{"id":"https://openalex.org/W2585748419","doi":"https://doi.org/10.1109/tim.2017.2652500","title":"Calibration of an $LCR$ -Meter at Arbitrary Phase Angles Using a Fully Automated Impedance Simulator","display_name":"Calibration of an $LCR$ -Meter at Arbitrary Phase Angles Using a Fully Automated Impedance Simulator","publication_year":2017,"publication_date":"2017-01-31","ids":{"openalex":"https://openalex.org/W2585748419","doi":"https://doi.org/10.1109/tim.2017.2652500","mag":"2585748419"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2017.2652500","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2017.2652500","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5054781013","display_name":"F. Overney","orcid":null},"institutions":[{"id":"https://openalex.org/I4210103407","display_name":"Swiss Federal Institute of Metrology","ror":"https://ror.org/0115xv923","country_code":"CH","type":"government","lineage":["https://openalex.org/I4210103407"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Frederic Overney","raw_affiliation_strings":["Swiss Federal Institute of Metrology (METAS), Bern, Switzerland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Swiss Federal Institute of Metrology (METAS), Bern, Switzerland","institution_ids":["https://openalex.org/I4210103407"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5014516061","display_name":"B. Jeanneret","orcid":"https://orcid.org/0000-0003-1113-5253"},"institutions":[{"id":"https://openalex.org/I4210103407","display_name":"Swiss Federal Institute of Metrology","ror":"https://ror.org/0115xv923","country_code":"CH","type":"government","lineage":["https://openalex.org/I4210103407"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Blaise Jeanneret","raw_affiliation_strings":["Swiss Federal Institute of Metrology (METAS), Bern, Switzerland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Swiss Federal Institute of Metrology (METAS), Bern, Switzerland","institution_ids":["https://openalex.org/I4210103407"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I4210103407"],"apc_list":null,"apc_paid":null,"fwci":0.8771,"has_fulltext":false,"cited_by_count":21,"citation_normalized_percentile":{"value":0.75159322,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"66","issue":"6","first_page":"1516","last_page":"1523"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12537","display_name":"Flow Measurement and Analysis","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.8165796995162964},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.7358083724975586},{"id":"https://openalex.org/keywords/metrology","display_name":"Metrology","score":0.6082113981246948},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.49820661544799805},{"id":"https://openalex.org/keywords/range","display_name":"Range (aeronautics)","score":0.464181125164032},{"id":"https://openalex.org/keywords/ranging","display_name":"Ranging","score":0.45966848731040955},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4201945662498474},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3916129171848297},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3621501922607422},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.22828200459480286},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.22748374938964844},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.21222788095474243},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.08219736814498901}],"concepts":[{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.8165796995162964},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.7358083724975586},{"id":"https://openalex.org/C195766429","wikidata":"https://www.wikidata.org/wiki/Q394","display_name":"Metrology","level":2,"score":0.6082113981246948},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.49820661544799805},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.464181125164032},{"id":"https://openalex.org/C115051666","wikidata":"https://www.wikidata.org/wiki/Q6522493","display_name":"Ranging","level":2,"score":0.45966848731040955},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4201945662498474},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3916129171848297},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3621501922607422},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.22828200459480286},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.22748374938964844},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.21222788095474243},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.08219736814498901},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2017.2652500","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2017.2652500","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":35,"referenced_works":["https://openalex.org/W8810246","https://openalex.org/W352914456","https://openalex.org/W1502785712","https://openalex.org/W1964550101","https://openalex.org/W1969233474","https://openalex.org/W1974536075","https://openalex.org/W1977377847","https://openalex.org/W1990211292","https://openalex.org/W1995163318","https://openalex.org/W2002428526","https://openalex.org/W2007507514","https://openalex.org/W2032559024","https://openalex.org/W2037272857","https://openalex.org/W2047936412","https://openalex.org/W2057289745","https://openalex.org/W2082949320","https://openalex.org/W2101980652","https://openalex.org/W2104074527","https://openalex.org/W2111621226","https://openalex.org/W2120596090","https://openalex.org/W2134470511","https://openalex.org/W2135965101","https://openalex.org/W2138540569","https://openalex.org/W2162399148","https://openalex.org/W2165750195","https://openalex.org/W2174206283","https://openalex.org/W2315905934","https://openalex.org/W2332369859","https://openalex.org/W2333500657","https://openalex.org/W2398382681","https://openalex.org/W2511948782","https://openalex.org/W3102130313","https://openalex.org/W4246923754","https://openalex.org/W6600326884","https://openalex.org/W6675552718"],"related_works":["https://openalex.org/W4384112194","https://openalex.org/W2783354812","https://openalex.org/W2103009189","https://openalex.org/W4312958259","https://openalex.org/W2349383066","https://openalex.org/W1969901537","https://openalex.org/W4328132048","https://openalex.org/W4308259661","https://openalex.org/W2376202349","https://openalex.org/W2969318460"],"abstract_inverted_index":{"A":[0],"fully":[1],"automated":[2],"impedance":[3,92,110,121],"simulator,":[4],"called":[5],"iSimulator,":[6,86],"capable":[7],"of":[8,37,54,60,84,98],"simulating":[9],"impedances":[10],"ranging":[11],"from":[12],"1":[13],"\u03a9":[14],"to":[15,30,48],"10":[16],"M\u03a9,":[17],"at":[18],"arbitrary":[19],"phase":[20],"angles,":[21],"over":[22],"a":[23,44,115],"large":[24],"frequency":[25,94],"range":[26],"(from":[27],"100":[28],"Hz":[29],"20":[31,49],"kHz)":[32],"is":[33,40],"presented.":[34],"The":[35,58],"validation":[36,78],"the":[38,52,55,61,73,81,85,99,107,119],"instrument":[39],"performed":[41],"by":[42],"calibrating":[43],"commercial":[45],"LCR-meter":[46],"up":[47],"kHz":[50],"along":[51],"axis":[53],"complex":[56,100],"plane.":[57],"results":[59],"iSimulator":[62],"calibration":[63,122,132],"are":[64],"in":[65,118,125,130],"good":[66],"agreement":[67],"with":[68],"measurements":[69],"carried":[70],"out":[71],"using":[72],"classical":[74],"artifactbased":[75],"method.":[76],"This":[77],"clearly":[79],"demonstrated":[80],"unique":[82],"capabilities":[83],"based":[87],"on":[88],"its":[89,103],"flexibility,":[90],"broad":[91],"and":[93,102,129],"range,":[95],"full":[96,104],"coverage":[97],"plane,":[101],"automation.":[105],"In":[106],"near":[108],"future,":[109],"simulators":[111],"will":[112],"definitely":[113],"play":[114],"privileged":[116],"role":[117],"entire":[120],"field":[123],"both":[124],"National":[126],"Metrology":[127],"Institutes":[128],"industrial":[131],"laboratories.":[133]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":6},{"year":2021,"cited_by_count":4},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":4}],"updated_date":"2026-06-26T08:34:08.712188","created_date":"2025-10-10T00:00:00"}