{"id":"https://openalex.org/W2468082373","doi":"https://doi.org/10.1109/tim.2016.2581438","title":"A Testability Measure for DC-Excited Periodically Switched Networks With Applications to DC-DC Converters","display_name":"A Testability Measure for DC-Excited Periodically Switched Networks With Applications to DC-DC Converters","publication_year":2016,"publication_date":"2016-07-11","ids":{"openalex":"https://openalex.org/W2468082373","doi":"https://doi.org/10.1109/tim.2016.2581438","mag":"2468082373"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2016.2581438","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2016.2581438","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5085090431","display_name":"Giuseppe Fontana","orcid":"https://orcid.org/0000-0003-1923-4651"},"institutions":[{"id":"https://openalex.org/I45084792","display_name":"University of Florence","ror":"https://ror.org/04jr1s763","country_code":"IT","type":"education","lineage":["https://openalex.org/I45084792"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"Giuseppe Fontana","raw_affiliation_strings":["Department of Information Engineering, University of Florence, Florence, Italy"],"affiliations":[{"raw_affiliation_string":"Department of Information Engineering, University of Florence, Florence, Italy","institution_ids":["https://openalex.org/I45084792"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008924460","display_name":"Antonio Luchetta","orcid":"https://orcid.org/0000-0003-4319-1495"},"institutions":[{"id":"https://openalex.org/I45084792","display_name":"University of Florence","ror":"https://ror.org/04jr1s763","country_code":"IT","type":"education","lineage":["https://openalex.org/I45084792"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Antonio Luchetta","raw_affiliation_strings":["Department of Information Engineering, University of Florence, Florence, Italy"],"affiliations":[{"raw_affiliation_string":"Department of Information Engineering, University of Florence, Florence, Italy","institution_ids":["https://openalex.org/I45084792"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007810132","display_name":"S. Manetti","orcid":"https://orcid.org/0000-0002-5798-7147"},"institutions":[{"id":"https://openalex.org/I45084792","display_name":"University of Florence","ror":"https://ror.org/04jr1s763","country_code":"IT","type":"education","lineage":["https://openalex.org/I45084792"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Stefano Manetti","raw_affiliation_strings":["Department of Information Engineering, University of Florence, Florence, Italy"],"affiliations":[{"raw_affiliation_string":"Department of Information Engineering, University of Florence, Florence, Italy","institution_ids":["https://openalex.org/I45084792"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5074559814","display_name":"Maria Cristina Piccirilli","orcid":"https://orcid.org/0000-0002-9955-1990"},"institutions":[{"id":"https://openalex.org/I45084792","display_name":"University of Florence","ror":"https://ror.org/04jr1s763","country_code":"IT","type":"education","lineage":["https://openalex.org/I45084792"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Maria Cristina Piccirilli","raw_affiliation_strings":["Department of Information Engineering, University of Florence, Florence, Italy"],"affiliations":[{"raw_affiliation_string":"Department of Information Engineering, University of Florence, Florence, Italy","institution_ids":["https://openalex.org/I45084792"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5085090431"],"corresponding_institution_ids":["https://openalex.org/I45084792"],"apc_list":null,"apc_paid":null,"fwci":2.5227,"has_fulltext":false,"cited_by_count":21,"citation_normalized_percentile":{"value":0.88800075,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"65","issue":"10","first_page":"2321","last_page":"2341"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/testability","display_name":"Testability","score":0.8633571863174438},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5402732491493225},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5097784399986267},{"id":"https://openalex.org/keywords/converters","display_name":"Converters","score":0.5005178451538086},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4934143126010895},{"id":"https://openalex.org/keywords/metric","display_name":"Metric (unit)","score":0.45265454053878784},{"id":"https://openalex.org/keywords/time-domain","display_name":"Time domain","score":0.43082892894744873},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.32443249225616455},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3213805556297302},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2895984649658203},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.17875617742538452},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.17866531014442444},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.15463191270828247}],"concepts":[{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.8633571863174438},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5402732491493225},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5097784399986267},{"id":"https://openalex.org/C2778422915","wikidata":"https://www.wikidata.org/wiki/Q10302051","display_name":"Converters","level":3,"score":0.5005178451538086},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4934143126010895},{"id":"https://openalex.org/C176217482","wikidata":"https://www.wikidata.org/wiki/Q860554","display_name":"Metric (unit)","level":2,"score":0.45265454053878784},{"id":"https://openalex.org/C103824480","wikidata":"https://www.wikidata.org/wiki/Q185889","display_name":"Time