{"id":"https://openalex.org/W2214611372","doi":"https://doi.org/10.1109/tim.2015.2419051","title":"The Development of $110/\\sqrt {3} \\textrm {kV}$ Two-Stage Voltage Transformer With Accuracy Class 0.001","display_name":"The Development of $110/\\sqrt {3} \\textrm {kV}$ Two-Stage Voltage Transformer With Accuracy Class 0.001","publication_year":2015,"publication_date":"2015-04-28","ids":{"openalex":"https://openalex.org/W2214611372","doi":"https://doi.org/10.1109/tim.2015.2419051","mag":"2214611372"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2015.2419051","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2015.2419051","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5001452215","display_name":"Haiming Shao","orcid":"https://orcid.org/0000-0002-3305-4190"},"institutions":[{"id":"https://openalex.org/I4210162136","display_name":"National Institute of Metrology","ror":"https://ror.org/05dw0p167","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210162136"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Haiming Shao","raw_affiliation_strings":["National Institute of Metrology, Beijing, China",", National Institute of Metrology, Beijing, China"],"affiliations":[{"raw_affiliation_string":"National Institute of Metrology, Beijing, China","institution_ids":["https://openalex.org/I4210162136"]},{"raw_affiliation_string":", National Institute of Metrology, Beijing, China","institution_ids":["https://openalex.org/I4210162136"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102979842","display_name":"Feipeng Lin","orcid":"https://orcid.org/0000-0002-1108-1622"},"institutions":[{"id":"https://openalex.org/I4210162136","display_name":"National Institute of Metrology","ror":"https://ror.org/05dw0p167","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210162136"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Feipeng Lin","raw_affiliation_strings":["National Institute of Metrology, Beijing, China",", National Institute of Metrology, Beijing, China"],"affiliations":[{"raw_affiliation_string":"National Institute of Metrology, Beijing, China","institution_ids":["https://openalex.org/I4210162136"]},{"raw_affiliation_string":", National Institute of Metrology, Beijing, China","institution_ids":["https://openalex.org/I4210162136"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040854060","display_name":"Bo Liang","orcid":"https://orcid.org/0000-0001-6977-7967"},"institutions":[{"id":"https://openalex.org/I4210162136","display_name":"National Institute of Metrology","ror":"https://ror.org/05dw0p167","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210162136"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Bo Liang","raw_affiliation_strings":["National Institute of Metrology, Beijing, China",", National Institute of Metrology, Beijing, China"],"affiliations":[{"raw_affiliation_string":"National Institute of Metrology, Beijing, China","institution_ids":["https://openalex.org/I4210162136"]},{"raw_affiliation_string":", National Institute of Metrology, Beijing, China","institution_ids":["https://openalex.org/I4210162136"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100695572","display_name":"Wei Zhao","orcid":"https://orcid.org/0000-0002-7346-5947"},"institutions":[{"id":"https://openalex.org/I4210162136","display_name":"National Institute of Metrology","ror":"https://ror.org/05dw0p167","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210162136"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wei Zhao","raw_affiliation_strings":["National Institute of Metrology, Beijing, China",", National Institute of Metrology, Beijing, China"],"affiliations":[{"raw_affiliation_string":"National Institute of Metrology, Beijing, China","institution_ids":["https://openalex.org/I4210162136"]},{"raw_affiliation_string":", National Institute of Metrology, Beijing, China","institution_ids":["https://openalex.org/I4210162136"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014953276","display_name":"Dongxue Dai","orcid":"https://orcid.org/0000-0002-1196-5508"},"institutions":[{"id":"https://openalex.org/I4210162136","display_name":"National Institute of Metrology","ror":"https://ror.org/05dw0p167","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210162136"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Dongxue Dai","raw_affiliation_strings":["National Institute of Metrology, Beijing, China",", National