{"id":"https://openalex.org/W2009879438","doi":"https://doi.org/10.1109/tim.2014.2385133","title":"Improvements in the Low-Frequency Characteristic and Sensitivity of a Thin-Film Multijunction Thermal Converter in Vacuum","display_name":"Improvements in the Low-Frequency Characteristic and Sensitivity of a Thin-Film Multijunction Thermal Converter in Vacuum","publication_year":2015,"publication_date":"2015-01-14","ids":{"openalex":"https://openalex.org/W2009879438","doi":"https://doi.org/10.1109/tim.2014.2385133","mag":"2009879438"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2014.2385133","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2014.2385133","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5024388326","display_name":"Yasutaka Amagai","orcid":"https://orcid.org/0000-0001-6816-8158"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Yasutaka Amagai","raw_affiliation_strings":["National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan","National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology , Tsukuba, Japan"],"affiliations":[{"raw_affiliation_string":"National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]},{"raw_affiliation_string":"National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology , Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073180314","display_name":"Hiroyuki Fujiki","orcid":"https://orcid.org/0000-0001-6472-6693"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hiroyuki Fujiki","raw_affiliation_strings":["National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan","National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology , Tsukuba, Japan"],"affiliations":[{"raw_affiliation_string":"National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]},{"raw_affiliation_string":"National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology , Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5076082725","display_name":"Koji Shimizume","orcid":null},"institutions":[{"id":"https://openalex.org/I162282272","display_name":"ROHM","ror":"https://ror.org/00vttj605","country_code":"JP","type":"company","lineage":["https://openalex.org/I162282272"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Koji Shimizume","raw_affiliation_strings":["Nikkohm Company Ltd., Misawa, Japan",", Nikkohm Company Ltd., Misawa, Japan"],"affiliations":[{"raw_affiliation_string":"Nikkohm Company Ltd., Misawa, Japan","institution_ids":[]},{"raw_affiliation_string":", Nikkohm Company Ltd., Misawa, Japan","institution_ids":["https://openalex.org/I162282272"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5061566500","display_name":"Kaname Kishino","orcid":null},"institutions":[{"id":"https://openalex.org/I162282272","display_name":"ROHM","ror":"https://ror.org/00vttj605","country_code":"JP","type":"company","lineage":["https://openalex.org/I162282272"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kaname Kishino","raw_affiliation_strings":["Nikkohm Company Ltd., Misawa, Japan",", Nikkohm Company Ltd., Misawa, Japan"],"affiliations":[{"raw_affiliation_string":"Nikkohm Company Ltd., Misawa, Japan","institution_ids":[]},{"raw_affiliation_string":", Nikkohm Company Ltd., Misawa, Japan","institution_ids":["https://openalex.org/I162282272"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5085987974","display_name":"Shigeru Hidaka","orcid":null},"institutions":[{"id":"https://openalex.org/I162282272","display_name":"ROHM","ror":"https://ror.org/00vttj605","country_code":"JP","type":"company","lineage":["https://openalex.org/I162282272"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Shigeru Hidaka","raw_affiliation_strings":["Nikkohm Company Ltd., Misawa, Japan",", Nikkohm Company Ltd., Misawa, Japan"],"affiliations":[{"raw_affiliation_string":"Nikkohm Company Ltd., Misawa, Japan","institution_ids":[]},{"raw_affiliation_string":", Nikkohm Company Ltd., Misawa, Japan","institution_ids":["https://openalex.org/I162282272"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5024388326"],"corresponding_institution_ids":["https://openalex.org/I73613424"],"apc_list":null,"apc_paid":null,"fwci":0.4339,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.65989567,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":95},"biblio":{"volume":"64","issue":"6","first_page":"1570","last_page":"1575"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11449","display_name":"Mechanical and Optical Resonators","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11449","display_name":"Mechanical and Optical Resonators","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10369","display_name":"Advanced MEMS and NEMS Technologies","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10299","display_name":"Photonic and Optical Devices","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.7649847269058228},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.6637376546859741},{"id":"https://openalex.org/keywords/thermal-conduction","display_name":"Thermal conduction","score":0.6488204002380371},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.631027102470398},{"id":"https://openalex.org/keywords/heat-transfer","display_name":"Heat transfer","score":0.6105598211288452},{"id":"https://openalex.org/keywords/thermal","display_name":"Thermal","score":0.5216363072395325},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4567273259162903},{"id":"https://openalex.org/keywords/converters","display_name":"Converters","score":0.4405291974544525},{"id":"https://openalex.org/keywords/time-constant","display_name":"Time