{"id":"https://openalex.org/W2609671466","doi":"https://doi.org/10.1109/tim.2017.2650658","title":"Preparation and Characterization of Sn-BSTS Topological Insulator for Universality Test of the Quantum Hall Effect","display_name":"Preparation and Characterization of Sn-BSTS Topological Insulator for Universality Test of the Quantum Hall Effect","publication_year":2017,"publication_date":"2017-04-24","ids":{"openalex":"https://openalex.org/W2609671466","doi":"https://doi.org/10.1109/tim.2017.2650658","mag":"2609671466"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2017.2650658","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2017.2650658","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5045377874","display_name":"Tetsuro Misawa","orcid":"https://orcid.org/0000-0002-0156-7012"},"institutions":[{"id":"https://openalex.org/I114531698","display_name":"Tokyo Institute of Technology","ror":"https://ror.org/0112mx960","country_code":"JP","type":"education","lineage":["https://openalex.org/I114531698"]},{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Tetsuro Misawa","raw_affiliation_strings":["Materials and Structures Laboratory, Tokyo Institute of Technology, Yokohama, Japan","National Metrology Institute of Japan, AIST, Tsukuba, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Materials and Structures Laboratory, Tokyo Institute of Technology, Yokohama, Japan","institution_ids":["https://openalex.org/I114531698"]},{"raw_affiliation_string":"National Metrology Institute of Japan, AIST, Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041358979","display_name":"Yasuhiro Fukuyama","orcid":"https://orcid.org/0000-0001-7145-9861"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yasuhiro Fukuyama","raw_affiliation_strings":["National Metrology Institute of Japan, AIST, Tsukuba, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Metrology Institute of Japan, AIST, Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009600720","display_name":"Yuma Okazaki","orcid":"https://orcid.org/0000-0002-2806-8774"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yuma Okazaki","raw_affiliation_strings":["National Metrology Institute of Japan, AIST, Tsukuba, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Metrology Institute of Japan, AIST, Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5021607947","display_name":"Shuji Nakamura","orcid":"https://orcid.org/0000-0002-0195-1428"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Shuji Nakamura","raw_affiliation_strings":["National Metrology Institute of Japan, AIST, Tsukuba, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Metrology Institute of Japan, AIST, Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5037332773","display_name":"Nariaki Nasaka","orcid":null},"institutions":[{"id":"https://openalex.org/I114531698","display_name":"Tokyo Institute of Technology","ror":"https://ror.org/0112mx960","country_code":"JP","type":"education","lineage":["https://openalex.org/I114531698"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Nariaki Nasaka","raw_affiliation_strings":["Materials and Structures Laboratory, Tokyo Institute of Technology, Yokohama, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Materials and Structures Laboratory, Tokyo Institute of Technology, Yokohama, Japan","institution_ids":["https://openalex.org/I114531698"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5030734334","display_name":"T. Sasagawa","orcid":"https://orcid.org/0000-0003-0149-6696"},"institutions":[{"id":"https://openalex.org/I114531698","display_name":"Tokyo Institute of Technology","ror":"https://ror.org/0112mx960","country_code":"JP","type":"education","lineage":["https://openalex.org/I114531698"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takao Sasagawa","raw_affiliation_strings":["Materials and Structures Laboratory, Tokyo Institute of Technology, Yokohama, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Materials and Structures Laboratory, Tokyo Institute of Technology, Yokohama, Japan","institution_ids":["https://openalex.org/I114531698"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5089866154","display_name":"Nobu\u2010Hisa Kaneko","orcid":"https://orcid.org/0000-0003-3857-7940"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Nobu-Hisa Kaneko","raw_affiliation_strings":["National Metrology Institute of Japan, AIST, Tsukuba, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Metrology Institute of Japan, AIST, Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.0982,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.77983393,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"66","issue":"6","first_page":"1489","last_page":"1495"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10657","display_name":"Topological Materials and Phenomena","score":1.0,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10657","display_name":"Topological Materials and Phenomena","score":1.0,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10382","display_name":"Quantum and electron transport phenomena","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10083","display_name":"Graphene research and applications","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/topological-insulator","display_name":"Topological insulator","score":0.5475432276725769},{"id":"https://openalex.org/keywords/measure","display_name":"Measure (data warehouse)","score":0.47671645879745483},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.47529780864715576},{"id":"https://openalex.org/keywords/thermal-conduction","display_name":"Thermal conduction","score":0.4640082120895386},{"id":"https://openalex.org/keywords/condensed-matter-physics","display_name":"Condensed matter physics","score":0.4405193328857422},{"id":"https://openalex.org/keywords/characterization","display_name":"Characterization (materials