{"id":"https://openalex.org/W2608240244","doi":"https://doi.org/10.1109/tim.2017.2681258","title":"Coaxial Connector Conversion Method for Traceable Scattering Parameter Measurement","display_name":"Coaxial Connector Conversion Method for Traceable Scattering Parameter Measurement","publication_year":2017,"publication_date":"2017-04-24","ids":{"openalex":"https://openalex.org/W2608240244","doi":"https://doi.org/10.1109/tim.2017.2681258","mag":"2608240244"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2017.2681258","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2017.2681258","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5026725703","display_name":"Ryoko Kishikawa","orcid":"https://orcid.org/0000-0002-5545-4136"},"institutions":[{"id":"https://openalex.org/I4210136277","display_name":"Institute of Space and Astronautical Science","ror":"https://ror.org/034gcgw60","country_code":"JP","type":"facility","lineage":["https://openalex.org/I2800865746","https://openalex.org/I4210136277"]},{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Ryoko Kishikawa","raw_affiliation_strings":["Department of Space and Astronautical Science, The Graduate University for Advanced Studies, Sagamihara, Japan","National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan"],"affiliations":[{"raw_affiliation_string":"Department of Space and Astronautical Science, The Graduate University for Advanced Studies, Sagamihara, Japan","institution_ids":["https://openalex.org/I4210136277"]},{"raw_affiliation_string":"National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002000026","display_name":"Shintaro Nakamura","orcid":"https://orcid.org/0000-0003-0785-7333"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Shintaro Nakamura","raw_affiliation_strings":["Japan Quality Assurance Organization, Hachioji, Japan"],"affiliations":[{"raw_affiliation_string":"Japan Quality Assurance Organization, Hachioji, Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001716964","display_name":"Keiko Sato","orcid":"https://orcid.org/0000-0003-3302-022X"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Keiko Sato","raw_affiliation_strings":["Japan Quality Assurance Organization, Hachioji, Japan"],"affiliations":[{"raw_affiliation_string":"Japan Quality Assurance Organization, Hachioji, Japan","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5031714807","display_name":"Masahiro Horibe","orcid":"https://orcid.org/0000-0002-1193-607X"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Masahiro Horibe","raw_affiliation_strings":["National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan"],"affiliations":[{"raw_affiliation_string":"National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5026725703"],"corresponding_institution_ids":["https://openalex.org/I4210136277","https://openalex.org/I73613424"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.03194654,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":"66","issue":"6","first_page":"1566","last_page":"1571"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9905999898910522,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9905999898910522,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9621999859809875,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9603000283241272,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cable-gland","display_name":"Cable gland","score":0.8764883875846863},{"id":"https://openalex.org/keywords/coaxial","display_name":"Coaxial","score":0.7650473117828369},{"id":"https://openalex.org/keywords/conductor","display_name":"Conductor","score":0.655130922794342},{"id":"https://openalex.org/keywords/electrical-conductor","display_name":"Electrical conductor","score":0.6424552202224731},{"id":"https://openalex.org/keywords/scattering-parameters","display_name":"Scattering parameters","score":0.6059397459030151},{"id":"https://openalex.org/keywords/metrology","display_name":"Metrology","score":0.5477771162986755},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5272796750068665},{"id":"https://openalex.org/keywords/scattering","display_name":"Scattering","score":0.45349204540252686},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.3867725133895874},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3498704135417938},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.32755404710769653},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.30696025490760803},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.28170695900917053},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.20513397455215454}],"concepts":[{"id":"https://openalex.org/C110925319","wikidata":"https://www.wikidata.org/wiki/Q12855","display_name":"Cable gland","level":2,"score":0.8764883875846863},{"id":"https://openalex.org/C51221625","wikidata":"https://www.wikidata.org/wiki/Q1751466","display_name":"Coaxial","level":2,"score":0.7650473117828369},{"id":"https://openalex.org/C34800285","wikidata":"https://www.wikidata.org/wiki/Q5159395","display_name":"Conductor","level":2,"score":0.655130922794342},{"id":"https://openalex.org/C202374169","wikidata":"https://www.wikidata.org/wiki/Q124291","display_name":"Electrical conductor","level":2,"score":0.6424552202224731},{"id":"https://openalex.org/C195266298","wikidata":"https://www.wikidata.org/wiki/Q2165620","display_name":"Scattering parameters","level":2,"score":0.6059397459030151},{"id":"https://openalex.org/C195766429","wikidata":"https://www.wikidata.org/wiki/Q394","display_name":"Metrology","level":2,"score":0.5477771162986755},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5272796750068665},{"id":"https://openalex.org/C191486275","wikidata":"https://www.wikidata.org/wiki/Q210028","display_name":"Scattering","level":2,"score":0.45349204540252686},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.3867725133895874},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3498704135417938},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.32755404710769653},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.30696025490760803},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.28170695900917053},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.20513397455215454},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2017.2681258","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2017.2681258","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.7900000214576721,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W1965910111","https://openalex.org/W1968803904","https://openalex.org/W1983656890","https://openalex.org/W2033708812","https://openalex.org/W2085767250","https://openalex.org/W2117707601","https://openalex.org/W2127408789","https://openalex.org/W2510136761"],"related_works":["https://openalex.org/W3023206390","https://openalex.org/W2914572048","https://openalex.org/W2580508178","https://openalex.org/W2373102250","https://openalex.org/W2913399970","https://openalex.org/W2546219912","https://openalex.org/W3126278005","https://openalex.org/W2972040590","https://openalex.org/W2385195413","https://openalex.org/W2537311557"],"abstract_inverted_index":{"This":[0],"paper":[1],"reports":[2],"a":[3,94],"connector":[4,26,100],"conversion":[5,27,101],"technique":[6],"for":[7],"coaxial":[8],"lines":[9],"in":[10,112,122],"the":[11,47,53,58,64,72,82,89,116,119,123],"frequency":[12,124],"range":[13,125],"from":[14,52,63,126],"9":[15,127],"kHz":[16,128],"to":[17,81,87,97,129],"100":[18,130],"MHz.":[19,131],"We":[20,114],"designed":[21],"and":[22,36,57,69,74],"fabricated":[23],"an":[24,33,37],"original":[25],"adaptor,":[28],"which":[29],"is":[30,79],"composed":[31],"of":[32,46,71,118],"inner":[34,73],"conductor":[35,39],"outer":[38,75],"without":[40],"insulator":[41],"beads.":[42],"The":[43,77],"scattering":[44],"parameter":[45],"adaptor":[48,102],"was":[49,91],"theoretically":[50],"calculated":[51],"dimensional":[54,65],"measurement":[55,86],"data,":[56],"expanded":[59],"uncertainties":[60],"were":[61],"propagated":[62],"measurements,":[66,68],"electrical":[67],"configuration":[70],"conductors.":[76],"method":[78,90,121],"traceable":[80],"length":[83],"standard.":[84],"A":[85],"validate":[88],"performed":[92],"using":[93],"7":[95],"mm":[96,99],"3.5":[98],"because":[103],"these":[104],"two":[105],"metrology":[106],"standards":[107],"have":[108],"already":[109],"been":[110],"developed":[111],"Japan.":[113],"confirmed":[115],"validity":[117],"proposed":[120]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}