{"id":"https://openalex.org/W2583708305","doi":"https://doi.org/10.1109/tim.2017.2653518","title":"Precision Measurement System for the Calibration of Phasor Measurement Units","display_name":"Precision Measurement System for the Calibration of Phasor Measurement Units","publication_year":2017,"publication_date":"2017-02-01","ids":{"openalex":"https://openalex.org/W2583708305","doi":"https://doi.org/10.1109/tim.2017.2653518","mag":"2583708305"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2017.2653518","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2017.2653518","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5007946269","display_name":"D. Georgakopoulos","orcid":"https://orcid.org/0000-0002-5687-7229"},"institutions":[{"id":"https://openalex.org/I1319171921","display_name":"National Measurement Institute","ror":"https://ror.org/03be3fb73","country_code":"AU","type":"government","lineage":["https://openalex.org/I1319171921","https://openalex.org/I2801453606","https://openalex.org/I4387156119"]}],"countries":["AU"],"is_corresponding":true,"raw_author_name":"Dimitrios Georgakopoulos","raw_affiliation_strings":["Electricity Section, National Measurement Institute, Lindfield, NSW, Australia"],"affiliations":[{"raw_affiliation_string":"Electricity Section, National Measurement Institute, Lindfield, NSW, Australia","institution_ids":["https://openalex.org/I1319171921"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5067519555","display_name":"S. Quigg","orcid":null},"institutions":[{"id":"https://openalex.org/I1319171921","display_name":"National Measurement Institute","ror":"https://ror.org/03be3fb73","country_code":"AU","type":"government","lineage":["https://openalex.org/I1319171921","https://openalex.org/I2801453606","https://openalex.org/I4387156119"]}],"countries":["AU"],"is_corresponding":false,"raw_author_name":"Stephen Quigg","raw_affiliation_strings":["Electricity Section, National Measurement Institute, Lindfield, NSW, Australia"],"affiliations":[{"raw_affiliation_string":"Electricity Section, National Measurement Institute, Lindfield, NSW, Australia","institution_ids":["https://openalex.org/I1319171921"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5007946269"],"corresponding_institution_ids":["https://openalex.org/I1319171921"],"apc_list":null,"apc_paid":null,"fwci":2.0395,"has_fulltext":false,"cited_by_count":31,"citation_normalized_percentile":{"value":0.872714,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":96,"max":99},"biblio":{"volume":"66","issue":"6","first_page":"1441","last_page":"1445"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10305","display_name":"Power System Optimization and Stability","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10305","display_name":"Power System Optimization and Stability","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10972","display_name":"Power Systems Fault Detection","score":0.9951000213623047,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9901999831199646,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/traceability","display_name":"Traceability","score":0.8837205171585083},{"id":"https://openalex.org/keywords/units-of-measurement","display_name":"Units of measurement","score":0.8637219667434692},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.8070623874664307},{"id":"https://openalex.org/keywords/phasor","display_name":"Phasor","score":0.7736353874206543},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6248599290847778},{"id":"https://openalex.org/keywords/measurement-uncertainty","display_name":"Measurement uncertainty","score":0.6016278266906738},{"id":"https://openalex.org/keywords/system-of-measurement","display_name":"System of measurement","score":0.5485204458236694},{"id":"https://openalex.org/keywords/consistency","display_name":"Consistency (knowledge bases)","score":0.5251700282096863},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.488986611366272},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.45998185873031616},{"id":"https://openalex.org/keywords/phasor-measurement-unit","display_name":"Phasor measurement unit","score":0.4519042372703552},{"id":"https://openalex.org/keywords/state","display_name":"State (computer science)","score":0.4174567759037018},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3705574572086334},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3510071039199829},{"id":"https://openalex.org/keywords/control-engineering","display_name":"Control engineering","score":0.33676397800445557},{"id":"https://openalex.org/keywords/electric-power-system","display_name":"Electric power