{"id":"https://openalex.org/W1964041634","doi":"https://doi.org/10.1109/tim.2014.2363580","title":"Vision-Based On-Loom Measurement of Yarn Densities in Woven Fabrics","display_name":"Vision-Based On-Loom Measurement of Yarn Densities in Woven Fabrics","publication_year":2014,"publication_date":"2014-11-03","ids":{"openalex":"https://openalex.org/W1964041634","doi":"https://doi.org/10.1109/tim.2014.2363580","mag":"1964041634"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2014.2363580","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2014.2363580","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5091429665","display_name":"Dorian Schneider","orcid":null},"institutions":[{"id":"https://openalex.org/I887968799","display_name":"RWTH Aachen University","ror":"https://ror.org/04xfq0f34","country_code":"DE","type":"education","lineage":["https://openalex.org/I887968799"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Dorian Schneider","raw_affiliation_strings":["Institute of Imaging and Computer Vision, RWTH Aachen University, Aachen, Germany","Institute of Imaging & Computer Vision, RWTH Aachen University, Aachen, Germany#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Imaging and Computer Vision, RWTH Aachen University, Aachen, Germany","institution_ids":["https://openalex.org/I887968799"]},{"raw_affiliation_string":"Institute of Imaging & Computer Vision, RWTH Aachen University, Aachen, Germany#TAB#","institution_ids":["https://openalex.org/I887968799"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112314240","display_name":"Yves-Simon Gloy","orcid":null},"institutions":[{"id":"https://openalex.org/I4210131995","display_name":"FEG Textiltechnik (Germany)","ror":"https://ror.org/02zp8yy63","country_code":"DE","type":"company","lineage":["https://openalex.org/I4210131995"]},{"id":"https://openalex.org/I887968799","display_name":"RWTH Aachen University","ror":"https://ror.org/04xfq0f34","country_code":"DE","type":"education","lineage":["https://openalex.org/I887968799"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Yves-Simon Gloy","raw_affiliation_strings":["Institut f\u00fcr Textiltechnik, RWTH Aachen University, Aachen, Germany","Institut f\u00fcr Textiltechnik , RWTH Aachen University , Aachen , Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institut f\u00fcr Textiltechnik, RWTH Aachen University, Aachen, Germany","institution_ids":["https://openalex.org/I887968799"]},{"raw_affiliation_string":"Institut f\u00fcr Textiltechnik , RWTH Aachen University , Aachen , Germany","institution_ids":["https://openalex.org/I4210131995","https://openalex.org/I887968799"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5064747056","display_name":"Dorit Merhof","orcid":"https://orcid.org/0000-0002-1672-2185"},"institutions":[{"id":"https://openalex.org/I887968799","display_name":"RWTH Aachen University","ror":"https://ror.org/04xfq0f34","country_code":"DE","type":"education","lineage":["https://openalex.org/I887968799"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Dorit Merhof","raw_affiliation_strings":["Institute of Imaging and Computer Vision, RWTH Aachen University, Aachen, Germany","Institute of Imaging & Computer Vision, RWTH Aachen University, Aachen, Germany#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Imaging and Computer Vision, RWTH Aachen University, Aachen, Germany","institution_ids":["https://openalex.org/I887968799"]},{"raw_affiliation_string":"Institute of Imaging & Computer Vision, RWTH Aachen University, Aachen, Germany#TAB#","institution_ids":["https://openalex.org/I887968799"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":4.8562,"has_fulltext":false,"cited_by_count":38,"citation_normalized_percentile":{"value":0.94118545,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":"64","issue":"4","first_page":"1063","last_page":"1074"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9972000122070312,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.993399977684021,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/loom","display_name":"LOOM","score":0.9734591245651245},{"id":"https://openalex.org/keywords/yarn","display_name":"Yarn","score":0.8766974210739136},{"id":"https://openalex.org/keywords/woven-fabric","display_name":"Woven fabric","score":0.5509631633758545},{"id":"https://openalex.org/keywords/weaving","display_name":"Weaving","score":0.5263242125511169},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4823455214500427},{"id":"https://openalex.org/keywords/image-processing","display_name":"Image processing","score":0.4447993338108063},{"id":"https://openalex.org/keywords/machine-vision","display_name":"Machine vision","score":0.4338233470916748},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.4025859236717224},{"id":"https://openalex.org/keywords/engineering-drawing","display_name":"Engineering drawing","score":0.3756997585296631},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.3605712652206421},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.35714462399482727},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.33788082003593445},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.18077093362808228}],"concepts":[{"id":"https://openalex.org/C2778584943","wikidata":"https://www.wikidata.org/wiki/Q6459541","display_name":"LOOM","level":2,"score":0.9734591245651245},{"id":"https://openalex.org/C2778787235","wikidata":"https://www.wikidata.org/wiki/Q49007","display_name":"Yarn","level":2,"score":0.8766974210739136},{"id":"https://openalex.org/C2777297030","wikidata":"https://www.wikidata.org/wiki/Q1314278","display_name":"Woven