{"id":"https://openalex.org/W2582714816","doi":"https://doi.org/10.1109/tim.2017.2649899","title":"Digital Sampling Setup for Measurement of Complex Voltage Ratio","display_name":"Digital Sampling Setup for Measurement of Complex Voltage Ratio","publication_year":2017,"publication_date":"2017-01-30","ids":{"openalex":"https://openalex.org/W2582714816","doi":"https://doi.org/10.1109/tim.2017.2649899","mag":"2582714816"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2017.2649899","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2017.2649899","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5030349917","display_name":"Stanislav Ma\u0161l\u00e1\u0148","orcid":"https://orcid.org/0000-0002-8536-9119"},"institutions":[{"id":"https://openalex.org/I4210124866","display_name":"\u010cesk\u00fd Metrologick\u00fd Institut","ror":"https://ror.org/02m5haa59","country_code":"CZ","type":"facility","lineage":["https://openalex.org/I4210124866"]}],"countries":["CZ"],"is_corresponding":true,"raw_author_name":"Stanislav Maslan","raw_affiliation_strings":["Czech Metrology Institute, Brno, Czech Republic"],"affiliations":[{"raw_affiliation_string":"Czech Metrology Institute, Brno, Czech Republic","institution_ids":["https://openalex.org/I4210124866"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5012088426","display_name":"Martin \u0160\u00edra","orcid":"https://orcid.org/0000-0002-9322-5991"},"institutions":[{"id":"https://openalex.org/I4210124866","display_name":"\u010cesk\u00fd Metrologick\u00fd Institut","ror":"https://ror.org/02m5haa59","country_code":"CZ","type":"facility","lineage":["https://openalex.org/I4210124866"]}],"countries":["CZ"],"is_corresponding":false,"raw_author_name":"Martin Sira","raw_affiliation_strings":["Czech Metrology Institute, Brno, Czech Republic"],"affiliations":[{"raw_affiliation_string":"Czech Metrology Institute, Brno, Czech Republic","institution_ids":["https://openalex.org/I4210124866"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5012795867","display_name":"V\u011bra Nov\u00e1kov\u00e1 Zachovalov\u00e1","orcid":"https://orcid.org/0000-0002-9154-143X"},"institutions":[{"id":"https://openalex.org/I4210124866","display_name":"\u010cesk\u00fd Metrologick\u00fd Institut","ror":"https://ror.org/02m5haa59","country_code":"CZ","type":"facility","lineage":["https://openalex.org/I4210124866"]}],"countries":["CZ"],"is_corresponding":false,"raw_author_name":"Vera Novakova Zachovalova","raw_affiliation_strings":["Czech Metrology Institute, Brno, Czech Republic"],"affiliations":[{"raw_affiliation_string":"Czech Metrology Institute, Brno, Czech Republic","institution_ids":["https://openalex.org/I4210124866"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5071684096","display_name":"Jir\u00ed Streit","orcid":null},"institutions":[{"id":"https://openalex.org/I4210124866","display_name":"\u010cesk\u00fd Metrologick\u00fd Institut","ror":"https://ror.org/02m5haa59","country_code":"CZ","type":"facility","lineage":["https://openalex.org/I4210124866"]}],"countries":["CZ"],"is_corresponding":false,"raw_author_name":"Jiri Streit","raw_affiliation_strings":["Czech Metrology Institute, Brno, Czech Republic"],"affiliations":[{"raw_affiliation_string":"Czech Metrology Institute, Brno, Czech Republic","institution_ids":["https://openalex.org/I4210124866"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5030349917"],"corresponding_institution_ids":["https://openalex.org/I4210124866"],"apc_list":null,"apc_paid":null,"fwci":1.9098,"has_fulltext":false,"cited_by_count":17,"citation_normalized_percentile":{"value":0.86112105,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"66","issue":"6","first_page":"1355","last_page":"1363"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.9962000250816345,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10573","display_name":"Power Quality and Harmonics","score":0.9957000017166138,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.7409852743148804},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.736169159412384},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.6125056743621826},{"id":"https://openalex.org/keywords/volt","display_name":"Volt","score":0.5996882319450378},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.5178802013397217},{"id":"https://openalex.org/keywords/measurement-uncertainty","display_name":"Measurement uncertainty","score":0.5067673325538635},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.491205632686615},{"id":"https://openalex.org/keywords/multimeter","display_name":"Multimeter","score":0.486126184463501},{"id":"https://openalex.org/keywords/range","display_name":"Range (aeronautics)","score":0.48121312260627747},{"id":"https://openalex.org/keywords/voltage-divider","display_name":"Voltage divider","score":0.463775098323822},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.429910808801651},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.4209112823009491},{"id":"https://openalex.org/keywords/phase","display_name":"Phase (matter)","score":0.41431742906570435},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3405171036720276},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.3368649482727051},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.28802961111068726},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2786674499511719},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.16394391655921936},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.08333262801170349}],"concepts":[{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.7409852743148804},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.736169159412384},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.6125056743621826},{"id":"https://openalex.org/C157985801","wikidata":"https://www.wikidata.org/wiki/Q25250","display_name":"Volt","level":3,"score":0.5996882319450378},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.5178802013397217},{"id":"https://openalex.org/C137209882","wikidata":"https://www.wikidata.org/wiki/Q1403517","display_name":"Measurement uncertainty","level":2,"score":0.5067673325538635},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.491205632686615},{"id":"https://openalex.org/C103185065","wikidata":"https://www.wikidata.org/wiki/Q189996","display_name":"Multimeter","level":3,"score":0.486126184463501},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.48121312260627747},{"id":"https://openalex.org/C49324399","wikidata":"https://www.wikidata.org/wiki/Q466758","display_name":"Voltage divider","level":3,"score":0.463775098323822},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.429910808801651},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.4209112823009491},{"id":"https://openalex.org/C44280652","wikidata":"https://www.wikidata.org/wiki/Q104837","display_name":"Phase (matter)","level":2,"score":0.41431742906570435},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3405171036720276},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.3368649482727051},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.28802961111068726},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2786674499511719},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.16394391655921936},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.08333262801170349},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2017.2649899","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2017.2649899","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8100000023841858,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1994367844","https://openalex.org/W2009069408","https://openalex.org/W2012291524","https://openalex.org/W2125069769","https://openalex.org/W2133004675","https://openalex.org/W2135551595","https://openalex.org/W2137352037","https://openalex.org/W2168519832","https://openalex.org/W2257199776","https://openalex.org/W2319862299","https://openalex.org/W2326537323","https://openalex.org/W2332369859","https://openalex.org/W2507692935","https://openalex.org/W2508498434","https://openalex.org/W2518439920","https://openalex.org/W2582714816","https://openalex.org/W2789214243"],"related_works":["https://openalex.org/W3085932616","https://openalex.org/W2377441625","https://openalex.org/W3085932769","https://openalex.org/W1982691041","https://openalex.org/W2977232264","https://openalex.org/W2322061900","https://openalex.org/W2129755801","https://openalex.org/W2077131264","https://openalex.org/W2126265156","https://openalex.org/W2338764836"],"abstract_inverted_index":{"This":[0],"paper":[1],"describes":[2],"a":[3,11,23,92,158],"universal":[4],"digital":[5],"sampling":[6],"setup":[7,16,48,71,146],"for":[8,20,35,76,97,107,131],"measurement":[9],"of":[10,22,27,37,40,51,78],"complex":[12,45,152],"voltage":[13,80,100,108,153],"ratio.":[14],"The":[15,47,70,114],"was":[17,72],"primarily":[18],"designed":[19],"calibration":[21,36,50],"phase":[24,115],"angle":[25],"error":[26],"current":[28],"shunts,":[29],"but":[30],"it":[31],"can":[32,147],"be":[33,148],"used":[34,75,141,149],"wide":[38],"range":[39,56],"impedance":[41],"standards":[42],"in":[43],"full":[44],"plane.":[46],"allows":[49],"impedances":[52],"down":[53],"to":[54,61,67,104,139,150],"submegaohm":[55],"with":[57,82,156],"compare":[58],"currents":[59],"up":[60,66,103],"10":[62],"A":[63],"and":[64,102,124],"frequencies":[65],"100":[68,112,129],"kHz.":[69,113],"also":[73],"successfully":[74],"comparison":[77],"inductive":[79],"dividers":[81],"ratio":[83,101,109,132,154],"uncertainty":[84,116],"approximately":[85],"1":[86,119,122],"\u03bcV/V.":[87],"Achieved":[88],"expanded":[89],"uncertainties":[90],"are":[91],"few":[93,159],"microvolts":[94],"per":[95],"volt":[96],"near":[98],"unity":[99],"35":[105],"\u03bcV/V":[106],"1:10":[110,133],"at":[111,121,128,162],"is":[117],"below":[118,125],"\u03bcrad":[120,127],"kHz":[123,130],"50":[126],"(confidence":[134],"level":[135],"95":[136],"%).":[137],"Due":[138],"the":[140,145,163],"signal":[142],"processing":[143],"techniques,":[144],"measure":[151],"even":[155],"just":[157],"millivolt":[160],"voltages":[161],"inputs.":[164]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":4},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":6},{"year":2017,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}