{"id":"https://openalex.org/W2901436421","doi":"https://doi.org/10.1109/tim.2018.2877954","title":"Planar Multijunction Thermal Converters With Increased Sensitivity Operated in Hermetically Sealed Housings Filled With Noble Gas","display_name":"Planar Multijunction Thermal Converters With Increased Sensitivity Operated in Hermetically Sealed Housings Filled With Noble Gas","publication_year":2018,"publication_date":"2018-11-14","ids":{"openalex":"https://openalex.org/W2901436421","doi":"https://doi.org/10.1109/tim.2018.2877954","mag":"2901436421"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2018.2877954","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2018.2877954","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5090932302","display_name":"T. Funck","orcid":"https://orcid.org/0000-0003-1917-7183"},"institutions":[{"id":"https://openalex.org/I1285933455","display_name":"Physikalisch-Technische Bundesanstalt","ror":"https://ror.org/05r3f7h03","country_code":"DE","type":"facility","lineage":["https://openalex.org/I1285933455","https://openalex.org/I4210136623"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Torsten Funck","raw_affiliation_strings":["Physikalisch-Technische Bundesanstalt, Braunschweig, Germany"],"affiliations":[{"raw_affiliation_string":"Physikalisch-Technische Bundesanstalt, Braunschweig, Germany","institution_ids":["https://openalex.org/I1285933455"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067225891","display_name":"Thomas Spiegel","orcid":"https://orcid.org/0000-0001-9258-0564"},"institutions":[{"id":"https://openalex.org/I1285933455","display_name":"Physikalisch-Technische Bundesanstalt","ror":"https://ror.org/05r3f7h03","country_code":"DE","type":"facility","lineage":["https://openalex.org/I1285933455","https://openalex.org/I4210136623"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Thomas Spiegel","raw_affiliation_strings":["Physikalisch-Technische Bundesanstalt, Braunschweig, Germany"],"affiliations":[{"raw_affiliation_string":"Physikalisch-Technische Bundesanstalt, Braunschweig, Germany","institution_ids":["https://openalex.org/I1285933455"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5016726630","display_name":"Andreas Ihring","orcid":"https://orcid.org/0000-0003-4602-9135"},"institutions":[{"id":"https://openalex.org/I2801349226","display_name":"Leibniz Institute of Photonic Technology","ror":"https://ror.org/02se0t636","country_code":"DE","type":"facility","lineage":["https://openalex.org/I2801349226","https://openalex.org/I315704651"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Andreas Ihring","raw_affiliation_strings":["Leibniz-Institut f\u00fcr Photonische Technologien e.V., Jena, Germany"],"affiliations":[{"raw_affiliation_string":"Leibniz-Institut f\u00fcr Photonische Technologien e.V., Jena, Germany","institution_ids":["https://openalex.org/I2801349226"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5090932302"],"corresponding_institution_ids":["https://openalex.org/I1285933455"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.1229502,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":"68","issue":"6","first_page":"2003","last_page":"2006"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9908999800682068,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9908999800682068,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10369","display_name":"Advanced MEMS and NEMS Technologies","score":0.9803000092506409,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11449","display_name":"Mechanical and Optical Resonators","score":0.9781000018119812,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/xenon","display_name":"Xenon","score":0.817245364189148},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.7145733833312988},{"id":"https://openalex.org/keywords/krypton","display_name":"Krypton","score":0.6615644693374634},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.5639722943305969},{"id":"https://openalex.org/keywords/planar","display_name":"Planar","score":0.5515996813774109},{"id":"https://openalex.org/keywords/noble-gas","display_name":"Noble gas","score":0.550293505191803},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5079529881477356},{"id":"https://openalex.org/keywords/thermal","display_name":"Thermal","score":0.48990243673324585},{"id":"https://openalex.org/keywords/converters","display_name":"Converters","score":0.4838827848434448},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4715098440647125},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.4655300974845886},{"id":"https://openalex.org/keywords/thermal-resistance","display_name":"Thermal resistance","score":0.4535660445690155},{"id":"https://openalex.org/keywords/nuclear-engineering","display_name":"Nuclear