{"id":"https://openalex.org/W2523377413","doi":"https://doi.org/10.1109/tim.2016.2601004","title":"A New Method Based on Stochastic Process Models for Machine Remaining Useful Life Prediction","display_name":"A New Method Based on Stochastic Process Models for Machine Remaining Useful Life Prediction","publication_year":2016,"publication_date":"2016-09-22","ids":{"openalex":"https://openalex.org/W2523377413","doi":"https://doi.org/10.1109/tim.2016.2601004","mag":"2523377413"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2016.2601004","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2016.2601004","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5008554873","display_name":"Yaguo Lei","orcid":"https://orcid.org/0000-0002-5167-1459"},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yaguo Lei","raw_affiliation_strings":["Shaanxi Key Laboratory of Mechanical Product Quality Assurance and Diagnostics, Xi\u2019an Jiaotong University, Xi\u2019an, China","State Key Laboratory for Manufacturing Systems Engineering, Xi\u2019an Jiaotong University, Xi\u2019an, China","State Key Laboratory for Manufacturing Systems Engineering, Xi'an Jiaotong University, Xi'an, China","Shaanxi Key Laboratory of Mechanical Product Quality Assurance and Diagnostics, Xi'an Jiaotong University, Xi'an, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Shaanxi Key Laboratory of Mechanical Product Quality Assurance and Diagnostics, Xi\u2019an Jiaotong University, Xi\u2019an, China","institution_ids":["https://openalex.org/I87445476"]},{"raw_affiliation_string":"State Key Laboratory for Manufacturing Systems Engineering, Xi\u2019an Jiaotong University, Xi\u2019an, China","institution_ids":["https://openalex.org/I87445476"]},{"raw_affiliation_string":"State Key Laboratory for Manufacturing Systems Engineering, Xi'an Jiaotong University, Xi'an, China","institution_ids":["https://openalex.org/I87445476"]},{"raw_affiliation_string":"Shaanxi Key Laboratory of Mechanical Product Quality Assurance and Diagnostics, Xi'an Jiaotong University, Xi'an, China","institution_ids":["https://openalex.org/I87445476"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044245613","display_name":"Naipeng Li","orcid":"https://orcid.org/0000-0003-0678-8161"},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Naipeng Li","raw_affiliation_strings":["Shaanxi Key Laboratory of Mechanical Product Quality Assurance and Diagnostics, Xi\u2019an Jiaotong University, Xi\u2019an, China","State Key Laboratory for Manufacturing Systems Engineering, Xi\u2019an Jiaotong University, Xi\u2019an, China","Shaanxi Key Laboratory of Mechanical Product Quality Assurance and Diagnostics, Xi'an Jiaotong University, Xi'an, China","State Key Laboratory for Manufacturing Systems Engineering, Xi'an Jiaotong University, Xi'an, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Shaanxi Key Laboratory of Mechanical Product Quality Assurance and Diagnostics, Xi\u2019an Jiaotong University, Xi\u2019an, China","institution_ids":["https://openalex.org/I87445476"]},{"raw_affiliation_string":"State Key Laboratory for Manufacturing Systems Engineering, Xi\u2019an Jiaotong University, Xi\u2019an, China","institution_ids":["https://openalex.org/I87445476"]},{"raw_affiliation_string":"Shaanxi Key Laboratory of Mechanical Product Quality Assurance and Diagnostics, Xi'an Jiaotong University, Xi'an, China","institution_ids":["https://openalex.org/I87445476"]},{"raw_affiliation_string":"State Key Laboratory for Manufacturing Systems Engineering, Xi'an Jiaotong University, Xi'an, China","institution_ids":["https://openalex.org/I87445476"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100754192","display_name":"Jing Lin","orcid":"https://orcid.org/0000-0002-7670-1482"},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jing Lin","raw_affiliation_strings":["Shaanxi Key Laboratory of Mechanical Product Quality Assurance and Diagnostics, Xi\u2019an Jiaotong University, Xi\u2019an, China","State Key Laboratory for Manufacturing Systems Engineering, Xi\u2019an Jiaotong University, Xi\u2019an, China","State Key Laboratory for Manufacturing Systems Engineering, Xi'an Jiaotong University, Xi'an, China","Shaanxi Key Laboratory of Mechanical Product Quality Assurance and Diagnostics, Xi'an Jiaotong University, Xi'an, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Shaanxi Key Laboratory of Mechanical Product Quality Assurance and Diagnostics, Xi\u2019an Jiaotong University, Xi\u2019an, China","institution_ids":["https://openalex.org/I87445476"]},{"raw_affiliation_string":"State Key Laboratory for Manufacturing Systems