{"id":"https://openalex.org/W2015978290","doi":"https://doi.org/10.1109/tim.2015.2398955","title":"Development and Evaluation of High-Stability Metal-Foil Resistor With a Resistance of 1 <inline-formula> <tex-math notation=\"LaTeX\">$\\text{k}\\Omega $ </tex-math></inline-formula>","display_name":"Development and Evaluation of High-Stability Metal-Foil Resistor With a Resistance of 1 <inline-formula> <tex-math notation=\"LaTeX\">$\\text{k}\\Omega $ </tex-math></inline-formula>","publication_year":2015,"publication_date":"2015-02-19","ids":{"openalex":"https://openalex.org/W2015978290","doi":"https://doi.org/10.1109/tim.2015.2398955","mag":"2015978290"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2015.2398955","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2015.2398955","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5041117747","display_name":"Atsushi Domae","orcid":"https://orcid.org/0000-0002-3582-1373"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Atsushi Domae","raw_affiliation_strings":["National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan","National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology , Tsukuba, Japan"],"affiliations":[{"raw_affiliation_string":"National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]},{"raw_affiliation_string":"National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology , Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080388789","display_name":"Takayuki Abe","orcid":"https://orcid.org/0000-0002-2295-7458"},"institutions":[{"id":"https://openalex.org/I4387152235","display_name":"Japan Electric Meters Inspection Corporation","ror":"https://ror.org/00s3p9v54","country_code":null,"type":"facility","lineage":["https://openalex.org/I4387152235"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takayuki Abe","raw_affiliation_strings":["Japan Electric Meters Inspection Corporation, Tokyo, Japan",", Japan Electric Meters Inspection Corporation, Tokyo, Japan"],"affiliations":[{"raw_affiliation_string":"Japan Electric Meters Inspection Corporation, Tokyo, Japan","institution_ids":["https://openalex.org/I4387152235"]},{"raw_affiliation_string":", Japan Electric Meters Inspection Corporation, Tokyo, Japan","institution_ids":["https://openalex.org/I4387152235"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5091535307","display_name":"Masaya Kumagai","orcid":"https://orcid.org/0000-0003-4766-8625"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Masaya Kumagai","raw_affiliation_strings":["Alpha Electronics Corporation, Tokyo, Japan",", Alpha Electronics Corporation, Tokyo, Japan"],"affiliations":[{"raw_affiliation_string":"Alpha Electronics Corporation, Tokyo, Japan","institution_ids":[]},{"raw_affiliation_string":", Alpha Electronics Corporation, Tokyo, Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034708827","display_name":"Matsuo Zama","orcid":"https://orcid.org/0000-0002-6189-1746"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Matsuo Zama","raw_affiliation_strings":["Alpha Electronics Corporation, Tokyo, Japan",", Alpha Electronics Corporation, Tokyo, Japan"],"affiliations":[{"raw_affiliation_string":"Alpha Electronics Corporation, Tokyo, Japan","institution_ids":[]},{"raw_affiliation_string":", Alpha Electronics Corporation, Tokyo, Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5052274255","display_name":"Takehiko Oe","orcid":"https://orcid.org/0000-0003-3424-1745"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takehiko Oe","raw_affiliation_strings":["National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan","National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology , Tsukuba, Japan"],"affiliations":[{"raw_affiliation_string":"National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]},{"raw_affiliation_string":"National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology , Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5089866154","display_name":"Nobu\u2010Hisa Kaneko","orcid":"https://orcid.org/0000-0003-3857-7940"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Nobu-hisa Kaneko","raw_affiliation_strings":["National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan","National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology , Tsukuba, Japan"],"affiliations":[{"raw_affiliation_string":"National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]},{"raw_affiliation_string":"National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology , Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5041117747"],"corresponding_institution_ids":["https://openalex.org/I73613424"],"apc_list":null,"apc_paid":null,"fwci":0.7081,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.70531724,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"64","issue":"6","first_page":"1490","last_page":"1495"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T13928","display_name":"Advanced Sensor Technologies