engineering","score":0.36470863223075867},{"id":"https://openalex.org/keywords/atomic-physics","display_name":"Atomic physics","score":0.2171962559223175},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.1595436930656433},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1236003041267395},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.10403665900230408},{"id":"https://openalex.org/keywords/thermodynamics","display_name":"Thermodynamics","score":0.07299050688743591}],"concepts":[{"id":"https://openalex.org/C548442186","wikidata":"https://www.wikidata.org/wiki/Q1106","display_name":"Xenon","level":2,"score":0.817245364189148},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7145733833312988},{"id":"https://openalex.org/C521692839","wikidata":"https://www.wikidata.org/wiki/Q888","display_name":"Krypton","level":3,"score":0.6615644693374634},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.5639722943305969},{"id":"https://openalex.org/C134786449","wikidata":"https://www.wikidata.org/wiki/Q3391255","display_name":"Planar","level":2,"score":0.5515996813774109},{"id":"https://openalex.org/C121530826","wikidata":"https://www.wikidata.org/wiki/Q19609","display_name":"Noble gas","level":2,"score":0.550293505191803},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5079529881477356},{"id":"https://openalex.org/C204530211","wikidata":"https://www.wikidata.org/wiki/Q752823","display_name":"Thermal","level":2,"score":0.48990243673324585},{"id":"https://openalex.org/C2778422915","wikidata":"https://www.wikidata.org/wiki/Q10302051","display_name":"Converters","level":3,"score":0.4838827848434448},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4715098440647125},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4655300974845886},{"id":"https://openalex.org/C137693562","wikidata":"https://www.wikidata.org/wiki/Q899628","display_name":"Thermal resistance","level":3,"score":0.4535660445690155},{"id":"https://openalex.org/C116915560","wikidata":"https://www.wikidata.org/wiki/Q83504","display_name":"Nuclear engineering","level":1,"score":0.36470863223075867},{"id":"https://openalex.org/C184779094","wikidata":"https://www.wikidata.org/wiki/Q26383","display_name":"Atomic physics","level":1,"score":0.2171962559223175},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.1595436930656433},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1236003041267395},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.10403665900230408},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.07299050688743591},{"id":"https://openalex.org/C121684516","wikidata":"https://www.wikidata.org/wiki/Q7600677","display_name":"Computer graphics (images)","level":1,"score":0.0},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2018.2877954","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2018.2877954","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W1993625499","https://openalex.org/W2033127617","https://openalex.org/W2098710838","https://openalex.org/W2145967769","https://openalex.org/W2899471489"],"related_works":["https://openalex.org/W3123319101","https://openalex.org/W2903323862","https://openalex.org/W2049439356","https://openalex.org/W2081653096","https://openalex.org/W2348291157","https://openalex.org/W2602253370","https://openalex.org/W2824996696","https://openalex.org/W2841351343","https://openalex.org/W2831069895","https://openalex.org/W2397137259","https://openalex.org/W2158488588","https://openalex.org/W2852098256","https://openalex.org/W2538824318","https://openalex.org/W3000327830","https://openalex.org/W2242123440","https://openalex.org/W3150666947","https://openalex.org/W2096888120","https://openalex.org/W1999815329","https://openalex.org/W2002503190","https://openalex.org/W2843398913"],"abstract_inverted_index":{"The":[0,21],"sensitivity":[1,34],"of":[2,32,41,65],"planar":[3],"multijunction":[4],"thermal":[5],"converters":[6],"was":[7,23,35],"significantly":[8],"increased":[9],"by":[10],"filling":[11],"the":[12,33,38,42,58,69],"housing":[13],"with":[14,68],"noble":[15,70],"gasses,":[16],"preferably":[17],"xenon":[18],"or":[19],"krypton.":[20],"performance":[22],"observed":[24],"for":[25],"almost":[26,79],"two":[27],"years,":[28],"and":[29,51],"no":[30],"degradation":[31],"found.":[36],"Also,":[37],"frequency":[39],"response":[40],"ac-dc":[43,73],"transfer":[44,74],"difference":[45],"remains":[46],"unchanged":[47],"at":[48,60,75],"high":[49],"frequencies":[50],"even":[52],"improves":[53],"below":[54],"40":[55],"Hz.":[56],"Using":[57],"lowest":[59],"present":[61],"manufacturable":[62],"heater":[63],"resistance":[64],"90":[66],"\u03a9":[67],"gas":[71],"filling,":[72],"voltages":[76],"down":[77],"to":[78,83],"70":[80],"mV":[81,86],"compared":[82],"about":[84],"100":[85],"in":[87],"air":[88],"becomes":[89],"possible.":[90]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}