{"id":"https://openalex.org/W1630642568","doi":"https://doi.org/10.1109/tim.2015.2437633","title":"A Time-Grating Sensor for Displacement Measurement With Long Range and Nanometer Accuracy","display_name":"A Time-Grating Sensor for Displacement Measurement With Long Range and Nanometer Accuracy","publication_year":2015,"publication_date":"2015-06-12","ids":{"openalex":"https://openalex.org/W1630642568","doi":"https://doi.org/10.1109/tim.2015.2437633","mag":"1630642568"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2015.2437633","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2015.2437633","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5072541304","display_name":"Ziran Chen","orcid":"https://orcid.org/0000-0002-7309-6547"},"institutions":[{"id":"https://openalex.org/I50632499","display_name":"Chongqing University of Technology","ror":"https://ror.org/04vgbd477","country_code":"CN","type":"education","lineage":["https://openalex.org/I50632499"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ziran Chen","raw_affiliation_strings":["Engineering Research Center of Mechanical Testing Technology and Equipment, Ministry of Education, Chongqing University of Technology, Chongqing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Engineering Research Center of Mechanical Testing Technology and Equipment, Ministry of Education, Chongqing University of Technology, Chongqing, China","institution_ids":["https://openalex.org/I50632499"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072879812","display_name":"Hongji Pu","orcid":"https://orcid.org/0000-0001-8245-3182"},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hongji Pu","raw_affiliation_strings":["State Key Laboratory for Manufacturing Systems Engineering, Xi\u2019an Jiaotong University, Xi\u2019an, China","State key Laboratory for Manufacturing Systems Engineering, Xi\u2019an Jiaotong University, Xi\u2019an, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Laboratory for Manufacturing Systems Engineering, Xi\u2019an Jiaotong University, Xi\u2019an, China","institution_ids":["https://openalex.org/I87445476"]},{"raw_affiliation_string":"State key Laboratory for Manufacturing Systems Engineering, Xi\u2019an Jiaotong University, Xi\u2019an, China","institution_ids":["https://openalex.org/I87445476"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100628116","display_name":"Xiaokang Liu","orcid":"https://orcid.org/0000-0002-2541-3974"},"institutions":[{"id":"https://openalex.org/I50632499","display_name":"Chongqing University of Technology","ror":"https://ror.org/04vgbd477","country_code":"CN","type":"education","lineage":["https://openalex.org/I50632499"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaokang Liu","raw_affiliation_strings":["Engineering Research Center of Mechanical Testing Technology and Equipment, Ministry of Education, Chongqing University of Technology, Chongqing, China"],"raw_orcid":"https://orcid.org/0000-0002-2541-3974","affiliations":[{"raw_affiliation_string":"Engineering Research Center of Mechanical Testing Technology and Equipment, Ministry of Education, Chongqing University of Technology, Chongqing, China","institution_ids":["https://openalex.org/I50632499"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101018637","display_name":"Donglin Peng","orcid":null},"institutions":[{"id":"https://openalex.org/I50632499","display_name":"Chongqing University of Technology","ror":"https://ror.org/04vgbd477","country_code":"CN","type":"education","lineage":["https://openalex.org/I50632499"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Donglin Peng","raw_affiliation_strings":["Engineering Research Center of Mechanical Testing Technology and Equipment, Ministry of Education, Chongqing University of Technology, Chongqing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Engineering Research Center of Mechanical Testing Technology and Equipment, Ministry of Education, Chongqing University of Technology, Chongqing, China","institution_ids":["https://openalex.org/I50632499"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5054014122","display_name":"Zhicheng Yu","orcid":"https://orcid.org/0000-0002-0685-2357"},"institutions":[{"id":"https://openalex.org/I50632499","display_name":"Chongqing University of Technology","ror":"https://ror.org/04vgbd477","country_code":"CN","type":"education","lineage":["https://openalex.org/I50632499"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhicheng Yu","raw_affiliation_strings":["Engineering Research Center of