{"id":"https://openalex.org/W2794183899","doi":"https://doi.org/10.1109/tim.2018.2811228","title":"Deep Learning-Based Inversion Method for Imaging Problems in Electrical Capacitance Tomography","display_name":"Deep Learning-Based Inversion Method for Imaging Problems in Electrical Capacitance Tomography","publication_year":2018,"publication_date":"2018-03-19","ids":{"openalex":"https://openalex.org/W2794183899","doi":"https://doi.org/10.1109/tim.2018.2811228","mag":"2794183899"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2018.2811228","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2018.2811228","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5018989901","display_name":"Jing Lei","orcid":"https://orcid.org/0000-0002-3976-2817"},"institutions":[{"id":"https://openalex.org/I153473198","display_name":"North China Electric Power University","ror":"https://ror.org/04qr5t414","country_code":"CN","type":"education","lineage":["https://openalex.org/I153473198"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jing Lei","raw_affiliation_strings":["School of Energy, Power and Mechanical Engineering, North China Electric Power University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-3976-2817","affiliations":[{"raw_affiliation_string":"School of Energy, Power and Mechanical Engineering, North China Electric Power University, Beijing, China","institution_ids":["https://openalex.org/I153473198"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100630128","display_name":"Qibin Liu","orcid":null},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210120320","display_name":"Institute of Engineering Thermophysics","ror":"https://ror.org/031zj0q48","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210120320"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qibin Liu","raw_affiliation_strings":["Institute of Engineering Thermophysics, Chinese Academy of Sciences, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Engineering Thermophysics, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210120320","https://openalex.org/I19820366"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5033284348","display_name":"Xueyao Wang","orcid":"https://orcid.org/0009-0009-9386-0088"},"institutions":[{"id":"https://openalex.org/I153473198","display_name":"North China Electric Power University","ror":"https://ror.org/04qr5t414","country_code":"CN","type":"education","lineage":["https://openalex.org/I153473198"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xueyao Wang","raw_affiliation_strings":["School of Control and Computer Engineering, North China Electric Power University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Control and Computer Engineering, North China Electric Power University, Beijing, China","institution_ids":["https://openalex.org/I153473198"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":3.9138,"has_fulltext":false,"cited_by_count":64,"citation_normalized_percentile":{"value":0.94149182,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":"67","issue":"9","first_page":"2107","last_page":"2118"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9945999979972839,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11739","display_name":"Microwave Imaging and Scattering Analysis","score":0.9904000163078308,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electrical-capacitance-tomography","display_name":"Electrical capacitance tomography","score":0.8703063726425171},{"id":"https://openalex.org/keywords/deep-learning","display_name":"Deep learning","score":0.702938437461853},{"id":"https://openalex.org/keywords/iterative-reconstruction","display_name":"Iterative reconstruction","score":0.6765648126602173},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.6578379273414612},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6557451486587524},{"id":"https://openalex.org/keywords/inversion","display_name":"Inversion (geology)","score":0.6041902303695679},{"id":"https://openalex.org/keywords/thresholding","display_name":"Thresholding","score":0.48950374126434326},{"id":"https://openalex.org/keywords/visualization","display_name":"Visualization","score":0.4754604697227478},{"id":"https://openalex.org/keywords/inverse-problem","display_name":"Inverse problem","score":0.44916799664497375},{"id":"https://openalex.org/keywords/iterative-method","display_name":"Iterative method","score":0.4463405907154083},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4439725875854492},{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.43584901094436646},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.43132078647613525},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.19811266660690308},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.1534210443496704},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.08530041575431824},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.0835304856300354}],"concepts":[{"id":"https://openalex.org/C2777418626","wikidata":"https://www.wikidata.org/wiki/Q2584887","display_name":"Electrical capacitance tomography","level":4,"score":0.8703063726425171},{"id":"https://openalex.org/C108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","level":2,"score":0.702938437461853},{"id":"https://openalex.org/C141379421","wikidata":"https://www.wikidata.org/wiki/Q6094427","display_name":"Iterative reconstruction","level":2,"score":0.6765648126602173},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.6578379273414612},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6557451486587524},{"id":"https://openalex.org/C1893757","wikidata":"https://www.wikidata.org/wiki/Q3653001","display_name":"Inversion (geology)","level":3,"score":0.6041902303695679},{"id":"https://openalex.org/C191178318","wikidata":"https://www.wikidata.org/wiki/Q2256906","display_name":"Thresholding","level":3,"score":0.48950374126434326},{"id":"https://openalex.org/C36464697","wikidata":"https://www.wikidata.org/wiki/Q451553","display_name":"Visualization","level":2,"score":0.4754604697227478},{"id":"https://openalex.org/C135252773","wikidata":"https://www.wikidata.org/wiki/Q1567213","display_name":"Inverse