{"id":"https://openalex.org/W2805592207","doi":"https://doi.org/10.1109/tim.2018.2838198","title":"Time-Variant In-Circuit Impedance Monitoring Based on the Inductive Coupling Method","display_name":"Time-Variant In-Circuit Impedance Monitoring Based on the Inductive Coupling Method","publication_year":2018,"publication_date":"2018-06-05","ids":{"openalex":"https://openalex.org/W2805592207","doi":"https://doi.org/10.1109/tim.2018.2838198","mag":"2805592207"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2018.2838198","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2018.2838198","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://dr.ntu.edu.sg/bitstream/10356/90257/2/Time-Variant%20In-Circuit%20Impedance%20Monitoring%20Based%20on%20the%20Inductive%20Coupling%20Method.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5067695900","display_name":"Zhenyu Zhao","orcid":"https://orcid.org/0000-0003-1501-4272"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":true,"raw_author_name":"Zhenyu Zhao","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058488059","display_name":"Kye Yak See","orcid":"https://orcid.org/0000-0003-2452-7627"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Kye-Yak See","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109163672","display_name":"Eng-Kee Chua","orcid":null},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Eng-Kee Chua","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5027462583","display_name":"Arun Shankar Narayanan","orcid":"https://orcid.org/0000-0003-3282-6360"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Arun Shankar Narayanan","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5026057056","display_name":"Wayne Chen","orcid":null},"institutions":[{"id":"https://openalex.org/I4210095327","display_name":"Singapore Maritime Institute","ror":"https://ror.org/00p86m346","country_code":"SG","type":"facility","lineage":["https://openalex.org/I4210095327"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Wayne Chen","raw_affiliation_strings":["SMRT Corporation Ltd., Singapore"],"affiliations":[{"raw_affiliation_string":"SMRT Corporation Ltd., Singapore","institution_ids":["https://openalex.org/I4210095327"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5017672644","display_name":"Arjuna Weerasinghe","orcid":"https://orcid.org/0000-0002-0670-7184"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Arjuna Weerasinghe","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5067695900"],"corresponding_institution_ids":["https://openalex.org/I172675005"],"apc_list":null,"apc_paid":null,"fwci":2.3175,"has_fulltext":true,"cited_by_count":44,"citation_normalized_percentile":{"value":0.89048461,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":"68","issue":"1","first_page":"169","last_page":"176"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.5946176648139954},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5446861982345581},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4859265387058258},{"id":"https://openalex.org/keywords/coupling","display_name":"Coupling (piping)","score":0.47639670968055725},{"id":"https://openalex.org/keywords/measure","display_name":"Measure (data warehouse)","score":0.46414199471473694},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4340149760246277},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.4184481203556061},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3562292456626892}],"concepts":[{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.5946176648139954},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5446861982345581},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4859265387058258},{"id":"https://openalex.org/C131584629","wikidata":"https://www.wikidata.org/wiki/Q4308705","display_name":"Coupling (piping)","level":2,"score":0.47639670968055725},{"id":"https://openalex.org/C2780009758","wikidata":"https://www.wikidata.org/wiki/Q6804172","display_name":"Measure (data warehouse)","level":2,"score":0.46414199471473694},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4340149760246277},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.4184481203556061},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3562292456626892},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tim.2018.2838198","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2018.2838198","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},{"id":"pmh:oai:dr.ntu.edu.sg:10356/90257","is_oa":true,"landing_page_url":"http://hdl.handle.net/10220/48458","pdf_url":"https://dr.ntu.edu.sg/bitstream/10356/90257/2/Time-Variant%20In-Circuit%20Impedance%20Monitoring%20Based%20on%20the%20Inductive%20Coupling%20Method.pdf","source":{"id":"https://openalex.org/S4306402609","display_name":"DR-NTU (Nanyang Technological University)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I172675005","host_organization_name":"Nanyang Technological University","host_organization_lineage":["https://openalex.org/I172675005"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Journal Article"}],"best_oa_location":{"id":"pmh:oai:dr.ntu.edu.sg:10356/90257","is_oa":true,"landing_page_url":"http://hdl.handle.net/10220/48458","pdf_url":"https://dr.ntu.edu.sg/bitstream/10356/90257/2/Time-Variant%20In-Circuit%20Impedance%20Monitoring%20Based%20on%20the%20Inductive%20Coupling%20Method.pdf","source":{"id":"https://openalex.org/S4306402609","display_name":"DR-NTU (Nanyang Technological University)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I172675005","host_organization_name":"Nanyang Technological University","host_organization_lineage":["https://openalex.org/I172675005"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Journal Article"},"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.5799999833106995}],"awards":[],"funders":[{"id":"https://openalex.org/F4320320671","display_name":"National Research Foundation","ror":"https://ror.org/05s0g1g46"},{"id":"https://openalex.org/F4320320766","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2805592207.pdf","grobid_xml":"https://content.openalex.org/works/W2805592207.grobid-xml"},"referenced_works_count":16,"referenced_works":["https://openalex.org/W1984078715","https://openalex.org/W2003935246","https://openalex.org/W2031606204","https://openalex.org/W2066626412","https://openalex.org/W2093480438","https://openalex.org/W2102891047","https://openalex.org/W2118348409","https://openalex.org/W2139350845","https://openalex.org/W2151498281","https://openalex.org/W2156621131","https://openalex.org/W2316526239","https://openalex.org/W2743731241","https://openalex.org/W2903136240","https://openalex.org/W3013035523","https://openalex.org/W4213277510","https://openalex.org/W4236233820"],"related_works":["https://openalex.org/W4255837520","https://openalex.org/W2387011115","https://openalex.org/W4255628145","https://openalex.org/W2382043075","https://openalex.org/W2809151339","https://openalex.org/W2808854221","https://openalex.org/W2360673138","https://openalex.org/W2809370583","https://openalex.org/W2808690056","https://openalex.org/W2337245573"],"abstract_inverted_index":{"In-circuit":[0],"impedance":[1,101],"extraction":[2],"of":[3,22,55,63,79,102,116,118],"a":[4,27,40,103],"time-variant":[5,28,104],"electrical":[6,70,121],"system":[7,29,105,122],"is":[8,124],"essential":[9],"for":[10,26,113],"real-time":[11,23],"condition":[12],"monitoring":[13,25],"purpose.":[14],"This":[15],"paper":[16],"looks":[17],"into":[18],"the":[19,49,53,60,73,91,95,99,119],"design":[20,89],"consideration":[21],"in-circuit":[24,100],"based":[30],"on":[31],"inductive":[32,47],"coupling":[33],"approach":[34],"and":[35,81],"discrete":[36],"Fourier":[37],"transform":[38],"in":[39,106,127],"moving":[41],"window.":[42],"By":[43],"using":[44],"two":[45],"clamped-on-type":[46],"probes,":[48],"proposed":[50,92],"setup":[51],"eliminates":[52,68],"need":[54],"voltage":[56],"sensors":[57],"to":[58,97],"measure":[59,98],"terminal":[61],"voltages":[62],"system-under-monitoring":[64],"(SUM)":[65],"and,":[66],"hence,":[67],"direct":[69],"contact":[71],"with":[72,87],"SUM.":[74],"Therefore,":[75],"it":[76],"facilitates":[77,110],"ease":[78],"mounting":[80],"disassembly.":[82],"Experimental":[83],"results":[84],"show":[85],"that":[86,123],"careful":[88],"consideration,":[90],"method":[93],"has":[94],"ability":[96],"real":[107],"time,":[108],"which":[109],"useful":[111],"inputs":[112],"early":[114],"detection":[115],"abnormality":[117],"monitored":[120],"time":[125],"variant":[126],"nature.":[128]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":10},{"year":2023,"cited_by_count":5},{"year":2022,"cited_by_count":7},{"year":2021,"cited_by_count":10},{"year":2020,"cited_by_count":4},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}