{"id":"https://openalex.org/W2938692364","doi":"https://doi.org/10.1109/tim.2018.2869438","title":"An Opening Profile Recognition Method for Magnetic Flux Leakage Signals of Defect","display_name":"An Opening Profile Recognition Method for Magnetic Flux Leakage Signals of Defect","publication_year":2018,"publication_date":"2018-09-26","ids":{"openalex":"https://openalex.org/W2938692364","doi":"https://doi.org/10.1109/tim.2018.2869438","mag":"2938692364"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2018.2869438","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2018.2869438","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://durham-repository.worktribe.com/output/1319033","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100432868","display_name":"Songling Huang","orcid":"https://orcid.org/0000-0003-4442-2566"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Songling Huang","raw_affiliation_strings":["Department of Electrical Engineering, Tsinghua University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0003-4442-2566","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017470096","display_name":"Lisha Peng","orcid":"https://orcid.org/0000-0002-7315-2692"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lisha Peng","raw_affiliation_strings":["Department of Electrical Engineering, Tsinghua University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100434858","display_name":"Qing Wang","orcid":"https://orcid.org/0000-0002-7631-129X"},"institutions":[{"id":"https://openalex.org/I190082696","display_name":"Durham University","ror":"https://ror.org/01v29qb04","country_code":"GB","type":"education","lineage":["https://openalex.org/I190082696"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Qing Wang","raw_affiliation_strings":["Department of Engineering, Durham University, Durham, U.K"],"raw_orcid":"https://orcid.org/0000-0002-7631-129X","affiliations":[{"raw_affiliation_string":"Department of Engineering, Durham University, Durham, U.K","institution_ids":["https://openalex.org/I190082696"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100377060","display_name":"Shen Wang","orcid":"https://orcid.org/0000-0001-5140-648X"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shen Wang","raw_affiliation_strings":["Department of Electrical Engineering, Tsinghua University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0001-5140-648X","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5009949085","display_name":"Wei Zhao","orcid":"https://orcid.org/0000-0002-3679-6165"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wei Zhao","raw_affiliation_strings":["Department of Electrical Engineering, Tsinghua University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-3679-6165","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":4.9573,"has_fulltext":false,"cited_by_count":55,"citation_normalized_percentile":{"value":0.95829218,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":95,"max":99},"biblio":{"volume":"68","issue":"6","first_page":"2229","last_page":"2236"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10834","display_name":"Welding Techniques and Residual Stresses","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11222","display_name":"Magnetic Properties and Applications","score":0.9926000237464905,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/magnetic-flux-leakage","display_name":"Magnetic flux leakage","score":0.825766921043396},{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.6719813346862793},{"id":"https://openalex.org/keywords/magnetic-flux","display_name":"Magnetic flux","score":0.530969500541687},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4737459123134613},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4060063660144806},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.39627304673194885},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.394270658493042},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3471371829509735},{"id":"https://openalex.org/keywords/magnetic-field","display_name":"Magnetic field","score":0.2981727719306946},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.28209537267684937},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2571144104003906},{"id":"https://openalex.org/keywords/magnet","display_name":"Magnet","score":0.17388439178466797}],"concepts":[{"id":"https://openalex.org/C20892748","wikidata":"https://www.wikidata.org/wiki/Q4390394","display_name":"Magnetic flux leakage","level":3,"score":0.825766921043396},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.6719813346862793},{"id":"https://openalex.org/C157479481","wikidata":"https://www.wikidata.org/wiki/Q177831","display_name":"Magnetic flux","level":3,"score":0.530969500541687},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4737459123134613},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4060063660144806},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.39627304673194885},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.394270658493042},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3471371829509735},{"id":"https://openalex.org/C115260700","wikidata":"https://www.wikidata.org/wiki/Q11408","display_name":"Magnetic