problem","level":2,"score":0.44916799664497375},{"id":"https://openalex.org/C159694833","wikidata":"https://www.wikidata.org/wiki/Q2321565","display_name":"Iterative method","level":2,"score":0.4463405907154083},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4439725875854492},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.43584901094436646},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.43132078647613525},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.19811266660690308},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.1534210443496704},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.08530041575431824},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0835304856300354},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.0},{"id":"https://openalex.org/C109007969","wikidata":"https://www.wikidata.org/wiki/Q749565","display_name":"Structural basin","level":2,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2018.2811228","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2018.2811228","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","score":0.5400000214576721,"id":"https://metadata.un.org/sdg/9"}],"awards":[{"id":"https://openalex.org/G5209791654","display_name":null,"funder_award_id":"51206048","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G7313232359","display_name":null,"funder_award_id":"51576196","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G8437115312","display_name":null,"funder_award_id":"2017YFB0903601","funder_id":"https://openalex.org/F4320335777","funder_display_name":"National Key Research and Development Program of China"},{"id":"https://openalex.org/G8634500127","display_name":null,"funder_award_id":"2017MS012","funder_id":"https://openalex.org/F4320335787","funder_display_name":"Fundamental Research Funds for the Central Universities"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320335777","display_name":"National Key Research and Development Program of China","ror":null},{"id":"https://openalex.org/F4320335787","display_name":"Fundamental Research Funds for the Central Universities","ror":null},{"id":"https://openalex.org/F4320337393","display_name":"Division of Chemistry","ror":"https://ror.org/01ar8dr59"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":34,"referenced_works":["https://openalex.org/W1060101780","https://openalex.org/W1437416296","https://openalex.org/W1525510058","https://openalex.org/W1970341134","https://openalex.org/W1984011536","https://openalex.org/W1990919278","https://openalex.org/W1991112025","https://openalex.org/W1993717606","https://openalex.org/W2000241688","https://openalex.org/W2005836623","https://openalex.org/W2022002298","https://openalex.org/W2031034439","https://openalex.org/W2035414577","https://openalex.org/W2049772201","https://openalex.org/W2052981193","https://openalex.org/W2069558524","https://openalex.org/W2070738097","https://openalex.org/W2072128103","https://openalex.org/W2073283474","https://openalex.org/W2084497670","https://openalex.org/W2094445643","https://openalex.org/W2098290011","https://openalex.org/W2100495367","https://openalex.org/W2100556411","https://openalex.org/W2101916945","https://openalex.org/W2111072639","https://openalex.org/W2114314161","https://openalex.org/W2116818806","https://openalex.org/W2142058898","https://openalex.org/W2148882247","https://openalex.org/W2522887442","https://openalex.org/W2919115771","https://openalex.org/W4231109964","https://openalex.org/W4234954550"],"related_works":["https://openalex.org/W2170544729","https://openalex.org/W2090093661","https://openalex.org/W2031832834","https://openalex.org/W2097442821","https://openalex.org/W2061980133","https://openalex.org/W2157674401","https://openalex.org/W1974104633","https://openalex.org/W1519688086","https://openalex.org/W2058033086","https://openalex.org/W2045604881"],"abstract_inverted_index":{"Electrical":[0],"capacitance":[1],"tomography":[2],"exhibits":[3],"great":[4,18],"potentials":[5],"in":[6,70,138,153],"the":[7,21,40,44,47,51,54,63,71,84,87,93,100,105,124,134,142,150,154],"visualization":[8],"measurement":[9,26],"of":[10,17,25,46],"industrial":[11],"processes,":[12],"and":[13,23,68,92,99,104,129,145,147],"high-precision":[14],"images":[15,55,65],"are":[16,111],"significance":[19],"for":[20],"reliability":[22],"usefulness":[24],"results.":[27],"In":[28],"this":[29,139],"paper,":[30],"we":[31],"propose":[32],"a":[33,58,114],"deep":[34,48,72,89],"learning-based":[35],"inversion":[36,135],"method":[37,117,136],"to":[38,62,82,118,122,149],"ameliorate":[39],"reconstruction":[41,143],"accuracy.":[42],"With":[43],"aid":[45],"learning":[49,74,90],"methodology,":[50],"prior":[52,85],"from":[53,86],"reconstructed":[56],"by":[57],"certain":[59],"imaging":[60,97,155],"technique":[61,110],"true":[64],"is":[66,80],"abstracted":[67],"stored":[69],"extreme":[73],"machine.":[75],"A":[76],"new":[77,115],"cost":[78],"function":[79],"constructed":[81],"encapsulate":[83],"proposed":[88,137],"model":[91],"domain":[94],"expertise":[95],"about":[96],"targets,":[98],"split":[101],"Bregman":[102],"algorithm":[103],"fast":[106],"iterative":[107],"shrinkage":[108],"thresholding":[109],"combined":[112],"into":[113],"numerical":[116,128],"effectively":[119],"solve":[120],"it":[121],"get":[123],"final":[125],"reconstruction.":[126],"The":[127],"experimental":[130],"results":[131],"validate":[132],"that":[133],"paper":[140],"reduces":[141],"artifacts":[144],"deformations":[146],"leads":[148],"much":[151],"improvement":[152],"quality.":[156]},"counts_by_year":[{"year":2026,"cited_by_count":3},{"year":2025,"cited_by_count":7},{"year":2024,"cited_by_count":8},{"year":2023,"cited_by_count":6},{"year":2022,"cited_by_count":9},{"year":2021,"cited_by_count":9},{"year":2020,"cited_by_count":15},{"year":2019,"cited_by_count":5},{"year":2018,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}