{"id":"https://openalex.org/W2005057054","doi":"https://doi.org/10.1109/tim.2014.2381732","title":"Antiperovskite Manganese Nitride Standard Resistor","display_name":"Antiperovskite Manganese Nitride Standard Resistor","publication_year":2014,"publication_date":"2014-12-31","ids":{"openalex":"https://openalex.org/W2005057054","doi":"https://doi.org/10.1109/tim.2014.2381732","mag":"2005057054"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2014.2381732","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2014.2381732","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5052274255","display_name":"Takehiko Oe","orcid":"https://orcid.org/0000-0003-3424-1745"},"institutions":[{"id":"https://openalex.org/I60134161","display_name":"Nagoya University","ror":"https://ror.org/04chrp450","country_code":"JP","type":"education","lineage":["https://openalex.org/I60134161"]},{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takehiko Oe","raw_affiliation_strings":["Department of Crystalline Materials Science, Nagoya University, Nagoya, Japan","National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Crystalline Materials Science, Nagoya University, Nagoya, Japan","institution_ids":["https://openalex.org/I60134161"]},{"raw_affiliation_string":"National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011542345","display_name":"Chiharu Urano","orcid":"https://orcid.org/0000-0002-7581-2009"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Chiharu Urano","raw_affiliation_strings":["National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5089866154","display_name":"Nobu\u2010Hisa Kaneko","orcid":"https://orcid.org/0000-0003-3857-7940"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Nobu-hisa Kaneko","raw_affiliation_strings":["National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084639900","display_name":"Hiroshi Eisaki","orcid":"https://orcid.org/0000-0002-8299-6416"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hiroshi Eisaki","raw_affiliation_strings":["Electronics and Photonics Research Institute, National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electronics and Photonics Research Institute, National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048844435","display_name":"Yoshiyuki Yoshida","orcid":"https://orcid.org/0000-0001-7998-1873"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yoshiyuki Yoshida","raw_affiliation_strings":["Electronics and Photonics Research Institute, National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electronics and Photonics Research Institute, National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013989526","display_name":"A. Yamamoto","orcid":null},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Atsuhi Yamamoto","raw_affiliation_strings":["Energy Technology Research Institute, National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Energy Technology Research Institute, National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5091816472","display_name":"K. Takenaka","orcid":"https://orcid.org/0000-0003-3206-1919"},"institutions":[{"id":"https://openalex.org/I60134161","display_name":"Nagoya University","ror":"https://ror.org/04chrp450","country_code":"JP","type":"education","lineage":["https://openalex.org/I60134161"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Koshi Takenaka","raw_affiliation_strings":["Department of Applied Physics, Nagoya University, Nagoya, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Applied Physics, Nagoya University, Nagoya, Japan","institution_ids":["https://openalex.org/I60134161"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.4289,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.59293203,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":"64","issue":"6","first_page":"1446","last_page":"1450"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12875","display_name":"Thermal Expansion and Ionic Conductivity","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12875","display_name":"Thermal Expansion and Ionic Conductivity","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10107","display_name":"Ferroelectric and Piezoelectric Materials","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10607","display_name":"Magnetic and transport properties of perovskites and related materials","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/resistor","display_name":"Resistor","score":0.6854022741317749},{"id":"https://openalex.org/keywords/antiperovskite","display_name":"Antiperovskite","score":0.6436421275138855},{"id":"https://openalex.org/keywords/temperature-coefficient","display_name":"Temperature coefficient","score":0.5439907908439636},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.53575599193573},{"id":"https://openalex.org/keywords/analytical-chemistry","display_name":"Analytical Chemistry (journal)","score":0.49131885170936584},{"id":"https://openalex.org/keywords/electrical-resistivity-and-conductivity","display_name":"Electrical resistivity and