{"id":"https://openalex.org/W2790578887","doi":"https://doi.org/10.1109/tim.2018.2809079","title":"Noncontact AC Voltage Measurements: Error and Noise Analysis","display_name":"Noncontact AC Voltage Measurements: Error and Noise Analysis","publication_year":2018,"publication_date":"2018-03-14","ids":{"openalex":"https://openalex.org/W2790578887","doi":"https://doi.org/10.1109/tim.2018.2809079","mag":"2790578887"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2018.2809079","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2018.2809079","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"http://hdl.handle.net/11336/93729","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5065165007","display_name":"Marcelo Haberman","orcid":"https://orcid.org/0000-0003-1387-3436"},"institutions":[{"id":"https://openalex.org/I151201029","display_name":"Consejo Nacional de Investigaciones Cient\u00edficas y T\u00e9cnicas","ror":"https://ror.org/03cqe8w59","country_code":"AR","type":"government","lineage":["https://openalex.org/I151201029","https://openalex.org/I4210123736","https://openalex.org/I4387155568"]}],"countries":["AR"],"is_corresponding":false,"raw_author_name":"Marcelo Alejandro Haberman","raw_affiliation_strings":["Institute LEICI, UNLP, CONICET, La Plata, Argentina"],"raw_orcid":"https://orcid.org/0000-0003-1387-3436","affiliations":[{"raw_affiliation_string":"Institute LEICI, UNLP, CONICET, La Plata, Argentina","institution_ids":["https://openalex.org/I151201029"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5065084374","display_name":"Enrique Mario Spinelli","orcid":"https://orcid.org/0000-0002-4164-9151"},"institutions":[{"id":"https://openalex.org/I151201029","display_name":"Consejo Nacional de Investigaciones Cient\u00edficas y T\u00e9cnicas","ror":"https://ror.org/03cqe8w59","country_code":"AR","type":"government","lineage":["https://openalex.org/I151201029","https://openalex.org/I4210123736","https://openalex.org/I4387155568"]}],"countries":["AR"],"is_corresponding":false,"raw_author_name":"Enrique Mario Spinelli","raw_affiliation_strings":["Institute LEICI, UNLP, CONICET, La Plata, Argentina"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute LEICI, UNLP, CONICET, La Plata, Argentina","institution_ids":["https://openalex.org/I151201029"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I151201029"],"apc_list":null,"apc_paid":null,"fwci":0.7575,"has_fulltext":false,"cited_by_count":26,"citation_normalized_percentile":{"value":0.72170909,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"67","issue":"8","first_page":"1946","last_page":"1953"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/waveform","display_name":"Waveform","score":0.6262052059173584},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.6233871579170227},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.614351749420166},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.5527443289756775},{"id":"https://openalex.org/keywords/capacitive-coupling","display_name":"Capacitive coupling","score":0.5483362078666687},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5441185235977173},{"id":"https://openalex.org/keywords/capacitive-sensing","display_name":"Capacitive sensing","score":0.500295877456665},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4728063642978668},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.4686063528060913},{"id":"https://openalex.org/keywords/observational-error","display_name":"Observational error","score":0.4590190649032593},{"id":"https://openalex.org/keywords/johnson\u2013nyquist-noise","display_name":"Johnson\u2013Nyquist noise","score":0.42388951778411865},{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.4238152503967285},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.41405826807022095},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.39326053857803345},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.30637866258621216},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.27197134494781494},{"id":"https://openalex.org/keywords/electrode","display_name":"Electrode","score":0.1895465850830078},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.16110089421272278}],"concepts":[{"id":"https://openalex.org/C197424946","wikidata":"https://www.wikidata.org/wiki/Q1165717","display_name":"Waveform","level":3,"score":0.6262052059173584},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.6233871579170227},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.614351749420166},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.5527443289756775},{"id":"https://openalex.org/C68278764","wikidata":"https://www.wikidata.org/wiki/Q444167","display_name":"Capacitive coupling","level":3,"score":0.5483362078666687},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5441185235977173},{"id":"https://openalex.org/C206755178","wikidata":"https://www.wikidata.org/wiki/Q1131271","display_name":"Capacitive sensing","level":2,"score":0.500295877456665},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4728063642978668},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.4686063528060913},{"id":"https://openalex.org/C19619285","wikidata":"https://www.wikidata.org/wiki/Q196372","display_name":"Observational error","level":2,"score":0.4590190649032593},{"id":"https://openalex.org/C104419016","wikidata":"https://www.wikidata.org/wiki/Q1337490","display_name":"Johnson\u2013Nyquist