{"id":"https://openalex.org/W2904619345","doi":"https://doi.org/10.1109/tim.2018.2882929","title":"Low-Frequency AC\u2013DC Differences of a Series\u2013Parallel Circuit of Thermal Converters","display_name":"Low-Frequency AC\u2013DC Differences of a Series\u2013Parallel Circuit of Thermal Converters","publication_year":2018,"publication_date":"2018-12-13","ids":{"openalex":"https://openalex.org/W2904619345","doi":"https://doi.org/10.1109/tim.2018.2882929","mag":"2904619345"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2018.2882929","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2018.2882929","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5024388326","display_name":"Yasutaka Amagai","orcid":"https://orcid.org/0000-0001-6816-8158"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yasutaka Amagai","raw_affiliation_strings":["National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan","National Metrology Institute of Japan National Institute of Advanced Industrial Science and Technology Tsukuba Japan"],"raw_orcid":"https://orcid.org/0000-0001-6816-8158","affiliations":[{"raw_affiliation_string":"National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]},{"raw_affiliation_string":"National Metrology Institute of Japan National Institute of Advanced Industrial Science and Technology Tsukuba Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073180314","display_name":"Hiroyuki Fujiki","orcid":"https://orcid.org/0000-0001-6472-6693"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hiroyuki Fujiki","raw_affiliation_strings":["National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan","National Metrology Institute of Japan National Institute of Advanced Industrial Science and Technology Tsukuba Japan"],"raw_orcid":"https://orcid.org/0000-0001-6472-6693","affiliations":[{"raw_affiliation_string":"National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]},{"raw_affiliation_string":"National Metrology Institute of Japan National Institute of Advanced Industrial Science and Technology Tsukuba Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5023586429","display_name":"Kenjiro Okawa","orcid":"https://orcid.org/0000-0001-5324-594X"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kenjiro Okawa","raw_affiliation_strings":["National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan","National Metrology Institute of Japan National Institute of Advanced Industrial Science and Technology Tsukuba Japan"],"raw_orcid":"https://orcid.org/0000-0001-5324-594X","affiliations":[{"raw_affiliation_string":"National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]},{"raw_affiliation_string":"National Metrology Institute of Japan National Institute of Advanced Industrial Science and Technology Tsukuba Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5089866154","display_name":"Nobu\u2010Hisa Kaneko","orcid":"https://orcid.org/0000-0003-3857-7940"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Nobu-Hisa Kaneko","raw_affiliation_strings":["National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan","National Metrology Institute of Japan National Institute of Advanced Industrial Science and Technology Tsukuba Japan"],"raw_orcid":"https://orcid.org/0000-0003-3857-7940","affiliations":[{"raw_affiliation_string":"National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]},{"raw_affiliation_string":"National Metrology Institute of Japan National Institute of Advanced Industrial Science and Technology Tsukuba Japan","institution_ids":["https://openalex.org/I73613424"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I73613424"],"apc_list":{"value":2645,"currency":"USD","value_usd":2645},"apc_paid":null,"fwci":0.1999,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.5468359,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"68","issue":"6","first_page":"1907","last_page":"1912"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11222","display_name":"Magnetic Properties and Applications","score":0.9962999820709229,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13928","display_name":"Advanced Sensor Technologies Research","score":0.9959999918937683,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5791767835617065},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5735230445861816},{"id":"https://openalex.org/keywords/series-and-parallel-circuits","display_name":"Series and parallel circuits","score":0.5484413504600525},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.517869234085083},{"id":"https://openalex.org/keywords/series","display_name":"Series (stratigraphy)","score":0.513309895992279},{"id":"https://openalex.org/keywords/converters","display_name":"Converters","score":0.499680757522583},{"id":"https://openalex.org/keywords/equivalent-circuit","display_name":"Equivalent