{"id":"https://openalex.org/W2569225586","doi":"https://doi.org/10.1109/tim.2016.2637518","title":"Experimental Demonstration of Current Dependence Evaluation of Voltage Divider Based on Quantized Hall Resistance Voltage Divider","display_name":"Experimental Demonstration of Current Dependence Evaluation of Voltage Divider Based on Quantized Hall Resistance Voltage Divider","publication_year":2017,"publication_date":"2017-01-10","ids":{"openalex":"https://openalex.org/W2569225586","doi":"https://doi.org/10.1109/tim.2016.2637518","mag":"2569225586"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2016.2637518","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2016.2637518","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5041117747","display_name":"Atsushi Domae","orcid":"https://orcid.org/0000-0002-3582-1373"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Atsushi Domae","raw_affiliation_strings":["National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5052274255","display_name":"Takehiko Oe","orcid":"https://orcid.org/0000-0003-3424-1745"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takehiko Oe","raw_affiliation_strings":["National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112074875","display_name":"Syogo Kiryu","orcid":null},"institutions":[{"id":"https://openalex.org/I185088104","display_name":"Tokyo City University","ror":"https://ror.org/04dt6bw53","country_code":"JP","type":"education","lineage":["https://openalex.org/I185088104"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Syogo Kiryu","raw_affiliation_strings":["Tokyo City University, Setagaya, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tokyo City University, Setagaya, Japan","institution_ids":["https://openalex.org/I185088104"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5089866154","display_name":"Nobu\u2010Hisa Kaneko","orcid":"https://orcid.org/0000-0003-3857-7940"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Nobu-Hisa Kaneko","raw_affiliation_strings":["National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.2924,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.57400308,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"66","issue":"6","first_page":"1237","last_page":"1242"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12692","display_name":"Magnetic Field Sensors Techniques","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/voltage-divider","display_name":"Voltage divider","score":0.8319752812385559},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.7033053636550903},{"id":"https://openalex.org/keywords/current-divider","display_name":"Current divider","score":0.6790674924850464},{"id":"https://openalex.org/keywords/resistive-touchscreen","display_name":"Resistive touchscreen","score":0.649878978729248},{"id":"https://openalex.org/keywords/metrology","display_name":"Metrology","score":0.6352535486221313},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.6144062280654907},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.5855393409729004},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.5807050466537476},{"id":"https://openalex.org/keywords/resistor","display_name":"Resistor","score":0.5249050855636597},{"id":"https://openalex.org/keywords/measurement-uncertainty","display_name":"Measurement uncertainty","score":0.41620633006095886},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3820779621601105},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2552555501461029},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.08394494652748108}],"concepts":[{"id":"https://openalex.org/C49324399","wikidata":"https://www.wikidata.org/wiki/Q466758","display_name":"Voltage divider","level":3,"score":0.8319752812385559},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.7033053636550903},{"id":"https://openalex.org/C97264828","wikidata":"https://www.wikidata.org/wiki/Q4157078","display_name":"Current divider","level":4,"score":0.6790674924850464},{"id":"https://openalex.org/C6899612","wikidata":"https://www.wikidata.org/wiki/Q852911","display_name":"Resistive touchscreen","level":2,"score":0.649878978729248},{"id":"https://openalex.org/C195766429","wikidata":"https://www.wikidata.org/wiki/Q394","display_name":"Metrology","level":2,"score":0.6352535486221313},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.6144062280654907},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.5855393409729004},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.5807050466537476},{"id":"https://openalex.org/C137488568","wikidata":"https://www.wikidata.org/wiki/Q5321","display_name":"Resistor","level":3,"score":0.5249050855636597},{"id":"https://openalex.org/C137209882","wikidata":"https://www.wikidata.org/wiki/Q1403517","display_name":"Measurement uncertainty","level":2,"score":0.41620633006095886},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3820779621601105},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2552555501461029},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.08394494652748108},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2016.2637518","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2016.2637518","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.46000000834465027,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W1978515977","https://openalex.org/W1979192444","https://openalex.org/W2017724148","https://openalex.org/W2022527431","https://openalex.org/W2039794774","https://openalex.org/W2047021301","https://openalex.org/W2058443746","https://openalex.org/W2061000251","https://openalex.org/W2090518455","https://openalex.org/W2110641578","https://openalex.org/W2115869911","https://openalex.org/W2136320213","https://openalex.org/W2142015442","https://openalex.org/W2152523269","https://openalex.org/W2155517614","https://openalex.org/W2161139106","https://openalex.org/W2178199459","https://openalex.org/W2266456698","https://openalex.org/W2515051200","https://openalex.org/W2566706182"],"related_works":["https://openalex.org/W2515051200","https://openalex.org/W2022527431","https://openalex.org/W2112008304","https://openalex.org/W2111225411","https://openalex.org/W2326403607","https://openalex.org/W1995492832","https://openalex.org/W1590113738","https://openalex.org/W2369561886","https://openalex.org/W2097351719","https://openalex.org/W2518533697","https://openalex.org/W2138976642","https://openalex.org/W1481015961","https://openalex.org/W1977404915","https://openalex.org/W1985273714","https://openalex.org/W3085183016","https://openalex.org/W2019141500","https://openalex.org/W2001671159","https://openalex.org/W2049432715","https://openalex.org/W2904242599","https://openalex.org/W1586441564"],"abstract_inverted_index":{"The":[0],"National":[1],"Metrology":[2],"Institute":[3],"of":[4,20,76,84],"Japan":[5],"has":[6],"developed":[7],"a":[8,17,70],"resistive":[9],"voltage":[10,28,38,63,92],"divider":[11,39,64],"(RVD),":[12],"which":[13],"is":[14,47,65,93],"constructed":[15],"from":[16],"series":[18],"array":[19],"quantized":[21],"Hall":[22],"resistance":[23],"(QHR)":[24],"bars":[25],"named":[26],"\u201cQHR":[27],"divider\u201d":[29],"fabricated":[30],"on":[31,89],"one":[32],"chip.":[33],"In":[34,79],"principle,":[35],"the":[36,61,82,90],"QHR":[37,62,91],"does":[40],"not":[41,48],"need":[42],"time-consuming":[43],"bootstrap":[44],"self-calibration":[45],"and":[46,57],"affected":[49],"by":[50],"measurement":[51,58],"conditions":[52],"such":[53],"as":[54,69],"ambient":[55],"temperature":[56],"current":[59,86],"Therefore":[60],"suitable":[66],"for":[67,73],"use":[68],"reference":[71],"standard":[72],"characteristic":[74],"evaluation":[75,83],"conventional":[77],"RVDs.":[78],"this":[80],"paper,":[81],"RVD":[85],"dependence":[87],"based":[88],"demonstrated.":[94]},"counts_by_year":[{"year":2019,"cited_by_count":1},{"year":2017,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}