{"id":"https://openalex.org/W2887975641","doi":"https://doi.org/10.1109/tim.2018.2858062","title":"Fast Defect Inspection Based on Data-Driven Photometric Stereo","display_name":"Fast Defect Inspection Based on Data-Driven Photometric Stereo","publication_year":2018,"publication_date":"2018-08-09","ids":{"openalex":"https://openalex.org/W2887975641","doi":"https://doi.org/10.1109/tim.2018.2858062","mag":"2887975641"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2018.2858062","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2018.2858062","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5073798631","display_name":"Mingjun Ren","orcid":"https://orcid.org/0000-0001-8796-5355"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Mingjun Ren","raw_affiliation_strings":["State Key Laboratory of Mechanical System and Vibration, School of Mechanical Engineering, Shanghai Jiao Tong University, Shanghai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Mechanical System and Vibration, School of Mechanical Engineering, Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100442264","display_name":"Xi Wang","orcid":"https://orcid.org/0000-0002-5632-3146"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xi Wang","raw_affiliation_strings":["State Key Laboratory of Mechanical System and Vibration, School of Mechanical Engineering, Shanghai Jiao Tong University, Shanghai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Mechanical System and Vibration, School of Mechanical Engineering, Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5045181518","display_name":"Gaobo Xiao","orcid":"https://orcid.org/0000-0002-5494-722X"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Gaobo Xiao","raw_affiliation_strings":["State Key Laboratory of Mechanical System and Vibration, School of Mechanical Engineering, Shanghai Jiao Tong University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0002-5494-722X","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Mechanical System and Vibration, School of Mechanical Engineering, Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103218616","display_name":"Minghan Chen","orcid":"https://orcid.org/0009-0008-8240-1516"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Minghan Chen","raw_affiliation_strings":["State Key Laboratory of Mechanical System and Vibration, School of Mechanical Engineering, Shanghai Jiao Tong University, Shanghai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Mechanical System and Vibration, School of Mechanical Engineering, Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5079645279","display_name":"Lin Fu","orcid":"https://orcid.org/0000-0002-9368-8881"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lin Fu","raw_affiliation_strings":["State Key Laboratory of Mechanical System and Vibration, School of Mechanical Engineering, Shanghai Jiao Tong University, Shanghai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Mechanical System and Vibration, School of Mechanical Engineering, Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I183067930"],"apc_list":null,"apc_paid":null,"fwci":2.7768,"has_fulltext":false,"cited_by_count":38,"citation_normalized_percentile":{"value":0.91772589,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":95,"max":99},"biblio":{"volume":"68","issue":"4","first_page":"1148","last_page":"1156"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11211","display_name":"3D Surveying and Cultural Heritage","score":0.994700014591217,"subfield":{"id":"https://openalex.org/subfields/1907","display_name":"Geology"},"field":{"id":"https://openalex.org/fields/19","display_name":"Earth and Planetary Sciences"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/photometric-stereo","display_name":"Photometric stereo","score":0.860846996307373},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.5835739970207214},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.577155590057373},{"id":"https://openalex.org/keywords/normal","display_name":"Normal","score":0.5530501008033752},{"id":"https://openalex.org/keywords/bidirectional-reflectance-distribution-function","display_name":"Bidirectional reflectance distribution function","score":0.5489639639854431},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4849531948566437},{"id":"https://openalex.org/keywords/gaussian","display_name":"Gaussian","score":0.45069438219070435},{"id":"https://openalex.org/keywords/reflectivity","display_name":"Reflectivity","score":0.43039679527282715},{"id":"https://openalex.org/keywords/surface","display_name":"Surface (topology)","score":0.430254191160202},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.3790607452392578},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.24883407354354858},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.16754284501075745},{"id":"https://openalex.org/keywords/geometry","display_name":"Geometry","score":0.13754311203956604},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.13206273317337036}],"concepts":[{"id":"https://openalex.org/C44365914","wikidata":"https://www.wikidata.org/wiki/Q17120636","display_name":"Photometric stereo","level":3,"score":0.860846996307373},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.5835739970207214},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.577155590057373},{"id":"https://openalex.org/C118732077","wikidata":"https://www.wikidata.org/wiki/Q273176","display_name":"Normal","level":3,"score":0.5530501008033752},{"id":"https://openalex.org/C151596937","wikidata":"https://www.wikidata.org/wiki/Q856980","display_name":"Bidirectional reflectance distribution