{"id":"https://openalex.org/W2515677218","doi":"https://doi.org/10.1109/tim.2016.2593965","title":"Effect of Keysight 3458A Jitter on Precision of Phase Difference Measurement","display_name":"Effect of Keysight 3458A Jitter on Precision of Phase Difference Measurement","publication_year":2016,"publication_date":"2016-09-02","ids":{"openalex":"https://openalex.org/W2515677218","doi":"https://doi.org/10.1109/tim.2016.2593965","mag":"2515677218"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2016.2593965","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2016.2593965","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102721788","display_name":"Andrei Pokatilov","orcid":"https://orcid.org/0000-0002-6878-4214"},"institutions":[{"id":"https://openalex.org/I111112146","display_name":"Tallinn University of Technology","ror":"https://ror.org/0443cwa12","country_code":"EE","type":"education","lineage":["https://openalex.org/I111112146"]},{"id":"https://openalex.org/I4210095453","display_name":"East Tallinn Central Hospital","ror":"https://ror.org/00wpg5z42","country_code":"EE","type":"healthcare","lineage":["https://openalex.org/I4210095453"]},{"id":"https://openalex.org/I4387156421","display_name":"Metrosert","ror":"https://ror.org/020wg5393","country_code":null,"type":"company","lineage":["https://openalex.org/I4387156421"]}],"countries":["EE"],"is_corresponding":true,"raw_author_name":"Andrei Pokatilov","raw_affiliation_strings":["Central Office of Metrology, AS Metrosert, Tallinn, Estonia","Tallinn University of Technology, Tallinn, Estonia"],"raw_orcid":"https://orcid.org/0000-0002-6878-4214","affiliations":[{"raw_affiliation_string":"Central Office of Metrology, AS Metrosert, Tallinn, Estonia","institution_ids":["https://openalex.org/I4210095453","https://openalex.org/I4387156421"]},{"raw_affiliation_string":"Tallinn University of Technology, Tallinn, Estonia","institution_ids":["https://openalex.org/I111112146"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081361429","display_name":"Toomas K\u00fcbarsepp","orcid":"https://orcid.org/0000-0002-7304-427X"},"institutions":[{"id":"https://openalex.org/I111112146","display_name":"Tallinn University of Technology","ror":"https://ror.org/0443cwa12","country_code":"EE","type":"education","lineage":["https://openalex.org/I111112146"]},{"id":"https://openalex.org/I4210095453","display_name":"East Tallinn Central Hospital","ror":"https://ror.org/00wpg5z42","country_code":"EE","type":"healthcare","lineage":["https://openalex.org/I4210095453"]},{"id":"https://openalex.org/I4387156421","display_name":"Metrosert","ror":"https://ror.org/020wg5393","country_code":null,"type":"company","lineage":["https://openalex.org/I4387156421"]}],"countries":["EE"],"is_corresponding":false,"raw_author_name":"Toomas Kubarsepp","raw_affiliation_strings":["Central Office of Metrology, AS Metrosert, Tallinn, Estonia","Tallinn University of Technology, Tallinn, Estonia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Central Office of Metrology, AS Metrosert, Tallinn, Estonia","institution_ids":["https://openalex.org/I4210095453","https://openalex.org/I4387156421"]},{"raw_affiliation_string":"Tallinn University of Technology, Tallinn, Estonia","institution_ids":["https://openalex.org/I111112146"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5013979599","display_name":"Viktor Vabson","orcid":"https://orcid.org/0000-0003-0963-706X"},"institutions":[{"id":"https://openalex.org/I2802841028","display_name":"Tartu Observatory","ror":"https://ror.org/04mc23283","country_code":"EE","type":"archive","lineage":["https://openalex.org/I172656520","https://openalex.org/I2802841028","https://openalex.org/I56085075"]}],"countries":["EE"],"is_corresponding":false,"raw_author_name":"Viktor Vabson","raw_affiliation_strings":["Tartu Observatory, T\u00f5ravere, Tartumaa, Estonia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tartu Observatory, T\u00f5ravere, Tartumaa, Estonia","institution_ids":["https://openalex.org/I2802841028"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5102721788"],"corresponding_institution_ids":["https://openalex.org/I111112146","https://openalex.org/I4210095453","https://openalex.org/I4387156421"],"apc_list":null,"apc_paid":null,"fwci":0.9299,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.78363888,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":"65","issue":"11","first_page":"2595","last_page":"2600"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9909999966621399,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/jitter","display_name":"Jitter","score":0.8765173554420471},{"id":"https://openalex.org/keywords/synchronization","display_name":"Synchronization (alternating current)","score":0.5952476263046265},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.528940737247467},{"id":"https://openalex.org/keywords/phase-difference","display_name":"Phase