conductivity","score":0.4199334383010864},{"id":"https://openalex.org/keywords/manganese","display_name":"Manganese","score":0.41434934735298157},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2862277030944824},{"id":"https://openalex.org/keywords/metallurgy","display_name":"Metallurgy","score":0.2735660672187805},{"id":"https://openalex.org/keywords/nitride","display_name":"Nitride","score":0.26307806372642517},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.2180679440498352},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.214570552110672},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.10783916711807251}],"concepts":[{"id":"https://openalex.org/C137488568","wikidata":"https://www.wikidata.org/wiki/Q5321","display_name":"Resistor","level":3,"score":0.6854022741317749},{"id":"https://openalex.org/C2776905175","wikidata":"https://www.wikidata.org/wiki/Q19903322","display_name":"Antiperovskite","level":4,"score":0.6436421275138855},{"id":"https://openalex.org/C16643434","wikidata":"https://www.wikidata.org/wiki/Q898642","display_name":"Temperature coefficient","level":2,"score":0.5439907908439636},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.53575599193573},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.49131885170936584},{"id":"https://openalex.org/C69990965","wikidata":"https://www.wikidata.org/wiki/Q65402698","display_name":"Electrical resistivity and conductivity","level":2,"score":0.4199334383010864},{"id":"https://openalex.org/C528890316","wikidata":"https://www.wikidata.org/wiki/Q731","display_name":"Manganese","level":2,"score":0.41434934735298157},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2862277030944824},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.2735660672187805},{"id":"https://openalex.org/C194760766","wikidata":"https://www.wikidata.org/wiki/Q410851","display_name":"Nitride","level":3,"score":0.26307806372642517},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.2180679440498352},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.214570552110672},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.10783916711807251},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.0},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2014.2381732","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2014.2381732","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G4902175170","display_name":null,"funder_award_id":"26286038","funder_id":"https://openalex.org/F4320320912","funder_display_name":"Ministry of Education, Culture, Sports, Science and Technology"},{"id":"https://openalex.org/G8975084428","display_name":null,"funder_award_id":"22360291","funder_id":"https://openalex.org/F4320320912","funder_display_name":"Ministry of Education, Culture, Sports, Science and Technology"}],"funders":[{"id":"https://openalex.org/F4320311508","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54"},{"id":"https://openalex.org/F4320320912","display_name":"Ministry of Education, Culture, Sports, Science and Technology","ror":"https://ror.org/048rj2z13"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1506695234","https://openalex.org/W1573693852","https://openalex.org/W1591650141","https://openalex.org/W1984352921","https://openalex.org/W2010876852","https://openalex.org/W2026412796","https://openalex.org/W2046502228","https://openalex.org/W2068391393","https://openalex.org/W2217627717","https://openalex.org/W2313124459"],"related_works":["https://openalex.org/W2137172615","https://openalex.org/W2588215263","https://openalex.org/W2974910612","https://openalex.org/W4294266864","https://openalex.org/W2117118455","https://openalex.org/W1506695234","https://openalex.org/W1553248637","https://openalex.org/W2021342890","https://openalex.org/W2024080132","https://openalex.org/W2111405033"],"abstract_inverted_index":{"The":[0,50,87],"antiperovskite":[1,135],"manganese":[2],"nitride":[3],"compound":[4,136],"Mn":[5,108],"<sub":[6,10,14,109],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[7,11,15,110],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">3</sub>":[8,111],"Ag":[9],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">1-x</sub>":[12],"Cu":[13,45],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">x</sub>":[16],"N":[17],"has":[18,90,114],"a":[19,91,115,126,141],"broad":[20],"resistivity-temperature":[21],"curve":[22],"around":[23],"room":[24],"temperature":[25,38,150],"that":[26,94,106,122,133],"is":[27,95,123],"comparable":[28],"with":[29,44,74,84],"the":[30,36,54,61,64,68,71,100,107,149],"Manganin":[31],"alloy.":[32],"This":[33],"curvature":[34],"and":[35,46,67,146],"peak":[37],"can":[39],"be":[40,138],"adjusted":[41],"by":[42,60],"codoping":[43],"In":[47],"or":[48],"Fe.":[49],"drift":[51,80,92],"rate":[52,93],"of":[53,63,70,152],"resistance":[55,79],"value":[56],"was":[57],"strongly":[58],"affected":[59],"condition":[62],"four-terminal":[65],"contact":[66],"shape":[69],"sample.":[72,103],"Samples":[73],"spot-welded":[75],"contacts":[76],"show":[77],"lower":[78,98],"rates":[81],"than":[82,99,125],"samples":[83],"Ag-paste":[85],"contacts.":[86],"four-terminal-shaped":[88],"sample":[89,113],"80":[96],"times":[97],"normal":[101],"cuboid-shaped":[102],"We":[104,131],"confirmed":[105],"AgN":[112],"sufficiently":[116],"low-thermal":[117],"electromotive":[118],"force":[119],"against":[120],"copper":[121],"less":[124],"few":[127],"microvolts":[128],"per":[129],"kelvin.":[130],"expect":[132],"this":[134],"could":[137,147],"used":[139],"as":[140],"material":[142],"for":[143,154],"precision":[144],"resistors":[145,153],"improve":[148],"coefficient":[151],"developing":[155],"metrology":[156],"standards.":[157]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}