field","level":2,"score":0.2981727719306946},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.28209537267684937},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2571144104003906},{"id":"https://openalex.org/C16389437","wikidata":"https://www.wikidata.org/wiki/Q11421","display_name":"Magnet","level":2,"score":0.17388439178466797},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/tim.2018.2869438","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2018.2869438","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},{"id":"pmh:oai:dro.dur.ac.uk.OAI2:26289","is_oa":false,"landing_page_url":"http://dro.dur.ac.uk/26289/","pdf_url":null,"source":{"id":"https://openalex.org/S4377196258","display_name":"Durham Research Online (Durham University)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I190082696","host_organization_name":"Durham University","host_organization_lineage":["https://openalex.org/I190082696"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":"IEEE transactions on instrumentation and measurement, 2019, Vol.68(6), pp.2229-2236 [Peer Reviewed Journal]","raw_type":"Article"},{"id":"pmh:oai:durham-repository.worktribe.com:1319033","is_oa":true,"landing_page_url":"https://durham-repository.worktribe.com/output/1319033","pdf_url":null,"source":{"id":"https://openalex.org/S4306400188","display_name":"Durham Research Online (Durham University)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I190082696","host_organization_name":"Durham University","host_organization_lineage":["https://openalex.org/I190082696"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"acceptedVersion"}],"best_oa_location":{"id":"pmh:oai:durham-repository.worktribe.com:1319033","is_oa":true,"landing_page_url":"https://durham-repository.worktribe.com/output/1319033","pdf_url":null,"source":{"id":"https://openalex.org/S4306400188","display_name":"Durham Research Online (Durham University)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I190082696","host_organization_name":"Durham University","host_organization_lineage":["https://openalex.org/I190082696"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"acceptedVersion"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G7735543159","display_name":null,"funder_award_id":"51677093","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W2031713474","https://openalex.org/W2041053548","https://openalex.org/W2101676717","https://openalex.org/W2108321865","https://openalex.org/W2117480787","https://openalex.org/W2120417348","https://openalex.org/W2126827132","https://openalex.org/W2144658323","https://openalex.org/W2145023731","https://openalex.org/W2149739902","https://openalex.org/W2189709317","https://openalex.org/W2329054948","https://openalex.org/W2554156454","https://openalex.org/W2595750449","https://openalex.org/W2763316552","https://openalex.org/W2794714840","https://openalex.org/W2899339223","https://openalex.org/W3083443883","https://openalex.org/W4233226708"],"related_works":["https://openalex.org/W803998858","https://openalex.org/W3005508687","https://openalex.org/W2142368441","https://openalex.org/W4383333701","https://openalex.org/W2120417348","https://openalex.org/W2993285375","https://openalex.org/W2045234003","https://openalex.org/W2015574894","https://openalex.org/W2972622007","https://openalex.org/W3161862903"],"abstract_inverted_index":{"The":[0,17,128],"defect":[1,41,89,201],"opening":[2,90,118,129,169],"profile":[3,91,97,119,130],"recognition":[4,131,145,183],"is":[5,68,85,110,120,133],"of":[6,54,79,106,143,147,162],"great":[7],"concern":[8],"in":[9,136],"the":[10,40,44,52,55,59,64,75,80,88,95,99,104,107,113,117,141,144,148,159,163,168,174,178,189,200],"magnetic":[11],"flux":[12],"leakage":[13],"(MFL)":[14],"measurement":[15],"technique.":[16],"detected":[18],"spatial":[19],"MFL":[20,61],"signal":[21,67,192],"has":[22,47],"three":[23],"components:":[24],"horizontal,":[25],"vertical,":[26],"and":[27,31,58,116,152],"normal":[28,32,102],"components.":[29],"Horizontal":[30],"component":[33,46,66,82,176,191],"signals":[34],"are":[35,155],"commonly":[36],"used":[37],"to":[38,139,157],"estimate":[39],"profile,":[42],"while":[43],"vertical":[45,65,81,114,190],"always":[48],"been":[49],"neglected.":[50],"With":[51],"development":[53],"high":[56],"resolution":[57],"3-D":[60],"testing":[62],"techniques,":[63],"becoming":[69],"more":[70],"available.":[71],"This":[72],"paper":[73,138],"analyzes":[74],"essential":[76],"right-angle":[77,126],"features":[78],"signal,":[83,177],"which":[84,185],"useful":[86,197],"for":[87,199],"recognition.":[92],"After":[93],"obtaining":[94],"initial":[96],"from":[98,112],"horizontal":[100,175],"or":[101],"component,":[103,115],"types":[105],"right":[108],"angle":[109],"identified":[111],"further":[121],"optimized":[122],"based":[123],"on":[124],"these":[125],"features.":[127],"method":[132,180],"put":[134],"forward":[135],"this":[137],"improve":[140],"accuracy":[142],"result":[146],"defect.":[149],"Both":[150],"simulation":[151],"experimental":[153],"tests":[154],"conducted":[156],"verify":[158],"good":[160],"performance":[161],"proposed":[164,179],"method.":[165],"Compared":[166],"with":[167],"profiles":[170],"recognized":[171],"merely":[172],"by":[173],"shows":[181],"better":[182],"results,":[184],"also":[186,194],"validates":[187],"that":[188],"can":[193],"be":[195],"a":[196],"information":[198],"estimation.":[202]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":5},{"year":2024,"cited_by_count":9},{"year":2023,"cited_by_count":6},{"year":2022,"cited_by_count":5},{"year":2021,"cited_by_count":10},{"year":2020,"cited_by_count":15},{"year":2019,"cited_by_count":4}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}