{"id":"https://openalex.org/W2791729216","doi":"https://doi.org/10.1109/tim.2018.2800258","title":"Automated Machine Vision System for Liquid Particle Inspection of Pharmaceutical Injection","display_name":"Automated Machine Vision System for Liquid Particle Inspection of Pharmaceutical Injection","publication_year":2018,"publication_date":"2018-02-19","ids":{"openalex":"https://openalex.org/W2791729216","doi":"https://doi.org/10.1109/tim.2018.2800258","mag":"2791729216"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2018.2800258","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2018.2800258","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100323420","display_name":"Hui Zhang","orcid":"https://orcid.org/0000-0002-1803-3148"},"institutions":[{"id":"https://openalex.org/I56934997","display_name":"Changsha University of Science and Technology","ror":"https://ror.org/03yph8055","country_code":"CN","type":"education","lineage":["https://openalex.org/I56934997"]},{"id":"https://openalex.org/I74413500","display_name":"University of Windsor","ror":"https://ror.org/01gw3d370","country_code":"CA","type":"education","lineage":["https://openalex.org/I74413500"]}],"countries":["CA","CN"],"is_corresponding":false,"raw_author_name":"Hui Zhang","raw_affiliation_strings":["College of Electrical and Information Engineering, Changsha University of Science and Technology, Changsha, China","Department of Electrical and Computer Engineering, University of Windsor, Windsor, ON, Canada"],"raw_orcid":"https://orcid.org/0000-0002-1803-3148","affiliations":[{"raw_affiliation_string":"College of Electrical and Information Engineering, Changsha University of Science and Technology, Changsha, China","institution_ids":["https://openalex.org/I56934997"]},{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Windsor, Windsor, ON, Canada","institution_ids":["https://openalex.org/I74413500"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044253976","display_name":"Xuanlun Li","orcid":null},"institutions":[{"id":"https://openalex.org/I56934997","display_name":"Changsha University of Science and Technology","ror":"https://ror.org/03yph8055","country_code":"CN","type":"education","lineage":["https://openalex.org/I56934997"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xuanlun Li","raw_affiliation_strings":["College of Electrical and Information Engineering, Changsha University of Science and Technology, Changsha, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Electrical and Information Engineering, Changsha University of Science and Technology, Changsha, China","institution_ids":["https://openalex.org/I56934997"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084391120","display_name":"Hang Zhong","orcid":"https://orcid.org/0000-0001-5893-5026"},"institutions":[{"id":"https://openalex.org/I16609230","display_name":"Hunan University","ror":"https://ror.org/05htk5m33","country_code":"CN","type":"education","lineage":["https://openalex.org/I16609230"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hang Zhong","raw_affiliation_strings":["College of Electrical and Information Engineering, Hunan University, Changsha, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Electrical and Information Engineering, Hunan University, Changsha, China","institution_ids":["https://openalex.org/I16609230"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101783854","display_name":"Yimin Yang","orcid":"https://orcid.org/0000-0002-1131-2056"},"institutions":[{"id":"https://openalex.org/I74413500","display_name":"University of Windsor","ror":"https://ror.org/01gw3d370","country_code":"CA","type":"education","lineage":["https://openalex.org/I74413500"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Yimin Yang","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Windsor, Windsor, ON, Canada"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Windsor, Windsor, ON, Canada","institution_ids":["https://openalex.org/I74413500"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100731724","display_name":"Q. M. Jonathan Wu","orcid":"https://orcid.org/0000-0002-5208-7975"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]},{"id":"https://openalex.org/I4210165726","display_name":"Shanghai Municipal Education Commission","ror":"https://ror.org/05tewj457","country_code":"CN","type":"government","lineage":["https://openalex.org/I4210165456","https://openalex.org/I4210165726"]},{"id":"https://openalex.org/I74413500","display_name":"University of Windsor","ror":"https://ror.org/01gw3d370","country_code":"CA","type":"education","lineage":["https://openalex.org/I74413500"]}],"countries":["CA","CN"],"is_corresponding":false,"raw_author_name":"Q. M. Jonathan Wu","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Windsor, Windsor, ON, Canada","Key Laboratory of Shanghai Education Commission for Intelligent Interaction and Cognitive Engineering, Shanghai Jiao Tong University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0002-5208-7975","affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Windsor, Windsor, ON, Canada","institution_ids":["https://openalex.org/I74413500"]},{"raw_affiliation_string":"Key Laboratory