{"id":"https://openalex.org/W2766482467","doi":"https://doi.org/10.1109/tim.2017.2761238","title":"A Differential Output Interfacing ASIC for Integrated Capacitive Sensors","display_name":"A Differential Output Interfacing ASIC for Integrated Capacitive Sensors","publication_year":2017,"publication_date":"2017-10-31","ids":{"openalex":"https://openalex.org/W2766482467","doi":"https://doi.org/10.1109/tim.2017.2761238","mag":"2766482467"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2017.2761238","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2017.2761238","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103240495","display_name":"Sougata Kumar Kar","orcid":"https://orcid.org/0000-0003-2192-0845"},"institutions":[{"id":"https://openalex.org/I16292982","display_name":"National Institute of Technology Rourkela","ror":"https://ror.org/011gmn932","country_code":"IN","type":"education","lineage":["https://openalex.org/I16292982"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Sougata Kumar Kar","raw_affiliation_strings":["Department of Electronics and Communication Engineering, National Institute of Technology at Rourkela, Rourkela, India"],"raw_orcid":"https://orcid.org/0000-0003-2192-0845","affiliations":[{"raw_affiliation_string":"Department of Electronics and Communication Engineering, National Institute of Technology at Rourkela, Rourkela, India","institution_ids":["https://openalex.org/I16292982"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113827128","display_name":"Procheta Chatterjee","orcid":null},"institutions":[{"id":"https://openalex.org/I145894827","display_name":"Indian Institute of Technology Kharagpur","ror":"https://ror.org/03w5sq511","country_code":"IN","type":"education","lineage":["https://openalex.org/I145894827"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Procheta Chatterjee","raw_affiliation_strings":["Department of Electrical Engineering, IIT Kharagpur, Kharagpur, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, IIT Kharagpur, Kharagpur, India","institution_ids":["https://openalex.org/I145894827"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5052363666","display_name":"Banibrata Mukherjee","orcid":"https://orcid.org/0000-0002-1100-5400"},"institutions":[{"id":"https://openalex.org/I16292982","display_name":"National Institute of Technology Rourkela","ror":"https://ror.org/011gmn932","country_code":"IN","type":"education","lineage":["https://openalex.org/I16292982"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Banibrata Mukherjee","raw_affiliation_strings":["Department of Electronics and Communication Engineering, National Institute of Technology at Rourkela, Rourkela, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronics and Communication Engineering, National Institute of Technology at Rourkela, Rourkela, India","institution_ids":["https://openalex.org/I16292982"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110532018","display_name":"Kenkere Balashantha Murthy Mruthyunjaya Swamy","orcid":null},"institutions":[{"id":"https://openalex.org/I59270414","display_name":"Indian Institute of Science Bangalore","ror":"https://ror.org/04dese585","country_code":"IN","type":"education","lineage":["https://openalex.org/I59270414"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Kenkere Balashantha Murthy Mruthyunjaya Swamy","raw_affiliation_strings":["Centre for Nano Science and Engineering, IISc Bangalore, Bangalore, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Centre for Nano Science and Engineering, IISc Bangalore, Bangalore, India","institution_ids":["https://openalex.org/I59270414"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5049055278","display_name":"Siddhartha Sen","orcid":"https://orcid.org/0000-0001-6501-6386"},"institutions":[{"id":"https://openalex.org/I145894827","display_name":"Indian Institute of Technology Kharagpur","ror":"https://ror.org/03w5sq511","country_code":"IN","type":"education","lineage":["https://openalex.org/I145894827"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Siddhartha Sen","raw_affiliation_strings":["Department of Electrical Engineering, IIT Kharagpur, Kharagpur, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, IIT Kharagpur, Kharagpur, India","institution_ids":["https://openalex.org/I145894827"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.5345,"has_fulltext":false,"cited_by_count":39,"citation_normalized_percentile":{"value":0.9033854,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"67","issue":"1","first_page":"196","last_page":"203"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10369","display_name":"Advanced MEMS and NEMS Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10369","display_name":"Advanced MEMS and NEMS Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11449","display_name":"Mechanical and Optical Resonators","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/interfacing","display_name":"Interfacing","score":0.7324684858322144},{"id":"https://openalex.org/keywords/application-specific-integrated-circuit","display_name":"Application-specific integrated circuit","score":0.6825708150863647},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.6265033483505249},{"id":"https://openalex.org/keywords/capacitive-sensing","display_name":"Capacitive sensing","score":0.6131107807159424},{"id":"https://openalex.org/keywords/operational-transconductance-amplifier","display_name":"Operational transconductance amplifier","score":0.5896983742713928},{"id":"https://openalex.org/keywords/differential-amplifier","display_name":"Differential amplifier","score":0.5466495156288147},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5387841463088989},{"id":"https://openalex.org/keywords/signal-conditioning","display_name":"Signal conditioning","score":0.5257982611656189},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5200133323669434},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.4904029369354248},{"id":"https://openalex.org/keywords/charge-amplifier","display_name":"Charge amplifier","score":0.48809611797332764},{"id":"https://openalex.org/keywords/operational-amplifier","display_name":"Operational amplifier","score":0.4791552424430847},{"id":"https://openalex.org/keywords/switched-capacitor","display_name":"Switched