Mechanical Testing Technology and Equipment, Ministry of Education, Chongqing University of Technology, Chongqing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Engineering Research Center of Mechanical Testing Technology and Equipment, Ministry of Education, Chongqing University of Technology, Chongqing, China","institution_ids":["https://openalex.org/I50632499"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.9245,"has_fulltext":false,"cited_by_count":44,"citation_normalized_percentile":{"value":0.75468013,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":"64","issue":"11","first_page":"3105","last_page":"3115"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10369","display_name":"Advanced MEMS and NEMS Technologies","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11449","display_name":"Mechanical and Optical Resonators","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/displacement","display_name":"Displacement (psychology)","score":0.7445549964904785},{"id":"https://openalex.org/keywords/grating","display_name":"Grating","score":0.6975889801979065},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.6105518937110901},{"id":"https://openalex.org/keywords/accuracy-and-precision","display_name":"Accuracy and precision","score":0.5857422947883606},{"id":"https://openalex.org/keywords/electric-field","display_name":"Electric field","score":0.5733410716056824},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.5134688019752502},{"id":"https://openalex.org/keywords/observational-error","display_name":"Observational error","score":0.49391013383865356},{"id":"https://openalex.org/keywords/system-of-measurement","display_name":"System of measurement","score":0.4672538936138153},{"id":"https://openalex.org/keywords/nanometrology","display_name":"Nanometrology","score":0.44019123911857605},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.4371544122695923},{"id":"https://openalex.org/keywords/range","display_name":"Range (aeronautics)","score":0.4148944616317749},{"id":"https://openalex.org/keywords/dynamic-range","display_name":"Dynamic range","score":0.41052547097206116},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.36727362871170044},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.32869061827659607},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.2798944413661957},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.11035987734794617}],"concepts":[{"id":"https://openalex.org/C107551265","wikidata":"https://www.wikidata.org/wiki/Q1458245","display_name":"Displacement (psychology)","level":2,"score":0.7445549964904785},{"id":"https://openalex.org/C2777813233","wikidata":"https://www.wikidata.org/wiki/Q1527816","display_name":"Grating","level":2,"score":0.6975889801979065},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.6105518937110901},{"id":"https://openalex.org/C202799725","wikidata":"https://www.wikidata.org/wiki/Q272035","display_name":"Accuracy and precision","level":2,"score":0.5857422947883606},{"id":"https://openalex.org/C60799052","wikidata":"https://www.wikidata.org/wiki/Q46221","display_name":"Electric field","level":2,"score":0.5733410716056824},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.5134688019752502},{"id":"https://openalex.org/C19619285","wikidata":"https://www.wikidata.org/wiki/Q196372","display_name":"Observational error","level":2,"score":0.49391013383865356},{"id":"https://openalex.org/C37649242","wikidata":"https://www.wikidata.org/wiki/Q932268","display_name":"System of measurement","level":2,"score":0.4672538936138153},{"id":"https://openalex.org/C148402106","wikidata":"https://www.wikidata.org/wiki/Q1549529","display_name":"Nanometrology","level":3,"score":0.44019123911857605},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.4371544122695923},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.4148944616317749},{"id":"https://openalex.org/C87133666","wikidata":"https://www.wikidata.org/wiki/Q1161699","display_name":"Dynamic range","level":2,"score":0.41052547097206116},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.36727362871170044},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.32869061827659607},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.2798944413661957},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.11035987734794617},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C195766429","wikidata":"https://www.wikidata.org/wiki/Q394","display_name":"Metrology","level":2,"score":0.0},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C542102704","wikidata":"https://www.wikidata.org/wiki/Q183257","display_name":"Psychotherapist","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C1276947","wikidata":"https://www.wikidata.org/wiki/Q333","display_name":"Astronomy","level":1,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2015.2437633","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2015.2437633","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.6399999856948853,"display_name":"Affordable