{"id":"https://openalex.org/W2806945578","doi":"https://doi.org/10.1109/tim.2018.2838858","title":"Modeling and Validation of Fixture-Induced Error for Impedance Measurements","display_name":"Modeling and Validation of Fixture-Induced Error for Impedance Measurements","publication_year":2018,"publication_date":"2018-06-08","ids":{"openalex":"https://openalex.org/W2806945578","doi":"https://doi.org/10.1109/tim.2018.2838858","mag":"2806945578"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2018.2838858","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2018.2838858","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5089814042","display_name":"Blake W. Nelson","orcid":"https://orcid.org/0000-0003-3167-2398"},"institutions":[{"id":"https://openalex.org/I17301866","display_name":"University of Alabama","ror":"https://ror.org/03xrrjk67","country_code":"US","type":"education","lineage":["https://openalex.org/I17301866"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Blake W. Nelson","raw_affiliation_strings":["Department of Electrical and Computer Engineering, The University of Alabama, Tuscaloosa, AL, USA"],"raw_orcid":"https://orcid.org/0000-0003-3167-2398","affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, The University of Alabama, Tuscaloosa, AL, USA","institution_ids":["https://openalex.org/I17301866"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054233675","display_name":"Andrew N. Lemmon","orcid":"https://orcid.org/0000-0002-3934-3735"},"institutions":[{"id":"https://openalex.org/I17301866","display_name":"University of Alabama","ror":"https://ror.org/03xrrjk67","country_code":"US","type":"education","lineage":["https://openalex.org/I17301866"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Andrew N. Lemmon","raw_affiliation_strings":["Department of Electrical and Computer Engineering, The University of Alabama, Tuscaloosa, AL, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, The University of Alabama, Tuscaloosa, AL, USA","institution_ids":["https://openalex.org/I17301866"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5055507066","display_name":"Brian T. DeBoi","orcid":"https://orcid.org/0000-0002-3774-990X"},"institutions":[{"id":"https://openalex.org/I17301866","display_name":"University of Alabama","ror":"https://ror.org/03xrrjk67","country_code":"US","type":"education","lineage":["https://openalex.org/I17301866"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Brian T. DeBoi","raw_affiliation_strings":["Department of Electrical and Computer Engineering, The University of Alabama, Tuscaloosa, AL, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, The University of Alabama, Tuscaloosa, AL, USA","institution_ids":["https://openalex.org/I17301866"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5027409359","display_name":"Todd J. Freeborn","orcid":"https://orcid.org/0000-0001-9979-7301"},"institutions":[{"id":"https://openalex.org/I17301866","display_name":"University of Alabama","ror":"https://ror.org/03xrrjk67","country_code":"US","type":"education","lineage":["https://openalex.org/I17301866"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Todd J. Freeborn","raw_affiliation_strings":["Department of Electrical and Computer Engineering, The University of Alabama, Tuscaloosa, AL, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, The University of Alabama, Tuscaloosa, AL, USA","institution_ids":["https://openalex.org/I17301866"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I17301866"],"apc_list":null,"apc_paid":null,"fwci":0.9166,"has_fulltext":false,"cited_by_count":17,"citation_normalized_percentile":{"value":0.76166245,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"68","issue":"1","first_page":"129","last_page":"137"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9965000152587891,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fixture","display_name":"Fixture","score":0.860438346862793},{"id":"https://openalex.org/keywords/test-fixture","display_name":"Test fixture","score":0.8259518146514893},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.7355390787124634},{"id":"https://openalex.org/keywords/observational-error","display_name":"Observational error","score":0.6607709527015686},{"id":"https://openalex.org/keywords/resistor","display_name":"Resistor","score":0.6374300122261047},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.5798820853233337},{"id":"https://openalex.org/keywords/measurement-uncertainty","display_name":"Measurement uncertainty","score":0.56095951795578},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4317566156387329},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.41440004110336304},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.41067641973495483},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3297969698905945},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.14898619055747986},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.12718191742897034},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.12106889486312866},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.11980560421943665}],"concepts":[{"id":"https://openalex.org/C2781122048","wikidata":"https://www.wikidata.org/wiki/Q15983064","display_name":"Fixture","level":2,"score":0.860438346862793},{"id":"https://openalex.org/C2778502540","wikidata":"https://www.wikidata.org/wiki/Q1141613","display_name":"Test