{"id":"https://openalex.org/W2592397907","doi":"https://doi.org/10.1109/tim.2017.2668760","title":"Further Investigation for Piecewise Sampling to Overcome Transient Effect of Staircase Waveform","display_name":"Further Investigation for Piecewise Sampling to Overcome Transient Effect of Staircase Waveform","publication_year":2017,"publication_date":"2017-03-07","ids":{"openalex":"https://openalex.org/W2592397907","doi":"https://doi.org/10.1109/tim.2017.2668760","mag":"2592397907"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2017.2668760","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2017.2668760","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101863021","display_name":"Zuliang Lu","orcid":"https://orcid.org/0000-0001-5254-6126"},"institutions":[{"id":"https://openalex.org/I4210162136","display_name":"National Institute of Metrology","ror":"https://ror.org/05dw0p167","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210162136"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Zuliang Lu","raw_affiliation_strings":["National Institute of Metrology, Beijing, China"],"affiliations":[{"raw_affiliation_string":"National Institute of Metrology, Beijing, China","institution_ids":["https://openalex.org/I4210162136"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067956081","display_name":"Yan Yang","orcid":"https://orcid.org/0000-0003-3097-2620"},"institutions":[{"id":"https://openalex.org/I4210162136","display_name":"National Institute of Metrology","ror":"https://ror.org/05dw0p167","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210162136"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yan Yang","raw_affiliation_strings":["National Institute of Metrology, Beijing, China"],"affiliations":[{"raw_affiliation_string":"National Institute of Metrology, Beijing, China","institution_ids":["https://openalex.org/I4210162136"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103284766","display_name":"Lu Huang","orcid":"https://orcid.org/0000-0002-8206-159X"},"institutions":[{"id":"https://openalex.org/I4210162136","display_name":"National Institute of Metrology","ror":"https://ror.org/05dw0p167","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210162136"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lu Huang","raw_affiliation_strings":["National Institute of Metrology, Beijing, China"],"affiliations":[{"raw_affiliation_string":"National Institute of Metrology, Beijing, China","institution_ids":["https://openalex.org/I4210162136"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5089100859","display_name":"Lei Wang","orcid":"https://orcid.org/0000-0001-6784-4572"},"institutions":[{"id":"https://openalex.org/I4210162136","display_name":"National Institute of Metrology","ror":"https://ror.org/05dw0p167","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210162136"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lei Wang","raw_affiliation_strings":["National Institute of Metrology, Beijing, China"],"affiliations":[{"raw_affiliation_string":"National Institute of Metrology, Beijing, China","institution_ids":["https://openalex.org/I4210162136"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068473082","display_name":"Xianlin Pan","orcid":"https://orcid.org/0000-0002-3158-7604"},"institutions":[{"id":"https://openalex.org/I4210162136","display_name":"National Institute of Metrology","ror":"https://ror.org/05dw0p167","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210162136"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xianlin Pan","raw_affiliation_strings":["National Institute of Metrology, Beijing, China"],"affiliations":[{"raw_affiliation_string":"National Institute of Metrology, Beijing, China","institution_ids":["https://openalex.org/I4210162136"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102021559","display_name":"Jiangtao Zhang","orcid":"https://orcid.org/0000-0001-8052-7600"},"institutions":[{"id":"https://openalex.org/I4210162136","display_name":"National Institute of Metrology","ror":"https://ror.org/05dw0p167","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210162136"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiangtao Zhang","raw_affiliation_strings":["National Institute of Metrology, Beijing, China"],"affiliations":[{"raw_affiliation_string":"National Institute of Metrology, Beijing, China","institution_ids":["https://openalex.org/I4210162136"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5029874260","display_name":"E. So","orcid":"https://orcid.org/0000-0001-9666-6226"},"institutions":[{"id":"https://openalex.org/I4210159778","display_name":"National Research Council Canada","ror":"https://ror.org/04mte1k06","country_code":"CA","type":"government","lineage":["https://openalex.org/I4210159778"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Eddy So","raw_affiliation_strings":["National Research Council of Canada, Ottawa, ON, Canada"],"affiliations":[{"raw_affiliation_string":"National Research Council of Canada, Ottawa, ON, Canada","institution_ids":["https://openalex.org/I4210159778"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5101863021"],"corresponding_institution_ids":["https://openalex.org/I4210162136"],"apc_list":null,"apc_paid":null,"fwci":0.2867,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.56943773,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":"66","issue":"6","first_page":"1217","last_page":"1226"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9969000220298767,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10573","display_name":"Power Quality and