{"id":"https://openalex.org/W2562826844","doi":"https://doi.org/10.1109/tim.2016.2637498","title":"Calibration of a Terahertz Attenuator by a DC Power Substitution Method","display_name":"Calibration of a Terahertz Attenuator by a DC Power Substitution Method","publication_year":2016,"publication_date":"2016-12-30","ids":{"openalex":"https://openalex.org/W2562826844","doi":"https://doi.org/10.1109/tim.2016.2637498","mag":"2562826844"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2016.2637498","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2016.2637498","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5082512165","display_name":"Hitoshi Iida","orcid":"https://orcid.org/0000-0003-0055-9253"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hitoshi Iida","raw_affiliation_strings":["National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087379283","display_name":"Moto Kinoshita","orcid":"https://orcid.org/0000-0002-8878-1942"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Moto Kinoshita","raw_affiliation_strings":["National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5042018312","display_name":"K. Amemiya","orcid":"https://orcid.org/0000-0002-8748-3062"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kuniaki Amemiya","raw_affiliation_strings":["National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.9301,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.79159727,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"66","issue":"6","first_page":"1586","last_page":"1591"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10752","display_name":"Terahertz technology and applications","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10752","display_name":"Terahertz technology and applications","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11803","display_name":"Superconducting and THz Device Technology","score":0.9871000051498413,"subfield":{"id":"https://openalex.org/subfields/3103","display_name":"Astronomy and Astrophysics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10299","display_name":"Photonic and Optical Devices","score":0.986299991607666,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/attenuator","display_name":"Attenuator (electronics)","score":0.7391637563705444},{"id":"https://openalex.org/keywords/terahertz-radiation","display_name":"Terahertz radiation","score":0.7205580472946167},{"id":"https://openalex.org/keywords/optical-attenuator","display_name":"Optical attenuator","score":0.6828868389129639},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.6283116340637207},{"id":"https://openalex.org/keywords/substitution","display_name":"Substitution (logic)","score":0.4840885400772095},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4711521863937378},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3562174439430237},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.351590633392334},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.3280928432941437},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.30192476511001587},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.26526424288749695},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.26499277353286743},{"id":"https://openalex.org/keywords/attenuation","display_name":"Attenuation","score":0.18583419919013977},{"id":"https://openalex.org/keywords/optical-fiber","display_name":"Optical fiber","score":0.10960659384727478},{"id":"https://openalex.org/keywords/multi-mode-optical-fiber","display_name":"Multi-mode optical fiber","score":0.08597400784492493}],"concepts":[{"id":"https://openalex.org/C174847166","wikidata":"https://www.wikidata.org/wiki/Q1269728","display_name":"Attenuator (electronics)","level":3,"score":0.7391637563705444},{"id":"https://openalex.org/C107816215","wikidata":"https://www.wikidata.org/wiki/Q647887","display_name":"Terahertz radiation","level":2,"score":0.7205580472946167},{"id":"https://openalex.org/C14650364","wikidata":"https://www.wikidata.org/wiki/Q7098828","display_name":"Optical attenuator","level":4,"score":0.6828868389129639},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.6283116340637207},{"id":"https://openalex.org/C2778220771","wikidata":"https://www.wikidata.org/wiki/Q1522579","display_name":"Substitution (logic)","level":2,"score":0.4840885400772095},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4711521863937378},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3562174439430237},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.351590633392334},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3280928432941437},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.30192476511001587},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.26526424288749695},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.26499277353286743},{"id":"https://openalex.org/C184652730","wikidata":"https://www.wikidata.org/wiki/Q2357982","display_name":"Attenuation","level":2,"score":0.18583419919013977},{"id":"https://openalex.org/C194232370","wikidata":"https://www.wikidata.org/wiki/Q162","display_name":"Optical fiber","level":2,"score":0.10960659384727478},{"id":"https://openalex.org/C101645829","wikidata":"https://www.wikidata.org/wiki/Q1781857","display_name":"Multi-mode optical fiber","level":3,"score":0.08597400784492493},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2016.2637498","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2016.2637498","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8299999833106995,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":22,"referenced_works":["https://openalex.org/W435853682","https://openalex.org/W1977261100","https://openalex.org/W1978085254","https://openalex.org/W1996902417","https://openalex.org/W2000471012","https://openalex.org/W2005465267","https://openalex.org/W2007964051","https://openalex.org/W2008866483","https://openalex.org/W2026624309","https://openalex.org/W2074316458","https://openalex.org/W2074334071","https://openalex.org/W2081965377","https://openalex.org/W2088275728","https://openalex.org/W2133872257","https://openalex.org/W2134069558","https://openalex.org/W2155585602","https://openalex.org/W2157645079","https://openalex.org/W2514096510","https://openalex.org/W2515414225","https://openalex.org/W2789988746","https://openalex.org/W4231812028","https://openalex.org/W4242004734"],"related_works":["https://openalex.org/W1974455620","https://openalex.org/W2334362266","https://openalex.org/W2515414225","https://openalex.org/W2026195857","https://openalex.org/W1980603551","https://openalex.org/W2094435284","https://openalex.org/W2020015267","https://openalex.org/W2062672528","https://openalex.org/W2248825947","https://openalex.org/W4306393496"],"abstract_inverted_index":{"An":[0],"attenuation":[1,39,83],"calibration":[2,40],"system":[3,18,65],"is":[4,19,45,72],"developed":[5],"using":[6,53],"an":[7,82],"isothermal":[8],"temperature":[9],"control-type":[10],"calorimeter":[11,33],"for":[12,47,81],"a":[13,22,35,54],"terahertz":[14],"(THz)":[15],"attenuator.":[16],"This":[17],"based":[20],"on":[21],"power":[23,28],"ratio":[24],"measurement":[25,61,84],"by":[26],"dc":[27],"substitution.":[29],"A":[30],"highly":[31],"sensitive":[32],"achieves":[34],"simple":[36],"and":[37,68],"accurate":[38],"at":[41,50],"room":[42],"temperature.":[43],"Calibration":[44],"performed":[46],"metalized-film":[48],"attenuators":[49],"1":[51],"THz":[52,58],"photomixer":[55],"as":[56],"the":[57,64,69],"source.":[59],"The":[60],"uncertainties":[62],"in":[63],"are":[66],"evaluated,":[67],"expanded":[70],"uncertainty":[71],"found":[73],"to":[74,87],"be":[75],"0.19-0.84":[76],"dB":[77],"(k":[78],"=":[79],"2)":[80],"range":[85],"up":[86],"12":[88],"dB.":[89]},"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}