{"id":"https://openalex.org/W2216379166","doi":"https://doi.org/10.1109/tim.2015.2485341","title":"Measuring Color Defects in Flat Panel Displays Using HDR Imaging and Appearance Modeling","display_name":"Measuring Color Defects in Flat Panel Displays Using HDR Imaging and Appearance Modeling","publication_year":2015,"publication_date":"2015-10-19","ids":{"openalex":"https://openalex.org/W2216379166","doi":"https://doi.org/10.1109/tim.2015.2485341","mag":"2216379166"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2015.2485341","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2015.2485341","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5008083611","display_name":"Giljoo Nam","orcid":"https://orcid.org/0000-0002-1822-1501"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Giljoo Nam","raw_affiliation_strings":["KAIST School of Computing, Daejeon, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"KAIST School of Computing, Daejeon, Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5076058431","display_name":"Haebom Lee","orcid":"https://orcid.org/0000-0001-9250-3526"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Haebom Lee","raw_affiliation_strings":["KAIST School of Computing, Daejeon, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"KAIST School of Computing, Daejeon, Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064614942","display_name":"Sungsoo Oh","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Sungsoo Oh","raw_affiliation_strings":["LG Electronics, Production Engineering Research Institute, Pyeongtaek, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"LG Electronics, Production Engineering Research Institute, Pyeongtaek, Korea","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5052213409","display_name":"Min H. Kim","orcid":"https://orcid.org/0000-0002-5078-4005"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Min H. Kim","raw_affiliation_strings":["KAIST School of Computing, Daejeon, Korea"],"raw_orcid":"https://orcid.org/0000-0002-5078-4005","affiliations":[{"raw_affiliation_string":"KAIST School of Computing, Daejeon, Korea","institution_ids":["https://openalex.org/I157485424"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5008083611"],"corresponding_institution_ids":["https://openalex.org/I157485424"],"apc_list":null,"apc_paid":null,"fwci":3.4544,"has_fulltext":false,"cited_by_count":28,"citation_normalized_percentile":{"value":0.92262014,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":97},"biblio":{"volume":"65","issue":"2","first_page":"297","last_page":"304"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11019","display_name":"Image Enhancement Techniques","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11666","display_name":"Color Science and Applications","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.7484889626502991},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.7211484909057617},{"id":"https://openalex.org/keywords/workflow","display_name":"Workflow","score":0.5794143676757812},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5601499676704407},{"id":"https://openalex.org/keywords/color-analysis","display_name":"Color analysis","score":0.5414919257164001},{"id":"https://openalex.org/keywords/automation","display_name":"Automation","score":0.49407365918159485},{"id":"https://openalex.org/keywords/high-dynamic-range","display_name":"High dynamic range","score":0.43348491191864014},{"id":"https://openalex.org/keywords/computer-graphics","display_name":"Computer graphics (images)","score":0.36885982751846313},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17962148785591125},{"id":"https://openalex.org/keywords/dynamic-range","display_name":"Dynamic range","score":0.14542442560195923}],"concepts":[{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.7484889626502991},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.7211484909057617},{"id":"https://openalex.org/C177212765","wikidata":"https://www.wikidata.org/wiki/Q627335","display_name":"Workflow","level":2,"score":0.5794143676757812},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5601499676704407},{"id":"https://openalex.org/C2777385505","wikidata":"https://www.wikidata.org/wiki/Q1396469","display_name":"Color