fixture","level":2,"score":0.8259518146514893},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.7355390787124634},{"id":"https://openalex.org/C19619285","wikidata":"https://www.wikidata.org/wiki/Q196372","display_name":"Observational error","level":2,"score":0.6607709527015686},{"id":"https://openalex.org/C137488568","wikidata":"https://www.wikidata.org/wiki/Q5321","display_name":"Resistor","level":3,"score":0.6374300122261047},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.5798820853233337},{"id":"https://openalex.org/C137209882","wikidata":"https://www.wikidata.org/wiki/Q1403517","display_name":"Measurement uncertainty","level":2,"score":0.56095951795578},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4317566156387329},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.41440004110336304},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.41067641973495483},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3297969698905945},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.14898619055747986},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.12718191742897034},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.12106889486312866},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.11980560421943665},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2018.2838858","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2018.2838858","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G2455479983","display_name":null,"funder_award_id":"N000141612940","funder_id":"https://openalex.org/F4320337345","funder_display_name":"Office of Naval Research"}],"funders":[{"id":"https://openalex.org/F4320337345","display_name":"Office of Naval Research","ror":"https://ror.org/00rk2pe57"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W1826593932","https://openalex.org/W1937005195","https://openalex.org/W1975165549","https://openalex.org/W2012773427","https://openalex.org/W2043927476","https://openalex.org/W2049969900","https://openalex.org/W2107281124","https://openalex.org/W2108221118","https://openalex.org/W2113803706","https://openalex.org/W2116494573","https://openalex.org/W2135551595","https://openalex.org/W2142302963","https://openalex.org/W2261452446","https://openalex.org/W2516008859","https://openalex.org/W2566076328","https://openalex.org/W2966253764","https://openalex.org/W3003844013","https://openalex.org/W6692890397","https://openalex.org/W6730887822","https://openalex.org/W6766657804"],"related_works":["https://openalex.org/W2520989350","https://openalex.org/W2528338088","https://openalex.org/W2043574796","https://openalex.org/W2122638535","https://openalex.org/W2392619146","https://openalex.org/W2114914214","https://openalex.org/W1917079085","https://openalex.org/W4313176842","https://openalex.org/W2095679624","https://openalex.org/W2575395363"],"abstract_inverted_index":{"Measuring":[0],"impedance":[1,76],"accurately":[2],"requires":[3],"dedicated":[4],"fixturing":[5],"to":[6,15,33,39,99,124],"match":[7],"the":[8,11,16,19,44,55,72,88,101,106,133],"geometry":[9],"of":[10,18,41,46,57,87,110],"device":[12],"under":[13],"test":[14,79,114],"ports":[17],"instrument.":[20],"These":[21],"fixtures":[22],"introduce":[23],"error":[24,36,73,103,109,134],"into":[25,75],"collected":[26],"measurements":[27,86],"which":[28],"is":[29,116],"rarely":[30],"acknowledged.":[31],"Failure":[32],"quantify":[34,100],"measurement":[35,47],"can":[37,131],"lead":[38],"over-estimation":[40],"accuracy,":[42],"increase":[43,54],"difficulty":[45],"comparisons":[48],"taken":[49],"with":[50,120],"different":[51],"fixtures,":[52],"and":[53,61,70,90,118],"risk":[56],"inappropriate":[58],"fixture":[59,115],"selection":[60],"calibration.":[62],"This":[63,128],"paper":[64],"presents":[65],"a":[66,96,111],"methodology":[67],"for":[68],"characterizing":[69],"modeling":[71],"introduced":[74,104,135],"data":[77],"by":[78,105,136],"fixtures.":[80,140],"The":[81,108],"proposed":[82],"method":[83],"uses":[84],"direct":[85],"open-":[89],"short-calibration":[91],"standards":[92],"as":[93,95],"well":[94],"precision":[97],"resistor":[98],"total":[102],"fixture.":[107],"commercially":[112],"available":[113],"studied":[117],"compared":[119],"its":[121],"published":[122],"values":[123],"validate":[125],"this":[126],"method.":[127],"validated":[129],"approach":[130],"model":[132],"commercial":[137],"or":[138],"custom":[139]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":4},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":3}],"updated_date":"2026-06-26T08:34:08.712188","created_date":"2025-10-10T00:00:00"}