of Shanghai Education Commission for Intelligent Interaction and Cognitive Engineering, Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930","https://openalex.org/I4210165726"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063126825","display_name":"Ji Ge","orcid":"https://orcid.org/0000-0002-0610-7576"},"institutions":[{"id":"https://openalex.org/I185261750","display_name":"University of Toronto","ror":"https://ror.org/03dbr7087","country_code":"CA","type":"education","lineage":["https://openalex.org/I185261750"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Ji Ge","raw_affiliation_strings":["Advanced Micro and Nanosystems Laboratory, University of Toronto, Toronto, ON, Canada"],"raw_orcid":"https://orcid.org/0000-0002-0610-7576","affiliations":[{"raw_affiliation_string":"Advanced Micro and Nanosystems Laboratory, University of Toronto, Toronto, ON, Canada","institution_ids":["https://openalex.org/I185261750"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5025640070","display_name":"Yaonan Wang","orcid":"https://orcid.org/0000-0002-0519-6458"},"institutions":[{"id":"https://openalex.org/I16609230","display_name":"Hunan University","ror":"https://ror.org/05htk5m33","country_code":"CN","type":"education","lineage":["https://openalex.org/I16609230"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yaonan Wang","raw_affiliation_strings":["College of Electrical and Information Engineering, Hunan University, Changsha, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Electrical and Information Engineering, Hunan University, Changsha, China","institution_ids":["https://openalex.org/I16609230"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":4.6031,"has_fulltext":false,"cited_by_count":71,"citation_normalized_percentile":{"value":0.94662823,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":96,"max":100},"biblio":{"volume":"67","issue":"6","first_page":"1278","last_page":"1297"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12549","display_name":"Image and Object Detection Techniques","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12282","display_name":"Mineral Processing and Grinding","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.6827639937400818},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.6575431227684021},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6171199083328247},{"id":"https://openalex.org/keywords/machine-vision","display_name":"Machine vision","score":0.542936384677887},{"id":"https://openalex.org/keywords/visual-inspection","display_name":"Visual inspection","score":0.511893630027771},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5090429186820984},{"id":"https://openalex.org/keywords/automated-x-ray-inspection","display_name":"Automated X-ray inspection","score":0.4603540599346161},{"id":"https://openalex.org/keywords/image-segmentation","display_name":"Image segmentation","score":0.44278639554977417},{"id":"https://openalex.org/keywords/segmentation","display_name":"Segmentation","score":0.41548076272010803},{"id":"https://openalex.org/keywords/image-processing","display_name":"Image processing","score":0.3925028443336487},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.2365173101425171}],"concepts":[{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.6827639937400818},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.6575431227684021},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6171199083328247},{"id":"https://openalex.org/C5339829","wikidata":"https://www.wikidata.org/wiki/Q1425977","display_name":"Machine vision","level":2,"score":0.542936384677887},{"id":"https://openalex.org/C168820333","wikidata":"https://www.wikidata.org/wiki/Q448889","display_name":"Visual inspection","level":2,"score":0.511893630027771},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5090429186820984},{"id":"https://openalex.org/C146920229","wikidata":"https://www.wikidata.org/wiki/Q2278114","display_name":"Automated X-ray inspection","level":4,"score":0.4603540599346161},{"id":"https://openalex.org/C124504099","wikidata":"https://www.wikidata.org/wiki/Q56933","display_name":"Image segmentation","level":3,"score":0.44278639554977417},{"id":"https://openalex.org/C89600930","wikidata":"https://www.wikidata.org/wiki/Q1423946","display_name":"Segmentation","level":2,"score":0.41548076272010803},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.3925028443336487},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.2365173101425171},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2018.2800258","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2018.2800258","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","score":0.46000000834465027,"id":"https://metadata.un.org/sdg/9"}],"awards":[{"id":"https://openalex.org/G1562766343","display_name":null,"funder_award_id":"61473049","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G6421781732","display_name":null,"funder_award_id":"61401046","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":60,"referenced_works":["https://openalex.org/W2438976","https://openalex.org/W175299481","https://openalex.org/W1491719799","https://openalex.org/W1497467118","https