{"id":"https://openalex.org/W2052992686","doi":"https://doi.org/10.1109/tim.2015.2413531","title":"Guest Editorial: Special Issue on the 2014 IEEE International Instrumentation and Measurement Technology Conference","display_name":"Guest Editorial: Special Issue on the 2014 IEEE International Instrumentation and Measurement Technology Conference","publication_year":2015,"publication_date":"2015-03-25","ids":{"openalex":"https://openalex.org/W2052992686","doi":"https://doi.org/10.1109/tim.2015.2413531","mag":"2052992686"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2015.2413531","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tim.2015.2413531","pdf_url":"https://ieeexplore.ieee.org/ielx7/19/7079553/07067421.pdf","source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"editorial","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"bronze","oa_url":"https://ieeexplore.ieee.org/ielx7/19/7079553/07067421.pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5041569136","display_name":"Daniel Slomovitz","orcid":"https://orcid.org/0000-0003-0909-6443"},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Daniel Slomovitz","raw_affiliation_strings":[],"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108510713","display_name":"Wendy Van Moer","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Wendy Van Moer","raw_affiliation_strings":[],"affiliations":[]},{"author_position":"last","author":{"id":"https://openalex.org/A5078077176","display_name":"Bernardo Tellini","orcid":"https://orcid.org/0000-0001-7681-8026"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Bernardo Tellini","raw_affiliation_strings":[],"affiliations":[]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5041569136"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.07502394,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"64","issue":"5","first_page":"1098","last_page":"1099"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.7315999865531921,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.7315999865531921,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/instrumentation","display_name":"Instrumentation (computer programming)","score":0.9405205845832825},{"id":"https://openalex.org/keywords/systems-engineering","display_name":"Systems engineering","score":0.5285887718200684},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.49097493290901184},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.44965365529060364},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.38790497183799744},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3736724853515625},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.10334444046020508}],"concepts":[{"id":"https://openalex.org/C118530786","wikidata":"https://www.wikidata.org/wiki/Q1134732","display_name":"Instrumentation (computer programming)","level":2,"score":0.9405205845832825},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.5285887718200684},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.49097493290901184},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.44965365529060364},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.38790497183799744},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3736724853515625},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.10334444046020508}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tim.2015.2413531","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tim.2015.2413531","pdf_url":"https://ieeexplore.ieee.org/ielx7/19/7079553/07067421.pdf","source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},{"id":"pmh:oai:arpi.unipi.it:11568/793795","is_oa":false,"landing_page_url":"https://ieeexplore.ieee.org/document/7067421","pdf_url":null,"source":{"id":"https://openalex.org/S4377196265","display_name":"CINECA IRIS Institutial research information system (University of Pisa)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I108290504","host_organization_name":"University of Pisa","host_organization_lineage":["https://openalex.org/I108290504"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":{"id":"doi:10.1109/tim.2015.2413531","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tim.2015.2413531","pdf_url":"https://ieeexplore.ieee.org/ielx7/19/7079553/07067421.pdf","source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2052992686.pdf","grobid_xml":"https://content.openalex.org/works/W2052992686.grobid-xml"},"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W1972557159","https://openalex.org/W562823126","https://openalex.org/W2106037662","https://openalex.org/W2993874308","https://openalex.org/W2363498374","https://openalex.org/W2152596889","https://openalex.org/W2489600020","https://openalex.org/W1497201623","https://openalex.org/W1549180838"],"abstract_inverted_index":{"The":[0,39],"31st":[1],"annual":[2],"IEEE":[3],"International":[4],"Instrumentation":[5,66,110],"and":[6,32,54,67,83,98,106,109,114],"Measurement":[7,55,91,97],"Technology":[8],"Conference":[9],"was":[10,41],"held":[11],"in":[12,29,33,96,103,129],"Montevideo,":[13],"Uruguay,":[14],"on":[15,72,81],"May":[16],"12\u201315,":[17],"2014.":[18],"This":[19],"is":[20],"the":[21,34,51,59,73,112,123],"first":[22],"time":[23],"that":[24],"this":[25,130],"conference":[26,40,60,124],"took":[27],"place":[28],"Latin":[30],"America":[31],"southern":[35],"hemisphere":[36],"as":[37],"well.":[38],"attended":[42],"by":[43],"a":[44],"total":[45],"of":[46],"321":[47],"registered":[48],"participants.":[49],"Under":[50],"theme":[52],"\u201cInstrumentation":[53],"for":[56,111,127],"Sustainable":[57],"Development,\u201d":[58],"covered":[61],"many":[62],"topics":[63],"related":[64],"to":[65],"Measurement,":[68],"with":[69],"papers":[70,119],"presented":[71,121],"following":[74],"topics:":[75],"1)":[76],"Biomedical":[77],"Instrumentation;":[78,99],"2)":[79],"Measurements":[80,102],"Energy":[82],"Power":[84],"Systems;":[85],"3)":[86],"Wireless":[87],"Sensors;":[88],"4)":[89],"Noninvasive":[90],"Techniques;":[92],"5)":[93],"Nanotechnology":[94],"Applications":[95],"6)":[100],"Noise":[101],"Electronic":[104],"Devices;":[105],"7)":[107],"Sensors":[108],"Environment":[113],"Climate":[115],"Change":[116],"Monitoring.":[117],"Twenty-three":[118],"originally":[120],"at":[122],"were":[125],"selected":[126],"publication":[128],"special":[131],"issue.":[132]},"counts_by_year":[],"updated_date":"2026-02-09T09:26:11.010843","created_date":"2025-10-10T00:00:00"}