{"id":"https://openalex.org/W2035414577","doi":"https://doi.org/10.1109/tim.2014.2329738","title":"Image Reconstruction for Electrical Capacitance Tomography Based on Sparse Representation","display_name":"Image Reconstruction for Electrical Capacitance Tomography Based on Sparse Representation","publication_year":2014,"publication_date":"2014-06-25","ids":{"openalex":"https://openalex.org/W2035414577","doi":"https://doi.org/10.1109/tim.2014.2329738","mag":"2035414577"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2014.2329738","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2014.2329738","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5068680225","display_name":"Jiamin Ye","orcid":"https://orcid.org/0000-0001-5061-6135"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210120320","display_name":"Institute of Engineering Thermophysics","ror":"https://ror.org/031zj0q48","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210120320"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiamin Ye","raw_affiliation_strings":["Chinese Academy of Sciences, Institute of Engineering Thermophysics, Beijing, China","Chinese Academy of Sciences Institute of Engineering Thermophysics Beijing China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Chinese Academy of Sciences, Institute of Engineering Thermophysics, Beijing, China","institution_ids":["https://openalex.org/I4210120320","https://openalex.org/I19820366"]},{"raw_affiliation_string":"Chinese Academy of Sciences Institute of Engineering Thermophysics Beijing China","institution_ids":["https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5012447667","display_name":"Haigang Wang","orcid":"https://orcid.org/0000-0002-4545-3834"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210120320","display_name":"Institute of Engineering Thermophysics","ror":"https://ror.org/031zj0q48","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210120320"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Haigang Wang","raw_affiliation_strings":["Chinese Academy of Sciences, Institute of Engineering Thermophysics, Beijing, China","Chinese Academy of Sciences Institute of Engineering Thermophysics Beijing China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Chinese Academy of Sciences, Institute of Engineering Thermophysics, Beijing, China","institution_ids":["https://openalex.org/I4210120320","https://openalex.org/I19820366"]},{"raw_affiliation_string":"Chinese Academy of Sciences Institute of Engineering Thermophysics Beijing China","institution_ids":["https://openalex.org/I19820366"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5085677250","display_name":"Wuqiang Yang","orcid":"https://orcid.org/0000-0002-7201-1011"},"institutions":[{"id":"https://openalex.org/I28407311","display_name":"University of Manchester","ror":"https://ror.org/027m9bs27","country_code":"GB","type":"education","lineage":["https://openalex.org/I28407311"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Wuqiang Yang","raw_affiliation_strings":["School of Electrical and Electronic Engineering, University of Manchester, Manchester, U.K","School of Electrical and Electronic Engineering , University of Manchester, Manchester, U.K"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, University of Manchester, Manchester, U.K","institution_ids":["https://openalex.org/I28407311"]},{"raw_affiliation_string":"School of Electrical and Electronic Engineering , University of Manchester, Manchester, U.K","institution_ids":["https://openalex.org/I28407311"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":6.4228,"has_fulltext":false,"cited_by_count":135,"citation_normalized_percentile":{"value":0.9706464,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":100},"biblio":{"volume":"64","issue":"1","first_page":"89","last_page":"102"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.996999979019165,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10500","display_name":"Sparse and Compressive Sensing Techniques","score":0.9965000152587891,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electrical-capacitance-tomography","display_name":"Electrical capacitance tomography","score":0.9381711483001709},{"id":"https://openalex.org/keywords/iterative-reconstruction","display_name":"Iterative reconstruction","score":0.7847198247909546},{"id":"https://openalex.org/keywords/inverse-problem","display_name":"Inverse problem","score":0.7546189427375793},{"id":"https://openalex.org/keywords/permittivity","display_name":"Permittivity","score":0.5419204831123352},{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.5386813282966614},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4908014237880707},{"id":"https://openalex.org/keywords/regularization","display_name":"Regularization (linguistics)","score":0.4739413559436798},{"id":"https://openalex.org/keywords/compressed-sensing","display_name":"Compressed sensing","score":0.45823198556900024},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.4581126570701599},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.4439196288585663},{"id":"https://openalex.org/keywords/sparse-approximation","display_name":"Sparse approximation","score":0.42044854164123535},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3788158595561981},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.2694271206855774},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.2459743618965149},{"id":"https://openalex.org/keywords/mathematical-analysis","display_name":"Mathematical analysis","score":0.1676042675971985},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1332516372203827},{"id":"https://openalex.org/keywords/dielectric","display_name":"Dielectric","score":0.092765212059021}],"concepts":[{"id":"https://openalex.org/C2777418626","wikidata":"https://www.wikidata.org/wiki/Q2584887","display_name":"Electrical capacitance tomography","level":4,"score":0.9381711483001709},{"id":"https://openalex.org/C141379421","wikidata":"https://www.wikidata.org/wiki/Q6094427","display_name":"Iterative reconstruction","level":2,"score":0.7847198247909546},{"id":"https://openalex.org/C135252773","wikidata":"https://www.wikidata.org/wiki/Q1567213","display_name":"Inverse problem","level":2,"score":0.7546189427375793},{"id":"https://openalex.org/C168651791","wikidata":"https://www.wikidata.org/wiki/Q211569","display_name":"Permittivity","level":3,"score":0.5419204831123352},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.5386813282966614},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4908014237880707},{"id":"https://openalex.org/C2776135515","wikidata":"https://www.wikidata.org/wiki/Q17143721","display_name":"Regularization (linguistics)","level":2,"score":0.4739413559436798},{"id":"https://openalex.org/C124851039","wikidata":"https://www.wikidata.org/wiki/Q2665459","display_name":"Compressed sensing","level":2,"score":0.45823198556900024},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.4581126570701599},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.4439196288585663},{"id":"https://openalex.org/C124066611","wikidata":"https://www.wikidata.org/wiki/Q28684319","display_name":"Sparse approximation","level":2,"score":0.42044854164123535},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3788158595561981},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.2694271206855774},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.2459743618965149},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.1676042675971985},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1332516372203827},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.092765212059021},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.0},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tim.2014.2329738","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2014.2329738","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},{"id":"pmh:oai:pure.atira.dk:openaire_cris_publications/15ec7a19-f34b-4377-9286-2047f8834c8b","is_oa":false,"landing_page_url":"https://research.manchester.ac.uk/en/publications/15ec7a19-f34b-4377-9286-2047f8834c8b","pdf_url":null,"source":{"id":"https://openalex.org/S4306400662","display_name":"Research Explorer (The University of Manchester)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I28407311","host_organization_name":"University of Manchester","host_organization_lineage":["https://openalex.org/I28407311"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Ye, J, Wang, H & Yang, W 2015, 'Image Reconstruction for Electrical Capacitance Tomography Based on Sparse Representation', I E E E Transactions on Instrumentation and Measurement, vol. 64, no. 1, pp. 89-102. https://doi.org/10.1109/TIM.2014.2329738","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.4399999976158142,"display_name":"Life in Land","id":"https://metadata.un.org/sdg/15"}],"awards":[{"id":"https://openalex.org/G3596144061","display_name":null,"funder_award_id":"61320106004","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G4511599407","display_name":"\u57fa\u4e8e\u6d41\u56fa\u7535\u8026\u5408\u7684\u5927\u5c3a\u5ea6\u590d\u6742\u6d41\u52a8\u7535\u5bb9\u5c42\u6790\u6210\u50cf\u673a\u7406","funder_award_id":"61374018","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G5105382614","display_name":null,"funder_award_id":"EP/G005702/1","funder_id":"https://openalex.org/F4320334627","funder_display_name":"Engineering