analysis","level":2,"score":0.5414919257164001},{"id":"https://openalex.org/C115901376","wikidata":"https://www.wikidata.org/wiki/Q184199","display_name":"Automation","level":2,"score":0.49407365918159485},{"id":"https://openalex.org/C2780056265","wikidata":"https://www.wikidata.org/wiki/Q106239881","display_name":"High dynamic range","level":3,"score":0.43348491191864014},{"id":"https://openalex.org/C121684516","wikidata":"https://www.wikidata.org/wiki/Q7600677","display_name":"Computer graphics (images)","level":1,"score":0.36885982751846313},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17962148785591125},{"id":"https://openalex.org/C87133666","wikidata":"https://www.wikidata.org/wiki/Q1161699","display_name":"Dynamic range","level":2,"score":0.14542442560195923},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2015.2485341","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2015.2485341","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","score":0.6299999952316284,"display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":29,"referenced_works":["https://openalex.org/W1950004577","https://openalex.org/W1969367028","https://openalex.org/W1974825120","https://openalex.org/W1990693464","https://openalex.org/W1999960477","https://openalex.org/W2005487901","https://openalex.org/W2007932953","https://openalex.org/W2009973781","https://openalex.org/W2033663040","https://openalex.org/W2039970331","https://openalex.org/W2067197576","https://openalex.org/W2088203481","https://openalex.org/W2090893889","https://openalex.org/W2095776733","https://openalex.org/W2105712007","https://openalex.org/W2111496835","https://openalex.org/W2125286842","https://openalex.org/W2127044649","https://openalex.org/W2127229650","https://openalex.org/W2129440600","https://openalex.org/W2133665775","https://openalex.org/W2141847061","https://openalex.org/W2145502302","https://openalex.org/W2148846275","https://openalex.org/W2155524740","https://openalex.org/W2155669845","https://openalex.org/W2495297484","https://openalex.org/W2982984565","https://openalex.org/W2984445790"],"related_works":["https://openalex.org/W2074172223","https://openalex.org/W2143955714","https://openalex.org/W2349174811","https://openalex.org/W1976754823","https://openalex.org/W2007587128","https://openalex.org/W2146033527","https://openalex.org/W2166044122","https://openalex.org/W2770374838","https://openalex.org/W2571717880","https://openalex.org/W2263033889"],"abstract_inverted_index":{"Measuring":[0],"and":[1,16,84],"quantifying":[2],"color":[3,29,54,61,88,103,127,143,157],"defects":[4,20,30,128,158],"in":[5,12,64,154,159],"flat":[6],"panel":[7],"displays":[8],"(FPDs)":[9],"are":[10,21,31,36],"critical":[11],"the":[13,49,57,82,108,122,142,148,151],"FPD":[14],"industry":[15],"related":[17],"business.":[18],"Color":[19],"traditionally":[22],"investigated":[23],"by":[24,71],"professional":[25],"human":[26,123,130],"assessors,":[27],"as":[28,129],"subtle":[32,102,156],"perceptual":[33],"phenomena":[34],"that":[35],"difficult":[37],"to":[38,95,107,120],"detect":[39],"using":[40],"a":[41,78,162],"camera":[42],"system.":[43],"However,":[44],"human-based":[45],"inspection":[46],"has":[47,66],"hindered":[48],"quantitative":[50,139],"analysis":[51,140],"of":[52,60,87,101,110,126,141,150],"such":[53],"defects.":[55,89,104,144],"Thus,":[56],"industrial":[58],"automation":[59],"defect":[62],"measurement":[63,83],"FPDs":[65,160],"been":[67],"severely":[68],"limited":[69],"even":[70],"leading":[72],"manufacturers":[73],"accordingly.":[74],"This":[75,133,145],"paper":[76,146],"presents":[77],"systematic":[79],"framework":[80,91,136],"for":[81],"numerical":[85],"evaluation":[86],"Our":[90],"exploits":[92],"high-dynamic-range":[93],"imaging":[94,112],"robustly":[96],"measure":[97],"physically":[98],"meaningful":[99],"quantities":[100],"In":[105],"addition":[106],"application":[109],"advanced":[111],"technology,":[113],"an":[114],"image":[115],"appearance":[116],"model":[117],"is":[118],"employed":[119],"predict":[121],"visual":[124],"perception":[125],"assessors":[131],"do.":[132],"proposed":[134,152],"automated":[135],"can":[137],"output":[138],"demonstrates":[147],"performance":[149],"workflow":[153],"investigating":[155],"with":[161],"high":[163],"accuracy.":[164]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":4},{"year":2021,"cited_by_count":4},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}