{"id":"https://openalex.org/W2585866888","doi":"https://doi.org/10.1109/tim.2017.2653598","title":"Improvement of Transmission/Reflection Method for Permittivity Measurement Using Long Fixtures With Time-Domain Analysis Approach","display_name":"Improvement of Transmission/Reflection Method for Permittivity Measurement Using Long Fixtures With Time-Domain Analysis Approach","publication_year":2017,"publication_date":"2017-02-01","ids":{"openalex":"https://openalex.org/W2585866888","doi":"https://doi.org/10.1109/tim.2017.2653598","mag":"2585866888"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2017.2653598","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2017.2653598","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5012204884","display_name":"Yuto Kato","orcid":"https://orcid.org/0000-0002-4939-8449"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yuto Kato","raw_affiliation_strings":["National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5031714807","display_name":"Masahiro Horibe","orcid":"https://orcid.org/0000-0002-1193-607X"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Masahiro Horibe","raw_affiliation_strings":["National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I73613424"],"apc_list":null,"apc_paid":null,"fwci":0.7309,"has_fulltext":false,"cited_by_count":12,"citation_normalized_percentile":{"value":0.72173588,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"66","issue":"6","first_page":"1201","last_page":"1207"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9972000122070312,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9972000122070312,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10299","display_name":"Photonic and Optical Devices","score":0.9966999888420105,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11429","display_name":"Semiconductor Lasers and Optical Devices","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reflection","display_name":"Reflection (computer programming)","score":0.7510309219360352},{"id":"https://openalex.org/keywords/permittivity","display_name":"Permittivity","score":0.7395651340484619},{"id":"https://openalex.org/keywords/time-domain","display_name":"Time domain","score":0.6697975397109985},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5240466594696045},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.508709728717804},{"id":"https://openalex.org/keywords/transmission","display_name":"Transmission (telecommunications)","score":0.4986119270324707},{"id":"https://openalex.org/keywords/reflection-coefficient","display_name":"Reflection coefficient","score":0.43755123019218445},{"id":"https://openalex.org/keywords/frequency-domain","display_name":"Frequency domain","score":0.41399717330932617},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3830100893974304},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.3794648349285126},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.37401825189590454},{"id":"https://openalex.org/keywords/dielectric","display_name":"Dielectric","score":0.2762136161327362},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.2724760174751282},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.24461489915847778},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.19644597172737122},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.18200784921646118}],"concepts":[{"id":"https://openalex.org/C65682993","wikidata":"https://www.wikidata.org/wiki/Q1056451","display_name":"Reflection (computer programming)","level":2,"score":0.7510309219360352},{"id":"https://openalex.org/C168651791","wikidata":"https://www.wikidata.org/wiki/Q211569","display_name":"Permittivity","level":3,"score":0.7395651340484619},{"id":"https://openalex.org/C103824480","wikidata":"https://www.wikidata.org/wiki/Q185889","display_name":"Time domain","level":2,"score":0.6697975397109985},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5240466594696045},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.508709728717804},{"id":"https://openalex.org/C761482","wikidata":"https://www.wikidata.org/wiki/Q118093","display_name":"Transmission (telecommunications)","level":2,"score":0.4986119270324707},{"id":"https://openalex.org/C41700454","wikidata":"https://www.wikidata.org/wiki/Q1852282","display_name":"Reflection coefficient","level":2,"score":0.43755123019218445},{"id":"https://openalex.org/C19118579","wikidata":"https://www.wikidata.org/wiki/Q786423","display_name":"Frequency domain","level":2,"score":0.41399717330932617},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3830100893974304},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.3794648349285126},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.37401825189590454},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.2762136161327362},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.2724760174751282},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24461489915847778},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.19644597172737122},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.18200784921646118},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2017.2653598","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2017.2653598","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1993520037","https://openalex.org/W2044617818","https://openalex.org/W2052526026","https://openalex.org/W2103386416","https://openalex.org/W2130705138","https://openalex.org/W2183039567","https://openalex.org/W2332851879","https://openalex.org/W2478884216","https://openalex.org/W2516369693","https://openalex.org/W2890351524","https://openalex.org/W2947592443","https://openalex.org/W6763031090"],"related_works":["https://openalex.org/W3052101671","https://openalex.org/W2102167196","https://openalex.org/W4386004670","https://openalex.org/W2362680144","https://openalex.org/W2038558525","https://openalex.org/W2329459365","https://openalex.org/W4313547091","https://openalex.org/W2348857543","https://openalex.org/W2389321785","https://openalex.org/W860648897"],"abstract_inverted_index":{"A":[0],"transmission/reflection":[1],"(T/R)":[2],"method":[3,212],"using":[4,116,155],"a":[5,103,108,163,176,180],"coaxial":[6],"fixture":[7,38,99],"is":[8],"conventionally":[9],"employed":[10,49],"for":[11,43,159,179,213],"permittivity":[12,214],"measurements":[13],"of":[14,28,66,70,93,141,170,184,188,209],"high-loss":[15],"materials.":[16],"However,":[17],"in":[18,24,84,121,129,131],"this":[19,203],"method,":[20],"ripples":[21],"often":[22],"appear":[23],"the":[25,29,34,37,44,67,71,75,85,91,95,112,117,122,132,139,142,168,185,192,195,207,210],"frequency":[26],"characteristics":[27],"measured":[30,113,196],"permittivities":[31],"owing":[32],"to":[33,50,58,81],"reflections":[35],"at":[36,62,98,198],"ends.":[39],"Although":[40],"gating":[41,86,119],"analysis":[42,120,183,187],"time-domain":[45,186],"signals":[46,80,128],"have":[47],"been":[48],"reduce":[51],"these":[52],"ripples,":[53],"it":[54],"cannot":[55],"be":[56,82],"applied":[57],"conventional":[59],"T/R":[60],"methods":[61],"microwave":[63],"frequencies":[64],"because":[65],"short":[68],"distance":[69],"time":[72,123,133],"interval":[73],"between":[74,194],"required":[76],"signal":[77],"and":[78,110],"unwanted":[79,126],"eliminated":[83,136],"process.":[87],"To":[88],"deal":[89],"with":[90,162,167],"problem":[92],"eliminating":[94],"reflection":[96,127],"effects":[97],"interfaces,":[100],"we":[101,174,205],"used":[102],"long":[104],"air":[105,165],"line":[106,166],"as":[107,152,154],"fixture,":[109],"analyzed":[111],"S-parameters":[114,130,189,197],"by":[115,148],"improved":[118],"domain,":[124],"where":[125],"domain":[134],"were":[135],"while":[137],"maintaining":[138],"continuity":[140],"waveforms.":[143],"We":[144],"demonstrated":[145],"its":[146],"efficacy":[147],"performing":[149],"numerical":[150],"calculations,":[151],"well":[153],"actual":[156],"measurement":[157],"data":[158],"polytetrafluoroethylene":[160],"obtained":[161],"PC-7":[164],"length":[169],"30":[171],"cm.":[172],"Furthermore,":[173],"developed":[175],"new":[177],"algorithm":[178],"rigorous":[181],"uncertainty":[182,208],"that":[190],"considers":[191],"correlations":[193],"different":[199],"frequencies.":[200],"By":[201],"applying":[202],"algorithm,":[204],"evaluated":[206],"proposed":[211],"measurements.":[215]},"counts_by_year":[{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":2},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":2}],"updated_date":"2026-06-26T08:34:08.712188","created_date":"2025-10-10T00:00:00"}