and Physical Sciences Research Council"},{"id":"https://openalex.org/G6017898125","display_name":null,"funder_award_id":"EP/H502327/1","funder_id":"https://openalex.org/F4320334627","funder_display_name":"Engineering and Physical Sciences Research Council"}],"funders":[{"id":"https://openalex.org/F4320320291","display_name":"University of Manchester","ror":"https://ror.org/027m9bs27"},{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320322392","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549"},{"id":"https://openalex.org/F4320334627","display_name":"Engineering and Physical Sciences Research Council","ror":"https://ror.org/0439y7842"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":35,"referenced_works":["https://openalex.org/W967831527","https://openalex.org/W1963548229","https://openalex.org/W1963640956","https://openalex.org/W1974831921","https://openalex.org/W1975080737","https://openalex.org/W1987258266","https://openalex.org/W1991048188","https://openalex.org/W1994097344","https://openalex.org/W1999518795","https://openalex.org/W2000241688","https://openalex.org/W2029026810","https://openalex.org/W2033367330","https://openalex.org/W2039014262","https://openalex.org/W2049772201","https://openalex.org/W2050834445","https://openalex.org/W2051760592","https://openalex.org/W2061980133","https://openalex.org/W2069959554","https://openalex.org/W2070738097","https://openalex.org/W2087160109","https://openalex.org/W2097584868","https://openalex.org/W2115706991","https://openalex.org/W2129638195","https://openalex.org/W2129812935","https://openalex.org/W2136660391","https://openalex.org/W2138838870","https://openalex.org/W2144188699","https://openalex.org/W2149846618","https://openalex.org/W2164452299","https://openalex.org/W2170164530","https://openalex.org/W2296319761","https://openalex.org/W2803670972","https://openalex.org/W4214806317","https://openalex.org/W4250589301","https://openalex.org/W6625470382"],"related_works":["https://openalex.org/W2111203800","https://openalex.org/W2170544729","https://openalex.org/W2090093661","https://openalex.org/W2031832834","https://openalex.org/W2097442821","https://openalex.org/W2157674401","https://openalex.org/W1519688086","https://openalex.org/W1974104633","https://openalex.org/W2045604881","https://openalex.org/W2058033086"],"abstract_inverted_index":{"Image":[0],"reconstruction":[1,48],"for":[2,28,50,126,144],"electrical":[3],"capacitance":[4,70],"tomography":[5],"(ECT)":[6],"is":[7,15,56,78,123],"a":[8,22,45,92,106,121],"nonlinear":[9],"problem.":[10],"A":[11],"generalized":[12],"inverse":[13],"operator":[14],"usually":[16],"ill-posed":[17],"(unbounded)":[18],"and":[19,33,101,138,141],"ill-conditioned":[20],"(with":[21,137],"large":[23],"norm).":[24],"Therefore,":[25],"the":[26,37,42,74,98,110],"solutions":[27],"ECT":[29,51],"are":[30],"not":[31],"unique":[32],"highly":[34],"sensitive":[35],"to":[36,73,87],"measurement":[38],"noise.":[39],"To":[40],"improve":[41],"image":[43,47],"quality,":[44],"new":[46,99],"algorithm":[49,130],"based":[52,96],"on":[53,97],"sparse":[54,94],"representation":[55,95],"proposed.":[57],"An":[58],"unconventional":[59],"basis,":[60],"i.e.,":[61],"an":[62,81],"extended":[63],"sensitivity":[64],"matrix":[65],"consisting":[66],"of":[67,109],"some":[68],"normalized":[69],"vectors":[71],"corresponding":[72],"base":[75,111],"permittivity":[76,85,146],"elements":[77],"designed":[79],"as":[80,105],"expansion":[82],"frame.":[83],"The":[84,128],"distributions":[86],"be":[88,103],"reconstructed":[89],"can":[90,102],"have":[91],"natural":[93],"basis":[100],"represented":[104],"linear":[107],"combination":[108],"elements.":[112],"Another":[113],"sparsity":[114],"regularization":[115],"method-the":[116],"standard":[117],"Landweber":[118],"iteration":[119],"with":[120],"threshold":[122],"also":[124],"conducted":[125],"comparison.":[127],"proposed":[129],"has":[131],"been":[132],"evaluated":[133],"by":[134],"both":[135],"simulation":[136],"without":[139],"noise)":[140],"experimental":[142],"results":[143],"different":[145],"distributions.":[147]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":7},{"year":2024,"cited_by_count":5},{"year":2023,"cited_by_count":9},{"year":2022,"cited_by_count":18},{"year":2021,"cited_by_count":17},{"year":2020,"cited_by_count":15},{"year":2019,"cited_by_count":14},{"year":2018,"cited_by_count":17},{"year":2017,"cited_by_count":13},{"year":2016,"cited_by_count":9},{"year":2015,"cited_by_count":7},{"year":2014,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}