circuit","score":0.4527256488800049},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.38098227977752686},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3372909426689148},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.32761284708976746}],"concepts":[{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5791767835617065},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5735230445861816},{"id":"https://openalex.org/C95023266","wikidata":"https://www.wikidata.org/wiki/Q55738334","display_name":"Series and parallel circuits","level":3,"score":0.5484413504600525},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.517869234085083},{"id":"https://openalex.org/C143724316","wikidata":"https://www.wikidata.org/wiki/Q312468","display_name":"Series (stratigraphy)","level":2,"score":0.513309895992279},{"id":"https://openalex.org/C2778422915","wikidata":"https://www.wikidata.org/wiki/Q10302051","display_name":"Converters","level":3,"score":0.499680757522583},{"id":"https://openalex.org/C23572009","wikidata":"https://www.wikidata.org/wiki/Q964981","display_name":"Equivalent circuit","level":3,"score":0.4527256488800049},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.38098227977752686},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3372909426689148},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.32761284708976746},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2018.2882929","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2018.2882929","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.75}],"awards":[{"id":"https://openalex.org/G4063952833","display_name":"Precious Measurement of Thermoelectric Performances of single crystals using AC Harman Method","funder_award_id":"17H07399","funder_id":"https://openalex.org/F4320334764","funder_display_name":"Japan Society for the Promotion of Science"},{"id":"https://openalex.org/G8062204568","display_name":"Quantum Standards and Ultimate Precision Measurements Based on Single Electrons","funder_award_id":"18H05258","funder_id":"https://openalex.org/F4320334764","funder_display_name":"Japan Society for the Promotion of Science"}],"funders":[{"id":"https://openalex.org/F4320311508","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54"},{"id":"https://openalex.org/F4320334764","display_name":"Japan Society for the Promotion of Science","ror":"https://ror.org/00hhkn466"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":35,"referenced_works":["https://openalex.org/W1970585877","https://openalex.org/W1979514275","https://openalex.org/W1981088223","https://openalex.org/W1983976661","https://openalex.org/W1993822067","https://openalex.org/W2000449577","https://openalex.org/W2014844712","https://openalex.org/W2033388642","https://openalex.org/W2044267718","https://openalex.org/W2045940492","https://openalex.org/W2070205567","https://openalex.org/W2081579715","https://openalex.org/W2100359301","https://openalex.org/W2101272815","https://openalex.org/W2107481531","https://openalex.org/W2111327704","https://openalex.org/W2122230150","https://openalex.org/W2131899430","https://openalex.org/W2142929984","https://openalex.org/W2145967769","https://openalex.org/W2146268052","https://openalex.org/W2148478748","https://openalex.org/W2149537533","https://openalex.org/W2151094621","https://openalex.org/W2163417809","https://openalex.org/W2163724237","https://openalex.org/W2165410023","https://openalex.org/W2167606261","https://openalex.org/W2170732350","https://openalex.org/W2173680989","https://openalex.org/W2177411483","https://openalex.org/W2267171311","https://openalex.org/W2530936306","https://openalex.org/W2898849097","https://openalex.org/W2988859072"],"related_works":["https://openalex.org/W631083485","https://openalex.org/W2091387920","https://openalex.org/W2487581613","https://openalex.org/W1580399661","https://openalex.org/W4236803798","https://openalex.org/W411258524","https://openalex.org/W1996472338","https://openalex.org/W1986897651","https://openalex.org/W2141735554","https://openalex.org/W2178239133"],"abstract_inverted_index":{"A":[0,65],"series-parallel":[1,46],"connected":[2,19,47],"thermal":[3],"converter":[4],"(TC)":[5],"arranged":[6],"in":[7,50,57],"an":[8,17],"m":[9,11,43,45],"\u00d7":[10,44],"matrix":[12],"of":[13,42,68,76,88],"a":[14,62,74],"heater":[15],"and":[16,61],"m2-series":[18],"thermocouple":[20],"are":[21],"proposed":[22,34,80],"to":[23,52],"reduce":[24],"low-frequency":[25,39,70],"ac-dc":[26,40,71],"differences.":[27],"The":[28],"electrical":[29,97],"circuit":[30,35,81,98],"theory":[31],"on":[32],"the":[33,38,58,69,79,89,96],"suggests":[36],"that":[37],"differences":[41,72],"TCs":[48],"decrease":[49,87],"proportion":[51],"1/m2,":[53],"avoiding":[54],"any":[55],"degradation":[56],"output":[59,90],"voltage":[60],"time-consuming":[63],"measurement.":[64],"significant":[66],"reduction":[67],"by":[73],"factor":[75],"10":[77],"for":[78],"is":[82,93],"experimentally":[83],"demonstrated":[84],"with":[85,95],"no":[86],"voltage,":[91],"which":[92],"consistent":[94],"theory.":[99]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1}],"updated_date":"2026-08-21T09:56:20.448147","created_date":"2025-10-10T00:00:00"}