{"id":"https://openalex.org/W2791139105","doi":"https://doi.org/10.1109/tim.2018.2800978","title":"Early Fault Detection Approach With Deep Architectures","display_name":"Early Fault Detection Approach With Deep Architectures","publication_year":2018,"publication_date":"2018-02-26","ids":{"openalex":"https://openalex.org/W2791139105","doi":"https://doi.org/10.1109/tim.2018.2800978","mag":"2791139105"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2018.2800978","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2018.2800978","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5075352865","display_name":"Weining Lu","orcid":"https://orcid.org/0000-0002-0927-1259"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Weining Lu","raw_affiliation_strings":["School of Aerospace Engineering, Tsinghua University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Aerospace Engineering, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101799190","display_name":"Yipeng Li","orcid":"https://orcid.org/0000-0001-9099-4077"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yipeng Li","raw_affiliation_strings":["Department of Automation, Tsinghua University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0001-9099-4077","affiliations":[{"raw_affiliation_string":"Department of Automation, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101580521","display_name":"Yu Cheng","orcid":"https://orcid.org/0000-0002-2315-5641"},"institutions":[{"id":"https://openalex.org/I4210114115","display_name":"IBM Research - Thomas J. Watson Research Center","ror":"https://ror.org/0265w5591","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yu Cheng","raw_affiliation_strings":["IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA"],"raw_orcid":"https://orcid.org/0000-0002-2315-5641","affiliations":[{"raw_affiliation_string":"IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA","institution_ids":["https://openalex.org/I4210114115"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010130426","display_name":"Deshan Meng","orcid":"https://orcid.org/0000-0002-9588-6662"},"institutions":[{"id":"https://openalex.org/I3131625388","display_name":"University Town of Shenzhen","ror":"https://ror.org/05f5j6225","country_code":"CN","type":"education","lineage":["https://openalex.org/I3131625388"]},{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Deshan Meng","raw_affiliation_strings":["Graduate School at Shenzhen, Tsinghua University, Shenzhen, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Graduate School at Shenzhen, Tsinghua University, Shenzhen, China","institution_ids":["https://openalex.org/I3131625388","https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101626172","display_name":"Bin Liang","orcid":"https://orcid.org/0000-0001-6310-6214"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Bin Liang","raw_affiliation_strings":["Department of Automation, Tsinghua University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Automation, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100693197","display_name":"Pan Zhou","orcid":"https://orcid.org/0000-0002-8629-4622"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Pan Zhou","raw_affiliation_strings":["School of Electronic Information and Communications, Huazhong University of Science and Technology, Wuhan, China"],"raw_orcid":"https://orcid.org/0000-0002-8629-4622","affiliations":[{"raw_affiliation_string":"School of Electronic Information and Communications, Huazhong University of Science and Technology, Wuhan, China","institution_ids":["https://openalex.org/I47720641"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":14.6123,"has_fulltext":false,"cited_by_count":190,"citation_normalized_percentile":{"value":0.99260875,"is_in_top_1_percent":true,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":100},"biblio":{"volume":"67","issue":"7","first_page":"1679","last_page":"1689"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11512","display_name":"Anomaly Detection Techniques and Applications","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9948999881744385,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/estimator","display_name":"Estimator","score":0.6382806301116943},{"id":"https://openalex.org/keywords/downtime","display_name":"Downtime","score":0.6014294028282166},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5863653421401978},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.5700924396514893},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.5549978613853455},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5291864275932312},{"id":"https://openalex.org/keywords/context","display_name":"Context (archaeology)","score":0.5220334529876709},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5127754807472229},{"id":"https://openalex.org/keywords/false-alarm","display_name":"False alarm","score":0.510679304599762},{"id":"https://openalex.org/keywords/constant-false-alarm-rate","display_name":"Constant false alarm rate","score":0.4813031256198883},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.46014484763145447},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.4519800543785095},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.44361361861228943},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.43547266721725464},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.4264867305755615},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.12193810939788818},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.09994104504585266}],"concepts":[{"id":"https://openalex.org/C185429906","wikidata":"https://www.wikidata.org/wiki/Q1130160","display_name":"Estimator","level":2,"score":0.6382806301116943},{"id":"https://openalex.org/C180591934","wikidata":"https://www.wikidata.org/wiki/Q1253369","display_name":"Downtime","level":2,"score":0.6014294028282166},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5863653421401978},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.5700924396514893},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.5549978613853455},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5291864275932312},{"id":"https://openalex.org/C2779343474","wikidata":"https://www.wikidata.org/wiki/Q3109175","display_name":"Context (archaeology)","level":2,"score":0.5220334529876709},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5127754807472229},{"id":"https://openalex.org/C2776836416","wikidata":"https://www.wikidata.org/wiki/Q1364844","display_name":"False alarm","level":2,"score":0.510679304599762},{"id":"https://openalex.org/C77052588","wikidata":"https://www.wikidata.org/wiki/Q644307","display_name":"Constant false alarm rate","level":2,"score":0.4813031256198883},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.46014484763145447},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.4519800543785095},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.44361361861228943},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.43547266721725464},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.4264867305755615},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.12193810939788818},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.09994104504585266},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2018.2800978","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2018.2800978","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure","score":0.49000000953674316}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":40,"referenced_works":["https://openalex.org/W1486311415","https://openalex.org/W1502612369","https://openalex.org/W1598796236","https://openalex.org/W1974225813","https://openalex.org/W1995430360","https://openalex.org/W2004039783","https://openalex.org/W2014526686","https://openalex.org/W2019505419","https://openalex.org/W2020692786","https://openalex.org/W2027176154","https://openalex.org/W2037411704","https://openalex.org/W2058983449","https://openalex.org/W2064675550","https://openalex.org/W2090996960","https://openalex.org/W2099499423","https://openalex.org/W2102832680","https://openalex.org/W2117499988","https://openalex.org/W2122646361","https://openalex.org/W2139833307","https://openalex.org/W2158958729","https://openalex.org/W2165351402","https://openalex.org/W2172000360","https://openalex.org/W2281806455","https://openalex.org/W2319957760","https://openalex.org/W2330534857","https://openalex.org/W2398119937","https://openalex.org/W2399038344","https://openalex.org/W2417225786","https://openalex.org/W2461729787","https://openalex.org/W2507423952","https://openalex.org/W2511990606","https://openalex.org/W2514132437","https://openalex.org/W2556013418","https://openalex.org/W2622370560","https://openalex.org/W2919115771","https://openalex.org/W2963344330","https://openalex.org/W6635679246","https://openalex.org/W6677604277","https://openalex.org/W6684361840","https://openalex.org/W6712574313"],"related_works":["https://openalex.org/W2046276983","https://openalex.org/W2954002293","https://openalex.org/W2078264086","https://openalex.org/W2892741875","https://openalex.org/W2164372000","https://openalex.org/W1983393909","https://openalex.org/W2040150569","https://openalex.org/W2132174924","https://openalex.org/W1911540634","https://openalex.org/W2013909972"],"abstract_inverted_index":{"Early":[0],"fault":[1,24,38,54,69,126,185],"detection":[2,25,70],"technique":[3],"is":[4,26,76,120,134,176,193],"crucial":[5],"to":[6,29,65,136,163],"reduce":[7],"the":[8,30,51,67,73,79,100,108,124,158,166,184,198,205,208],"machine":[9],"downtime":[10],"and":[11,48,94,114,132,182,207],"has":[12,107],"high":[13],"impact":[14],"on":[15,99,197],"a":[16,61,84,95,112,170,189],"wide":[17],"variety":[18],"of":[19,53,110,150,210],"industrial":[20],"applications.":[21],"However,":[22],"early":[23,68,125],"still":[27],"subject":[28],"following":[31],"challenges:":[32],"1)":[33],"extracting":[34],"features":[35],"from":[36],"incipient":[37],"signals;":[39],"2)":[40],"detecting":[41],"anomalies":[42],"with":[43,78],"considering":[44],"sequential":[45,142],"data":[46,127,202],"correlation;":[47],"3)":[49],"enhancing":[50],"reliability":[52,209],"alarm.":[55],"In":[56],"this":[57],"paper,":[58],"we":[59],"introduce":[60],"novel":[62],"deep-structured":[63],"framework":[64],"solve":[66],"problem.":[71],"First,":[72],"system":[74],"variation":[75],"measured":[77],"deviation":[80,180],"value":[81],"generated":[82],"by":[83,129],"current":[85],"feature":[86],"extraction":[87],"model":[88],"using":[89],"deep":[90],"neural":[91],"network":[92],"(DNN)":[93],"distribution":[96,116,146,159],"estimator":[97,147,160],"based":[98],"long":[101],"short-term":[102],"memory":[103],"(LSTM)":[104],"network.":[105],"DNN":[106],"ability":[109],"representing":[111],"complicated":[113],"intrinsic":[115],"for":[117,122,178],"data,":[118,143],"which":[119,144],"suitable":[121],"handling":[123],"masked":[128],"heavy":[130],"noise,":[131],"LSTM":[133],"able":[135],"discover":[137],"temporal":[138],"dependencies":[139],"in":[140],"high-dimensional":[141],"allows":[145],"making":[148],"use":[149],"previous":[151],"context":[152],"information":[153],"as":[154,156],"well":[155],"makes":[157],"more":[161],"robust":[162],"warp":[164],"along":[165],"time":[167],"axis.":[168],"Second,":[169],"circular":[171],"indirect":[172],"alarm":[173],"assessment":[174],"strategy":[175],"designed":[177],"collecting":[179],"values":[181],"confirming":[183],"appearance":[186],"only":[187],"when":[188],"specified":[190],"confidence":[191],"level":[192],"reached.":[194],"Experimental":[195],"results":[196],"typical":[199],"real-world":[200],"bearing":[201],"sets":[203],"demonstrate":[204],"effectiveness":[206],"our":[211],"model.":[212]},"counts_by_year":[{"year":2026,"cited_by_count":5},{"year":2025,"cited_by_count":24},{"year":2024,"cited_by_count":36},{"year":2023,"cited_by_count":20},{"year":2022,"cited_by_count":25},{"year":2021,"cited_by_count":35},{"year":2020,"cited_by_count":22},{"year":2019,"cited_by_count":17},{"year":2018,"cited_by_count":4},{"year":2017,"cited_by_count":2}],"updated_date":"2026-06-16T09:24:06.705377","created_date":"2025-10-10T00:00:00"}