{"id":"https://openalex.org/W2791635257","doi":"https://doi.org/10.1109/tim.2018.2806998","title":"Analysis and Experiment of Self-Differential Eddy Current Displacement Sensor for AMBs Used in Molecular Pump","display_name":"Analysis and Experiment of Self-Differential Eddy Current Displacement Sensor for AMBs Used in Molecular Pump","publication_year":2018,"publication_date":"2018-03-06","ids":{"openalex":"https://openalex.org/W2791635257","doi":"https://doi.org/10.1109/tim.2018.2806998","mag":"2791635257"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2018.2806998","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2018.2806998","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100635678","display_name":"Kun Wang","orcid":"https://orcid.org/0000-0003-3159-3702"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Kun Wang","raw_affiliation_strings":["Beijing Engineering Research Center of High-Speed Magnetically Suspended Motor Technology and Application, Beijing University of Aeronautics and Astronautics, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0003-3159-3702","affiliations":[{"raw_affiliation_string":"Beijing Engineering Research Center of High-Speed Magnetically Suspended Motor Technology and Application, Beijing University of Aeronautics and Astronautics, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101435833","display_name":"Lisheng Zhang","orcid":"https://orcid.org/0000-0003-3958-4018"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lisheng Zhang","raw_affiliation_strings":["Beijing Engineering Research Center of High-Speed Magnetically Suspended Motor Technology and Application, Beijing University of Aeronautics and Astronautics, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Beijing Engineering Research Center of High-Speed Magnetically Suspended Motor Technology and Application, Beijing University of Aeronautics and Astronautics, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017471039","display_name":"Bangcheng Han","orcid":"https://orcid.org/0000-0003-1313-756X"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Bangcheng Han","raw_affiliation_strings":["Beijing Engineering Research Center of High-Speed Magnetically Suspended Motor Technology and Application, Beijing University of Aeronautics and Astronautics, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0003-1313-756X","affiliations":[{"raw_affiliation_string":"Beijing Engineering Research Center of High-Speed Magnetically Suspended Motor Technology and Application, Beijing University of Aeronautics and Astronautics, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100335696","display_name":"Shaohua Chen","orcid":"https://orcid.org/0000-0003-3347-4432"},"institutions":[{"id":"https://openalex.org/I78675632","display_name":"Beijing Information Science & Technology University","ror":"https://ror.org/04xnqep60","country_code":"CN","type":"education","lineage":["https://openalex.org/I78675632"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shaohua Chen","raw_affiliation_strings":["School of Instrument Science and Optoelectronics Engineering, Beijing Information Science and Technology University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0003-3347-4432","affiliations":[{"raw_affiliation_string":"School of Instrument Science and Optoelectronics Engineering, Beijing Information Science and Technology University, Beijing, China","institution_ids":["https://openalex.org/I78675632"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.6652,"has_fulltext":false,"cited_by_count":32,"citation_normalized_percentile":{"value":0.82010861,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":"67","issue":"8","first_page":"1815","last_page":"1824"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10377","display_name":"Metal and Thin Film Mechanics","score":0.9955999851226807,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12692","display_name":"Magnetic Field Sensors Techniques","score":0.9955000281333923,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/inductor","display_name":"Inductor","score":0.6540063619613647},{"id":"https://openalex.org/keywords/eddy-current","display_name":"Eddy current","score":0.6123321056365967},{"id":"https://openalex.org/keywords/eddy-current-sensor","display_name":"Eddy-current sensor","score":0.5264131426811218},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4979555606842041},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.4610336124897003},{"id":"https://openalex.org/keywords/magnetic-bearing","display_name":"Magnetic bearing","score":0.44761472940444946},{"id":"https://openalex.org/keywords/controllability","display_name":"Controllability","score":0.42972826957702637},{"id":"https://openalex.org/keywords/inductive-sensor","display_name":"Inductive sensor","score":0.42371323704719543},{"id":"https://openalex.org/keywords/transfer-function","display_name":"Transfer function","score":0.4171631932258606},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.37333011627197266},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3133785128593445},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.31120747327804565},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.18884029984474182},{"id":"https://openalex.org/keywords/magnet","display_name":"Magnet","score":0.14882880449295044}],"concepts":[{"id":"https://openalex.org/C144534570","wikidata":"https://www.wikidata.org/wiki/Q5325","display_name":"Inductor","level":3,"score":0.6540063619613647},{"id":"https://openalex.org/C131357438","wikidata":"https://www.wikidata.org/wiki/Q208598","display_name":"Eddy