution_ids":["https://openalex.org/I4210109969","https://openalex.org/I1321296531"]},{"raw_affiliation_string":"Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, USA","institution_ids":["https://openalex.org/I4210109969","https://openalex.org/I1321296531"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5078951512","display_name":"Randolph E. Elmquist","orcid":"https://orcid.org/0000-0001-9041-7966"},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]},{"id":"https://openalex.org/I4210109969","display_name":"Physical Measurement Laboratory","ror":"https://ror.org/016s8vs02","country_code":"US","type":"government","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065","https://openalex.org/I4210109969"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Randolph E. Elmquist","raw_affiliation_strings":["Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899 USA","Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, USA"],"raw_orcid":"https://orcid.org/0000-0001-9041-7966","affiliations":[{"raw_affiliation_string":"Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899 USA","institution_ids":["https://openalex.org/I4210109969","https://openalex.org/I1321296531"]},{"raw_affiliation_string":"Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, USA","institution_ids":["https://openalex.org/I4210109969","https://openalex.org/I1321296531"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":13,"corresponding_author_ids":["https://openalex.org/A5039812989"],"corresponding_institution_ids":["https://openalex.org/I1321296531","https://openalex.org/I4210109969"],"apc_list":null,"apc_paid":null,"fwci":3.1418,"has_fulltext":false,"cited_by_count":46,"citation_normalized_percentile":{"value":0.92465298,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":"68","issue":"6","first_page":"1870","last_page":"1878"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12692","display_name":"Magnetic Field Sensors Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12692","display_name":"Magnetic Field Sensors Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11993","display_name":"Atomic and Subatomic Physics Research","score":0.9958000183105469,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12510","display_name":"Magneto-Optical Properties and Applications","score":0.9950000047683716,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/graphene","display_name":"Graphene","score":0.8107644319534302},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.5832010507583618},{"id":"https://openalex.org/keywords/hall-effect","display_name":"Hall effect","score":0.47913190722465515},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.469795823097229},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.4200677275657654},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3934699296951294},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.386074036359787},{"id":"https://openalex.org/keywords/engineering-physics","display_name":"Engineering physics","score":0.35704344511032104},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3492918610572815},{"id":"https://openalex.org/keywords/condensed-matter-physics","display_name":"Condensed matter physics","score":0.333890825510025},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.30430832505226135},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2238360345363617},{"id":"https://openalex.org/keywords/electrical-resistivity-and-conductivity","display_name":"Electrical resistivity and conductivity","score":0.18254601955413818}],"concepts":[{"id":"https://openalex.org/C30080830","wikidata":"https://www.wikidata.org/wiki/Q169917","display_name":"Graphene","level":2,"score":0.8107644319534302},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.5832010507583618},{"id":"https://openalex.org/C134112204","wikidata":"https://www.wikidata.org/wiki/Q10656","display_name":"Hall effect","level":3,"score":0.47913190722465515},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.469795823097229},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.4200677275657654},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3934699296951294},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.386074036359787},{"id":"https://openalex.org/C61696701","wikidata":"https://www.wikidata.org/wiki/Q770766","display_name":"Engineering