{"id":"https://openalex.org/W2342691326","doi":"https://doi.org/10.1109/tim.2016.2526637","title":"Deployment of Inductance-Based Pulsating Sensor Toward Development of Measurement Technique for Ovality in Pipe","display_name":"Deployment of Inductance-Based Pulsating Sensor Toward Development of Measurement Technique for Ovality in Pipe","publication_year":2016,"publication_date":"2016-02-19","ids":{"openalex":"https://openalex.org/W2342691326","doi":"https://doi.org/10.1109/tim.2016.2526637","mag":"2342691326"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2016.2526637","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2016.2526637","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5030061692","display_name":"Ramesh Sanga","orcid":"https://orcid.org/0000-0001-9581-3888"},"institutions":[{"id":"https://openalex.org/I2802630050","display_name":"Indira Gandhi Centre for Atomic Research","ror":"https://ror.org/05tkzma19","country_code":"IN","type":"facility","lineage":["https://openalex.org/I2799351866","https://openalex.org/I2802630050","https://openalex.org/I3149292468"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"Sanga Ramesh","raw_affiliation_strings":["Electronics Instrumentation and Radiological Safety Group, Security and Innovative Sensors Division, Indira Gandhi Centre for Atomic Research, Kalpakkam, India"],"affiliations":[{"raw_affiliation_string":"Electronics Instrumentation and Radiological Safety Group, Security and Innovative Sensors Division, Indira Gandhi Centre for Atomic Research, Kalpakkam, India","institution_ids":["https://openalex.org/I2802630050"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044980764","display_name":"M. P. Rajiniganth","orcid":null},"institutions":[{"id":"https://openalex.org/I2802630050","display_name":"Indira Gandhi Centre for Atomic Research","ror":"https://ror.org/05tkzma19","country_code":"IN","type":"facility","lineage":["https://openalex.org/I2799351866","https://openalex.org/I2802630050","https://openalex.org/I3149292468"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Masila Pandiasankar Rajiniganth","raw_affiliation_strings":["Electronics Instrumentation and Radiological Safety Group, Security and Innovative Sensors Division, Indira Gandhi Centre for Atomic Research, Kalpakkam, India"],"affiliations":[{"raw_affiliation_string":"Electronics Instrumentation and Radiological Safety Group, Security and Innovative Sensors Division, Indira Gandhi Centre for Atomic Research, Kalpakkam, India","institution_ids":["https://openalex.org/I2802630050"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100926061","display_name":"Parashuram Sahoo","orcid":null},"institutions":[{"id":"https://openalex.org/I2802630050","display_name":"Indira Gandhi Centre for Atomic Research","ror":"https://ror.org/05tkzma19","country_code":"IN","type":"facility","lineage":["https://openalex.org/I2799351866","https://openalex.org/I2802630050","https://openalex.org/I3149292468"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Parashuram Sahoo","raw_affiliation_strings":["Electronics Instrumentation and Radiological Safety Group, Security and Innovative Sensors Division, Indira Gandhi Centre for Atomic Research, Kalpakkam, India"],"affiliations":[{"raw_affiliation_string":"Electronics Instrumentation and Radiological Safety Group, Security and Innovative Sensors Division, Indira Gandhi Centre for Atomic Research, Kalpakkam, India","institution_ids":["https://openalex.org/I2802630050"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5030061692"],"corresponding_institution_ids":["https://openalex.org/I2802630050"],"apc_list":null,"apc_paid":null,"fwci":2.3415,"has_fulltext":false,"cited_by_count":12,"citation_normalized_percentile":{"value":0.87203435,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"65","issue":"6","first_page":"1443","last_page":"1449"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/ovality","display_name":"Ovality","score":0.9776055812835693},{"id":"https://openalex.org/keywords/inductance","display_name":"Inductance","score":0.6005496382713318},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5126675367355347},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.5101883411407471},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5011608600616455},{"id":"https://openalex.org/keywords/capacitive-sensing","display_name":"Capacitive sensing","score":0.48701173067092896},{"id":"https://openalex.org/keywords/inductor","display_name":"Inductor","score":0.4795370101928711},{"id":"https://openalex.org/keywords/position","display_name":"Position (finance)","score":0.45699331164360046},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.4353814721107483},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.35875555872917175},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3447766602039337},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.2104385793209076},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.18532639741897583},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.09574383497238159}],"concepts":[{"id":"https://openalex.org/C151004103","wikidata":"https://www.wikidata.org/wiki/Q7113225","display_name":"Ovality","level":2,"score":0.9776055812835693},{"id":"https://openalex.org/C29210110","wikidata":"https://www.wikidata.org/wiki/Q177897","display_name":"Inductance","level":3,"score":0.6005496382713318},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5126675367355347},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.5101883411407471},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5011608600616455},{"id":"https://openalex.org/C206755178","wikidata":"https://www.wikidata.org/wiki/Q1131271","display_name":"Capacitive sensing","level":2,"score":0.48701173067092896},{"id":"https://openalex.org/C144534570","wikidata":"https://www.wikidata.org/wiki/Q5325","display_name":"Inductor","level":3,"score":0.4795370101928711},{"id":"https://openalex.org/C198082294","wikidata":"https://www.wikidata.org/wiki/Q3399648","display_name":"Position (finance)","level":2,"score":0.45699331164360046},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.4353814721107483},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.35875555872917175},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3447766602039337},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.2104385793209076},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.18532639741897583},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.09574383497238159},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C10138342","wikidata":"https://www.wikidata.org/wiki/Q43015","display_name":"Finance","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2016.2526637","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2016.2526637","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W1974137866","https://openalex.org/W1994010829","https://openalex.org/W1994636736","https://openalex.org/W1994723765","https://openalex.org/W2033718979","https://openalex.org/W2049746283","https://openalex.org/W2051037352","https://openalex.org/W2053768230","https://openalex.org/W2069968740","https://openalex.org/W2075656465","https://openalex.org/W2080712684","https://openalex.org/W2085504537","https://openalex.org/W2094292443","https://openalex.org/W2323972463","https://openalex.org/W2582728547","https://openalex.org/W6667745128"],"related_works":["https://openalex.org/W2769490182","https://openalex.org/W2196183592","https://openalex.org/W3168403633","https://openalex.org/W2120661608","https://openalex.org/W2114486131","https://openalex.org/W1487788472","https://openalex.org/W2117520483","https://openalex.org/W4226174229","https://openalex.org/W2144738648","https://openalex.org/W4235041402"],"abstract_inverted_index":{"This":[0,41],"paper":[1],"presents":[2],"a":[3,19,34,66,109,163],"handheld":[4],"robust":[5],"battery-operated":[6],"contact-based":[7],"ovality":[8,15,28,124,175],"meter":[9,29],"suitable":[10,173],"for":[11,174],"the":[12,44,56,60,75,79,91,94,100,105,115,123,128,131,166],"measurement":[13,61,135,144,168],"of":[14,33,46,62,78,93,104,111,117,133],"in":[16,18,23,55,69,72,142,155,165],"pipeline":[17],"plant":[20],"site":[21],"or":[22],"any":[24],"industrial":[25],"establishment.":[26],"The":[27,140],"is":[30,83,97,108,125,136,149],"mainly":[31],"composed":[32],"specially":[35],"designed":[36],"inductor":[37,42],"with":[38],"ferrite":[39],"core.":[40],"constitutes":[43],"part":[45],"an":[47],"LC-type":[48],"logic":[49],"gate":[50],"oscillator":[51],"(LGO).":[52],"A":[53],"change":[54,68],"sensor":[57],"position":[58,134,143,167],"during":[59],"pipe":[63,118],"diameter":[64,116],"causes":[65],"small":[67],"inductance,":[70],"which":[71,152],"turn":[73],"changes":[74],"pulse":[76],"frequency":[77],"LGO":[80],"when":[81],"it":[82],"powered":[84],"by":[85],"5":[86],"V":[87],"dc.":[88],"Thus,":[89],"frequency,":[90],"output":[92],"instrument":[95],"that":[96],"displayed":[98],"on":[99],"liquid":[101],"crystal":[102],"display":[103],"embedded":[106],"processor,":[107],"function":[110],"displacement.":[112],"By":[113],"measuring":[114],"specimen":[119],"at":[120],"different":[121],"locations,":[122],"computed.":[126],"In":[127],"present":[129],"design,":[130],"range":[132,157],"about":[137],"25":[138,160],"mm.":[139],"sensitivity":[141,164],"up":[145],"to":[146,159,170],"10":[147],"mm":[148],"~850":[150],"Hz/mm,":[151],"further":[153],"reduces":[154],"higher":[156],"(>10":[158],"mm).":[161],"Such":[162],"seems":[169],"be":[171],"quite":[172],"measurement.":[176]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":5},{"year":2016,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}