://openalex.org/W1532362218","https://openalex.org/W1965997090","https://openalex.org/W1980858172","https://openalex.org/W1989484124","https://openalex.org/W1994219073","https://openalex.org/W1999788504","https://openalex.org/W2018369696","https://openalex.org/W2018930433","https://openalex.org/W2019085623","https://openalex.org/W2019972236","https://openalex.org/W2024206427","https://openalex.org/W2027135575","https://openalex.org/W2036537299","https://openalex.org/W2040483045","https://openalex.org/W2057009842","https://openalex.org/W2061879449","https://openalex.org/W2065917713","https://openalex.org/W2067279732","https://openalex.org/W2069747077","https://openalex.org/W2076778321","https://openalex.org/W2094274531","https://openalex.org/W2102674365","https://openalex.org/W2119107075","https://openalex.org/W2120694107","https://openalex.org/W2129440600","https://openalex.org/W2130187411","https://openalex.org/W2132476640","https://openalex.org/W2141620994","https://openalex.org/W2145252826","https://openalex.org/W2147555557","https://openalex.org/W2163360595","https://openalex.org/W2171151720","https://openalex.org/W2171573186","https://openalex.org/W2172024015","https://openalex.org/W2172067177","https://openalex.org/W2270790931","https://openalex.org/W2290636541","https://openalex.org/W2336388276","https://openalex.org/W2344160655","https://openalex.org/W2375638919","https://openalex.org/W2377530498","https://openalex.org/W2518058967","https://openalex.org/W2525076183","https://openalex.org/W2538419421","https://openalex.org/W2538504857","https://openalex.org/W2553201531","https://openalex.org/W2560550165","https://openalex.org/W2568536335","https://openalex.org/W2577056945","https://openalex.org/W2774411915","https://openalex.org/W6607186136","https://openalex.org/W6629564929","https://openalex.org/W6631707545","https://openalex.org/W6684818360","https://openalex.org/W6685330939","https://openalex.org/W6703129668"],"related_works":["https://openalex.org/W2493185854","https://openalex.org/W2058593100","https://openalex.org/W849857824","https://openalex.org/W617381866","https://openalex.org/W2339456629","https://openalex.org/W1986703546","https://openalex.org/W1987385378","https://openalex.org/W2132335896","https://openalex.org/W2794901953","https://openalex.org/W2762725308"],"abstract_inverted_index":{"The":[0,96,179],"particle":[1,123,163],"matter":[2],"inspection":[3,48,84,185],"for":[4,135],"pharmaceutical":[5,13,194],"injection":[6,35],"is":[7,28,104,176],"inevitable":[8],"in":[9,148,192],"the":[10,18,22,25,33,91,126,153,157,183,190,193],"field":[11],"of":[12,24,51,122,132,155,203],"manufacturing,":[14],"as":[15],"it":[16],"has":[17],"direct":[19],"impact":[20],"on":[21,169],"quality":[23],"drugs.":[26],"It":[27],"a":[29,44,54,70,75,130,162,200],"challenge":[30],"to":[31,143],"inspect":[32],"contaminated":[34],"online":[36],"using":[37,90],"an":[38,61,170],"imaging":[39],"system.":[40,81,95],"This":[41],"paper":[42],"introduces":[43],"novel":[45,133],"and":[46,69,74,115,138,165,198],"effective":[47],"machine":[49,85],"consisting":[50],"three":[52],"modules,":[53],"mechanical":[55],"system":[56,64,186],"with":[57,65,107],"120":[58],"carousel":[59],"grips,":[60],"image":[62,88,93,97,136],"acquisition":[63,94],"multihigh":[66],"resolution":[67],"cameras":[68],"multilight":[71],"sources":[72],"station,":[73],"distributed":[76],"industrial":[77],"electrical":[78],"computer":[79],"control":[80],"Particle":[82],"visual":[83],"first":[86],"acquires":[87],"sequence":[89],"high-speed":[92],"capture":[98,121],"process":[99],"at":[100],"each":[101],"camera":[102],"module":[103],"alternately":[105],"synchronized":[106],"different":[108],"LED":[109],"illumination":[110],"techniques":[111],"(light":[112],"transmission":[113],"method":[114],"light":[116],"reflection":[117],"method),":[118],"enabling":[119],"independent":[120],"images":[124],"from":[125],"same":[127],"container.":[128],"Then,":[129],"set":[131],"algorithms":[134],"registration":[137],"fast":[139],"segmentation":[140],"are":[141],"proposed":[142,184],"minimize":[144],"false":[145],"rejections":[146],"even":[147],"sensitive":[149],"conditions,":[150],"which":[151],"enable":[152],"identification":[154],"all":[156],"tiny":[158],"potential":[159],"defects.":[160],"Finally,":[161],"tracking":[164],"classification":[166],"algorithm":[167],"based":[168],"adaptive":[171],"local":[172],"weighted-collaborative":[173],"sparse":[174],"model":[175],"also":[177],"presented.":[178],"experiments":[180],"demonstrate":[181],"that":[182],"can":[187],"effectively":[188],"detect":[189],"particles":[191],"infusion":[195],"solution":[196],"online,":[197],"achieve":[199],"performance":[201],"rate":[202],"above":[204],"97%":[205],"average":[206],"accuracy.":[207]},"counts_by_year":[{"year":2026,"cited_by_count":7},{"year":2025,"cited_by_count":14},{"year":2024,"cited_by_count":6},{"year":2023,"cited_by_count":10},{"year":2022,"cited_by_count":6},{"year":2021,"cited_by_count":7},{"year":2020,"cited_by_count":10},{"year":2019,"cited_by_count":8},{"year":2018,"cited_by_count":3}],"updated_date":"2026-07-22T07:51:19.307946","created_date":"2025-10-10T00:00:00"}