physics","level":1,"score":0.35704344511032104},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3492918610572815},{"id":"https://openalex.org/C26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","level":1,"score":0.333890825510025},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.30430832505226135},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2238360345363617},{"id":"https://openalex.org/C69990965","wikidata":"https://www.wikidata.org/wiki/Q65402698","display_name":"Electrical resistivity and conductivity","level":2,"score":0.18254601955413818}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/tim.2018.2882958","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2018.2882958","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},{"id":"pmid:31274879","is_oa":false,"landing_page_url":"https://pubmed.ncbi.nlm.nih.gov/31274879","pdf_url":null,"source":{"id":"https://openalex.org/S4306525036","display_name":"PubMed","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE transactions on instrumentation and measurement","raw_type":null},{"id":"pmh:oai:pubmedcentral.nih.gov:6604640","is_oa":true,"landing_page_url":"https://www.ncbi.nlm.nih.gov/pmc/articles/6604640","pdf_url":null,"source":{"id":"https://openalex.org/S2764455111","display_name":"PubMed Central","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Trans Instrum Meas","raw_type":"Text"}],"best_oa_location":{"id":"pmh:oai:pubmedcentral.nih.gov:6604640","is_oa":true,"landing_page_url":"https://www.ncbi.nlm.nih.gov/pmc/articles/6604640","pdf_url":null,"source":{"id":"https://openalex.org/S2764455111","display_name":"PubMed Central","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Trans Instrum Meas","raw_type":"Text"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.5899999737739563}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":22,"referenced_works":["https://openalex.org/W1025101247","https://openalex.org/W1965647794","https://openalex.org/W1978800832","https://openalex.org/W1980724492","https://openalex.org/W1991385489","https://openalex.org/W2000218650","https://openalex.org/W2003709203","https://openalex.org/W2007336997","https://openalex.org/W2038038773","https://openalex.org/W2050399681","https://openalex.org/W2122131294","https://openalex.org/W2132550532","https://openalex.org/W2414663613","https://openalex.org/W2515051361","https://openalex.org/W2620094837","https://openalex.org/W2784586728","https://openalex.org/W2799575890","https://openalex.org/W2809599325","https://openalex.org/W2883981039","https://openalex.org/W2963904554","https://openalex.org/W3105068220","https://openalex.org/W3105973609"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2606452130","https://openalex.org/W3149465128","https://openalex.org/W3196929922","https://openalex.org/W2377562106","https://openalex.org/W2081887179","https://openalex.org/W2328592354","https://openalex.org/W4321795992","https://openalex.org/W3033906315","https://openalex.org/W1578765583"],"abstract_inverted_index":{",":[0],"is":[1],"used":[2],"to":[3,5],"scale":[4],"1":[6],"k\u03a9":[7],"using":[8,38,119],"a":[9,17,99],"binary":[10],"cryogenic":[11],"current":[12,19,64],"comparator":[13,20],"(BCCC)":[14],"bridge":[15],"and":[16,53,62,79],"direct":[18],"(DCC)":[21],"bridge.":[22],"The":[23,108],"uncertainties":[24,86],"achieved":[25],"with":[26,98],"the":[27,35,75,84,88,102],"BCCC":[28,41],"are":[29,92,112,115],"such":[30],"as":[31,114],"those":[32],"obtained":[33],"in":[34,94],"state-of-the-art":[36],"measurements":[37],"GaAs-based":[39],"devices.":[40],"scaling":[42,72,90,106],"methods":[43,91],"can":[44,67],"achieve":[45],"large":[46],"resistance":[47,71],"ratios":[48,61],"of":[49,83,87,101,104],"100":[50],"or":[51],"more,":[52],"while":[54],"room":[55],"temperature":[56],"DCC":[57],"bridges":[58],"have":[59],"smaller":[60],"lower":[63],"sensitivity,":[65],"they":[66],"still":[68],"provide":[69],"alternate":[70],"paths":[73],"without":[74],"need":[76],"for":[77,118],"cryogens":[78],"superconducting":[80],"electronics.":[81],"Estimates":[82],"relative":[85],"possible":[89],"provided":[93],"this":[95],"report,":[96],"along":[97],"discussion":[100],"advantages":[103],"several":[105],"paths.":[107],"tabletop":[109],"system":[110],"limits":[111],"addressed":[113],"potential":[116],"solutions":[117],"graphene":[120],"standards":[121],"at":[122],"higher":[123],"currents.":[124]},"counts_by_year":[{"year":2025,"cited_by_count":6},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":6},{"year":2022,"cited_by_count":9},{"year":2021,"cited_by_count":6},{"year":2020,"cited_by_count":7},{"year":2019,"cited_by_count":9},{"year":2018,"cited_by_count":2}],"updated_date":"2026-05-04T08:30:34.212998","created_date":"2025-10-10T00:00:00"}