capacitor","score":0.4617498219013214},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.4414994716644287},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.43795496225357056},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.42405837774276733},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.31732356548309326},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.23314866423606873},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.14267155528068542},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.09815943241119385}],"concepts":[{"id":"https://openalex.org/C2776303644","wikidata":"https://www.wikidata.org/wiki/Q1020499","display_name":"Interfacing","level":2,"score":0.7324684858322144},{"id":"https://openalex.org/C77390884","wikidata":"https://www.wikidata.org/wiki/Q217302","display_name":"Application-specific integrated circuit","level":2,"score":0.6825708150863647},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.6265033483505249},{"id":"https://openalex.org/C206755178","wikidata":"https://www.wikidata.org/wiki/Q1131271","display_name":"Capacitive sensing","level":2,"score":0.6131107807159424},{"id":"https://openalex.org/C58117264","wikidata":"https://www.wikidata.org/wiki/Q1239595","display_name":"Operational transconductance amplifier","level":5,"score":0.5896983742713928},{"id":"https://openalex.org/C11722477","wikidata":"https://www.wikidata.org/wiki/Q1056298","display_name":"Differential amplifier","level":4,"score":0.5466495156288147},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5387841463088989},{"id":"https://openalex.org/C2780412824","wikidata":"https://www.wikidata.org/wiki/Q3686420","display_name":"Signal conditioning","level":3,"score":0.5257982611656189},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5200133323669434},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.4904029369354248},{"id":"https://openalex.org/C169076538","wikidata":"https://www.wikidata.org/wiki/Q1800062","display_name":"Charge amplifier","level":5,"score":0.48809611797332764},{"id":"https://openalex.org/C145366948","wikidata":"https://www.wikidata.org/wiki/Q178947","display_name":"Operational amplifier","level":4,"score":0.4791552424430847},{"id":"https://openalex.org/C103357873","wikidata":"https://www.wikidata.org/wiki/Q572656","display_name":"Switched capacitor","level":4,"score":0.4617498219013214},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.4414994716644287},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.43795496225357056},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.42405837774276733},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.31732356548309326},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.23314866423606873},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.14267155528068542},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.09815943241119385},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2017.2761238","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2017.2761238","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.800000011920929,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320325536","display_name":"Indian Institute of Technology Kharagpur","ror":"https://ror.org/03w5sq511"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1507052825","https://openalex.org/W1583125365","https://openalex.org/W1591300912","https://openalex.org/W1600992517","https://openalex.org/W2031424373","https://openalex.org/W2041625964","https://openalex.org/W2053388477","https://openalex.org/W2085132412","https://openalex.org/W2100484040","https://openalex.org/W2103198996","https://openalex.org/W2125105722","https://openalex.org/W2142010030","https://openalex.org/W2144637390","https://openalex.org/W2153265319","https://openalex.org/W2153484902","https://openalex.org/W2153660465","https://openalex.org/W2320323019"],"related_works":["https://openalex.org/W2546195600","https://openalex.org/W2129228928","https://openalex.org/W2029273722","https://openalex.org/W2047247819","https://openalex.org/W2035001307","https://openalex.org/W1654939831","https://openalex.org/W2543512348","https://openalex.org/W2560651091","https://openalex.org/W2082728650","https://openalex.org/W2113560059"],"abstract_inverted_index":{"In":[0,18,56],"this":[1],"paper,":[2],"we":[3],"have":[4],"proposed":[5,20,137,148],"an":[6],"input":[7],"interfacing":[8,24],"scheme":[9],"with":[10,50,122,169,175],"differential":[11,36,42,48],"output":[12,49],"for":[13,66],"integrated":[14,65,98,121,164],"capacitive":[15,43,127],"sensor":[16,44],"applications.":[17],"the":[19,22,57,87,133,136,144,147,160,180],"scheme,":[21],"front-end":[23],"is":[25,64,101,119,166],"based":[26],"on":[27],"switched":[28],"capacitor":[29,82],"charge":[30],"amplifier":[31,39],"configuration":[32],"using":[33],"a":[34,60,123,176],"fully":[35],"operational":[37],"transconductance":[38],"and":[40,83,103,131,179],"one":[41],"arrangement":[45],"which":[46],"provides":[47],"minimum":[51],"number":[52],"of":[53,135,146],"circuit":[54,73,99,149],"components.":[55],"back":[58],"end,":[59],"sigma-delta":[61],"(\u03a3\u0394)":[62],"modulator":[63],"modulated":[67],"digital":[68],"output.":[69],"The":[70,94,116,139,163],"signal":[71],"conditioning":[72],"also":[74,167],"includes":[75],"gain":[76],"programmability":[77],"by":[78,158],"selecting":[79],"proper":[80],"feedback":[81,161],"mismatch":[84],"cancellation":[85],"between":[86],"sensing":[88],"capacitors":[89,92],"through":[90],"on-chip":[91],"array.":[93],"complete":[95],"application":[96],"specific":[97],"(ASIC)":[100],"designed":[102],"fabricated":[104,117],"in":[105],"United":[106],"Microelectronics":[107],"Corporation":[108],"(UMC)":[109],"0.18":[110],"-":[111],"\u03bcm":[112],"CMOS":[113],"process":[114],"technology.":[115],"ASIC":[118],"then":[120],"silicon-on-insulator":[124],"microelectromechnical":[125],"systems":[126],"accelerometer":[128],"to":[129,155],"test":[130],"characterize":[132],"performance":[134],"scheme.":[138],"measured":[140],"result":[141],"shows":[142],"that":[143],"sensitivity":[145],"can":[150],"be":[151],"varied":[152],"from":[153],"200":[154],"900":[156],"mV/g":[157],"changing":[159],"capacitor.":[162],"system":[165],"tested":[168],"electrostatic":[170],"actuation":[171],"as":[172,174],"well":[173],"vibrating":[177],"shaker":[178],"measurement":[181],"results":[182],"are":[183],"presented.":[184]},"counts_by_year":[{"year":2025,"cited_by_count":9},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":6},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":7},{"year":2019,"cited_by_count":4},{"year":2018,"cited_by_count":7}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}