current","level":2,"score":0.6123321056365967},{"id":"https://openalex.org/C2777897478","wikidata":"https://www.wikidata.org/wiki/Q23718891","display_name":"Eddy-current sensor","level":3,"score":0.5264131426811218},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4979555606842041},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.4610336124897003},{"id":"https://openalex.org/C153056533","wikidata":"https://www.wikidata.org/wiki/Q1587136","display_name":"Magnetic bearing","level":3,"score":0.44761472940444946},{"id":"https://openalex.org/C48209547","wikidata":"https://www.wikidata.org/wiki/Q1331104","display_name":"Controllability","level":2,"score":0.42972826957702637},{"id":"https://openalex.org/C108572070","wikidata":"https://www.wikidata.org/wiki/Q765821","display_name":"Inductive sensor","level":2,"score":0.42371323704719543},{"id":"https://openalex.org/C81299745","wikidata":"https://www.wikidata.org/wiki/Q334269","display_name":"Transfer function","level":2,"score":0.4171631932258606},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.37333011627197266},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3133785128593445},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.31120747327804565},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.18884029984474182},{"id":"https://openalex.org/C16389437","wikidata":"https://www.wikidata.org/wiki/Q11421","display_name":"Magnet","level":2,"score":0.14882880449295044},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.0},{"id":"https://openalex.org/C28826006","wikidata":"https://www.wikidata.org/wiki/Q33521","display_name":"Applied mathematics","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2018.2806998","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2018.2806998","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5099999904632568,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":28,"referenced_works":["https://openalex.org/W1922657474","https://openalex.org/W1978025571","https://openalex.org/W1980176460","https://openalex.org/W2004248534","https://openalex.org/W2004669856","https://openalex.org/W2072885228","https://openalex.org/W2085550696","https://openalex.org/W2093609136","https://openalex.org/W2096941724","https://openalex.org/W2098951451","https://openalex.org/W2102115365","https://openalex.org/W2105007456","https://openalex.org/W2113779626","https://openalex.org/W2131417370","https://openalex.org/W2141394387","https://openalex.org/W2143484533","https://openalex.org/W2149253719","https://openalex.org/W2330813276","https://openalex.org/W2335394393","https://openalex.org/W2422561091","https://openalex.org/W2466177495","https://openalex.org/W2520213996","https://openalex.org/W2556984119","https://openalex.org/W2605029695","https://openalex.org/W2605739636","https://openalex.org/W2774560920","https://openalex.org/W2983448899","https://openalex.org/W6644903717"],"related_works":["https://openalex.org/W2899084033","https://openalex.org/W4321374065","https://openalex.org/W4292862960","https://openalex.org/W2371605051","https://openalex.org/W3199057949","https://openalex.org/W2576505995","https://openalex.org/W1970133349","https://openalex.org/W2075319771","https://openalex.org/W1899219737","https://openalex.org/W3166545479"],"abstract_inverted_index":{"With":[0],"the":[1,5,10,16,20,23,58,62,66,74,88,91,94,98,105,110,118,122,133,139,144,148,151,168,176,179,182,185,189,195,198],"wide":[2,186],"application":[3],"of":[4,22,73,90,97,147,161,181,197],"high-speed":[6],"electrical":[7],"machine":[8],"with":[9,178],"active":[11],"magnetic":[12],"bearings":[13],"(AMBs),":[14],"improving":[15,87],"dynamic":[17,59,145],"response":[18],"and":[19,137,150,156,188],"resolution":[21,89,191],"displacement":[24,42],"sensor":[25,43,63,149,169],"for":[26,32,45,61,86],"AMBs":[27,47,199],"becomes":[28],"an":[29],"actual":[30],"challenge":[31],"industrial":[33],"development.":[34],"This":[35],"paper":[36],"proposes":[37],"a":[38,83,128,159],"self-differential":[39,129],"eddy":[40],"current":[41],"(ECDS)":[44],"radial":[46],"system.":[48,200],"The":[49,71,171],"phase":[50],"advance":[51],"network":[52],"method":[53],"was":[54,77,100,108,154,163],"utilized":[55],"to":[56,81,126,131,166],"improve":[57,194],"characteristic":[60,146],"based":[64],"on":[65],"equivalent":[67],"transfer":[68],"function":[69],"model.":[70],"reason":[72],"sensor-to-sensor":[75,152],"crosstalk":[76,153],"analyzed":[78,101],"in":[79,102,121],"detail":[80],"provide":[82],"theoretical":[84],"basis":[85],"sensor.":[92],"First,":[93],"operating":[95],"principle":[96],"ECDS":[99,177],"detail.":[103],"Second,":[104],"miniaturization":[106],"design":[107],"presented:":[109],"two":[111],"symmetrical":[112],"probe":[113],"coils":[114],"were":[115],"used":[116],"as":[117],"working":[119],"inductors":[120],"Hartley":[123],"oscillation":[124],"circuit":[125,135],"form":[127],"structure":[130],"simplify":[132],"measuring":[134],"observably,":[136],"suppress":[138],"common":[140],"mode":[141],"interference.":[142],"Third,":[143],"described":[155],"compensated.":[157],"Finally,":[158],"series":[160],"experiments":[162],"carried":[164],"out":[165],"test":[167],"performance.":[170],"experimental":[172],"results":[173],"showed":[174],"that":[175],"features":[180],"minimum":[183],"circuit,":[184],"bandwidth,":[187],"high":[190],"can":[192],"greatly":[193],"controllability":[196]},"counts_by_year":[{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":9},{"year":2022,"cited_by_count":5},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":4},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":1}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}