constant","score":0.4389559328556061},{"id":"https://openalex.org/keywords/analytical-chemistry","display_name":"Analytical Chemistry (journal)","score":0.4203265309333801},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.4066884517669678},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.26986849308013916},{"id":"https://openalex.org/keywords/thermodynamics","display_name":"Thermodynamics","score":0.2643965780735016},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.20226693153381348},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.1562218964099884},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.12861156463623047},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.08306878805160522}],"concepts":[{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.7649847269058228},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6637376546859741},{"id":"https://openalex.org/C172100665","wikidata":"https://www.wikidata.org/wiki/Q7465774","display_name":"Thermal conduction","level":2,"score":0.6488204002380371},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.631027102470398},{"id":"https://openalex.org/C50517652","wikidata":"https://www.wikidata.org/wiki/Q179635","display_name":"Heat transfer","level":2,"score":0.6105598211288452},{"id":"https://openalex.org/C204530211","wikidata":"https://www.wikidata.org/wiki/Q752823","display_name":"Thermal","level":2,"score":0.5216363072395325},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4567273259162903},{"id":"https://openalex.org/C2778422915","wikidata":"https://www.wikidata.org/wiki/Q10302051","display_name":"Converters","level":3,"score":0.4405291974544525},{"id":"https://openalex.org/C81370116","wikidata":"https://www.wikidata.org/wiki/Q1335249","display_name":"Time constant","level":2,"score":0.4389559328556061},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.4203265309333801},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4066884517669678},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.26986849308013916},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.2643965780735016},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.20226693153381348},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.1562218964099884},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.12861156463623047},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.08306878805160522},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2014.2385133","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2014.2385133","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8899999856948853,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":24,"referenced_works":["https://openalex.org/W1983976661","https://openalex.org/W1986432348","https://openalex.org/W2028334974","https://openalex.org/W2037939724","https://openalex.org/W2044267718","https://openalex.org/W2070205567","https://openalex.org/W2107481531","https://openalex.org/W2108128601","https://openalex.org/W2111327704","https://openalex.org/W2122230150","https://openalex.org/W2137007607","https://openalex.org/W2142929984","https://openalex.org/W2145967769","https://openalex.org/W2148478748","https://openalex.org/W2149537533","https://openalex.org/W2151094621","https://openalex.org/W2163417809","https://openalex.org/W2163724237","https://openalex.org/W2165410023","https://openalex.org/W2167606261","https://openalex.org/W2170732350","https://openalex.org/W2173680989","https://openalex.org/W2333496260","https://openalex.org/W2416965756"],"related_works":["https://openalex.org/W631083485","https://openalex.org/W4313452936","https://openalex.org/W2097026685","https://openalex.org/W2480068220","https://openalex.org/W2070883797","https://openalex.org/W2576883267","https://openalex.org/W392655780","https://openalex.org/W2952286633","https://openalex.org/W1988668457","https://openalex.org/W4236409343"],"abstract_inverted_index":{"We":[0],"have":[1],"improved":[2],"the":[3,9,25,45,65,71,76,80,83,87,108,115],"ac-dc":[4,21],"transfer":[5,22,110],"differences":[6,23],"and":[7,36],"enhanced":[8],"sensitivity":[10,74],"in":[11,18],"our":[12,112],"thin-film":[13],"multijunction":[14],"thermal":[15,47],"converters":[16],"(TFMJTCs)":[17],"vacuum.":[19],"The":[20,50,73],"of":[24,67,75,82,107,111],"TFMJTCs":[26],"are":[27],"less":[28],"than":[29,99],"1":[30,34],"\u03bcV/V":[31,38],"down":[32,39],"to":[33,40,44,64,70,86],"Hz":[35,42],"10":[37,58],"0.2":[41],"owing":[43,63],"increased":[46],"time":[48],"constant.":[49],"measured":[51,101],"output":[52,84],"voltage":[53,85],"exceeds":[54],"120":[55],"mV":[56],"at":[57,102],"<sup":[59],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[60],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">-4</sup>":[61],"Pa":[62],"reduction":[66],"heat":[68,109],"conduction":[69],"air.":[72],"device,":[77],"defined":[78],"as":[79],"ratio":[81],"input":[88],"power,":[89],"is":[90,94],"2.4":[91],"V/W,":[92],"which":[93],"approximately":[95],"three":[96],"times":[97],"larger":[98],"that":[100],"ambient":[103],"pressure.":[104],"Numerical":[105],"simulations":[106],"TFMJTC":[113],"explain":[114],"experimental":[116],"results":[117],"well.":[118]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}