Institute of Metrology, Beijing, China"],"affiliations":[{"raw_affiliation_string":"National Institute of Metrology, Beijing, China","institution_ids":["https://openalex.org/I4210162136"]},{"raw_affiliation_string":", National Institute of Metrology, Beijing, China","institution_ids":["https://openalex.org/I4210162136"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Shixiong Peng","orcid":null},"institutions":[{"id":"https://openalex.org/I153473198","display_name":"North China Electric Power University","ror":"https://ror.org/04qr5t414","country_code":"CN","type":"education","lineage":["https://openalex.org/I153473198"]},{"id":"https://openalex.org/I4392738113","display_name":"China Electric Power Research Institute","ror":"https://ror.org/05ehpzy81","country_code":null,"type":"facility","lineage":["https://openalex.org/I17442442","https://openalex.org/I4392738113"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shixiong Peng","raw_affiliation_strings":["North China Electric Power Research Institute, Beijing, China","[North China Electric Power Research Institute, Beijing, China]"],"affiliations":[{"raw_affiliation_string":"North China Electric Power Research Institute, Beijing, China","institution_ids":["https://openalex.org/I153473198","https://openalex.org/I4392738113"]},{"raw_affiliation_string":"[North China Electric Power Research Institute, Beijing, China]","institution_ids":["https://openalex.org/I153473198","https://openalex.org/I4392738113"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015475948","display_name":"Tianyu Sun","orcid":"https://orcid.org/0000-0002-6915-4687"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Tianyu Sun","raw_affiliation_strings":["Liaoning Provincial Institute of Measurement, Shenyang, China",", Liaoning Provincial Institute of Measurement, Shenyang, China"],"affiliations":[{"raw_affiliation_string":"Liaoning Provincial Institute of Measurement, Shenyang, China","institution_ids":[]},{"raw_affiliation_string":", Liaoning Provincial Institute of Measurement, Shenyang, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110292193","display_name":"Jiangyin Liu","orcid":null},"institutions":[{"id":"https://openalex.org/I4210108723","display_name":"Changzhou Institute of Technology","ror":"https://ror.org/020mrfq61","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210108723"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiangyin Liu","raw_affiliation_strings":["Changzhou Institute of Metrology and Testing Technology, Changzhou, China",", Changzhou Institute of Metrology and Testing Technology, Changzhou, China"],"affiliations":[{"raw_affiliation_string":"Changzhou Institute of Metrology and Testing Technology, Changzhou, China","institution_ids":["https://openalex.org/I4210108723"]},{"raw_affiliation_string":", Changzhou Institute of Metrology and Testing Technology, Changzhou, China","institution_ids":["https://openalex.org/I4210108723"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5074000379","display_name":"Huanghui Zhang","orcid":"https://orcid.org/0000-0003-3412-6763"},"institutions":[{"id":"https://openalex.org/I4210109881","display_name":"Fujian Metrology Institute","ror":"https://ror.org/017y22r40","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210109881"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Huanghui Zhang","raw_affiliation_strings":["Fujian Institute of Metrology, Fuzhou, China",", Fujian Institute of Metrology, Fuzhou, China"],"affiliations":[{"raw_affiliation_string":"Fujian Institute of Metrology, Fuzhou, China","institution_ids":["https://openalex.org/I4210109881"]},{"raw_affiliation_string":", Fujian Institute of Metrology, Fuzhou, China","institution_ids":["https://openalex.org/I4210109881"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":9,"corresponding_author_ids":["https://openalex.org/A5001452215"],"corresponding_institution_ids":["https://openalex.org/I4210162136"],"apc_list":null,"apc_paid":null,"fwci":0.8029,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.77300174,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":"64","issue":"6","first_page":"1383","last_page":"1389"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5972307920455933},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5780948996543884},{"id":"https://openalex.org/keywords/transformer","display_name":"Transformer","score":0.568770706653595},{"id":"https://openalex.org/keywords/electromagnetic-coil","display_name":"Electromagnetic