difference","score":0.5198424458503723},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.453057199716568},{"id":"https://openalex.org/keywords/accuracy-and-precision","display_name":"Accuracy and precision","score":0.42130768299102783},{"id":"https://openalex.org/keywords/phase","display_name":"Phase (matter)","score":0.41157594323158264},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2719159722328186},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2263372838497162},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.19302096962928772},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.17971324920654297},{"id":"https://openalex.org/keywords/bandwidth","display_name":"Bandwidth (computing)","score":0.1737954020500183},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.10033616423606873},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.09518563747406006},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.09353289008140564}],"concepts":[{"id":"https://openalex.org/C134652429","wikidata":"https://www.wikidata.org/wiki/Q1052698","display_name":"Jitter","level":2,"score":0.8765173554420471},{"id":"https://openalex.org/C2778562939","wikidata":"https://www.wikidata.org/wiki/Q1298791","display_name":"Synchronization (alternating current)","level":3,"score":0.5952476263046265},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.528940737247467},{"id":"https://openalex.org/C3017413879","wikidata":"https://www.wikidata.org/wiki/Q185553","display_name":"Phase difference","level":3,"score":0.5198424458503723},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.453057199716568},{"id":"https://openalex.org/C202799725","wikidata":"https://www.wikidata.org/wiki/Q272035","display_name":"Accuracy and precision","level":2,"score":0.42130768299102783},{"id":"https://openalex.org/C44280652","wikidata":"https://www.wikidata.org/wiki/Q104837","display_name":"Phase (matter)","level":2,"score":0.41157594323158264},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2719159722328186},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2263372838497162},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.19302096962928772},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.17971324920654297},{"id":"https://openalex.org/C2776257435","wikidata":"https://www.wikidata.org/wiki/Q1576430","display_name":"Bandwidth (computing)","level":2,"score":0.1737954020500183},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.10033616423606873},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.09518563747406006},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.09353289008140564},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2016.2593965","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2016.2593965","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6899999976158142,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320322835","display_name":"Ministry of Economic Affairs","ror":"https://ror.org/042ge0913"},{"id":"https://openalex.org/F4320323438","display_name":"Tallinna Tehnika\u00fclikool","ror":"https://ror.org/0443cwa12"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1531928684","https://openalex.org/W1801762069","https://openalex.org/W1974430835","https://openalex.org/W1987585186","https://openalex.org/W2024885563","https://openalex.org/W2040687108","https://openalex.org/W2121063523","https://openalex.org/W2135104574","https://openalex.org/W2156762059","https://openalex.org/W2157843072","https://openalex.org/W2165750195","https://openalex.org/W2617610572"],"related_works":["https://openalex.org/W2121182846","https://openalex.org/W2315668284","https://openalex.org/W2155789024","https://openalex.org/W2109491806","https://openalex.org/W2138891318","https://openalex.org/W2991669302","https://openalex.org/W3005137592","https://openalex.org/W2040030256","https://openalex.org/W2391991476","https://openalex.org/W2138980940"],"abstract_inverted_index":{"A":[0],"new":[1],"method":[2,19],"improving":[3],"precision":[4,57],"of":[5,25,37,41,50,58],"the":[6,26,35,38,48,51,59,64,75],"phase":[7,60],"difference":[8,61],"measurement":[9],"performed":[10],"by":[11,28],"two":[12],"Keysight":[13],"3458A":[14],"multimeters":[15,27],"is":[16,20],"proposed.":[17],"The":[18],"based":[21],"on":[22,47],"external":[23],"synchronization":[24,78],"a":[29],"specially":[30],"selected":[31],"sampling":[32],"interval":[33],"reducing":[34],"effect":[36],"finite":[39],"resolution":[40],"an":[42],"internal":[43],"time":[44],"base":[45],"(jitter)":[46],"performance":[49],"multimeters.":[52],"By":[53],"using":[54],"this":[55],"method,":[56],"estimation":[62],"in":[63],"audio":[65],"frequency":[66],"band":[67],"can":[68],"significantly":[69],"be":[70],"improved":[71],"as":[72],"compared":[73],"with":[74],"commonly":[76],"used":[77],"schemes.":[79]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":3},{"year":2016,"cited_by_count":1}],"updated_date":"2026-05-10T08:33:47.465468","created_date":"2025-10-10T00:00:00"}