{"id":"https://openalex.org/W2259640260","doi":"https://doi.org/10.1109/tim.2015.2509218","title":"A 6-DOF Measurement Solution for Permanent Magnet Synchronous Planar Motors Based on Motion Continuity Principle","display_name":"A 6-DOF Measurement Solution for Permanent Magnet Synchronous Planar Motors Based on Motion Continuity Principle","publication_year":2016,"publication_date":"2016-01-12","ids":{"openalex":"https://openalex.org/W2259640260","doi":"https://doi.org/10.1109/tim.2015.2509218","mag":"2259640260"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2015.2509218","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2015.2509218","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5086852930","display_name":"Longmin Chen","orcid":"https://orcid.org/0000-0002-9790-7949"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Longmin Chen","raw_affiliation_strings":["Department of Mechanical EngineeringState Key Laboratory of Tribology, Tsinghua University, Beijing, China","Beijing Key Laboratory of Precision/Ultra-Precision Manufacturing Equipments and Control, Tsinghua University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Mechanical EngineeringState Key Laboratory of Tribology, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]},{"raw_affiliation_string":"Beijing Key Laboratory of Precision/Ultra-Precision Manufacturing Equipments and Control, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056545586","display_name":"Jinchun Hu","orcid":"https://orcid.org/0000-0003-2733-6738"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jinchun Hu","raw_affiliation_strings":["Department of Mechanical EngineeringState Key Laboratory of Tribology, Tsinghua University, Beijing, China","Beijing Key Laboratory of Precision/Ultra-Precision Manufacturing Equipments and Control, Tsinghua University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Mechanical EngineeringState Key Laboratory of Tribology, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]},{"raw_affiliation_string":"Beijing Key Laboratory of Precision/Ultra-Precision Manufacturing Equipments and Control, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112890006","display_name":"Yu Zhu","orcid":"https://orcid.org/0000-0002-6186-6874"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yu Zhu","raw_affiliation_strings":["Department of Mechanical EngineeringState Key Laboratory of Tribology, Tsinghua University, Beijing, China","Beijing Key Laboratory of Precision/Ultra-Precision Manufacturing Equipments and Control, Tsinghua University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Mechanical EngineeringState Key Laboratory of Tribology, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]},{"raw_affiliation_string":"Beijing Key Laboratory of Precision/Ultra-Precision Manufacturing Equipments and Control, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087850987","display_name":"Shengwu Du","orcid":"https://orcid.org/0000-0002-8656-2156"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shengwu Du","raw_affiliation_strings":["Department of Mechanical EngineeringState Key Laboratory of Tribology, Tsinghua University, Beijing, China","Beijing Key Laboratory of Precision/Ultra-Precision Manufacturing Equipments and Control, Tsinghua University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Mechanical EngineeringState Key Laboratory of Tribology, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]},{"raw_affiliation_string":"Beijing Key Laboratory of Precision/Ultra-Precision Manufacturing Equipments and Control, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5027645483","display_name":"Yuze Chai","orcid":null},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuze Chai","raw_affiliation_strings":["Department of Mechanical EngineeringState Key Laboratory of Tribology, Tsinghua University, Beijing, China","Beijing Key Laboratory of Precision/Ultra-Precision Manufacturing Equipments and Control, Tsinghua University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Mechanical EngineeringState Key Laboratory of Tribology, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]},{"raw_affiliation_string":"Beijing Key Laboratory of Precision/Ultra-Precision Manufacturing Equipments and Control, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I99065089"],"apc_list":null,"apc_paid":null,"fwci":1.3371,"has_fulltext":false,"cited_by_count":19,"citation_normalized_percentile":{"value":0.79943602,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"65","issue":"3","first_page":"643","last_page":"655"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12692","display_name":"Magnetic Field Sensors Techniques","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.6305700540542603},{"id":"https://openalex.org/keywords/displacement","display_name":"Displacement (psychology)","score":0.6295493245124817},{"id":"https://openalex.org/keywords/convergence","display_name":"Convergence (economics)","score":0.5391090512275696},{"id":"https://openalex.org/keywords/planar","display_name":"Planar","score":0.5369595885276794},{"id":"https://openalex.org/keywords/standard-deviation","display_name":"Standard deviation","score":0.5358802676200867},{"id":"https://openalex.org/keywords/magnet","display_name":"Magnet","score":0.528881311416626},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.5261121392250061},{"id":"https://openalex.org/keywords/rate-of-convergence","display_name":"Rate of convergence","score":0.4617268145084381},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4558067321777344},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.43938955664634705},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.4147319495677948},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.30839991569519043},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.27700096368789673},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.19608882069587708},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.17992451786994934},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.10574325919151306},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.09845113754272461}],"concepts":[{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.6305700540542603},{"id":"https://openalex.org/C107551265","wikidata":"https://www.wikidata.org/wiki/Q1458245","display_name":"Displacement (psychology)","level":2,"score":0.6295493245124817},{"id":"https://openalex.org/C2777303404","wikidata":"https://www.wikidata.org/wiki/Q759757","display_name":"Convergence (economics)","level":2,"score":0.5391090512275696},{"id":"https://openalex.org/C134786449","wikidata":"https://www.wikidata.org/wiki/Q3391255","display_name":"Planar","level":2,"score":0.5369595885276794},{"id":"https://openalex.org/C22679943","wikidata":"https://www.wikidata.org/wiki/Q159375","display_name":"Standard deviation","level":2,"score":0.5358802676200867},{"id":"https://openalex.org/C16389437","wikidata":"https://www.wikidata.org/wiki/Q11421","display_name":"Magnet","level":2,"score":0.528881311416626},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.5261121392250061},{"id":"https://openalex.org/C57869625","wikidata":"https://www.wikidata.org/wiki/Q1783502","display_name":"Rate of convergence","level":3,"score":0.4617268145084381},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4558067321777344},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.43938955664634705},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.4147319495677948},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.30839991569519043},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.27700096368789673},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.19608882069587708},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.17992451786994934},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.10574325919151306},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.09845113754272461},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C121684516","wikidata":"https://www.wikidata.org/wiki/Q7600677","display_name":"Computer graphics (images)","level":1,"score":0.0},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0},{"id":"https://openalex.org/C50522688","wikidata":"https://www.wikidata.org/wiki/Q189833","display_name":"Economic growth","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C542102704","wikidata":"https://www.wikidata.org/wiki/Q183257","display_name":"Psychotherapist","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2015.2509218","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2015.2509218","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G4125463439","display_name":null,"funder_award_id":"51175296","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W1971591628","https://openalex.org/W1983226443","https://openalex.org/W1998311663","https://openalex.org/W1998756577","https://openalex.org/W2005470433","https://openalex.org/W2017316038","https://openalex.org/W2017520164","https://openalex.org/W2032891836","https://openalex.org/W2039924400","https://openalex.org/W2050157718","https://openalex.org/W2067730679","https://openalex.org/W2071163133","https://openalex.org/W2088133566","https://openalex.org/W2093933867","https://openalex.org/W2105483819","https://openalex.org/W2109795634","https://openalex.org/W2139175431","https://openalex.org/W2165528467","https://openalex.org/W2314704433"],"related_works":["https://openalex.org/W2381426581","https://openalex.org/W2024370140","https://openalex.org/W2159705349","https://openalex.org/W4206327962","https://openalex.org/W2105392727","https://openalex.org/W2081826635","https://openalex.org/W2125678830","https://openalex.org/W601048412","https://openalex.org/W118630527","https://openalex.org/W4210698599"],"abstract_inverted_index":{"Exploiting":[0],"motor-inherent":[1],"magnetic":[2,30],"field":[3,31],"for":[4,39,188],"displacement":[5,41,70,108],"measurement":[6,42,132,147,181],"has":[7],"been":[8],"paid":[9],"much":[10],"attention":[11],"as":[12,197],"it":[13],"can":[14],"greatly":[15],"reduce":[16],"setup":[17],"complexity.":[18],"In":[19],"this":[20],"paper,":[21],"a":[22,113],"successive":[23],"solving":[24],"iterative":[25],"algorithm":[26],"based":[27],"on":[28,112,134],"the":[29,44,59,62,68,91,101,118,122,125,141,144,154,159,170,179,184],"detection":[32],"model":[33],"and":[34,93,97,117,156,158,166,172,178,201],"motion":[35],"continuity":[36],"is":[37,53,77,149,162],"proposed":[38,126,185],"6-DOF":[40,189],"of":[43,58,83,100,124,130,146,204],"permanent":[45],"magnet":[46],"synchronous":[47],"planar":[48,193],"motor.":[49],"A":[50],"convergence":[51,57,64,74],"theorem":[52],"given":[54,78],"to":[55,89,95],"ensure":[56],"algorithm.":[60,102],"On":[61],"basis":[63],"conditions":[65],"independent":[66],"with":[67,106,140,191],"desired":[69],"are":[71,86,110],"derived.":[72],"Furthermore":[73],"(iteration)":[75],"rate":[76],"from":[79],"an":[80],"engineering":[81],"point":[82],"view.":[84],"Simulations":[85],"carried":[87],"out":[88],"evaluate":[90],"feasibility":[92,123],"robustness":[94],"noise":[96],"parameter":[98],"deviation":[99,148,161],"Translational":[103],"comparison":[104],"experiments":[105,133],"commercial":[107,142],"sensors":[109],"conducted":[111],"self-developed":[114],"experimental":[115,119],"platform,":[116],"results":[120,129],"verified":[121],"method.":[127],"The":[128,175],"repeated":[131],"fixed":[135],"positions":[136],"show":[137],"that":[138],"compared":[139],"sensors,":[143],"mean":[145],"100-\u03bcm":[150],"scale":[151],"in":[152,169],"both":[153],"x-":[155,171],"y-directions,":[157,173],"standard":[160],"better":[163],"than":[164],"4.5":[165],"3":[167],"\u03bcm":[168],"respectively.":[174],"implementation":[176],"simplicity":[177],"favorable":[180],"accuracy":[182],"make":[183],"method":[186],"attractive":[187],"applications":[190],"large":[192],"travel":[194],"ranges,":[195],"such":[196],"semiconductor":[198],"manufacturing":[199],"equipment":[200,203],"inspection":[202],"printed":[205],"circuit":[206],"boards.":[207]},"counts_by_year":[{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":4},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":2}],"updated_date":"2026-06-26T08:34:08.712188","created_date":"2025-10-10T00:00:00"}