domain","level":2,"score":0.43082892894744873},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.32443249225616455},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3213805556297302},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2895984649658203},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.17875617742538452},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.17866531014442444},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.15463191270828247},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tim.2016.2581438","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2016.2581438","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},{"id":"pmh:oai:flore.unifi.it:2158/1054678","is_oa":false,"landing_page_url":"http://hdl.handle.net/2158/1054678","pdf_url":null,"source":{"id":"https://openalex.org/S4306402033","display_name":"Florence Research (University of Florence)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I45084792","host_organization_name":"University of Florence","host_organization_lineage":["https://openalex.org/I45084792"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":40,"referenced_works":["https://openalex.org/W1528198050","https://openalex.org/W1774537532","https://openalex.org/W1933057227","https://openalex.org/W1955340979","https://openalex.org/W1973987752","https://openalex.org/W1975773564","https://openalex.org/W1986402568","https://openalex.org/W1990117314","https://openalex.org/W1997244547","https://openalex.org/W2006149896","https://openalex.org/W2008949992","https://openalex.org/W2011352087","https://openalex.org/W2018723009","https://openalex.org/W2023267525","https://openalex.org/W2031230445","https://openalex.org/W2039767710","https://openalex.org/W2050931712","https://openalex.org/W2069540800","https://openalex.org/W2085885569","https://openalex.org/W2096214002","https://openalex.org/W2103882319","https://openalex.org/W2104826874","https://openalex.org/W2110273585","https://openalex.org/W2111125203","https://openalex.org/W2113753693","https://openalex.org/W2115292870","https://openalex.org/W2139134478","https://openalex.org/W2142066163","https://openalex.org/W2143441220","https://openalex.org/W2151293953","https://openalex.org/W2152013740","https://openalex.org/W2158176614","https://openalex.org/W2159440090","https://openalex.org/W2168398742","https://openalex.org/W2269445615","https://openalex.org/W2325207965","https://openalex.org/W3008683746","https://openalex.org/W4242555997","https://openalex.org/W6677037034","https://openalex.org/W6774442298"],"related_works":["https://openalex.org/W3141833020","https://openalex.org/W2005192856","https://openalex.org/W2088597164","https://openalex.org/W4214777083","https://openalex.org/W3026659167","https://openalex.org/W3136892476","https://openalex.org/W2139134507","https://openalex.org/W2127140870","https://openalex.org/W2170883915","https://openalex.org/W2963399522"],"abstract_inverted_index":{"Testability":[0],"analysis":[1,154,219],"is":[2,51,89,220],"a":[3,63,83,86,160,183,242],"fundamental":[4],"prerequisite":[5],"to":[6,33,43,55,96,126,185,204],"any":[7],"fault":[8],"location":[9],"or":[10,106],"parameter":[11,120],"identification":[12],"technique":[13],"(FLPIT)":[14],"for":[15,39,149,169,213],"analog":[16],"circuits.":[17,35],"However,":[18],"differently":[19],"from":[20,108],"the":[21,40,44,49,119,123,127,150,164,196,228],"linear":[22],"time-invariant":[23],"field,":[24],"this":[25,37],"topic":[26],"has":[27,141],"been":[28,142],"poorly":[29],"investigated":[30],"with":[31,53,59,222,241],"regard":[32],"nonlinear":[34,67],"In":[36],"paper,":[38],"first":[41,165],"time,":[42],"best":[45],"of":[46,65,118,129,155,198],"our":[47],"knowledge,":[48],"question":[50],"addressed":[52],"reference":[54],"periodically":[56],"switched":[57],"networks":[58],"dc":[60],"stimuli":[61],"(PSNDSs),":[62],"class":[64],"inherently":[66],"time-varying":[68],"circuits":[69],"that":[70],"subsumes":[71],"dc-dc":[72,234],"converters":[73],"as":[74,95,134,182,192,194,203],"noteworthy":[75],"members.":[76],"A":[77],"rigorous":[78],"testability":[79,139,153,167,218,246],"measure":[80,247],"at":[81],"both":[82,176],"circuit":[84,180],"and":[85,99,122,179,189],"component":[87],"level":[88],"thereby":[90],"obtained,":[91],"which":[92,100,214],"provides":[93],"information":[94],"how":[97],"many":[98],"components":[101],"can":[102,172],"be":[103,173],"unambiguously":[104],"diagnosed":[105],"estimated":[107],"time-domain":[109],"measurements.":[110],"Consequently,":[111],"it":[112,171],"yields":[113],"an":[114,135,145,215],"upper":[115],"bound,":[116],"independent":[117],"values":[121],"test":[124,177],"instants,":[125,201],"performance":[128],"whatever":[130],"method":[131],"actually":[132],"employed":[133,174],"FLPIT.":[136],"This":[137],"theoretical":[138],"metric":[140],"converted":[143],"into":[144],"efficient":[146],"computer":[147,161],"program":[148,162],"fully":[151],"automated":[152,224],"PSNDSs":[156],"presented":[157],"herein.":[158],"Such":[159],"represents":[163],"practical":[166],"gauge":[168],"PSNDSs:":[170],"by":[175,227],"engineers":[178],"designers":[181],"guide":[184],"properly":[186],"selecting":[187],"injection":[188],"measurement":[190,200],"points":[191],"well":[193],"estimating":[195],"number":[197],"necessary":[199],"so":[202],"shape":[205],"their":[206],"own":[207],"FLPITs.":[208],"Several":[209],"examples":[210],"are":[211,237,248],"provided":[212,226],"in-depth":[216],"pencil-and-paper":[217],"contrasted":[221],"its":[223],"counterpart":[225],"aforementioned":[229],"software:":[230],"in":[231],"particular,":[232],"popular":[233],"converter":[235],"topologies":[236],"thoroughly":[238],"analyzed.":[239],"Comparisons":[240],"previously":[243],"proposed":[244],"frequency-domain":[245],"also":[249],"considered.":[250]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":5},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}