{"id":"https://openalex.org/W2596852373","doi":"https://doi.org/10.1109/tim.2017.2662498","title":"Coaxial and Digital Impedance Bridges for Capacitance Measurements at the nF Range","display_name":"Coaxial and Digital Impedance Bridges for Capacitance Measurements at the nF Range","publication_year":2017,"publication_date":"2017-03-16","ids":{"openalex":"https://openalex.org/W2596852373","doi":"https://doi.org/10.1109/tim.2017.2662498","mag":"2596852373"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2017.2662498","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2017.2662498","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5074578836","display_name":"Renata T. de Barros e Vasconcellos","orcid":"https://orcid.org/0000-0002-7276-5630"},"institutions":[{"id":"https://openalex.org/I40891861","display_name":"Instituto Nacional de Metrologia, Qualidade e Tecnologia","ror":"https://ror.org/01f8vhd41","country_code":"BR","type":"government","lineage":["https://openalex.org/I2801200668","https://openalex.org/I2802647933","https://openalex.org/I40891861"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Renata T. de Barros e Vasconcellos","raw_affiliation_strings":["Quality and Technology, Brazilian National Institute of Metrology, Duque de Caxias, Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Quality and Technology, Brazilian National Institute of Metrology, Duque de Caxias, Brazil","institution_ids":["https://openalex.org/I40891861"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047846573","display_name":"Vladimir R. de Lima","orcid":null},"institutions":[{"id":"https://openalex.org/I40891861","display_name":"Instituto Nacional de Metrologia, Qualidade e Tecnologia","ror":"https://ror.org/01f8vhd41","country_code":"BR","type":"government","lineage":["https://openalex.org/I2801200668","https://openalex.org/I2802647933","https://openalex.org/I40891861"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Vladimir Rodrigues de Lima","raw_affiliation_strings":["Quality and Technology, Brazilian National Institute of Metrology, Duque de Caxias, Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Quality and Technology, Brazilian National Institute of Metrology, Duque de Caxias, Brazil","institution_ids":["https://openalex.org/I40891861"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002199733","display_name":"W. G. K\u00fcrten Ihlenfeld","orcid":null},"institutions":[{"id":"https://openalex.org/I40891861","display_name":"Instituto Nacional de Metrologia, Qualidade e Tecnologia","ror":"https://ror.org/01f8vhd41","country_code":"BR","type":"government","lineage":["https://openalex.org/I2801200668","https://openalex.org/I2802647933","https://openalex.org/I40891861"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Waldemar G. Kurten Ihlenfeld","raw_affiliation_strings":["Quality and Technology, Brazilian National Institute of Metrology, Duque de Caxias, Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Quality and Technology, Brazilian National Institute of Metrology, Duque de Caxias, Brazil","institution_ids":["https://openalex.org/I40891861"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5054733635","display_name":"Flavio da Silveira","orcid":null},"institutions":[{"id":"https://openalex.org/I40891861","display_name":"Instituto Nacional de Metrologia, Qualidade e Tecnologia","ror":"https://ror.org/01f8vhd41","country_code":"BR","type":"government","lineage":["https://openalex.org/I2801200668","https://openalex.org/I2802647933","https://openalex.org/I40891861"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Flavio da Silveira","raw_affiliation_strings":["Quality and Technology, Brazilian National Institute of Metrology, Duque de Caxias, Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Quality and Technology, Brazilian National Institute of Metrology, Duque de Caxias, Brazil","institution_ids":["https://openalex.org/I40891861"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I40891861"],"apc_list":null,"apc_paid":null,"fwci":0.8771,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.75346494,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"66","issue":"6","first_page":"1553","last_page":"1559"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9977999925613403,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/coaxial","display_name":"Coaxial","score":0.7855539917945862},{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.7367993593215942},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.6796364784240723},{"id":"https://openalex.org/keywords/quadrature","display_name":"Quadrature (astronomy)","score":0.6094317436218262},{"id":"https://openalex.org/keywords/varicap","display_name":"Varicap","score":0.49872541427612305},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.4416593611240387},{"id":"https://openalex.org/keywords/range","display_name":"Range (aeronautics)","score":0.4218613803386688},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.40758275985717773},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3614043891429901},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.35559678077697754},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3336624503135681},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3233523666858673},{"id":"https://openalex.org/keywords/aerospace-engineering","display_name":"Aerospace engineering","score":0.0756475031375885}],"concepts":[{"id":"https://openalex.org/C51221625","wikidata":"https://www.wikidata.org/wiki/Q1751466","display_name":"Coaxial","level":2,"score":0.7855539917945862},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.7367993593215942},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.6796364784240723},{"id":"https://openalex.org/C62869609","wikidata":"https://www.wikidata.org/wiki/Q28137","display_name":"Quadrature (astronomy)","level":2,"score":0.6094317436218262},{"id":"https://openalex.org/C15485314","wikidata":"https://www.wikidata.org/wiki/Q467463","display_name":"Varicap","level":4,"score":0.49872541427612305},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.4416593611240387},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.4218613803386688},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.40758275985717773},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3614043891429901},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.35559678077697754},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3336624503135681},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3233523666858673},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0756475031375885},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2017.2662498","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2017.2662498","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W1483090339","https://openalex.org/W1970904460","https://openalex.org/W2003450917","https://openalex.org/W2012291524","https://openalex.org/W2021521801","https://openalex.org/W2106020736","https://openalex.org/W2133837317","https://openalex.org/W2141925685","https://openalex.org/W2154397063","https://openalex.org/W2165437839","https://openalex.org/W2224233070","https://openalex.org/W2314274981","https://openalex.org/W2326537323","https://openalex.org/W2507683210","https://openalex.org/W2515654110","https://openalex.org/W2517295234","https://openalex.org/W2593575068","https://openalex.org/W3149486234","https://openalex.org/W4285719527","https://openalex.org/W6689438698"],"related_works":["https://openalex.org/W2062881472","https://openalex.org/W3216548552","https://openalex.org/W2498090544","https://openalex.org/W2955171543","https://openalex.org/W1982040370","https://openalex.org/W2754048597","https://openalex.org/W2136900323","https://openalex.org/W2020233054","https://openalex.org/W2091485363","https://openalex.org/W2287154167"],"abstract_inverted_index":{"This":[0],"paper":[1],"describes":[2],"three":[3],"impedance":[4],"bridges":[5,15,45],"in":[6,26,60,77,88,98,106],"operation":[7],"at":[8],"INMETRO:":[9],"the":[10,27,34,38,43,52,67,78,91],"two-":[11],"and":[12,16,40,48],"four-terminal-pair":[13],"coaxial":[14,44,70,92],"a":[17,55,95],"digital":[18,56,85],"quadrature":[19],"bridge,":[20],"including":[21],"several":[22],"comparisons":[23,32],"among":[24],"them":[25],"nanofarad":[28],"capacitance":[29],"range.":[30],"These":[31],"have":[33],"objective":[35],"to":[36,49],"verify":[37],"performance":[39],"reliability":[41],"of":[42,54],"between":[46],"themselves":[47],"infer":[50],"on":[51],"capabilities":[53],"one,":[57],"recently":[58],"put":[59],"operation.":[61],"The":[62,84],"results":[63],"obtained":[64],"indicate":[65],"that":[66],"more":[68],"accurate":[69],"systems":[71],"are":[72],"compatible":[73],"with":[74,90],"one":[75],"another":[76],"10":[79,99],"<sup":[80,100],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[81,101],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">-7</sup>":[82],"level.":[83],"bridge":[86],"is":[87],"agreement":[89],"ones":[93],"within":[94],"few":[96],"parts":[97],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">6</sup>":[102],"or":[103],"even":[104],"less":[105],"some":[107],"cases.":[108]},"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":2}],"updated_date":"2026-06-26T08:34:08.712188","created_date":"2025-10-10T00:00:00"}