Harmonics","score":0.9955999851226807,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/waveform","display_name":"Waveform","score":0.8491823673248291},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.68760746717453},{"id":"https://openalex.org/keywords/piecewise","display_name":"Piecewise","score":0.6792958378791809},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.6190996170043945},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.5489769577980042},{"id":"https://openalex.org/keywords/filter","display_name":"Filter (signal processing)","score":0.5248411297798157},{"id":"https://openalex.org/keywords/fourier-transform","display_name":"Fourier transform","score":0.5143100023269653},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.43112173676490784},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.42569872736930847},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3908812999725342},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21630966663360596},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.10470971465110779},{"id":"https://openalex.org/keywords/mathematical-analysis","display_name":"Mathematical analysis","score":0.08973971009254456}],"concepts":[{"id":"https://openalex.org/C197424946","wikidata":"https://www.wikidata.org/wiki/Q1165717","display_name":"Waveform","level":3,"score":0.8491823673248291},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.68760746717453},{"id":"https://openalex.org/C164660894","wikidata":"https://www.wikidata.org/wiki/Q2037833","display_name":"Piecewise","level":2,"score":0.6792958378791809},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.6190996170043945},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5489769577980042},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.5248411297798157},{"id":"https://openalex.org/C102519508","wikidata":"https://www.wikidata.org/wiki/Q6520159","display_name":"Fourier transform","level":2,"score":0.5143100023269653},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.43112173676490784},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.42569872736930847},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3908812999725342},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21630966663360596},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.10470971465110779},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.08973971009254456},{"id":"https://openalex.org/C554190296","wikidata":"https://www.wikidata.org/wiki/Q47528","display_name":"Radar","level":2,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2017.2668760","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2017.2668760","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/11","score":0.49000000953674316,"display_name":"Sustainable cities and communities"}],"awards":[{"id":"https://openalex.org/G2901308236","display_name":null,"funder_award_id":"51377150","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W1992286365","https://openalex.org/W2042876658","https://openalex.org/W2048445727","https://openalex.org/W2059529910","https://openalex.org/W2086693638","https://openalex.org/W2113442245","https://openalex.org/W2128269426","https://openalex.org/W2137624056","https://openalex.org/W2154544822","https://openalex.org/W2172971245","https://openalex.org/W2326674673","https://openalex.org/W2507120798","https://openalex.org/W3109938142"],"related_works":["https://openalex.org/W1974895211","https://openalex.org/W2176409448","https://openalex.org/W2129841057","https://openalex.org/W3040712279","https://openalex.org/W2364769705","https://openalex.org/W4367555392","https://openalex.org/W2374664672","https://openalex.org/W2056136368","https://openalex.org/W2538520412","https://openalex.org/W2883092465"],"abstract_inverted_index":{"A":[0],"further":[1],"investigation":[2],"of":[3,12,48,55,76,85,93,114,122,131,164],"the":[4,9,30,41,56,77,83,91,94,100,110,115,128,139,162,165,169],"new":[5],"approach":[6,105],"to":[7,37,108,149],"overcome":[8],"transient":[10],"effect":[11],"staircase":[13,95,123],"waveform":[14,96,124],"is":[15,20,27,34,63,106,125,147,193],"reported.":[16],"The":[17,53,73,119,174,183],"piecewise":[18,117],"sampling":[19,26],"reviewed,":[21],"in":[22,80,145],"which":[23],"a":[24],"normal":[25],"performed":[28],"but":[29],"discrete":[31],"Fourier":[32],"transform":[33],"only":[35],"applied":[36,144],"partial":[38],"samples":[39,43,86],"while":[40],"other":[42],"located":[44],"on":[45],"both":[46],"sides":[47],"each":[49,88],"step":[50,78,166],"are":[51,97,181],"discarded.":[52],"applicability":[54],"analog-to-digital":[57],"converter":[58,133],"(ADC)":[59],"with":[60,67,99],"antialiasing":[61],"filter":[62],"verified":[64],"through":[65],"comparison":[66],"another":[68,157],"ADC":[69,146],"without":[70],"such":[71],"filter.":[72],"parameter":[74],"settings":[75],"number":[79,84],"one":[81],"period,":[82],"at":[87],"step,":[89],"and":[90,112,167,178],"frequency":[92,121,137],"investigated":[98],"experimental":[101,104,179,184],"results.":[102],"An":[103],"introduced":[107],"determine":[109],"location":[111],"length":[113],"desired":[116],"sampling.":[118],"available":[120],"limited":[126],"by":[127],"settling":[129],"time":[130],"digital-to-analog":[132],"(DAC).":[134],"For":[135],"higher":[136],"measurements,":[138],"well-known":[140],"multiperiod":[141],"strategy":[142],"previously":[143],"proposed":[148],"have":[150],"its":[151],"application":[152],"extended":[153],"into":[154],"DAC.":[155],"From":[156],"perspective,":[158],"it":[159],"will":[160],"widen":[161],"width":[163],"alleviate":[168],"need":[170],"for":[171],"frequent":[172],"conversions.":[173],"relevant":[175],"principles,":[176],"procedures":[177],"evidences":[180],"presented.":[182],"results":[185],"indicate":[186],"that":[187],"no":[188],"significant":[189],"additional":[190],"measurement":[191],"error":[192],"detected.":[194]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2018,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}