function","level":3,"score":0.5489639639854431},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4849531948566437},{"id":"https://openalex.org/C163716315","wikidata":"https://www.wikidata.org/wiki/Q901177","display_name":"Gaussian","level":2,"score":0.45069438219070435},{"id":"https://openalex.org/C108597893","wikidata":"https://www.wikidata.org/wiki/Q663650","display_name":"Reflectivity","level":2,"score":0.43039679527282715},{"id":"https://openalex.org/C2776799497","wikidata":"https://www.wikidata.org/wiki/Q484298","display_name":"Surface (topology)","level":2,"score":0.430254191160202},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.3790607452392578},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.24883407354354858},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.16754284501075745},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.13754311203956604},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.13206273317337036},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2018.2858062","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2018.2858062","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G6782194025","display_name":null,"funder_award_id":"51675456","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G7823825979","display_name":null,"funder_award_id":"51505404","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320326931","display_name":"State Key Laboratory of Precision Measurement Technology and Instruments","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":37,"referenced_works":["https://openalex.org/W182144941","https://openalex.org/W1969520253","https://openalex.org/W1975089519","https://openalex.org/W1975931458","https://openalex.org/W1978356057","https://openalex.org/W1990238513","https://openalex.org/W1994005439","https://openalex.org/W1997068544","https://openalex.org/W2028349249","https://openalex.org/W2029113190","https://openalex.org/W2038623783","https://openalex.org/W2054063078","https://openalex.org/W2060375578","https://openalex.org/W2063042505","https://openalex.org/W2069179956","https://openalex.org/W2078087367","https://openalex.org/W2085608034","https://openalex.org/W2121649761","https://openalex.org/W2125478250","https://openalex.org/W2150810898","https://openalex.org/W2154143825","https://openalex.org/W2155669845","https://openalex.org/W2165192967","https://openalex.org/W2212150711","https://openalex.org/W2398534284","https://openalex.org/W2418691539","https://openalex.org/W2474450142","https://openalex.org/W2525143304","https://openalex.org/W2589306531","https://openalex.org/W2728074186","https://openalex.org/W2736973763","https://openalex.org/W2740069972","https://openalex.org/W2740960812","https://openalex.org/W2752586438","https://openalex.org/W2766067961","https://openalex.org/W2964113692","https://openalex.org/W3151597212"],"related_works":["https://openalex.org/W1554604122","https://openalex.org/W2158018118","https://openalex.org/W3194234974","https://openalex.org/W2744088300","https://openalex.org/W2103381853","https://openalex.org/W2122157311","https://openalex.org/W2078488576","https://openalex.org/W3040624984","https://openalex.org/W1866381601","https://openalex.org/W1506902333"],"abstract_inverted_index":{"Fast":[0],"inspection":[1,60],"of":[2,12,29,61,87,111,126,155,167,182,196],"a":[3,6,23,27,34,127],"defect":[4],"is":[5,33,72,170],"challenging":[7],"task":[8,39],"in":[9,107,159,200],"mass":[10],"production":[11],"curved":[13,204],"surfaces,":[14],"and":[15,54,67,121,143,153,189],"photometric":[16],"stereo":[17],"(PS)":[18],"utilizing":[19],"multiple":[20],"images":[21],"from":[22],"single":[24],"camera":[25],"under":[26,117],"number":[28],"different":[30,118],"illumination":[31],"directions":[32,120],"promising":[35],"technique":[36,57],"for":[37],"this":[38],"due":[40],"to":[41,45,58,81],"its":[42],"high":[43,65],"sensitivity":[44],"surface":[46,102,128,160,165,184],"normal":[47,103,161,166],"perturbations.":[48],"This":[49],"paper":[50],"adapts":[51],"conventional":[52],"PS":[53,71],"extends":[55],"the":[56,59,76,83,97,101,122,136,150,156,164,168,172,180,183,194,197],"non-Lambertian":[62,147,205],"surfaces":[63],"with":[64,132,146],"accuracy":[66,152],"efficiency.":[68],"A":[69],"data-driven":[70],"presented":[73],"by":[74,177],"establishing":[75],"Gaussian":[77],"process":[78],"(GP)":[79],"model":[80],"represent":[82],"nonlinear":[84],"reflectance":[85,93,113],"behavior":[86],"various":[88],"materials":[89,148],"based":[90],"on":[91,135,187,203],"measured":[92],"data":[94,141],"sets.":[95],"With":[96],"trained":[98],"GP":[99],"model,":[100],"can":[104,174],"be":[105,175],"estimated":[106],"two":[108],"steps:":[109],"prediction":[110],"bidirectional":[112],"distribution":[114],"function":[115],"values":[116],"light":[119],"subsequent":[123],"least-squares":[124],"estimation":[125],"normal.":[129,185],"Comparison":[130],"tests":[131],"other":[133],"algorithms":[134],"Mitsubishi":[137],"Electric":[138],"Research":[139],"Laboratories":[140],"set":[142],"real":[144],"workpieces":[145,192],"show":[149],"superior":[151],"efficiency":[154],"proposed":[157,198],"method":[158],"estimation.":[162],"After":[163],"workpiece":[169],"recovered,":[171],"defects":[173,202],"detected":[176],"filtering":[178],"out":[179],"perturbation":[181],"Experiments":[186],"steel":[188],"glossy":[190],"polyester":[191],"validate":[193],"efficacy":[195],"approach":[199],"detecting":[201],"surfaces.":[206]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":9},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":7},{"year":2022,"cited_by_count":6},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":5},{"year":2019,"cited_by_count":3}],"updated_date":"2026-06-26T08:34:08.712188","created_date":"2025-10-10T00:00:00"}