Research","score":0.9897000193595886,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T13928","display_name":"Advanced Sensor Technologies Research","score":0.9897000193595886,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9894999861717224,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10369","display_name":"Advanced MEMS and NEMS Technologies","score":0.9858999848365784,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/resistor","display_name":"Resistor","score":0.9486310482025146},{"id":"https://openalex.org/keywords/temperature-coefficient","display_name":"Temperature coefficient","score":0.6033059358596802},{"id":"https://openalex.org/keywords/omega","display_name":"Omega","score":0.5845363736152649},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4900778532028198},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4123512804508209},{"id":"https://openalex.org/keywords/time-constant","display_name":"Time constant","score":0.4100706875324249},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.30688780546188354},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.14848342537879944},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.14029955863952637}],"concepts":[{"id":"https://openalex.org/C137488568","wikidata":"https://www.wikidata.org/wiki/Q5321","display_name":"Resistor","level":3,"score":0.9486310482025146},{"id":"https://openalex.org/C16643434","wikidata":"https://www.wikidata.org/wiki/Q898642","display_name":"Temperature coefficient","level":2,"score":0.6033059358596802},{"id":"https://openalex.org/C2779557605","wikidata":"https://www.wikidata.org/wiki/Q9890","display_name":"Omega","level":2,"score":0.5845363736152649},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4900778532028198},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4123512804508209},{"id":"https://openalex.org/C81370116","wikidata":"https://www.wikidata.org/wiki/Q1335249","display_name":"Time constant","level":2,"score":0.4100706875324249},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.30688780546188354},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.14848342537879944},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.14029955863952637},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2015.2398955","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2015.2398955","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.7099999785423279}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W651355665","https://openalex.org/W1601105001","https://openalex.org/W1781422893","https://openalex.org/W1964550101","https://openalex.org/W2091747029","https://openalex.org/W2140816342","https://openalex.org/W2151309396","https://openalex.org/W2310596054","https://openalex.org/W2326864645","https://openalex.org/W2770590282","https://openalex.org/W6698483354"],"related_works":["https://openalex.org/W2902194312","https://openalex.org/W2137172615","https://openalex.org/W2588215263","https://openalex.org/W2974910612","https://openalex.org/W2767005964","https://openalex.org/W4390337072","https://openalex.org/W2117118455","https://openalex.org/W1553248637","https://openalex.org/W2021342890","https://openalex.org/W2024080132"],"abstract_inverted_index":{"Prototype":[0],"models":[1],"of":[2,7,24,39,51,88,139],"a":[3,11,59],"high-stability":[4],"metal-foil":[5],"resistor":[6,37,49,57,68,119],"1":[8,32,67,97,148],"k\u03a9":[9],"with":[10],"four-terminal-pair":[12],"design":[13,62],"were":[14,20,27],"developed,":[15],"and":[16,42,111,162],"the":[17,70,89,102,121,140,153],"key":[18,72,123],"characteristics":[19],"evaluated.":[21],"Two":[22],"types":[23],"metalfoil":[25],"resistors":[26],"fabricated:":[28],"serial":[29],"number":[30],"(s/n)":[31],"is":[33,45],"made":[34,46],"from":[35,47,105,156],"two":[36],"devices":[38,50],"500":[40],"\u03a9":[41],"s/n":[43,66,117],"2":[44,109,118,160],"three":[48],"333":[52],"\u03a9.":[53],"To":[54],"develop":[55],"these":[56],"devices,":[58],"new":[60],"resistor-device":[61],"was":[63],"introduced.":[64],"The":[65,116],"has":[69,120],"following":[71,122],"characteristics:":[73,124],"drift":[74,125],"rate:":[75,126],"0.010":[76],"(\u03bc\u03a9/\u03a9)/year,":[77,128],"first-order":[78,129],"temperature":[79,130],"coefficient":[80,131],"at":[81,96,132,147],"23":[82,133],"\u00b0C:":[83,134],"-0.165":[84],"(\u03bc\u03a9/\u03a9)/\u00b0C,":[85,136],"frequency":[86,103,137,154],"dependence":[87,138],"resistance":[90,94,141,145],"(relative":[91,142],"change":[92,143],"in":[93,101,144,152],"normalized":[95,146],"kHz):":[98,149],"\u00b10.21":[99],"\u03bc\u03a9/\u03a9":[100,151],"range":[104,155],"400":[106,157],"Hz":[107,158],"to":[108,159],"kHz,":[110,161],"time":[112,163],"constant:":[113,164],"-0.46":[114],"ns.":[115,166],"-0.092":[127],"0.096":[135],"\u00b10.54":[150],"0.12":[165]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":2},{"year":2016,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}