Engineering, Xi\u2019an Jiaotong University, Xi\u2019an, China","institution_ids":["https://openalex.org/I87445476"]},{"raw_affiliation_string":"State Key Laboratory for Manufacturing Systems Engineering, Xi'an Jiaotong University, Xi'an, China","institution_ids":["https://openalex.org/I87445476"]},{"raw_affiliation_string":"Shaanxi Key Laboratory of Mechanical Product Quality Assurance and Diagnostics, Xi'an Jiaotong University, Xi'an, China","institution_ids":["https://openalex.org/I87445476"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I87445476"],"apc_list":null,"apc_paid":null,"fwci":23.2891,"has_fulltext":false,"cited_by_count":250,"citation_normalized_percentile":{"value":0.99870444,"is_in_top_1_percent":true,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":99,"max":100},"biblio":{"volume":"65","issue":"12","first_page":"2671","last_page":"2684"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9955999851226807,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10968","display_name":"Statistical Distribution Estimation and Applications","score":0.9896000027656555,"subfield":{"id":"https://openalex.org/subfields/2613","display_name":"Statistics and Probability"},"field":{"id":"https://openalex.org/fields/26","display_name":"Mathematics"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/maintainability","display_name":"Maintainability","score":0.7421460747718811},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6803520321846008},{"id":"https://openalex.org/keywords/prognostics","display_name":"Prognostics","score":0.6552127599716187},{"id":"https://openalex.org/keywords/kalman-filter","display_name":"Kalman filter","score":0.6199052929878235},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5862600803375244},{"id":"https://openalex.org/keywords/stochastic-process","display_name":"Stochastic process","score":0.5843049883842468},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5020792484283447},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4819619357585907},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.4596852958202362},{"id":"https://openalex.org/keywords/particle-filter","display_name":"Particle filter","score":0.4451627731323242},{"id":"https://openalex.org/keywords/condition-based-maintenance","display_name":"Condition-based maintenance","score":0.43052026629447937},{"id":"https://openalex.org/keywords/stochastic-modelling","display_name":"Stochastic modelling","score":0.4236827492713928},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.37269049882888794},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.16173779964447021},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.08397117257118225}],"concepts":[{"id":"https://openalex.org/C160713754","wikidata":"https://www.wikidata.org/wiki/Q1389965","display_name":"Maintainability","level":2,"score":0.7421460747718811},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6803520321846008},{"id":"https://openalex.org/C129364497","wikidata":"https://www.wikidata.org/wiki/Q3042561","display_name":"Prognostics","level":2,"score":0.6552127599716187},{"id":"https://openalex.org/C157286648","wikidata":"https://www.wikidata.org/wiki/Q846780","display_name":"Kalman filter","level":2,"score":0.6199052929878235},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5862600803375244},{"id":"https://openalex.org/C8272713","wikidata":"https://www.wikidata.org/wiki/Q176737","display_name":"Stochastic process","level":2,"score":0.5843049883842468},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5020792484283447},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4819619357585907},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.4596852958202362},{"id":"https://openalex.org/C52421305","wikidata":"https://www.wikidata.org/wiki/Q1151499","display_name":"Particle filter","level":3,"score":0.4451627731323242},{"id":"https://openalex.org/C2776907094","wikidata":"https://www.wikidata.org/wiki/Q1043452","display_name":"Condition-based maintenance","level":2,"score":0.43052026629447937},{"id":"https://openalex.org/C127491075","wikidata":"https://www.wikidata.org/wiki/Q7617825","display_name":"Stochastic modelling","level":2,"score":0.4236827492713928},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.37269049882888794},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.16173779964447021},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.08397117257118225},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2016.2601004","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2016.2601004","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Responsible