system","score":0.18586158752441406},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.08925986289978027},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.0697261393070221}],"concepts":[{"id":"https://openalex.org/C153876917","wikidata":"https://www.wikidata.org/wiki/Q899704","display_name":"Traceability","level":2,"score":0.8837205171585083},{"id":"https://openalex.org/C151233233","wikidata":"https://www.wikidata.org/wiki/Q47574","display_name":"Units of measurement","level":2,"score":0.8637219667434692},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.8070623874664307},{"id":"https://openalex.org/C176605952","wikidata":"https://www.wikidata.org/wiki/Q827674","display_name":"Phasor","level":4,"score":0.7736353874206543},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6248599290847778},{"id":"https://openalex.org/C137209882","wikidata":"https://www.wikidata.org/wiki/Q1403517","display_name":"Measurement uncertainty","level":2,"score":0.6016278266906738},{"id":"https://openalex.org/C37649242","wikidata":"https://www.wikidata.org/wiki/Q932268","display_name":"System of measurement","level":2,"score":0.5485204458236694},{"id":"https://openalex.org/C2776436953","wikidata":"https://www.wikidata.org/wiki/Q5163215","display_name":"Consistency (knowledge bases)","level":2,"score":0.5251700282096863},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.488986611366272},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.45998185873031616},{"id":"https://openalex.org/C2778229166","wikidata":"https://www.wikidata.org/wiki/Q8290","display_name":"Phasor measurement unit","level":5,"score":0.4519042372703552},{"id":"https://openalex.org/C48103436","wikidata":"https://www.wikidata.org/wiki/Q599031","display_name":"State (computer science)","level":2,"score":0.4174567759037018},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3705574572086334},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3510071039199829},{"id":"https://openalex.org/C133731056","wikidata":"https://www.wikidata.org/wiki/Q4917288","display_name":"Control engineering","level":1,"score":0.33676397800445557},{"id":"https://openalex.org/C89227174","wikidata":"https://www.wikidata.org/wiki/Q2388981","display_name":"Electric power system","level":3,"score":0.18586158752441406},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.08925986289978027},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0697261393070221},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.0},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C1276947","wikidata":"https://www.wikidata.org/wiki/Q333","display_name":"Astronomy","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2017.2653518","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2017.2653518","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5899999737739563,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1965612527","https://openalex.org/W1988796894","https://openalex.org/W2040687108","https://openalex.org/W2041326972","https://openalex.org/W2047460623","https://openalex.org/W2107280963","https://openalex.org/W2114756795","https://openalex.org/W2115522606","https://openalex.org/W2125069769","https://openalex.org/W2139039549","https://openalex.org/W2149087321","https://openalex.org/W2324678923","https://openalex.org/W2328540531","https://openalex.org/W2518342449"],"related_works":["https://openalex.org/W2028471916","https://openalex.org/W2547260311","https://openalex.org/W1589114377","https://openalex.org/W2154842468","https://openalex.org/W2536794900","https://openalex.org/W1538400183","https://openalex.org/W2564500233","https://openalex.org/W1995635042","https://openalex.org/W2999493000","https://openalex.org/W2025215636"],"abstract_inverted_index":{"Phasor":[0],"measurement":[1,21],"units":[2],"(PMUs)":[3],"are":[4],"used":[5],"for":[6,57],"monitoring,":[7],"protection,":[8],"and":[9,27,34,77],"control":[10],"of":[11,15,20,29,60,79,89],"smart":[12],"grids.":[13],"Characterization":[14],"PMUs":[16,30,61],"to":[17,24,52,86],"national":[18,87],"standards":[19,88],"is":[22,35],"important":[23],"assure":[25],"reliability":[26],"consistency":[28],"across":[31],"the":[32,41,58,75,80],"industry":[33],"required":[36],"by":[37],"documentary":[38],"standards.":[39],"At":[40],"National":[42],"Measurement":[43],"Institute,":[44],"Australia,":[45],"we":[46],"have":[47],"developed":[48],"a":[49],"calibration":[50,55,78],"system":[51,81],"provide":[53],"some":[54],"points":[56],"characterization":[59],"under":[62],"steady-state":[63],"conditions":[64],"that":[65],"can":[66],"be":[67],"compatible":[68],"with":[69,82],"standard":[70],"tests.":[71],"This":[72],"paper":[73],"describes":[74],"operation":[76],"emphasis":[83],"on":[84],"traceability":[85],"measurement.":[90]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":4},{"year":2023,"cited_by_count":4},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":5},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":7},{"year":2018,"cited_by_count":4}],"updated_date":"2026-03-28T08:17:26.163206","created_date":"2025-10-10T00:00:00"}