science)","score":0.43136757612228394},{"id":"https://openalex.org/keywords/metal","display_name":"Metal","score":0.42034536600112915},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3872706890106201},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.38570475578308105},{"id":"https://openalex.org/keywords/quantum-mechanics","display_name":"Quantum mechanics","score":0.26749879121780396},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.2241758406162262},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1953245997428894},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.1726045310497284},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.0989287793636322}],"concepts":[{"id":"https://openalex.org/C128911142","wikidata":"https://www.wikidata.org/wiki/Q1488689","display_name":"Topological insulator","level":2,"score":0.5475432276725769},{"id":"https://openalex.org/C2780009758","wikidata":"https://www.wikidata.org/wiki/Q6804172","display_name":"Measure (data warehouse)","level":2,"score":0.47671645879745483},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.47529780864715576},{"id":"https://openalex.org/C172100665","wikidata":"https://www.wikidata.org/wiki/Q7465774","display_name":"Thermal conduction","level":2,"score":0.4640082120895386},{"id":"https://openalex.org/C26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","level":1,"score":0.4405193328857422},{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.43136757612228394},{"id":"https://openalex.org/C544153396","wikidata":"https://www.wikidata.org/wiki/Q11426","display_name":"Metal","level":2,"score":0.42034536600112915},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3872706890106201},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.38570475578308105},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.26749879121780396},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.2241758406162262},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1953245997428894},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.1726045310497284},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.0989287793636322},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2017.2650658","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2017.2650658","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G5281449457","display_name":"Explorarion of novel device technology based on topological electronic states","funder_award_id":"16H03847","funder_id":"https://openalex.org/F4320334764","funder_display_name":"Japan Society for the Promotion of Science"}],"funders":[{"id":"https://openalex.org/F4320311508","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54"},{"id":"https://openalex.org/F4320334764","display_name":"Japan Society for the Promotion of Science","ror":"https://ror.org/00hhkn466"},{"id":"https://openalex.org/F4320334789","display_name":"Japan Science and Technology Agency","ror":"https://ror.org/00097mb19"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":29,"referenced_works":["https://openalex.org/W1608552205","https://openalex.org/W1933527114","https://openalex.org/W1970188810","https://openalex.org/W1986660351","https://openalex.org/W1987345525","https://openalex.org/W1991987040","https://openalex.org/W1994560736","https://openalex.org/W2000883834","https://openalex.org/W2001755358","https://openalex.org/W2013393061","https://openalex.org/W2027396407","https://openalex.org/W2030164271","https://openalex.org/W2048977235","https://openalex.org/W2054052369","https://openalex.org/W2058122340","https://openalex.org/W2063964244","https://openalex.org/W2071573149","https://openalex.org/W2088198211","https://openalex.org/W2132283351","https://openalex.org/W2133367608","https://openalex.org/W2164037749","https://openalex.org/W2210241342","https://openalex.org/W2254848599","https://openalex.org/W2507624996","https://openalex.org/W3081576038","https://openalex.org/W3104246606","https://openalex.org/W3104422610","https://openalex.org/W3106201333","https://openalex.org/W6781947888"],"related_works":["https://openalex.org/W4247143848","https://openalex.org/W2735573198","https://openalex.org/W2009883749","https://openalex.org/W29442446","https://openalex.org/W1483407203","https://openalex.org/W4255837520","https://openalex.org/W330727063","https://openalex.org/W2001755358","https://openalex.org/W2387011115","https://openalex.org/W4206825956"],"abstract_inverted_index":{"Single":[0],"crystals":[1],"of":[2,40,47,51,67,86,95],"Sn":[3],"<sub":[4,8,12,16],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[5,9,13,17],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">0.02</sub>":[6],"Bi":[7],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">1.08</sub>":[10],"Sb":[11],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">0.9</sub>":[14],"Te":[15],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sub>":[18],"S":[19],"are":[20,26],"grown":[21],"and":[22,72],"their":[23],"transport":[24],"properties":[25],"evaluated":[27],"to":[28,91],"precisely":[29],"measure":[30,92],"the":[31,36,41,48,52,60,65,68,73,83,87,96,104,112],"quantum":[32],"Hall":[33],"effect":[34],"on":[35],"metallic":[37,74],"surface":[38,75,80],"state":[39],"topological":[42],"insulator.":[43],"The":[44,57],"temperature":[45],"dependence":[46],"electrical":[49],"resistance":[50],"bulk":[53,70],"samples":[54],"is":[55,62,82,106,118],"determined.":[56],"conduction":[58,71,81],"in":[59],"material":[61,97,105],"explained":[63],"by":[64],"parallelism":[66],"inner":[69],"conduction.":[76],"At":[77],"low":[78],"temperatures,":[79],"dominant":[84],"one":[85],"two.":[88],"In":[89],"order":[90],"thinner":[93],"flakes":[94],"with":[98,111],"an":[99],"appropriate":[100],"charge":[101],"carrier":[102],"control,":[103],"processed":[107],"into":[108],"measurement":[109],"devices":[110],"conventional":[113],"lithography":[114],"method.":[115],"Device":[116],"evaluation":[117],"also":[119],"introduced.":[120]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":1}],"updated_date":"2026-06-22T08:00:12.763002","created_date":"2025-10-10T00:00:00"}