noise","level":3,"score":0.42388951778411865},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.4238152503967285},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.41405826807022095},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.39326053857803345},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.30637866258621216},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.27197134494781494},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.1895465850830078},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.16110089421272278},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tim.2018.2809079","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2018.2809079","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},{"id":"pmh:oai:ri.conicet.gov.ar:11336/93729","is_oa":true,"landing_page_url":"http://hdl.handle.net/11336/93729","pdf_url":null,"source":{"id":"https://openalex.org/S4306401400","display_name":"Conicet","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4210104196","host_organization_name":"Centro Cient\u00edfico Tecnol\u00f3gico - Nordeste","host_organization_lineage":["https://openalex.org/I4210104196"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-nc-sa","license_id":"https://openalex.org/licenses/cc-by-nc-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":{"id":"pmh:oai:ri.conicet.gov.ar:11336/93729","is_oa":true,"landing_page_url":"http://hdl.handle.net/11336/93729","pdf_url":null,"source":{"id":"https://openalex.org/S4306401400","display_name":"Conicet","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4210104196","host_organization_name":"Centro Cient\u00edfico Tecnol\u00f3gico - Nordeste","host_organization_lineage":["https://openalex.org/I4210104196"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-nc-sa","license_id":"https://openalex.org/licenses/cc-by-nc-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/article"},"sustainable_development_goals":[{"score":0.6600000262260437,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[{"id":"https://openalex.org/G2983044076","display_name":null,"funder_award_id":"PIP-0558","funder_id":"https://openalex.org/F4320321594","funder_display_name":"Consejo Nacional de Investigaciones Cient\u00edficas y T\u00e9cnicas"}],"funders":[{"id":"https://openalex.org/F4320321594","display_name":"Consejo Nacional de Investigaciones Cient\u00edficas y T\u00e9cnicas","ror":"https://ror.org/03cqe8w59"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W250076511","https://openalex.org/W1505068380","https://openalex.org/W1592916261","https://openalex.org/W1958697927","https://openalex.org/W1965392255","https://openalex.org/W1972636952","https://openalex.org/W2006529684","https://openalex.org/W2018168518","https://openalex.org/W2018330451","https://openalex.org/W2029299375","https://openalex.org/W2038462420","https://openalex.org/W2103777286","https://openalex.org/W2146871671","https://openalex.org/W2317997279","https://openalex.org/W2533137575"],"related_works":["https://openalex.org/W2768092448","https://openalex.org/W2895758062","https://openalex.org/W2048683560","https://openalex.org/W2044770004","https://openalex.org/W1966070768","https://openalex.org/W2587186717","https://openalex.org/W1994341348","https://openalex.org/W2948902878","https://openalex.org/W2953512238","https://openalex.org/W4387574169"],"abstract_inverted_index":{"A":[0,111,134],"capacitive":[1],"noncontact":[2],"ac":[3],"voltage":[4,144,152,171],"measurement":[5,168,190],"technique":[6,44,159],"and":[7,72,117,139,145,160,172],"its":[8],"feasibility":[9],"to":[10,42,61,68,79,90,126,205],"measure":[11],"arbitrary":[12,147],"waveform":[13],"signals":[14,148,153],"are":[15,129],"analyzed.":[16],"The":[17,36],"method":[18],"provides":[19],"self-calibration":[20,175],"of":[21,38,50,83,124,169],"the":[22,29,43,48,55,62,80,157,167,174,177,200],"scale":[23],"factor,":[24],"an":[25],"important":[26],"feature":[27],"considering":[28],"high":[30],"variability":[31],"that":[32,121],"coupling":[33],"capacitances":[34],"present.":[35],"analysis":[37],"several":[39],"errors":[40,59],"related":[41],"is":[45,99,114,198],"performed,":[46],"showing":[47,120],"impact":[49],"different":[51],"design":[52,104],"parameters":[53],"on":[54,108],"final":[56],"accuracy.":[57],"Scaling":[58],"due":[60,78],"electronic":[63,103],"circuit":[64],"can":[65,73,87,202],"be":[66,74,88,203],"constrained":[67],"less":[69],"than":[70,182],"0.5%,":[71],"disaffected,":[75],"whereas":[76],"those":[77,163],"frequency":[81],"dependence":[82],"cable":[84],"sheath":[85],"permittivity":[86],"up":[89,125],"3%":[91],"for":[92,186],"polyvinyl":[93],"chloride":[94],"sheathed":[95],"cables.":[96],"This":[97],"error":[98,179,201],"not":[100],"controllable":[101],"by":[102,141,156],"but":[105],"requires":[106],"working":[107],"electrode":[109],"probe.":[110],"noise":[112],"model":[113],"also":[115],"proposed":[116,158],"experimentally":[118],"validated,":[119],"signal-to-noise":[122],"ratios":[123],"100":[127],"dB":[128],"achievable":[130],"with":[131,162],"common":[132],"components.":[133],"functional":[135],"prototype":[136],"was":[137,180],"built":[138],"tested":[140],"acquiring":[142],"power-line":[143,170],"other":[146],"without":[149],"contact.":[150],"Instantaneous":[151],"were":[154],"acquired":[155,164],"contrasted":[161],"directly.":[165],"For":[166],"using":[173],"feature,":[176],"instantaneous":[178],"lower":[181],"7":[183],"V":[184,189,207],"(2.2%)":[185],"a":[187],"\u00b11300":[188],"range":[191],"at":[192],"50":[193],"Hz.":[194],"If":[195],"manual":[196],"correction":[197],"applied,":[199],"reduced":[204],"0.28":[206],"<sub":[208],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[209],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">rms</sub>":[210],"(0.12%).":[211]},"counts_by_year":[{"year":2026,"cited_by_count":4},{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":5},{"year":2023,"cited_by_count":5},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":4}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}