coil","score":0.5230908393859863},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.4428270757198334},{"id":"https://openalex.org/keywords/voltage-divider","display_name":"Voltage divider","score":0.4398075044155121},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.40258270502090454},{"id":"https://openalex.org/keywords/analytical-chemistry","display_name":"Analytical Chemistry (journal)","score":0.34531569480895996},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.15637987852096558}],"concepts":[{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5972307920455933},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5780948996543884},{"id":"https://openalex.org/C66322947","wikidata":"https://www.wikidata.org/wiki/Q11658","display_name":"Transformer","level":3,"score":0.568770706653595},{"id":"https://openalex.org/C30403606","wikidata":"https://www.wikidata.org/wiki/Q2981904","display_name":"Electromagnetic coil","level":2,"score":0.5230908393859863},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.4428270757198334},{"id":"https://openalex.org/C49324399","wikidata":"https://www.wikidata.org/wiki/Q466758","display_name":"Voltage divider","level":3,"score":0.4398075044155121},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.40258270502090454},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.34531569480895996},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15637987852096558},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2015.2419051","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2015.2419051","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.5799999833106995,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W1985139731","https://openalex.org/W2019514496","https://openalex.org/W2067678302","https://openalex.org/W2119839147","https://openalex.org/W2314232598","https://openalex.org/W4210809922"],"related_works":["https://openalex.org/W3023469735","https://openalex.org/W2923723567","https://openalex.org/W1980924287","https://openalex.org/W2349104731","https://openalex.org/W2985839233","https://openalex.org/W3085932616","https://openalex.org/W2864363823","https://openalex.org/W2062376469","https://openalex.org/W1932911998","https://openalex.org/W2092374022"],"abstract_inverted_index":{"This":[0,43],"paper":[1],"presents":[2],"a":[3,7,118,123],"new":[4,26,140],"structure":[5,52],"of":[6,37,91,95,131,136,139],"two-stage":[8],"voltage":[9,20,55],"transformer":[10],"(TSVT)":[11],"with":[12,117],"toroidally":[13,38],"wound":[14,32,39,70],"ring":[15,40],"cores":[16],"excited":[17],"by":[18],"low":[19],"for":[21,53],"high-voltage":[22,29,62,119],"measurement.":[23],"In":[24],"the":[25,45,49,61,129],"TSVT,":[27],"two":[28,34],"windings":[30,66],"are":[31,98,142],"on":[33,86],"separate":[35],"groups":[36],"cores,":[41],"respectively.":[42],"avoids":[44],"insulation":[46],"problem":[47],"in":[48,59,128,154],"traditional":[50],"TSVT":[51],"high":[54,57],"and":[56,64,80,93,108,122,151,156],"accuracy,":[58],"which,":[60],"excitation":[63],"ratio":[65],"need":[67],"to":[68,163],"be":[69],"together":[71],"around":[72],"overlapped":[73],"V":[74],"cores.":[75],"Three":[76],"TSVTs,":[77],"10,":[78],"35,":[79],"110/\u221a3":[81],"kV,":[82],"were":[83],"developed":[84],"based":[85],"this":[87],"scheme.":[88],"The":[89],"uncertainties":[90],"magnitude":[92,155],"phase":[94],"these":[96],"TSVTs":[97,141],"all":[99],"less":[100],"than":[101],"3.2":[102],"\u00d7":[103,146],"10":[104,147],"<sup":[105,148],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[106,149],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">-6</sup>":[107,150],"1.1":[109],"\u03bcrad,":[110],"respectively,":[111,158],"at":[112],"reference":[113],"voltage.":[114],"Comparative":[115],"measurements":[116],"capacitive":[120],"divider":[121],"current":[124],"comparator":[125],"illustrate":[126],"that":[127],"range":[130],"20%-120%":[132],"rated":[133],"voltage,":[134],"variations":[135],"no-load":[137],"errors":[138],"as":[143],"follows:":[144],"2-4":[145],"2":[152],"\u03bcrad":[153],"phase,":[157],"which":[159],"reach":[160],"class":[161,164],"0.0005":[162],"0.001.":[165]},"counts_by_year":[{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":2}],"updated_date":"2026-04-16T08:26:57.006410","created_date":"2016-06-24T00:00:00"}