and clean energy"}],"awards":[{"id":"https://openalex.org/G1037394798","display_name":null,"funder_award_id":"51175534","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G2254906378","display_name":"\u5927\u91cf\u7a0b\u7eb3\u7c73\u65f6\u6805\u4f20\u611f\u6d4b\u91cf\u539f\u7406\u53ca\u5668\u4ef6\u57fa\u7840\u7814\u7a76","funder_award_id":"51435002","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G7759190544","display_name":null,"funder_award_id":"NCET-13-1065","funder_id":"https://openalex.org/F4320334924","funder_display_name":"Program for New Century Excellent Talents in University"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320334924","display_name":"Program for New Century Excellent Talents in University","ror":"https://ror.org/01mv9t934"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1974984002","https://openalex.org/W2003325902","https://openalex.org/W2023618805","https://openalex.org/W2028471668","https://openalex.org/W2049211025","https://openalex.org/W2064817949","https://openalex.org/W2066572252","https://openalex.org/W2067161648","https://openalex.org/W2081689099","https://openalex.org/W2085435934","https://openalex.org/W2096139021","https://openalex.org/W2111752794","https://openalex.org/W2161661271","https://openalex.org/W2164251426","https://openalex.org/W2171627491","https://openalex.org/W4245204728","https://openalex.org/W6637237034"],"related_works":["https://openalex.org/W784500383","https://openalex.org/W4322703778","https://openalex.org/W2907071475","https://openalex.org/W1996748844","https://openalex.org/W2043595074","https://openalex.org/W2134018486","https://openalex.org/W2378313920","https://openalex.org/W2046140837","https://openalex.org/W2091134328","https://openalex.org/W2383833818"],"abstract_inverted_index":{"It":[0],"is":[1,22,66,91],"difficult":[2],"to":[3,24,40,68,93,126],"achieve":[4],"long":[5],"measurement":[6],"range":[7,179],"with":[8,112,183],"high":[9],"precision":[10,150,169],"in":[11,48,56,176],"displacement":[12,17,30,62,181],"measurement,":[13],"a":[14],"new":[15],"nanometer":[16,168,180],"sensor,":[18],"named":[19],"time":[20,57,83],"grating,":[21],"proposed":[23,29],"tackle":[25],"this":[26],"problem.":[27],"The":[28,85,107,114,143],"sensor":[31,90,128],"uses":[32],"orthogonally":[33],"alternating":[34],"electric":[35],"fields":[36],"as":[37,101],"the":[38,42,45,52,60,64,69,73,89,95,127,131,134,138,148,155],"carrier":[39],"build":[41],"relationship":[43],"between":[44,133],"object":[46,65],"movement":[47],"space":[49],"domain":[50],"and":[51,59,104,123,137,154,170],"signal":[53,77],"phase":[54,70],"shift":[55,71],"domain,":[58],"moving":[61],"of":[63,72,88,97],"proportional":[67],"composited":[74],"traveling":[75],"wave":[76],"that":[78,147],"can":[79],"be":[80],"measured":[81],"by":[82],"difference.":[84],"electric-field":[86],"distribution":[87],"simulated":[92],"analyze":[94],"influences":[96],"various":[98],"factors,":[99],"such":[100],"electrode":[102,105],"intervals":[103],"width.":[106],"results":[108,145],"are":[109,117,141],"further":[110],"validated":[111],"experiments.":[113],"error":[115,120,135],"characteristics":[116,136],"extracted":[118],"using":[119],"identification":[121],"technology":[122],"traced":[124],"back":[125],"model,":[129],"thus":[130],"relationships":[132],"model":[139],"parameters":[140],"obtained.":[142],"experiment":[144],"prove":[146],"measuring":[149],"reaches":[151,157],"\u00b1200":[152],"nm":[153,159],"resolution":[156,171],"1":[158],"within":[160],"200":[161],"mm.":[162],"Submillimeter":[163],"period":[164],"sensing":[165],"unit":[166],"realizing":[167],"has":[172],"shown":[173],"significant":[174],"promise":[175],"fabricating":[177],"large":[178],"sensors":[182],"low":[184],"cost.":[185]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":7},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":4},{"year":2022,"cited_by_count":4},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":5},{"year":2019,"cited_by_count":13},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}