fabric","level":2,"score":0.5509631633758545},{"id":"https://openalex.org/C54525549","wikidata":"https://www.wikidata.org/wiki/Q2553445","display_name":"Weaving","level":2,"score":0.5263242125511169},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4823455214500427},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.4447993338108063},{"id":"https://openalex.org/C5339829","wikidata":"https://www.wikidata.org/wiki/Q1425977","display_name":"Machine vision","level":2,"score":0.4338233470916748},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.4025859236717224},{"id":"https://openalex.org/C199639397","wikidata":"https://www.wikidata.org/wiki/Q1788588","display_name":"Engineering drawing","level":1,"score":0.3756997585296631},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3605712652206421},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.35714462399482727},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.33788082003593445},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.18077093362808228},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tim.2014.2363580","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2014.2363580","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},{"id":"pmh:oai:publications.rwth-aachen.de:464795","is_oa":false,"landing_page_url":"https://publications.rwth-aachen.de/record/464795","pdf_url":null,"source":{"id":"https://openalex.org/S4306401362","display_name":"RWTH Publications (RWTH Aachen)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I887968799","host_organization_name":"RWTH Aachen University","host_organization_lineage":["https://openalex.org/I887968799"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE transactions on instrumentation and measurement : IM 64(4), 1063-1074 (2014). doi:10.1109/TIM.2014.2363580","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.44999998807907104,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":33,"referenced_works":["https://openalex.org/W147675548","https://openalex.org/W657134309","https://openalex.org/W1972556843","https://openalex.org/W1974813746","https://openalex.org/W1976606301","https://openalex.org/W1979332825","https://openalex.org/W1987056043","https://openalex.org/W1996195481","https://openalex.org/W2003660891","https://openalex.org/W2030400847","https://openalex.org/W2034851609","https://openalex.org/W2048132605","https://openalex.org/W2054330731","https://openalex.org/W2056053751","https://openalex.org/W2059432853","https://openalex.org/W2065670853","https://openalex.org/W2067149950","https://openalex.org/W2069370169","https://openalex.org/W2092541218","https://openalex.org/W2098266041","https://openalex.org/W2109925328","https://openalex.org/W2129440600","https://openalex.org/W2160137813","https://openalex.org/W2160250729","https://openalex.org/W2186116901","https://openalex.org/W2267510285","https://openalex.org/W2488529657","https://openalex.org/W2586907055","https://openalex.org/W4230861433","https://openalex.org/W6683544122","https://openalex.org/W6683727177","https://openalex.org/W6686398233","https://openalex.org/W7039830224"],"related_works":["https://openalex.org/W2575258119","https://openalex.org/W4230819241","https://openalex.org/W1987512196","https://openalex.org/W2348296977","https://openalex.org/W1995376137","https://openalex.org/W2056028772","https://openalex.org/W2499502399","https://openalex.org/W2356552547","https://openalex.org/W2386492862","https://openalex.org/W2317937884"],"abstract_inverted_index":{"A":[0],"vision-based":[1],"measurement":[2,59],"system":[3],"to":[4,19,42,102],"quantify":[5],"the":[6,27,58,72,116],"yarn":[7],"density":[8,61,98],"of":[9,31,34,60,115,119],"woven":[10],"fabrics":[11],"during":[12],"production":[13],"is":[14,89],"presented.":[15],"As":[16],"an":[17,20],"extension":[18],"earlier":[21],"developed":[22],"fabric":[23,50,97],"flaw":[24],"detection":[25],"system,":[26],"proposed":[28],"framework":[29,74],"consists":[30],"a":[32,84],"combination":[33],"basic":[35],"and":[36,47,66,88,106],"custom-made":[37],"image-processing":[38],"techniques":[39],"that":[40],"allow":[41],"precisely":[43],"track":[44],"single":[45],"wefts":[46],"warps":[48],"within":[49],"images":[51],"-":[52],"in":[53,78],"real-time.":[54],"Several":[55],"adaptations":[56],"facilitate":[57],"changes":[62],"for":[63,96,108],"plain,":[64],"satin,":[65],"twill":[67],"weaves.":[68],"In":[69],"this":[70],"paper,":[71],"algorithmic":[73],"has":[75],"been":[76],"evaluated":[77],"several":[79],"comprehensive":[80],"on-line":[81],"experiments":[82],"on":[83],"real-world":[85],"air-jet":[86],"loom":[87],"additionally":[90],"compared":[91],"with":[92],"three":[93],"alternative":[94],"methods":[95],"measurement.":[99],"It":[100],"proved":[101],"be":[103],"precise,":[104],"robust,":[105],"applicable":[107],"industrial":[109],"use":[110],"as":[111],"it":[112],"overcomes":[113],"many":[114],"existing":[117],"shortcomings":[118],"current":[120],"methods.":[121]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":5},{"year":2024,"cited_by_count":5},{"year":2023,"cited_by_count":4},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":7},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":4},{"year":2016,"cited_by_count":3},{"year":2015,"cited_by_count":1}],"updated_date":"2026-07-02T09:51:11.867554","created_date":"2025-10-10T00:00:00"}