consumption and production","score":0.5099999904632568,"id":"https://metadata.un.org/sdg/12"}],"awards":[{"id":"https://openalex.org/G3229652625","display_name":null,"funder_award_id":"51475355","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G4069261976","display_name":null,"funder_award_id":"2012jdgz01","funder_id":"https://openalex.org/F4320335787","funder_display_name":"Fundamental Research Funds for the Central Universities"},{"id":"https://openalex.org/G4103107196","display_name":null,"funder_award_id":"CXTD2014001","funder_id":"https://openalex.org/F4320335787","funder_display_name":"Fundamental Research Funds for the Central Universities"},{"id":"https://openalex.org/G5775067451","display_name":null,"funder_award_id":"61673311","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320335787","display_name":"Fundamental Research Funds for the Central Universities","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":40,"referenced_works":["https://openalex.org/W95577512","https://openalex.org/W116417043","https://openalex.org/W1556459174","https://openalex.org/W1968512012","https://openalex.org/W1969150846","https://openalex.org/W1978654022","https://openalex.org/W1981460882","https://openalex.org/W1983371987","https://openalex.org/W1985437849","https://openalex.org/W1989937845","https://openalex.org/W1992742133","https://openalex.org/W1995723008","https://openalex.org/W2005523062","https://openalex.org/W2006169073","https://openalex.org/W2023083702","https://openalex.org/W2028119131","https://openalex.org/W2049550263","https://openalex.org/W2051196068","https://openalex.org/W2053443947","https://openalex.org/W2057018442","https://openalex.org/W2061659083","https://openalex.org/W2062167668","https://openalex.org/W2064666683","https://openalex.org/W2067266460","https://openalex.org/W2075143718","https://openalex.org/W2081190536","https://openalex.org/W2081829568","https://openalex.org/W2097956058","https://openalex.org/W2098613108","https://openalex.org/W2106544870","https://openalex.org/W2110007571","https://openalex.org/W2126432428","https://openalex.org/W2128909582","https://openalex.org/W2137297477","https://openalex.org/W2142635246","https://openalex.org/W2160337655","https://openalex.org/W2603225712","https://openalex.org/W4298330376","https://openalex.org/W6633355566","https://openalex.org/W6736412012"],"related_works":["https://openalex.org/W2005485844","https://openalex.org/W2064323378","https://openalex.org/W1982533075","https://openalex.org/W2045186954","https://openalex.org/W2908973203","https://openalex.org/W2894706500","https://openalex.org/W2057931783","https://openalex.org/W4362698253","https://openalex.org/W2600946472","https://openalex.org/W1997521412"],"abstract_inverted_index":{"Remaining":[0],"useful":[1],"life":[2],"(RUL)":[3],"prediction":[4],"is":[5,53,72,88],"a":[6,35,48],"key":[7],"process":[8,41,51],"in":[9,113],"condition-based":[10],"maintenance":[11,20],"for":[12,43],"machines.":[13,31],"It":[14],"contributes":[15],"to":[16,74],"reducing":[17],"risks":[18],"and":[19,22,28,79,94,119],"costs":[21],"increasing":[23],"the":[24,56,67,76,81,86,107,115,121],"maintainability,":[25],"availability,":[26],"reliability,":[27],"productivity":[29],"of":[30,60,85,98],"This":[32],"paper":[33],"proposes":[34],"new":[36,49],"method":[37,87,109],"based":[38],"on":[39],"stochastic":[40,50,62,116],"models":[42],"machine":[44,61,122],"RUL":[45],"prediction.":[46],"First,":[47],"model":[52],"constructed":[54],"considering":[55],"multiple":[57],"variability":[58],"sources":[59],"degradation":[63,92,96,117],"processes":[64,93,118],"simultaneously.":[65],"Then":[66],"Kalman":[68],"particle":[69],"filtering":[70],"algorithm":[71],"used":[73],"estimate":[75],"system":[77],"states":[78],"predict":[80],"RUL.":[82,123],"The":[83],"effectiveness":[84],"demonstrated":[89],"using":[90],"simulated":[91],"accelerated":[95],"tests":[97],"rolling":[99],"element":[100],"bearings.":[101],"Through":[102],"comparisons":[103],"with":[104],"other":[105],"methods,":[106],"proposed":[108],"presents":[110],"its":[111],"superiority":[112],"describing":[114],"predicting":[120]},"counts_by_year":[{"year":2026,"cited_by_count":8},{"year":2025,"cited_by_count":22},{"year":2024,"cited_by_count":17},{"year":2023,"cited_by_count":39},{"year":2022,"cited_by_count":32},{"year":2021,"cited_by_count":46},{"year":2020,"cited_by_count":27},{"year":2019,"cited_by_count":23},{"year":2018,"cited_by_count":19},{"year":2017,"cited_by_count":17}],"updated_date":"2026-07-25T09:21:30.201066","created_date":"2025-10-10T00:00:00"}