{"id":"https://openalex.org/W2054803963","doi":"https://doi.org/10.1109/tim.2014.2322171","title":"Erratum to \u201cJoint Empirical Mode Decomposition and Sparse Binary Programming for Underlying Trend Extraction\u201d [Oct 13 2673-2682]","display_name":"Erratum to \u201cJoint Empirical Mode Decomposition and Sparse Binary Programming for Underlying Trend Extraction\u201d [Oct 13 2673-2682]","publication_year":2014,"publication_date":"2014-06-05","ids":{"openalex":"https://openalex.org/W2054803963","doi":"https://doi.org/10.1109/tim.2014.2322171","mag":"2054803963"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2014.2322171","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tim.2014.2322171","pdf_url":"https://ieeexplore.ieee.org/ielx7/19/6826597/06826608.pdf","source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"erratum","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"bronze","oa_url":"https://ieeexplore.ieee.org/ielx7/19/6826597/06826608.pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5064465418","display_name":"Zhijing Yang","orcid":"https://orcid.org/0000-0001-8336-5109"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Zhijing Yang","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022036826","display_name":"Bingo Wing\u2010Kuen Ling","orcid":"https://orcid.org/0000-0002-0633-7224"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Bingo Wing-Kuen Ling","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"last","author":{"id":"https://openalex.org/A5045647966","display_name":"Chris Bingham","orcid":"https://orcid.org/0000-0001-6684-7894"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Chris Bingham","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":true,"cited_by_count":0,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":"63","issue":"7","first_page":"1880","last_page":"1880"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10534","display_name":"Structural Health Monitoring Techniques","score":0.9602000117301941,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.947700023651123,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/binary-number","display_name":"Binary number","score":0.6947118043899536},{"id":"https://openalex.org/keywords/decomposition","display_name":"Decomposition","score":0.6047388315200806},{"id":"https://openalex.org/keywords/joint","display_name":"Joint (building)","score":0.5428755879402161},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5395464301109314},{"id":"https://openalex.org/keywords/hilbert\u2013huang-transform","display_name":"Hilbert\u2013Huang transform","score":0.5217160582542419},{"id":"https://openalex.org/keywords/extraction","display_name":"Extraction (chemistry)","score":0.4551243484020233},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4041312336921692},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.245828777551651},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.1728207767009735},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17174014449119568},{"id":"https://openalex.org/keywords/structural-engineering","display_name":"Structural engineering","score":0.1611464023590088},{"id":"https://openalex.org/keywords/arithmetic","display_name":"Arithmetic","score":0.08356603980064392},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.08153989911079407},{"id":"https://openalex.org/keywords/chromatography","display_name":"Chromatography","score":0.07426512241363525}],"concepts":[{"id":"https://openalex.org/C48372109","wikidata":"https://www.wikidata.org/wiki/Q3913","display_name":"Binary number","level":2,"score":0.6947118043899536},{"id":"https://openalex.org/C124681953","wikidata":"https://www.wikidata.org/wiki/Q339062","display_name":"Decomposition","level":2,"score":0.6047388315200806},{"id":"https://openalex.org/C18555067","wikidata":"https://www.wikidata.org/wiki/Q8375051","display_name":"Joint (building)","level":2,"score":0.5428755879402161},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5395464301109314},{"id":"https://openalex.org/C25570617","wikidata":"https://www.wikidata.org/wiki/Q1006462","display_name":"Hilbert\u2013Huang transform","level":3,"score":0.5217160582542419},{"id":"https://openalex.org/C4725764","wikidata":"https://www.wikidata.org/wiki/Q844704","display_name":"Extraction (chemistry)","level":2,"score":0.4551243484020233},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4041312336921692},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.245828777551651},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.1728207767009735},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17174014449119568},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.1611464023590088},{"id":"https://openalex.org/C94375191","wikidata":"https://www.wikidata.org/wiki/Q11205","display_name":"Arithmetic","level":1,"score":0.08356603980064392},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.08153989911079407},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.07426512241363525},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C112633086","wikidata":"https://www.wikidata.org/wiki/Q381287","display_name":"White noise","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2014.2322171","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tim.2014.2322171","pdf_url":"https://ieeexplore.ieee.org/ielx7/19/6826597/06826608.pdf","source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1109/tim.2014.2322171","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tim.2014.2322171","pdf_url":"https://ieeexplore.ieee.org/ielx7/19/6826597/06826608.pdf","source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2054803963.pdf","grobid_xml":"https://content.openalex.org/works/W2054803963.grobid-xml"},"referenced_works_count":1,"referenced_works":["https://openalex.org/W2089997590"],"related_works":["https://openalex.org/W3014107421","https://openalex.org/W2081563414","https://openalex.org/W2363056446","https://openalex.org/W2359718298","https://openalex.org/W2377062149","https://openalex.org/W2076661204","https://openalex.org/W2380939102","https://openalex.org/W2089603224","https://openalex.org/W2329112433","https://openalex.org/W2077314893"],"abstract_inverted_index":{"Due":[0],"to":[1],"a":[2],"production":[3],"error,":[4],"some":[5],"equations":[6],"in":[7],"the":[8,15],"above":[9],"paper":[10],"appeared":[11],"incorrectly.":[12],"Here":[13],"are":[14],"correct":[16],"versions.":[17]},"counts_by_year":[],"updated_date":"2026-07-29T09:40:50.615796","created_date":"2025-10-10T00:00:00"}